Industrial X-ray & CT Forum Agenda

Transcription

1 Day 1 Tuesday, May 12 Nittany Lion Inn Hotel and Conference Center Time Topic Speaker 08:00am 09:00am 09:00am 09:20am 09:20am 09:30am 09:30am 10:00am 10:00am 10:30am 10:30am 11:00am 11:00am 11:30am 11:30am 12:00pm 12:00pm 12:30pm 12:30pm 01:30pm 01:30pm 02:00pm 02:00pm 02:30pm 02:30pm 03:00pm 03:00pm 03:30pm 03:30pm 04:00pm 04:00pm 04:30pm 04:30pm 05:00pm 05:00am 05:30pm 05:30am 05:45pm 06:00pm 07:30pm 08:00pm Registration Welcome Introduction Advances in GE's Digital Detector Array (DDA) and Computed Radiography (CR) Technology Industrial Production Process Control with Advanced Helix and Cone Beam Computed Tomography Technology Leaps in Production Readiness of Computed Tomography Technology and Solutions Present and Future Applications for Radiography based NDT Implementation of 2D DDA inspection of aerospace magnesium castings and NADCAP approval Lunch PCC s Transition to the Digital World Blade-Line CT: 2D/3D inspection of turbine blades Vendor neutral global DICONDE asset inspection data management or Data Management / Archiving solution System and software requirements for VDI 2630 standard conform 3D metrology with CT Quantitative Interpretation of CT Numbers Computed Radiography vs. Film Radiography Bridge Integrity Inspection Closing Scavenger Hunt on Penn State Campus (Optional) Dinner at the Nittany Lion Inn Juan Mario Gomez Rajashekar Venkatachalam Dr. Oliver Brunke Shana Telesz * Walter Roy Keystone Innovations Justin Byers Magellan Aerospace Don Deptowicz PCC Airfoils * Ryan Soule GE Aviation Lloyd Arrowood Department of Energy * Prof. Phillip Halleck Penn State University / Halleck Geophysics Inc. Allen Gress Element Materials Technology Robin Dunlap and Scott Kopp High Steel Structures *Parallel Tutorials will be held at these times 11:00am-11:30am Volume Graphics Software Solutions - Roger Wende 1:30pm-2:00pm Digital Detector Array In-depth Review Johanna Phillips 3:00pm-3:30pm Service Solutions - Kevin Ahern/Jeff Gordon/ Melissa Stancato

2 Day 2 Wednesday, May 13 Nittany Lion Inn Hotel and Conference Center Time Topic Speaker 09:00am 09:30am 09:30am 10:00am 10:00am 10:30am 10:30am 11:00am 11:00am 11:30am 11:30am 12:00pm 12:00pm 12:30pm 12:30pm 01:30pm 01:30pm 02:00pm 02:00pm 02:30pm 02:30pm 03:00pm 03:00pm 03:30pm 03:30pm 04:00pm 04:00pm 04:30pm 04:30pm 05:00pm 05:00pm 05:10pm 05:10pm 05:20pm speed scan implementation at Volkswagen Fully automated in-line 3D CT inspection Complex additive manufactured part inspection with CT Industrial Implementation of Additive Manufacturing across GE Flaw Detection in Body Armor Using CT Biomedical Engineering Applications with nanotom m Lunch Soft tissue leeches scanned w/ CT after staining MicroCT Evaluation of Voids in Decayed Wood Plastic Composites 2D/3D x-ray inspection of electronic devices Digital Detector Array Design and Manufacture Manufacturing Software Visualization Solutions Digital Data Storage Solutions Closing Group Picture in front of Nittany Lion Inn Dr. Oliver Brunke Roger Wende Volume Graphics Griffin Jones Penn State University Ed Herderick GE Advanced Manufacturing * Initiatives Group Rory Bigger Southwest Research Institute Boyce Collins North Carolina A&T University Morgan Hill & Henry Towbin American Museum of Natural * History Grace Sun University of British Columbia Anju Sharma State University of NY - Binghamton Johanna Phillips GE Healthcare * Roger Wende Volume Graphics Sue Montagna 06:00pm Dinner at Penn State Football Stadium *Parallel Tutorials will be held at these times 11:00am-11:30am Volume Graphics Software Solutions - Roger Wende 1:30pm-2:00pm Digital Detector Array In-depth Review Johanna Phillips 3:00pm-3:30pm Service Solutions - Kevin Ahern/Jeff Gordon/ Melissa Stancato

3 Day 3 Thursday, May 14 Lewistown Technology Solutions Center Time 07:15am 08:00am Topic Bus leaves Nittany Lion Inn in State College for Lewistown TSC 08:15am 08:30am Welcome Kermit Hoffman 08:45am 09:35am Workshop 1 Attendees Choice See List Below 9:45am 10:35am Workshop 2 Attendees Choice See List Below 10:45am 11:35am Workshop 3 Attendees Choice See List Below 11:45am 12:35pm Workshop 4 Attendees Choice See List Below 12:35pm 01:45pm Lunch / Free Time Café 01:45pm 02:00pm Closing Comments Neil Bloomfield 02:00pm 03:00pm Bus leaves Lewistown TSC for Nittany Lion Inn in State College Thursday s agenda allows for attendance at up to four of the ten scheduled 50-minute workshops that will be held in GE s NDT Technology Solutions Center in Lewistown. Each of the ten workshops will be held four times, at 8:45, 9:45, 10:45, & 11:45. The only exception is the Digital Detector Array (DDA) development and manufacture workshop, which will be held at 8:45 & 10:45. You may select from any of the following: Aerospace casting inspection with Seifert x blade and blade line Meet at x blade Turbine blade inspection applications and X-ray system solutions 2D and 3D inspection workflows Void calculation and wall thickness measurements DICONDE conform inspection data management Advanced 3D CT: tips, tricks & tools for efficient, high quality scans (v tome x L 450) Meet at v tome x L 450 Improve CT Quality (acquisition) o Tube settings, tube setup, tube limits, X-ray filter o Detector settings o Correction images o Sample preparation, positioning Improve CT quality (reconstruction) o Use of automatic geometry calibration, image optimizer, etc. Setup of fast scan, sector scan, multi scan Digital Conversion - Static 2d Radiography Meet in Nittany Film replacement and targeted applications where automated inspection is not practical Utilization of DDA's / CR for portable applications and standard DDA's / CR for cabinet applications Software review including need for DICONDE standardization for archival and sharing of images Brief overview of major specifications

4 Digital Detector Array (DDA) development and manufacture (8:45 and 10:45 sessions only) Meet in Logan Brief overview of DDA technology GE Healthcare s investment in DDA research & development, and manufacturing Review of manufacturing process and techniques Rhythm Software solution package for DICONDE NDT data management Meet in Tuscarora Rhythm Review inspection platform Rhythm Radiography advanced image acquisition, review and data management tools Rhythm Enterprise Archive scalable and flexible DICONDE storage solution also for integration in enterprise networks Volume Graphics Professional CT Data analysis tools for geometry and material analysis Meet in Kishacoquillas Coordinate Measurements, nominal/actual comparison and registration processes in VGMetrology Analysis of fibers, pores and permeability calculation demonstrated on real world CT data sets 3D metrology with phoenix v tome x m metrology edition Meet at phoenix v tome x m VDI 2630 guideline criteria Additional system and software requirements for high precision metrology with CT Validation referring to VDI D metrology workflow Proactive Service for increased uptime Meet in Shawnee Feedback session with service directors and product managers Uncovering common and complex causes of failures Overview of GE s new service organization and service offerings CT Training Course - Overview of new 40-hour course for Scan Operators and Data Analysts Meet in Juniata Manufacturing Plant Tour Tour begins in Café Tour GE s manufacturing facility, where we have a 50 year history in the design and manufacture of non-destructive testing products and solutions. Advanced machining operations Piezoelectric fabrication Ultrasonic transducer assembly Eddy Current probe assembly Flaw detector assembly X-ray and Ultrasonic Testing Machines integration Computed Radiography system integration

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