National Institute of Technology Calicut

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1 National Institute of Technology Calicut School of Nano Science and Technology Centre for Microscopy Hands on Training Program on Scanning Electron (SEM) & Atomic Force Microscopy (AFM) July 18 20, 2011 Applications are invited for three days Hand on Training Program on Microscopy from July th, Qualifications: Bachelor s degree in Science or Engineering or higher with basic computer knowledge Course Fee: Rs 10, per person Number of seats available: 10 Interested candidates may apply through e mail to semcentre@nitc.ac.in along with a brief biodata on or before July 10 th, Selected candidates will be informed by return e mail. Coordinators: Dr Soney Varghese and Mr Hanas T Brief description about the training program: Three day training program will cover extensive introduction to scanning electron microscopy, energy dispersive spectroscopy and atomic force microscopy (instrument details and capabilities are given in the brochure below). The trainees will get enough experience to operate instrument by their own. Training includes both theory and hands on practical sessions handled by experts in this field. Certificate will be issued after successful completion of the training. Candidates are required to make arrangements for food and accommodation, limited number of accommodation will be available in the campus on payment basis.

2 CONTACT DETAILS Centre Manager, SEM Centre NIT Calicut, Kerala Phone: Fax: Web : Designed by NITC Graphic Studio/mkcm/10/09 National Institute of Technology Calicut Kozhikode, Kerala

3 Set in a picturesque landscape at the foothills of the Western Ghats, National Institute of Technology Calicut (NITC) is located about 22 kilometers north-east of Calicut City. National Institute of Technology Calicut is a Technical Institution of national importance. NITC is reputed for its top-rated standing among educational institutions in the country, up-to date research in cutting-edge technologies, and its excellent infrastructural facilities. There are various sophisticated facilities in the institute for materials characterization, such as Differential Scanning Calorimetry, Thermo-Gravimetric Analysis, Fourer-Transform Infrared Spectrometer, Metallurgical Microscope etc. NITC has recently commissioned a new highend Scanning Electron Microscopy Centre. The capabilities of this centre are open for consultancy services also. SEM CENTRE The centre is equipped with Hitachi SU6600 Variable Pressure Field Emission Scanning Electron Microscope (FESEM). THE MAIN FEATURES OF SU 6600-FESEM Electron gun: Tungsten Schottky emission electron source Resolution: 1.2 nm/30 kv, 3.0 nm/1 kv Probe current: 1pA~200nA Specimen chamber pressure : 10-4 Pa (high vacuum), 10~300Pa (low vacuum) Specimen Size: Max 150 mm dia. 40 mm H Magnification: 500,000 x IMAGING TECHNIQUES Secondary Electron Imaging (SE) Backscattered Electron Imaging (BSE) Environmental Secondary Electron Detector (ESED) Energy Dispersive Spectroscopy (Horiba, EMAX, 137 ev) For analysis, mapping & Point ID The ESED mode allows the operator to change vacuum conditions in the sample chamber from high vacuum to low vacuum. This also allows imaging of non-conducting samples with out conductive coating. It is also equipped with specimen exchange device which helps in reducing the time taken to build vacuum. OTHER FACILITIES Quantamix Capsule Kit for wet samples including suspensions, emulsions, creams, cells and tissues Ion sputter coating unit for carbon & gold for nonconducting samples CAPABILITIES AND PROGRAMS Characterization of samples for applications including Nanoscience and Technology Materials Processing Biosciences and Medical Applications Polymers and Ceramics Alloys and Gels Hands-on SEM training programs The institute will be launching hands-on training programs and workshops on the applications of Scanning Electron Microscopy periodically.

4 Scanning Probe Microscopy Centre CONTACT DETAILS Centre Manager, SPM Centre NIT Calicut, Kerala Phone: Fax: Web:

5 SPM CENTRE The centre is equipped with Park XE-100 Atomic Force Microscopy (AFM). Specifications: Decoupled XY & Z Scanners Scan range of XY-scanner: 5 μm and 100 μm Working distance of Z-scanner: 12 μm or 25 μm Sample size:up to 100 mm 100mm, 20 mm thick, and up to 500 g Supported Modes True Non-Contact Mode Contact Mode Force - distance Spectroscopy/F-d volume imaging Phase imaging of True Non-Contact, FMM, MFM and EFM Conductive AFM Scanning Tunneling Microscopy Magnetic Force Microscopy Electric Force Microscopy Scanning Thermal Microscopy Nanolithography Nanoindentation Accessories Electrochemistry Cell Universal Liquid Cell with heating/cooling stage Heating/Cooling sample stage Magnetic Field Generator Hands-on AFM training programs The institute will be launching hands-on training programs and workshops on the applications of Atomic Force Microscopy Set in a picturesque landscape at the foothills of the Western Ghats, National Institute of Technology Calicut (NITC) is located about 22 kilometers north-east of Calicut City. National Institute of Technology Calicut is a Technical Institution of national importance. NITC is reputed for its top-rated standing among educational institutions in the country, up-to date research in cutting edge technologies, and its excellent infrastructural facilities. The School of Nano Science and Technology at National Institute of Technology Calicut offers higher degree programs at the Master s and Doctoral levels, in various academic streams related to Nanoscience and Nanotechnology. The SEM centre in this department is equipped with Hitachi SU6600 Variable Pressure Field Emission Scanning Electron Microscope (FESEM). The Park XE-100 is the ultimate AFM/SPM solution for the True NonContact nanoscale metrology of small samples in data storage, semiconductors, nano science, materials science, polymers, and electrochemistry. The capabilities of this centre are open for consultancy services also.