MQ Series Medical Grade MLCC General Specifications

Transcription

1 General Specifications GENERAL DESCRIPTION AVX offers a wide variety of medically qualified passive components. Medical devices require the utmost reliability with respect to the components incorporated into the designs. Advanced design qualification requirements, in-process controls, requirements, and lot acceptance testing are implemented to ensure these components will meet the superior reliability levels of a life supporting application. AVX medical MLCC reliability documents provide an advanced level of designing, manufacturing, testing and qualification that places AVX as the top supplier and industry leader of medically qualified MLCCs. AVX MQ series of medically qualified ceramic capacitors are available in EIA case sizes ranging from 0402 to 2225, at typical voltage ratings between Vdc with various termination options including Sn, SnPb solder, and Au. APPLICATIONS Implantable cardioverter-defibrillator (ICD) Pacemakers Neuromodulation HOW TO ORDER MQ02 Z A 100 FEATURES 0402 to 2225 case sizes Voltage range from 4v to 100v up to 100μF Class I & II dielectric materials Tight tolerances on Class I dielectric materials Various terminations Customer specific requirements, screening, & testing J G T 3 A Size MQ02 = 0402 MQ03 = 0603 MQ05 = 0805 MQ06 = 1206 MQ10 = 1210 MQ12 = 1812 MQ13 = 1825 MQ14 = 2225 Rated Voltage 4 = 4V 6 = 6.3V Z = 10V Y = 16V 3 = 25V 5 = 50V 1 = 100V Code A = NP0 (C0G) C = X7R Z = x7s D = x5r Code (In pf) (2 significant digits + no. of zeros) Fir values <10pF: letter R denotes decimal point. Examples: 68pF = pF = 8R2 Tolerance For Values < 10pF B = ±0.1pF C = ±0.25pF D = ±0.5pF For Values 10pF F = ±1% G = ±2% J = ±5% K= ±10% M= ±20% N = ±30% Medical Grade Termination Finish T = Plated Ni & Sn J = 60/40 Sn/Pb B = 5% min Pb Plated Solder 7 = Gold Plated Packaging 1 = 7 Reel 2 = 7 Reel (0402 only) 3 = 13 Reel 4 = 13 Reel (0402 only) 6 = Waffle Special Code A = Standard Contact AVX for others

2 NP0 (C0G) & Voltage Range PREFERRED SIZES ARE SHADED SIZE Soldering Reflow Only Reflow/Wave Reflow/Wave Reflow/Wave Reflow Only Reflow Only Reflow Only Reflow Only Packaging All Paper All Embossed All Embossed All Embossed All Embossed All Embossed All Embossed All Embossed mm 1.00 ± ± ± ± ± ± 0.25 (L) Length (in.) ((0.040 ± 0.004) (0.063 ± 0.006) (0.079 ± 0.008) (0.126 ± 0.008) (0.126 ± 0.008) (0.177 ± 0.012) (0.177 ± 0.012) (0.225 ± 0.010) mm 0.50 ± ± ± ± ± ± ± 0.25 (W) Width (in.) (0.020 ± 0.004) (0.032 ± 0.006) (0.049 ± 0.008) (0.063 ± 0.008) (0.098 ± 0.008) (0.126 ± 0.008) (0.252 ± 0.016) (0.250 ± 0.010) mm 0.25 ± ± ± ± ± 0.39 (t) Terminal (in.) (0.010 ± 0.006) (0.037) (0.024 ± 0.014) (0.024 ± 0.014) (0.025 ± 0.015) Maximum mm Thickness (in.) (0.022) (0.014 ± 0.006) (0.060) (0.070) (0.070) (0.110) (0.110) (0.110) WVDC Cap 0.5 (pf) WVDC SIZE

3 NP0 (C0G) General Specifications TYPICAL ELECTRICAL CHARACTERISTICS Temperature Coefficient vs. Frequency (Ohm-Farads) 10,000 1, vs. Temperature vs Temperature Temperature C of Impedance with Cap Value C0G (NP0) 10 pf vs. 100 pf vs pf of Impedance with Chip Size 1000 pf - C0G (NP0) of Impedance with Ceramic Formulation 1000 pf - C0G (NP0) vs. X7R

4 NP0 (C0G) Specifications & Test Methods Parameter/Test NP0 Specification Limits Measuring Conditions Operating Temperature Range -55ºC to +125ºC Temperature Cycle Chamber Within specified tolerance Freq.: 1.0 MHz ± 10% for cap 1000 pf Q <30 pf: Q x Cap Value 1.0 khz ± 10% for cap > 1000 pf 30 pf: Q 1000 Voltage: 1.0Vrms ±.2V 100,000MΩ or 1000MΩ - μf, whichever is less Charge device with rated voltage for 120 ± 5 room temp/humidity Charge device with 250% of rated voltage for No breakdown or visual defects 1-5 seconds, with charge and discharge current limited to 50 ma (max) No defects Deflection: 2mm ±5% or ±.5 pf, whichever is greater Test Time: 30 seconds to Flexure Stresses Q Initial Value x 0.3 Solderability 85% of each terminal should be covered Dip device in eutectic solder at 245 ± 5ºC with fresh solder for 5.0 ± 0.5 seconds No defects, <25% leaching of either end terminal ±2.5% or ±.25 pf, whichever is greater to MIL-STD-202 / Method 210 / Condition J Solder Heat Q (Reflow Mounting plus 1 Reflow 235 C ± 5 C) Step 1: -55ºC ± 2º 30 ± 3 minutes Thermal Shock Load Life Load Humidity ±3.0% or ±.0.3 pf, whichever is greater Step 2: Room Temp 3 minutes Q Step 3: +125ºC ± 2º 30 ± 3 minutes Step 4: Room Temp 3 minutes Repeat for 5 cycles and measure after 24 hours at room temperature ±3.0% or ± 0.3 pf, whichever is greater 30 pf: Q 350 Q 10 pf, <30 pf: Q C/2 <10 pf: Q C Load in test chamber set at 125 C ± 2 C for 1000 hours (+48, -0) with twice rated voltage applied. Remove from test chamber and stabilize at room Load in a test chamber set at 85 C ± 2 C/85% ± 5% relative humidity for 1000 hours (+48, -0) with rated voltage applied. Remove from chamber and stabilize at room

5 X7R/X7S General Specifications PREFERRED SIZES ARE SHADED SIZE Soldering Reflow Only Reflow/Wave Reflow/Wave Reflow/Wave Reflow Only Reflow Only Reflow Only Reflow Only Packaging All Paper All Embossed All Embossed All Embossed All Embossed All Embossed All Embossed All Embossed (L) Length mm 1.00 ± ± ± ± ± ± 0.25 (in.) (0.040 ± 0.004) (0.063 ± 0.006) (0.079 ± 0.008) (0.126 ± 0.008) (0.126 ± 0.008) (0.177 ± 0.012) (0.177 ± 0.012) (0.225 ± 0.010) (W) Width mm 0.50 ± ± ± ± ± ± ± 0.25 (in.) (0.020 ± 0.004) (0.032 ± 0.006) (0.049 ± 0.008) (0.063 ± 0.008) (0.098 ± 0.008) (0.126 ± 0.008) (0.252 ± 0.016) (0.250 ± 0.010) (t) Terminal mm 0.25 ± ± ± ± ± 0.39 (in.) (0.010 ± 0.006) (0.037) (0.024 ± 0.014) (0.024 ± 0.014) (0.025 ± 0.015) Maximum mm Thickness (in.) (0.022) (0.014 ± 0.006) (0.060) (0.070) (0.070) (0.110) (0.110) (0.110) Cap (pf) Cap (μf) WVDC WVDC SIZE

6 X7R/X7S General Specifications TYPICAL ELECTRICAL CHARACTERISTICS X7R Typical Temperature Coefficient vs. Frequency vs. Temperature of Impedance with Cap Value 1,000 pf vs. 10,000 pf - X7R 0805 of Impedance with Chip Size 10,000 pf -X7R of Impedance with Chip Size 100,000 pf - X7R

7 X7R/X7S Specifications & Test Methods Parameter/Test NP0 Specification Limits Measuring Conditions Operating Temperature Range -55ºC to +125ºC Temperature Cycle Chamber Within specified tolerance 2.5% for 50V DC rating Frequency: 1.0kHz ± 10% 3.0% for 25V & 35V DC rating Voltage: 1.0Vrms ± 0.2V 12.5% for 16V DC rating and lower Contact factory for DF by PN 100,000MΩ or 1000MΩ - μf, whichever is less Charge device with rated voltage for 120 ± 5 room temp/humidity Charge device with 250% of rated voltage for No breakdown or visual defects 1-5 seconds, with charge and discharge current limited to 50 ma (max) No defects Deflection: 2mm to Flexure Stresses to Solder Heat Thermal Shock Load Life Load Humidity Solderability ±12% Initial Value x 0.3 Test Time: 30 seconds 85% of each terminal should be covered Dip device in eutectic solder at 245 ± 5ºC with fresh solder for 5.0 ± 0.5 seconds No defects, <25% leaching of either end terminal ±7.5% MIL-STD-202 / Method 210 / Condition J (Reflow Mounting plus 1 Reflow 235 C ± 5 C) Step 1: -55ºC ± 2º 30 ± 3 minutes ±7.5% Step 2: Room Temp 3 minutes Step 3: +125ºC ± 2º 30 ± 3 minutes Step 4: Room Temp 3 minutes ±12.5% initial value x 2.0 (see above) Repeat for 5 cycles and measure after 24 hours at room temperature Load in test chamber set at 125 C ± 2 C for 1000 hours (+48, -0) with twice rated voltage applied. Remove from test chamber and stabilize at room Load in a test chamber set at 85 C ± 2 C/85% ± 5% relative humidity for 1000 hours (+48, -0) with rated voltage applied. Remove from chamber and stabilize at room

8 X5R & Voltage Range PREFERRED SIZES ARE SHADED SIZE Soldering Reflow Only Reflow/Wave Reflow/Wave Reflow/Wave Reflow Only Reflow Only Packaging All Paper All Embossed All Embossed All Embossed All Embossed All Embossed (L) Length (W) Width (t) Terminal mm 1.00 ± 0.10 (in.) (0.040 ± 0.004) mm 0.50 ± 0.10 (in.) (0.020 ± 0.004) mm 0.25 ± 0.15 (in.) (0.010 ± 0.006) 1.60 ± 0.15 (0.063 ± 0.006) 0.81 ± 0.15 (0.032 ± 0.006) 0.35 ± 0.15 (0.037) 2.01 ± 0.20 (0.079 ± 0.008) 1.25 ± 0.20 (0.049 ± 0.008) (0.126 ± 0.008) 1.60 ± 0.20 (0.063 ± 0.008) (0.126 ± 0.008) 2.50 ± 0.20 (0.098 ± 0.008) 4.50 ± 0.30 (0.177 ± 0.012) (0.126 ± 0.008) 0.61 ± 0.36 (0.024 ± 0.014) Maximum mm Thickness (in.) (0.022) (0.014 ± 0.006) (0.060) (0.070) (0.070) (0.110) WVDC Cap (μf) WVDC SIZE TYPICAL ELECTRICAL CHARACTERISTICS

9 X5R Specifications & Test Methods Parameter/Test X5R Specification Limits Measuring Conditions Operating Temperature Range -55ºC to +85ºC Temperature Cycle Chamber Within specified tolerance 2.5% for 50V DC rating Freq.: 1.0 khz ± 10% 3.0% for 25V, 35V DC rating Voltage: 1.0Vrms ±.2V 12.5% Max. for 16V DC rating and lower For Cap > 10 μf, 120Hz Contact y for DF by PN 10,000MΩ or 500MΩ - μf, Charge device with rated voltage for whichever is less 120 ± 5 room temp/humidity Charge device with 150% of rated voltage for No breakdown or visual defects 1-5 seconds, w/charge and discharge current limited to 50 ma (max) No defects Deflection: 2mm ±12% Test Time: 30 seconds to Flexure Stresses Initial Value x 0.3 Solderability 85% of each terminal should be covered Dip device in eutectic solder at 245 ± 5ºC with fresh solder for 5.0 ± 0.5 seconds No defects, <25% leaching of either end terminal to Solder Heat Thermal Shock Load Life Load Humidity ±7.5% MIL-STD-202 / Method 210 / Condition J (Reflow Mounting plus 1 Reflow 235 C ± 5 C) Step 1: -55ºC ± 2º 30 ± 3 minutes ±7.5% Step 2: Room Temp 3 minutes Step 3: +85ºC ± 2º 30 ± 3 minutes Step 4: Room Temp 3 minutes ±12.5% Initial Value x 2.0 (See Above) Repeat for 5 cycles and measure after 24 ± 2 hours at room temperature Load in test chamber set at 85 C ± 2 C for 1000 hours (+48, -0) with twice rated voltage applied. Remove from test chamber and stabilize at room Load in a test chamber set at 85 C ± 2 C/85% ± 5% relative humidity for 1000 hours (+48, -0) with rated voltage applied. Remove from chamber and stabilize at room