LEAP 5000 & EIKOS Consumables, Accessories, and Options

Transcription

1 LEAP 5000 & EIKOS Consumables, Accessories, and Options

2 Contents Consumables... 5 Local Electrode Assembly (New)... 5 Local Electrode (Refurbished)... 5 LEAP Quality Assurance Test Kit... 5 Consumables Credit Package... 5 Presharpened Microtip Coupons (PSM M36)... 6 Microtip for FIB Liftout Mounting (FT M36 - LEAP 3000)... 6 Microtip Coupons for FIB Liftout (M22)... 6 Microtip Coupons for Automated FIB Liftout (M22)... 7 Spare Parts Kit... 8 ARM replacement needles... 8 Cu Spring Clip Replacement... 8 Small ID Sample Stub (copper crimps)... 8 Medium ID Sample Stub (copper crimps)... 9 Large Sample Stub (copper crimps)... 9 Grooved Sample Stub, 0.9mm ID (copper crimps)... 9 Grooved Sample Stub, 0.5mm ID (copper crimps) DAP Sample Stub (Ni crimps) Planar Sample Stubs Specimen, Test, Aluminum Specimen, Test, Stainless-Steel Specimen, Test, Tungsten Silver Epoxy Kit FIM Gas Bottle Refill Bulb, Replacement Correlative Microscopy Grid, 10 pk FIB ready wire mounting post, 8 pk Wire for Aluminum Specimen Preparation... 12

3 Accessories IVAS Software License IVAS Computers Simplex ElectroPointer TM Manual Electropolish Station Local electrode Test Flat Kit Microtip Accessory Kit Specimen Puck Four Specimen Puck Copper Spring Clip Microtip Stub Tilted (45 degrees) Specimen Holder Advanced Specimen Prep Kit (V3) Transmission EBSD Kit Correlative Microscopy Grid, 10 pk Tilted (45 degrees) Specimen Holder FIB Stage pedestal kit Angled wire holder for Quickloader systems Angled Microtip coupon holder for Quickloader systems Carousel Handling Tool Puck Handling Tool Carousel Assembly Local Electrode Shipping Assembly Specimen Holder Assy. (SEM and FIB) Vertical Wire Holder for FIB/SEM Horizontal Wire Holder for FIB/SEM STEM Holder for FIB Specimen Shipping Assembly Specimen Holder Assembly FIM Gas Bottle Specimen Puck Assembly, Integrated Electrode Integrated Local Electrode Alignment Station... 21

4 Integrated Local Electrode Shipping Assembly Specimen Shipping Assembly for EIKOS Specimen Holder Assembly for EIKOS Integrated Counter Electrode Carousel for EIKOS Atom Probe Stub Crimper Accessories Packages: Metallurgical Application Package: Training/Consulting Packages: Options Integrated Plasma Treatment System HDeFIM (Optional on 4000X Si and 5000 S) Productivity Enhancement Package Active Vibration Isolation Platform for LEAP... 26

5 Consumables Local Electrode Assembly (New) Local Electrode Assembly (New) Pre-cleaned, tested and UHV packed. Aperture openings specified between 30 to 60 microns with less than 5 microns variance X to Y (roundness). (Must also order shipment case PN or supply one.) Part number: Lead time (ARO): 4 weeks Local Electrode (Refurbished) Refurbished Local Electrodes (new cone electrode), pre-cleaned, tested to new specifications and UHV packed. Aperture openings specified between 30 to 60 microns with less than 5 microns variance X to Y (roundness). *Original core electrode pucks must be returned. **If an empty specimen puck is included in the shipment block, a FREE PN test flat will be included Part number: R Lead time (ARO): 4 weeks from the receipt of core electrode pucks LEAP Quality Assurance Test Kit Specimens prepared specifically for testing and QA checks of the LEAP instrument, 10 aluminum specimens, one presharpened microtip coupon, and one local electrode test flat. Includes Specimen Shipping Assembly (PN 21385). Part number: Consumables Credit Package Provides a credit redeemable against future consumable requirements (supplied at list price up to a maximum value of $25,000). Ask your local sales representative for details. *Expires two years from the date of purchase* Part number: Lead time (ARO): Ask your local sales representative for details

6 Presharpened Microtip Coupons (PSM M36) 36-specimen grid of presharpened microtips (tapering to a sharp point less than 50nm in diameter); height 100 micron ± 20 micron on a 3mm X 7mm (±0.2mm) silicon coupon doped to less than 0.1 Ohmcm resistivity. Shipped in packages of 10 coupons, requires mounting to planar sample stub (not included). Guaranteed > 80% of the tips are viable on shipment. Part number: (pkg. of 10); (per each) Microtip for FIB Liftout Mounting (FT M36 - LEAP 3000) 36-specimen grid of flat top microtips with diameter 2 µm ± 1 µm; height 110 micron ± 20 micron on a 3mm X 7mm (±0.2mm) silicon coupon doped to < 0.1 Ohm-cm resistivity. Shipped in packages of 10 coupons, requires mounting to planar sample stub (not included). Guaranteed > 80% of the tips are viable on shipment. Not recommended for LEAP 4000X and 5000X platforms. Part number: (pkg. of 10); (per each) Microtip Coupons for FIB Liftout (M22) 22-specimen grid of flat top microtips with tips located within 400 microns of the edge of the microtip coupon. Diameter 2 µm ± 1 µm; height 125 micron ± 20 micron on a 3mm X 7mm (±0.3mm - thicker) silicon coupon doped < 0.1 Ohm-cm resistivity. Shipped in packages of 10 coupons, requires mounting to planar sample stub (not included PN 23739). Guaranteed > 80% of the tips are viable on shipment. Part number: (pack of 10); (per each)

7 Microtip Coupons for Automated FIB Liftout (M22) 22-specimen grid of flat top microtips with tips located within 400 microns of the edge of the microtip coupon. Diameter 2 µm ± 1 µm; height 125 micron ± 20 micron on a 3mm X 7mm (±0.3mm - thicker) silicon coupon doped < 0.1 Ohm-cm resistivity. Shipped in packages of 10 coupons, requires mounting to planar sample stub (not included PN 23739). Optimized for automated sample preparation procedures. Part number: (pack of 10); (per each)

8 Spare Parts Kit Contains: Screws, set screws, and washers for pucks, Screws for microtip spring clips Replacement cover and base for the 18 position sample holder Allen keys for tightening specimen puck set screws and specimen storage set screws. Part number: ARM replacement needles Pre-bent replacements for the rotation needle on ARM stages. (PN 23213). Comes as a package of two. Part number: (ARM III); (ARM IV Rotoprobe) Cu Spring Clip Replacement Replacement clips for spring clip microtip stubs PN Comes as a package of 5. Part number: Small ID Sample Stub (copper crimps) Pre-cleaned and UHV packaged in quantities of 100 each. General use stubs for wire samples. Inside diameter 0.4mm. OD 1.8mm. 8mm length. Part number: 21609

9 Medium ID Sample Stub (copper crimps) Pre-cleaned and UHV packaged in quantities of 25 each. Precision inside diameter measures 1.0mm accepts 3DAP Ni crimps (see PN 23863). OD 1.8mm. 14mm length. Part number: Also available with an 8mm length, packet of SHORT Part number: Lead time (ARO): TBD Large Sample Stub (copper crimps) Pre-cleaned and UHV packaged in quantities of 100 each. Inside diameter measures 1.4mm. OD 1.8mm. 8mm length. Part number: Grooved Sample Stub, 0.9mm ID (copper crimps) Pre-cleaned and UHV packaged in quantities of 100 each. Inside diameter measures 0.9 mm. OD 1.8mm. 8mm length. Part number: 25961

10 Grooved Sample Stub, 0.5mm ID (copper crimps) Pre-cleaned and UHV packaged in quantities of 100 each. Inside diameter measures 0.5 mm. OD 1.8mm. 8mm length. Part number: DAP Sample Stub (Ni crimps) Precision Ni crimp for use in a 3DAP systems. Fits inside Medium ID Sample Stubs PN Pre-cleaned and UHV packaged in quantities of 25 each. OD 1.00 mm, ID 0.8mm. 5mm length. Part number: Planar Sample Stubs Pre-cleaned and UHV packaged in quantities of 25 stubs each. Diameter: 0.25" (6.35 mm) Height: 0.48" (12.2mm) Part number: Specimen, Test, Aluminum Single aluminum specimen prepared specifically for testing and calibrating the LEAP instrument. (Must also order container PN ) Part number: 21634

11 Specimen, Test, Stainless-Steel Single stainless-steel specimen prepared specifically for testing and calibrating the LEAP instrument. (Must also order container PN ) Part number: Specimen, Test, Tungsten Single Tungsten specimen prepared specifically for testing and calibrating the LEAP instrument. (Must also order container PN ) Part number: Silver Epoxy Kit Conductive epoxy (Silver embedded) for mounting specimens to stubs especially for mounting microtip coupon samples to planar stubs without the use of a spring clip. Price and availability subject to change. Part number: Lead time (ARO): 4 weeks FIM Gas Bottle Refill You must obtain an RMA number before shipping the bottles back to us. **Contact Service for installation quotation. Part number: R Lead time (ARO): 4 weeks Bulb, Replacement Replacement halogen lamp for LEAP 3000 specimen transfer and alignment lighting system. Part number: 21449

12 Correlative Microscopy Grid, 10 pk Nominally non-magnetic stainless steel grids for correlative microscopy applications such as tebsd/fib/sem. 4 mounting posts per grid, electropolishing recommended before FIB mounting specimens. Part number: Lead time (ARO): TBD FIB ready wire mounting post, 8 pk Tungsten needle pre-crimped in copper stub. Specimens will accommodate a FIB liftout for EIKOS or TEM. Note, the end radius of the needle is approximately 1.2 µm and it is recommended that the end be milled flat in the FIB prior to mounting a liftout. Users can follow the procedure in TN-08. Part number: Lead time (ARO): TBD Wire for Aluminum Specimen Preparation Aluminum wire, 0.25mm (0.01in) diameter, annealed % (metals basis) Part number: 21637

13 Accessories IVAS Software License Software dongle that enables full use of the IVAS 3.X reconstruction and analysis capabilities IVAS Software 3.6.X license Part number: IVAS License upgrade via dongle swap (*requires prior return of existing dongle) Part number:23898 Lead time (ARO): 4 weeks* IVAS, Days of Use, min 10 days Part number:23897 IVAS, TEAM 3D IQ Part number:24758 IVAS Manual (Printed) Part number: IVAS Computers IVAS Workstation (includes IVAS license) Desktop workstation with license Part number: Lead time (ARO): 6 weeks Mobile workstation with license Part number: 23899

14 Lead time (ARO): 6 weeks Pre-configured with IVAS, no license Desktop workstation - no license Part number: Lead time (ARO): 6 weeks Mobile workstation - no license Part number: Lead time (ARO): 6 weeks Simplex ElectroPointer TM The Electropointer system is designed to ease the production of high quality samples for analysis in the LEAP microscope. The Electropointer consists of the electropolisher and control software, which allows setting parameters to optimally produce tips in a number of materials. V2 includes an automatic and a manual mode (push button). System does not include the required PC to operate. Part number: Lead time (ARO): 12 weeks Manual Electropolish Station The manual Electropolish Station is designed to allow flexibility for producing a wide variety with an integrated microscope. Includes a power supply, microscope, WiFi camera, and accessories necessary to make high quality LEAP specimens (reagents not included, also available without the microscope/camera) Part number: 24499; (without microscope) Lead time (ARO): 12 weeks Local electrode Test Flat Kit One piece of polished refractory alloy ideal for performing electrode testing (instructions provided). Testing flat comes with an 18-position sample holder (PN 21385). Part number: 23211

15 Microtip Accessory Kit All the tools you need to start a group using microtip coupons. Kit includes: two presharpened microtip coupons for QA (PN 21505) two flat topped coupons for FIB LO (PN 23264) a specially developed set of tweezers (PN and PN 22058) set of 5 spring clip microtip stubs (PN 23739) Planar stubs qty. 25 (PN 21600) Part number: Lead time (ARO): 4 weeks Specimen Puck Pre-cleaned and UHV wrapped to ensure vacuum system cleanliness. Accepts sample stubs 1mm to 2.1mm in diameter. Part number: Four Specimen Puck Pre-cleaned and UHV wrapped to ensure vacuum system cleanliness. Accepts sample stubs 1mm to 2.1mm in diameter. Part number: Lead time (ARO): 4 weeks Copper Spring Clip Microtip Stub The copper alloy spring clip microtip stub (shown in a specimen puck assembly - not included) is a self-aligning, re-useable, microtip stub which does not require epoxy but instead holds the microtip using a spring clip. The design provides convenient, reliable operation and enables additional processing (e.g. depositions) after the initial atom probe work has been completed. The new low-profile design out of a non-magnetic alloy is ideal for use in low working distance FIB systems. (stub only 22001) Part number: 23739

16 Tilted (45 degrees) Specimen Holder Pre-tilted 45-degree specimen holder for FIB/SEM/transmission EBSD applications. Two set screws hold the copper stub or wire crimp securely. Can be used for transmission EBSD on microtip coupons. Coupon and stub not included. Part number: Advanced Specimen Prep Kit (V3) Contains all of the parts necessary for FIB liftout sample preparation for a wide variety of geometries including: Aluminum base (PN 23108) Allen hex keys (PN and 21520) Tweezers (PN 22057) TEM grid holder (PN 24242) Tilted (45 deg) specimen holder (PN 24413) Specimen preparation stage (PN 24776) Specimen preparation stage with rotation arm (PN 24779) Integrated storage of tools in base Part number (entire kit): Latest version of individual parts will be included at time of sale. Lead time (ARO): 6 weeks Specialized Specimen Stages: The Advanced Sample Preparation Kit ships with an ARM4 stage with integrated Rotation Manipulator arm that allows complex geometry, site specific sample preparation and an ALPS Advanced Lift-out and Preparation Stage for load-lock compatible FIB lift-out with flexible work flows. (Can be purchased separately as PN or 24776)

17 FIB/LEAP TEM Grid Holder: Included in the Advanced Specimen Prep Kit, this part allows for transferring TEM grid mounted samples between the LEAP and a FIB systems without extra handling. The design allows safe, one-handed, loading and unloading. (Can be purchased separately as PN 24242) Transmission EBSD Kit Contains a comprehensive set of parts to facilitate transmission EBSD-assisted specimen preparation: FIB LEAP TEM grid holder Correlative microscopy grid, 10 pk Tilted (45 deg) specimen holder FIB stage pedestal kit Angled wire holder for Quickloader systems Angled microtip coupon holder for Quickloader systems Part number (entire kit): FIB/LEAP TEM Grid Holder: Allows for transferring TEM grid mounted samples between the LEAP and a FIB systems without extra handling. The design allows safe, one-handed, loading and unloading. (Can be purchased separately as PN 24242) Correlative Microscopy Grid, 10 pk Nominally non-magnetic stainless steel grids for correlative microscopy applications such as tebsd/fib/sem. 4 mounting posts per grid, electropolishing recommended before FIB mounting specimens. Can be purchased separately as PN : Tilted (45 degrees) Specimen Holder Pre-tilted 45-degree specimen holder for FIB/SEM/transmission EBSD applications. Two set screws hold the copper stub or wire crimp securely. Can be used for transmission EBSD on microtip coupons. Coupon and stub not included (Can be purchased separately as PN 25477)

18 FIB Stage pedestal kit A series of four stage pedestals of varying heights that make it possible to perform t-ebsd or other FIB operations on larger samples. Can be purchased separately as PN: Angled wire holder for Quickloader systems A quickloader-compatible shuttle for wire specimen transmission EBSD. The angled position makes it easier to mill and map with minimal stage movements Part number: Angled Microtip coupon holder for Quickloader systems A quickloader-compatible shuttle for transmission EBSD on specimens mounted to microtip coupons. The angled position and cutaway at the base minimizes reflections and shadowing Can be purchased separately as PN: Carousel Handling Tool Used to insert and remove carousels from the load lock and to control the carousel during specimen puck insertion Part number: Puck Handling Tool Used to load and lock specimen pucks into carousel or storage location positions. The standard five inch handle model also is available with an twelve inch handle for use with radioactive specimens Part number: Long handle PN: 20900

19 Carousel Assembly Pre-cleaned and vacuum system tested. Numbered and indexed contains positions for combinations of up to 6 specimen pucks and/or local electrode pucks. LEAP 5000 carousels hold up to 8 pucks. NOTE: Heated carousels are available for systems with the productivity enhancement package. Part number: (4000); (5000) Lead time (ARO): 4 weeks Local Electrode Shipping Assembly Covered aluminum block protects up to 8 local electrodes or specimen pucks for shipping or short-term storage Part number: 21400

20 Specimen Holder Assy. (SEM and FIB) Used to transfer up to 10 wire samples or 5 coupons directly on to the eucentric stage of a FIB or SEM tool for measurement and analysis. Part number: Vertical Wire Holder for FIB/SEM For specimen preparation on wire specimens for LEAP or EIKOS. The wire holder has a standard pin mount on the base and 6 wire positions for PN or similar crimped wires. Two spring clips at the top can hold samples for liftout. See Technical Note TN-08 for procedures for liftout to wire specimens. Part number: Horizontal Wire Holder for FIB/SEM For specimen preparation on wire specimens for LEAP or EIKOS. The wire holder has a standard pin mount on the base and 6 wire positions for PN or similar crimped wires. This holder can accommodate wire specimens for cutting a flat surface for FIB mounting. See Technical Note TN-08 for procedures for liftout to wire specimens. Part number: STEM Holder for FIB Angled holder to enable FIB specimen prep and STEM imaging with removable insert for up to 12 wire specimens. Can also hold microtip coupon stubs for STEM analysis. May not be compatible with all FIBs. Part number: 25450

21 Specimen Shipping Assembly Plastic cover protects up to 18 wire specimens for storage or shipping. May also be used to store or ship coupon samples. Part number: Specimen Holder Assembly Plastic cover protects up to 48 wire specimens for storage or shipping. May also be used to store or ship coupon samples Part number: FIM Gas Bottle Gas bottles are pre-baked and filled with argon, neon, or helium. Gas bottles are filled to a pressure of 5 inches of water and are guaranteed to contain purity to %. Part number: Lead time (ARO): 6 weeks. Does not include installation. Specimen Puck Assembly, Integrated Electrode Specimen puck, numbered C-washer, and electrode top hat for use in EIKOS platforms. Part number: Integrated Local Electrode Alignment Station Complete ex-situ alignment station for integrating specimens with the counter electrode pucks for EIKOS. Comes with computer and CamAlign software to accurately confirm the specimen position within the counter electrode. Part number: 25346

22 Integrated Local Electrode Shipping Assembly Specimen puck block that can accommodate 10 EIKOS pucks with integrated local electrodes for shipping or storage Part number: Specimen Shipping Assembly for EIKOS Similar to PN 21385, this specimen shipping container is anodized and contains soft tipped set screws to avoid deforming EIKOS specimens. Plastic cover protects up to 18 wire specimens for storage or shipping. Part number: Lead time (ARO): 4 weeks Specimen Holder Assembly for EIKOS Similar to PN 21390, this specimen holder is anodized and has soft tipped set screws to avoid deforming EIKOS specimens. Plastic cover protects up to 48 wire specimens for storage or shipping. May also be used to store or ship coupon samples Part number: Lead time (ARO): 4 weeks Integrated Counter Electrode Carousel for EIKOS Pre-cleaned and vacuum system tested. Numbered and indexed contains positions for combinations of up to 5 integrated counter electrode pucks LEAP 5000 carousels hold up to 8 pucks. Part number: Lead time (ARO): 4 weeks

23 Atom Probe Stub Crimper Conveniently crimps bare wire in Cu stub for handling, electropolishing and atom probe. Camera with software allows the user to set a target height for EIKOS or other applications. Lever crimps specimen into stub by applying equal pressure so as not to deform the specimen. Part number: Lead time (ARO): 4 weeks Accessories Packages: Metallurgical Application Package: Provides a comprehensive package of accessories and consumables to supply a typical group concentrating on metallurgical sample analysis for approximately 1 year. Includes the following: Carousel handling tool Puck handling tool, short 8-position carousel (5000) 10 position specimen holder for FIB/SEM Specimen shipping assembly 48 position specimen storage block 2x Local electrode shipping case Kit, small ID copper crimps 2x Kit, large ID copper crimps Kit, medium ID copper crimps Presharpened microtip coupon QA specimen kit Advanced specimen prep kit 6x four-specimen puck Local electrode test flat 8x 22-tip microtip coupons for FIB liftout Replacement spring clips for microtip stubs, 5 pack 5x copper spring clip microtip stubs 10x local electrode aperture pucks ARM replacement arm Vertical wire holder for FIB/SEM Part number: Latest version of parts ship. Ask your salesperson for details. LEAP 4000 and 5000 systems have different part numbers

24 FIB-Based Application Package: Provides a comprehensive package of accessories and consumables to supply a typical group concentrating on FIB-based sample analysis for approximately 1 year. Includes all of the following: Carousel handling tool Puck handling tool, short 8-position carousel (5000) 2x Specimen shipping assembly 48 position specimen storage block 2x Local electrode shipping case Kit, large ID copper crimps Kit, medium ID copper crimps 2x Presharpened microtip coupon QA specimen kit Advanced specimen prep kit Four-specimen puck Local electrode test flat 8x 22-tip microtip coupons for FIB liftout Replacement spring clips for microtip stubs, 5 pack 15x copper spring clip microtip stubs 16x local electrode aperture pucks Spare rotoprobe for FIB/SEM stage Vertical wire holder for FIB/SEM Part number: Latest version of parts ship. Ask your salesperson for details. LEAP 4000 and 5000 systems have different part numbers Training/Consulting Packages: Standard Installation Training: 2 day LEAP Operations Basics Part number: day APT Intro (Modules 1-5) Part number: Additional Training Packages: 5 day Advanced APT Training; Part number: day Advanced Specimen Prep/LEAP; Part number: day Advanced Data Analysis; Part number: Custom support and training packages (ask your salesperson) Part number: Printed manual: 23810

25 Options Integrated Plasma Treatment System Plasma treatment system attached to the LEAP load lock provides surface contamination removal enabling faster pump down and enhanced Local Electrode performance. The plasma treatment option offers both increased productivity and reduced cost of ownership for the LEAP system. The system can extend the operating life-time of local electrodes > 2 times Part number: (5000 only). For 4000 systems, please ask your salesperson. Lead time (ARO): 12 weeks HDeFIM (Optional on 4000X Si and 5000 S) Up the three gasses can be mounted to the manifold allowing static or dynamic digitally recorded FIM. HDeFIM can be saved and played back, to optimize integration parameters after the experiment is over. Voltage, pressure, detection rate and MCP condition are monitored and recorded and run conditions are automatically stored in the run database. Part number: (4000); (5000) Lead time (ARO): 12 weeks Productivity Enhancement Package Local electrode pump down time can be reduced to as little as 4 hours using the integrated heating system in the load lock. The special carousel can be heated up to 150C. The heater, and hardware and software update enables use of a 4th carousel in a LEAP system. The two features allow more flexible specimen staging, especially in a high-throughput multi-user environment. It is only available for instruments already equipped with the plasma treatment system,part number Part number: (4000); (5000) Lead time (ARO): 12 weeks

26 Active Vibration Isolation Platform for LEAP Designed and offered to allow the LEAP to be installed in environments not meeting ISO TC-D vibration standards, this integrated solution combines active vibration cancellation together with an upgraded LEAP platform. Patented Piezoelectric Technology and tuned inertial damping cancels floor vibration in real time with active bandwidth starting at 0.6Hz, 50-70% isolation achieved at 1Hz and 90% at Hz. Rigging and installation of vibration platform and loading of LEAP instrument onto the platform are not included in this offer and are the responsibility of the customer. Destination room/floor must meet manufacturer requirements for anti-vibration platform. Part number: (4000); (5000). For field upgrades, please contact your salesperson. Lead time (ARO): 12 weeks