Design Qualification Report

Transcription

1 Prject Number: Design Qualificatin Reprt Requested by: Eric Mings Date: 11/16/2012 Prduct Rev: AM /Daughter Card Lt #: N/A Tech: Aarn McKim Eng: Eric Mings Qty t test: 32 Test Start: 10/09/2012 Test Cmpleted: 10/30/2012 Design Qualificatin Reprt HSEC8 HSEC L-DV-A Page 1 f 19

2 Tracking Cde: Reprt /Daughter Card CERTIFICATION All instruments and measuring equipment were calibrated t Natinal Institute fr Standards and Technlgy (NIST) traceable standards accrding t IS l and ANSI/NCSL , as applicable. All cntents cntained herein are the prperty f Samtec. N prtin f this reprt, in part r in full shall be reprduced withut prir written apprval f Samtec. SCOPE T perfrm the fllwing tests: Design Qualificatin Test, Please see test plan APPLICABLE DOCUMENTS Standards: EIA Publicatin 364 TEST SAMPLES AND PREPARATION 1) All materials were manufactured in accrdance with the applicable prduct specificatin. 2) All test samples were identified and encded t maintain traceability thrughut the test sequences. 3) After sldering, the parts t be used fr LLCR and DWV/IR testing were cleaned accrding t TLWI ) Either an autmated cleaning prcedure r an ultrasnic cleaning prcedure may be used. 5) The autmated prcedure is used with aqueus cmpatible sldering materials. 6) Parts nt intended fr testing LLCR and DWV/IR are visually inspected and cleaned if necessary. 7) Any additinal preparatin will be nted in the individual test sequences. 8) Slder Infrmatin: Lead free 9) Re-Flw Time/Temp: See accmpanying prfile. 10) Samtec Test PCBs used: PCB /PCB /PCB Page 2 f 19

3 TYPICAL OVEN PROFILE (Sldering Parts t Test Bards) Page 3 f 19

4 FLOWCHARTS Durability/Mating//Gaps TEST GROUP 1 GROUP 2 STEP 8 Assemblies HSEC L-DV-A (.056" Thick Mating Card) 8 Assemblies HSEC L-DV-A (.068" Thick Mating Card) 01 Cntact Gaps Cntact Gaps 02 LLCR-1 LLCR-1 03 Frces - Mating / Frces - Mating / Cycles 25 Cycles 05 Frces - Mating / Frces - Mating / Cycles (50 Ttal) 25 Cycles (50 Ttal) 07 Frces - Mating / Frces - Mating / Cycles (75 Ttal) 25 Cycles (75 Ttal) 09 Frces - Mating / Frces - Mating / Cycles (100 Ttal) 25 Cycles (100 Ttal) 11 Frces - Mating / Frces - Mating / 12 Clean w/cmpressed Air Clean w/cmpressed Air 13 Cntact Gaps Cntact Gaps 14 LLCR-2 LLCR-2 Thermal Shck Thermal Shck 15 (Mated and Undisturbed) (Mated and Undisturbed) 16 LLCR-3 LLCR-3 Cyclic Humidity Cyclic Humidity 17 (Mated and Undisturbed) (Mated and Undisturbed) 18 LLCR-4 LLCR-4 19 Frces - Mating / Frces - Mating / Thermal Shck = EIA , Table II, Test Cnditin I: -55 C t +85 C 1/2 hur dw ell, 100 cycles Humidity = EIA , Test Cnditin B (240 Hurs) and Methd III (+25 C t % RH t 98% RH) ambient pre-cnditin and delete steps 7a and 7b Mating / Frces = EIA Cntact Gaps / Height - N standard methd. Usually measured ptically. Gaps t be taken n a minimum f 20% f each part tested LLCR = EIA , LLCR 20 mv Max, 100 ma Max Use Keithley 580 r 3706 in 4 w ire dry circuit mde Page 4 f 19

5 FLOWCHARTS CONTINUED Mechanical Shck / Vibratin / LLCR TEST GROUP 1 GROUP 2 STEP 8 Assemblies (.056" Thick Mating Card) 8 Assemblies (.068" Thick Mating Card) 01 LLCR-1 LLCR-1 02 Shck Shck 03 Vibratin Vibratin 04 LLCR-2 LLCR-2 Mechanical Shck = EIA Half Sine, 100 g's, 6 millisecnds (Cnditin "C") each axis Vibratin = EIA , Randm Vibratin 7.56 g RMS, Cnditin VB hurs/axis LLCR = EIA , LLCR 20 mv Max, 100 ma Max Use Keithley 580 r 3706 in 4 w ire dry circuit mde Shck / Vibratin / nansecnd Event Detectin TEST GROUP 1 STEP 60 Pints (.056" Thick Mating Card) 01 Event Detectin, Shck 02 Event Detectin, Vibratin Mechanical Shck = EIA Half Sine, 100 g's, 6 millisecnds (Cnditin "C") each axis Vibratin = EIA , Randm Vibratin 7.56 g RMS, Cnditin VB hurs/axis Event detectin requirement during Shck / Vibratin is 50 nansecnds minimum Page 5 f 19

6 ATTRIBUTE DEFINITIONS The fllwing is a brief, simplified descriptin f attributes. THERMAL SHOCK: 1) EIA , Thermal Shck (Temperature Cycling) Test Prcedure fr Electrical Cnnectrs. 2) Test Cnditin 1: -55 C t +85 C 3) Test Time: ½ hur dwell at each temperature extreme 4) Number f Cycles: 100 5) All test samples are pre-cnditined at ambient. 6) All test samples are expsed t envirnmental stressing in the mated cnditin. HUMIDITY: 1) Reference dcument: EIA , Humidity Test Prcedure fr Electrical Cnnectrs. 2) Test Cnditin B, 240 Hurs. 3) Methd III, +25 C t + 65 C, 90% t 98% Relative Humidity excluding sub-cycles 7a and 7b. 4) All samples are pre-cnditined at ambient. 5) All test samples are expsed t envirnmental stressing in the mated cnditin. MECHANICAL SHOCK (Specified Pulse): 1) Reference dcument: EIA , Mechanical Shck Test Prcedure fr Electrical Cnnectrs 2) Test Cnditin C 3) Peak Value: 100 G 4) Duratin: 6 Millisecnds 5) Wave Frm: Half Sine 6) Velcity: 12.3 ft/s 7) Number f Shcks: 3 Shcks / Directin, 3 Axis (18 Ttal) VIBRATION: 1) Reference dcument: EIA , Vibratin Test Prcedure fr Electrical Cnnectrs 2) Test Cnditin V, Letter B 3) Pwer Spectral Density: 0.04 G² / Hz 4) G RMS : ) Frequency: 50 t 2000 Hz 6) Duratin: 2.0 Hurs per axis (3 axis ttal) NANOSECOND-EVENT DETECTION: 1) Reference dcument: EIA , Nansecnd-Event Detectin fr Electrical Cnnectrs 2) Prir t test, the samples were characterized t assure the lw nansecnd event being mnitred will trigger the detectr. 3) After characterizatin it was determined the test samples culd be mnitred fr 50 nansecnd events Page 6 f 19

7 ATTRIBUTE DEFINITIONS Cntinued The fllwing is a brief, simplified descriptin f attributes MATING/UNMATING: 1) Reference dcument: EIA , Mating and Frces Test Prcedure fr Electrical Cnnectrs. 2) The full insertin psitin was t within t f the plug bttming ut in the receptacle t prevent damage t the system under test. 3) One f the mating parts is secured t a flating X-Y table t prevent damage during cycling. LLCR: 1) EIA , Lw Level Cntact Resistance Test Prcedure fr Electrical Cnnectrs and Sckets. 2) A cmputer prgram, LLCR 221.exe, ensures repeatability fr data acquisitin. 3) The fllwing guidelines are used t categrize the changes in LLCR as a result frm stressing a. <= +5.0 mohms: Stable b t mohms: Minr c t mohms: Acceptable d t mohms: Marginal e t mohms: Unstable f. >+2000 mohms: Open Failure Page 7 f 19

8 Mating Frces RESULTS Mating/ Durability (HSEC L-DV-A/ Edge Card) Initial Mating Min Lbs Max Lbs Min Lbs Max Lbs After 25 Cycles After 50 Cycles After 75 Cycles Mating Min Lbs Max Lbs Min Lbs Max Lbs Mating Min Lbs Max Lbs Min Lbs Max Lbs Mating Min Lbs Max Lbs After 100 Cycles Min Lbs Max Lbs Mating Min Lbs Max Lbs Min Lbs Max Lbs Humidity Mating Min Lbs Max Lbs Min Lbs Max Lbs Page 8 f 19

9 RESULTS Cntinued Mating/ Durability (HSEC L-DV-A/ Edge Card) Initial After 25 Cycles After 50 Cycles After 75 Cycles Mating Min Lbs Max Lbs Min Lbs Max Lbs Mating Min Lbs Max Lbs Min Lbs Max Lbs Mating Min Lbs Max Lbs Min Lbs Max Lbs Mating Min Lbs Max Lbs After 100 Cycles Min Lbs Max Lbs Mating Min Lbs Max Lbs Min Lbs Max Lbs Humidity Mating Min Lbs Max Lbs Min Lbs Max Lbs Page 9 f 19

10 RESULTS Cntinued LLCR Mate/Unmate Durability (192 LLCR test pints) HSEC L-DV-A/ Edge Card Initial mohms Max Durability, 100 Cycles <= +5.0 mohms Pints Stable +5.1 t mohms Pints Minr t mohms Pints Acceptable t mohms Pints Marginal t mohms Pints Unstable >+2000 mohms Pints Open Failure Thermal Shck <= +5.0 mohms Pints Stable +5.1 t mohms Pints Minr t mohms Pints Acceptable t mohms Pints Marginal t mohms Pints Unstable >+2000 mohms Pints Open Failure Humidity <= +5.0 mohms Pints Stable +5.1 t mohms Pints Minr t mohms Pints Acceptable t mohms Pints Marginal t mohms Pints Unstable >+2000 mohms Pints Open Failure LLCR Mate/Unmate Durability (192 LLCR test pints) HSEC L-DV-A/ Edge Card Initial mohms Max Durability, 100 Cycles <= +5.0 mohms Pints Stable +5.1 t mohms Pints Minr t mohms Pints Acceptable t mohms Pints Marginal t mohms Pints Unstable >+2000 mohms Pints Open Failure Thermal <= +5.0 mohms Pints Stable +5.1 t mohms Pints Minr t mohms Pints Acceptable t mohms Pints Marginal t mohms Pints Unstable >+2000 mohms Pints Open Failure Humidity <= +5.0 mohms Pints Stable +5.1 t mohms Pints Minr t mohms Pints Acceptable t mohms Pints Marginal t mohms Pints Unstable >+2000 mohms Pints Open Failure Page 10 f 19

11 RESULTS Cntinued LLCR Mechanical Shck & Randm Vibratin (192 LLCR test pints) HSEC S-DV-A/ Edge Card Initial mohms Max Mechanical Shck & Randm Vibratin <= +5.0 mohms Pints Stable +5.1 t mohms Pints Minr t mohms Pints Acceptable t mohms Pints Marginal t mohms Pints Unstable >+2000 mohms Pints Open Failure HSEC S-DV-A/ Edge Card Initial mohms Max Mechanical Shck & Randm Vibratin <= +5.0 mohms Pints Stable +5.1 t mohms Pints Minr t mohms Pints Acceptable t mohms Pints Marginal t mohms Pints Unstable >+2000 mohms Pints Open Failure Mechanical Shck & Randm Vibratin Event Detectin HSEC L-DV-A/ Edge Card Shck N Damage Passed 50 Nansecnds Passed Vibratin N Damage Passed 50 Nansecnds Passed Page 11 f 19

12 MATING-UNMATING FORCES DATA SUMMARIES Mating/ Durability HSEC S-DV-A/ Edge Card Initial 25 Cycles Mating Mating New tns Frce (Lbs) New tns Frce (Lbs) New tns Frce (Lbs) New tns Frce (Lbs) Minimum Maximum Average St Dev Cunt Cycles 75 Cycles Mating Mating New tns Frce (Lbs) New tns Frce (Lbs) New tns Frce (Lbs) New tns Frce (Lbs) Minimum Maximum Average St Dev Cunt Cycles After Humidity Mating Mating New tns Frce (Lbs) New tns Frce (Lbs) New tns Frce (Lbs) New tns Frce (Lbs) Minimum Maximum Average St Dev Cunt Page 12 f 19

13 Mating/ Durability HSEC S-DV-A/ Edge Card DATA SUMMARIES Cntinued Initial 25 Cycles Mating Mating New tns Frce (Lbs) New tns Frce (Lbs) New tns Frce (Lbs) New tns Frce (Lbs) Minimum Maximum Average St Dev Cunt Cycles 75 Cycles Mating Mating New tns Frce (Lbs) New tns Frce (Lbs) New tns Frce (Lbs) New tns Frce (Lbs) Minimum Maximum Average St Dev Cunt Cycles After Humidity Mating Mating New tns Frce (Lbs) New tns Frce (Lbs) New tns Frce (Lbs) New tns Frce (Lbs) Minimum Maximum Average St Dev Cunt Page 13 f 19

14 DATA SUMMARIES Cntinued LLCR: 1) A ttal f 192 pints were measured. 2) EIA , Lw Level Cntact Resistance Test Prcedure fr Electrical Cnnectrs and Sckets. 3) A cmputer prgram, LLCR 221.exe, ensures repeatability fr data acquisitin. 4) The fllwing guidelines are used t categrize the changes in LLCR as a result frm stressing. a. <= +5.0 mohms: Stable b t mohms: Minr c t mohms: Acceptable d t mohms: Marginal e t mohms Unstable f. >+2000 mohms: Open Failure Mating/ Durability HSEC L-D-V-A/0.056 Edge Card LLCR Measurement Summaries by Pin Type Date 10/9/ /11/ /16/ /26/2012 Rm Temp (Deg C) Rel Humidity (%) Technician Aarn McKim Aarn McKim Try Ck Aarn McKim mohm values Actual Delta Delta Delta Initial 100 Cycles Therm Shck Humidity Pin Type 1: Signal Average St. Dev Min Max Summary Cunt Ttal Cunt LLCR Delta Cunt by Categry Stable Minr Acceptable Marginal Unstable Open mohms <=5 >5 & <=10 >10 & <=15 >15 & <=50 >50 & <=1000 > Cycles Therm Shck Humidity Page 14 f 19

15 DATA SUMMARIES Cntinued LLCR: 1) A ttal f 192 pints were measured. 2) EIA , Lw Level Cntact Resistance Test Prcedure fr Electrical Cnnectrs and Sckets. 3) A cmputer prgram, LLCR 221.exe, ensures repeatability fr data acquisitin. 4) The fllwing guidelines are used t categrize the changes in LLCR as a result frm stressing. a. <= +5.0 mohms: Stable b t mohms: Minr c t mohms: Acceptable d t mohms: Marginal e t mohms Unstable f. >+2000 mohms: Open Failure Mating/ Durability HSEC L-DV-A/ Edge Card LLCR Measurement Summaries by Pin Type Date 10/9/ /11/ /16/ /26/2012 Rm Temp (Deg C) Rel Humidity (%) Technician Aarn McKim Aarn McKim Aarn McKim Aarn McKim mohm values Actual Delta Delta Delta Initial 100 Cycles Therm Shck Humidity Pin Type 1: Signal Average St. Dev Min Max Summary Cunt Ttal Cunt LLCR Delta Cunt by Categry Stable Minr Acceptable Marginal Unstable Open mohms <=5 >5 & <=10 >10 & <=15 >15 & <=50 >50 & <=1000 > Cycles Therm Shck Humidity Page 15 f 19

16 DATA SUMMARIES Cntinued LLCR: 1) A ttal f 192 pints were measured. 2) EIA , Lw Level Cntact Resistance Test Prcedure fr Electrical Cnnectrs and Sckets. 3) A cmputer prgram, LLCR 221.exe, ensures repeatability fr data acquisitin. 4) The fllwing guidelines are used t categrize the changes in LLCR as a result frm stressing. a. <= +5.0 mohms: Stable b t mohms: Minr c t mohms: Acceptable d t mohms: Marginal e t mohms Unstable f. >+2000 mohms: Open Failure Mechanical Shck & Randm Vibratin HSEC L-DV-A/ Edge Card LLCR Measurement Summaries by Pin Type Date 10/9/ /29/2012 Rm Temp (Deg C) Rel Humidity (%) Technician Aarn McKim Aarn McKim mohm values Actual Delta Initial Shck-Vib Pin Type 1: Signal Average St. Dev Min Max Summary Cunt Ttal Cunt Nansecnd Event Detectin LLCR Delta Cunt by Categry Stable Minr Acceptable Marginal Unstable Open mohms <=5 >5 & <=10 >10 & <=15 >15 & <=50 >50 & <=1000 >1000 Shck-Vib Shck and Vibratin Event Detectin Summary Cntacts tested 60 Test Cnditin C, 100g's, 6ms, Half-Sine Shck Events 0 Test Cnditin V-B, 7.56 rms g Vibratin Events 0 Ttal Events 0 Page 16 f 19

17 DATA SUMMARIES Cntinued LLCR: 1) A ttal f 192 pints were measured. 2) EIA , Lw Level Cntact Resistance Test Prcedure fr Electrical Cnnectrs and Sckets. 3) A cmputer prgram, LLCR 221.exe, ensures repeatability fr data acquisitin. 4) The fllwing guidelines are used t categrize the changes in LLCR as a result frm stressing. a. <= +5.0 mohms: Stable b t mohms: Minr c t mohms: Acceptable d t mohms: Marginal e t mohms Unstable f. >+2000 mohms: Open Failure Mechanical Shck & Randm Vibratin HSEC L-DV-A/ Edge Card LLCR Measurement Summaries by Pin Type Date 10/9/ /23/2012 Rm Temp (Deg C) Rel Humidity (%) Technician Aarn McKim Aarn McKim mohm values Actual Delta Initial Shck-Vib Pin Type 1: Signal Average St. Dev Min Max Summary Cunt Ttal Cunt LLCR Delta Cunt by Categry Stable Minr Acceptable Marginal Unstable Open mohms <=5 >5 & <=10 >10 & <=15 >15 & <=50 >50 & <=1000 >1000 Shck-Vib Page 17 f 19

18 EQUIPMENT AND CALIBRATION SCHEDULES Equipment #: MO-11 Descriptin: System Switch Multimeter /Data Acquisitin System Manufacturer: Keithley Mdel: 3706 Serial #: Accuracy: See Manual Last Cal: 09/24/2012, Next Cal: 09/30/2013 Equipment #: THC-01 Descriptin: Temperature/Humidity Chamber Manufacturer: Thermtrn Mdel: SE Serial #: Accuracy: See Manual Last Cal: 09/18/2012, Next Cal: 09/18/2013 Equipment #: TSC-01 Descriptin: Vertical Thermal Shck Chamber Manufacturer: Cincinnatti Sub Zer Mdel: VTS SC/AC Serial #: 10-VT14993 Accuracy: See Manual Last Cal: 05/13/2012, Next Cal: 05/13/2013 Equipment #: TCT-04 Descriptin: Dilln Quantrl TC2 Test Stand Manufacturer: Dilln Quantrl Mdel: TC2 Serial #: Accuracy: Speed Accuracy: +/- 5% f indicated speed; Displacement: +/- 5 micrmeters. Last Cal: 05/03/2012, Next Cal: 05/03/2013 Equipment #: TCT-05 Descriptin: Chatilln TCD Series Manufacturer: Chatilln Mdel: TCD2255 Serial #: TCD0071 Accuracy: See Manual Last Cal: 11/01/2012, Next Cal: 11/01/2013 Equipment #: SVC-01 Descriptin: Shck and Vibratin Table Manufacturer: Data Physics Mdel: LE-DSA-10-20K Serial #: Accuracy: See Manual Last Cal: 01/12/2012, Next Cal: 01/12/2013 Page 18 f 19

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