AUGUST 14, 2006 TEST REPORT # RANDOM VIBRATION TEST SERIES PROBE SERIES PROBE TEST SOCKET INTERCONNECT DEVICES, INC.

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1 AUGUST 14, 2006 TEST REPORT # RANDOM VIBRATION TEST SERIES PROBE SERIES PROBE TEST SOCKET INTERCONNECT DEVICES, INC. APPROVED BY: MAX PEEL SENIOR FELLOW CONTECH RESEARCH, INC.

2 REVISION HISTORY DATE REV. NO. DESCRIPTION ENG. 8/11/ Initial Issue MP TR#206271, REV of 30

3 CERTIFICATION This is to certify that the evaluation described herein was designed and executed by personnel of, Inc. It was performed with the concurrence of Interconnect Devices, Inc. of Kansas City, KS who was the test sponsor. All equipment and measuring instruments used during testing were calibrated and traceable to NIST according to ISO and ANSI/NCSL Z540-1 and MIL-STD as applicable. All data, raw and summarized, analysis and conclusions presented herein are the property of the test sponsor. No copy of this report, except in full, shall be forwarded to any agency, customer, etc., without the written approval of the test sponsor and. Max Peel Senior Fellow MP:js TR#206271, REV of 30

4 SCOPE To perform Mechanical Shock and Random Vibration Testing on Test Socket Probes as manufactured and submitted by the test sponsor Interconnect Devices, Inc. APPLICABLE DOCUMENTS 1. Unless otherwise specified, the following documents of issue in effect at the time of testing performed form a part of this report to the extent as specified herein. The requirements of sub-tier specifications and/or standards apply only when specifically referenced in this report. 2. Standards: EIA Publication Drawings or Slash Sheets: Interconnect Devices Dwg TEST SAMPLES AND PREPARATION 1. The following test samples were submitted by the test sponsor, Interconnect Devices, Inc., for the evaluation to be performed by, Inc. a) Probes b) Test Socket Assy 2. Unless otherwise indicated, all materials were certified by the manufacturer to be in accordance with the applicable product specification. 3. The test samples as submitted were certified by the manufacturer as being fabricated and assembled utilizing normal production techniques common for this type of product and inspected in accordance with the quality criteria as established for the product involved. 4. All test samples were coded and identified by (Contech Research or the test sponsor) to maintain continuity throughout the test sequences. Upon initiating testing, mated test samples remained with each other throughout the test sequences for which they were designated. 5. Test samples were assembled to test boards by the test sponsor. The test boards were fabricated from FR-4 with 1.0 ounce copper material using typical production techniques. Special circuit lines and/or plated though hole patterns were provided for ease of efficient test lead attachment. The test boards were thick. TR#206271, REV of 30

5 TEST SAMPLES AND PREPARATION continued 6. Prior to testing a common buss was soldered to the bottom test board for the performance of Low Level Contact Resistance and to complete the series circuit required for discontinuity monitoring. 7. After soldering, the applicable test boards were ultrasonically cleaned after test lead attachment, preparation and/or soldering using the following process: A) Test samples were immersed into the Branson 8210 cleaner which contained Kyzen Ionex HC cleaning solution with the following conditions: a) Temperature : 55 ± 4 C b) Frequency : 43 KHz c) Immersion Time : 3 to 5 Minutes B) Test samples were slowly removed and placed into the Branson 5210 cleaner which contained DI water with the following conditions: a) Temperature : 55 ± 4 C b) Frequency : 47 KHz c) Immersion Time : 1 to 2 Minutes C) Test samples were removed and placed in a Fisher Thermix agitator containing DI water warmed to 55 ± 5 C for 1 to 2 minutes. D) Upon removal, the test samples were rinsed for 1 to 2 minutes in free flowing DI water at 55 ± 5 C. E) After final rinse, test samples were dried in an air circulating oven for 2 to 3 minutes minimum at 50 ± 2 C. F) Test samples were allowed to recover to room ambient conditions prior to testing. 8. Unless otherwise specified in the test procedures used, no further preparation was used. 9. All equipment and measuring instruments used during testing were calibrated and traceable to NIST according to ISO and ANSI/NCSL Z540-1, as applicable. TR#206271, REV of 30

6 TEST SELECTION 1. The following test sequence was established for this program: LLCR MECHANICAL SHOCK LLCR RANDOM VIBRATION 3.1 G S RMS LLCR RANDOM VIBRATION 5.35 G S RMS LLCR RANDOM VIBRATION 7.56 G S RMS LLCR RANDOM VIBRATION 9.26 G S RMS LLCR 2. Test set ups and/or procedures which are standard or common are not detailed or documented herein provided they are certified as being performed in accordance with the applicable industry test methods, standards and/or drawings as specified in the detail specification. TR#206271, REV of 30

7 TR#206271, REV of 30

8 EQUIPMENT LIST ID# Next Cal Last Cal Equipment Name Manufacturer Model # Serial # Accuracy Freq.Cal 601 Computer A.M.I. P N/A N/A 681 Computer ARC Co. P166 N/A N/A N/A 684 7/10/2007 7/10/2006 Accelerometer PCB. Co. 353B See Cal Cert. 12mon 991 Sig Processor interface Agilent 35651B n/a N/A N/A /15/ /15/2005 Microohm Meter Keithley See Cal Cert 12mon /18/2007 1/18/2006 Discontinuity Monitor Metronics DM K-1 See Cal Cert 12mon 1243 Computer ARC Co. P450 BU-001 N/A N/A 1271 Amplifier Unholtz Dickie SA See Manual N/A 1272 Shaker Table Unholtz Dickie S202PB 263 N/A N/A /1/2007 8/1/2006 Microohm mtr Keithley See Manual 12 mon Main Frame Hewlett Packard A00927 N/A Ea Test /10/2007 1/10/2006 Programable DAC Unit Hewlett Packard 35656A 3007A00107 See Cal Cert 12 mo /10/2007 1/10/ Chan Input Module Hewlett Packard 35655A 2911A00337 N/A 12mon TR#206271, REV of 30

9 TEST RESULTS TR#206271, REV of 30

10 PROJECT NO.: SPECIFICATION: IDI Test Plan PART NO.: Probes PART DESCRIPTION: Test Probe Probes SAMPLE SIZE: Two Assemblies TECHNICIAN: BE START DATE: COMPLETE DATE: ROOM AMBIENT: 22 C RELATIVE HUMIDITY: 50% EQUIPMENT ID#: 601, 684, 991, 1175, 1243, 1271, 1272, 1278, 1438, 1439, MECHANICAL SHOCK (SPECIFIED PULSE) PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure Test Conditions: a) Peak Value : 58 G s b) Duration : 11 Milliseconds c) Wave Form : Half Sine d) No. of Shocks : 3 blows/direction/axis, 3 axis 3. Initial and final LLCR was measured in accordance with EIA 364, Test Procedure 23 with a 100ma maximum test current and a 20 mv open circuit voltage. 4. Discontinuity monitoring was performed in accordance with EIA 364, Test Procedure REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. There shall be no contact interruption greater than 1.0 microsecond. (one test assembly 32 contacts) 3. The initial low level contact resistance shall be measured and recorded. (one test assembly 32 contacts) 4. The post test change in low level contact resistance shall be measured and recorded. (one test assembly 32 contacts) TR#206271, REV of 30

11 RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. There was no contact interruption greater than 1.0 microsecond. 3. The following is a summary of the data observed: LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Initial Post Mech. Shock Std. Avg. Max. Std. Avg. Max. Dev. Change Change Dev See data file for individual data points. TR#206271, REV of 30

12 Classical Shock Channel 1 [g] ACCELERATION (g) UPPER LIMIT Project IDI 8/08/06 Actual Wave ACTUAL PULSE----- Tech:BE / LOWER LIMIT [s] DURATION (Seconds) TR#206271, REV of 30

13 Classical Shock Channel 1 [g] ACCELERATION (g) UPPER LIMIT Project IDI 8/08/06 Cal Wave 1 ACTUAL PULSE----- Tech: BE/ LOWER LIMIT [s] DURATION (Seconds) TR#206271, REV of 30

14 Classical Shock Channel 1 [g] ACCELERATION (g) UPPER LIMIT Project IDI 8/08/06 Cal Wave 2 ACTUAL PULSE----- Tech: BE/ LOWER LIMIT [s] DURATION (Seconds) TR#206271, REV of 30

15 PROJECT NO.: SPECIFICATION: IDI Test Plan PART NO.: Probes PART DESCRIPTION: Test Probe Probes SAMPLE SIZE: Two Assemblies TECHNICIAN: MOB START DATE: COMPLETE DATE: ROOM AMBIENT: 22 C RELATIVE HUMIDITY: 50% EQUIPMENT ID#: 601, 681, 684, 991, 1047, 1175, 1243, 1271, 1272, 1278, 1438, 1439, VIBRATION, RANDOM PROCEDURE: 1. The test sample was fixtured to the test stand via rails located along the longitudinal length of the bottom test support. No restraints were used on the top board aside for the locking hardware. 2. Initial, intermediate (after each vibration condition) and final low level circuit resistance was performed in accordance with EIA 364, Test Procedure 23 with the following test condition: a) Test Current : 100 ma Max. b) Open Circuit Voltage : 20 mv 3. The test was performed in accordance with EIA 364, Test Procedure Test Conditions: Test #1 a) Power Spectral Density : 0.02 b) G RMS : 3.1 c) Frequency : Hz d) Duration : 1.0 hr/axis, 3 axis Test #2 a) Power Spectral Density : 0.02 b) G RMS : 5.35 c) Frequency : Hz d) Duration : 1.0 hr/axis, 3 axis TR#206271, REV of 30

16 Test Conditions: continued Test #3 a) Power Spectral Density : 0.04 b) G RMS : 7.56 c) Frequency : Hz d) Duration : 1.0 hr/axis, 3 axis Test #4 a) Power Spectral Density : 0.06 b) G RMS : 9.26 c) Frequency : Hz d) Duration : 1.0 hr/axis, 3 axis REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. The change in low level contact resistance shall be measured and recorded. 3. There shall be no contact interruption greater than 1.0 microsecond RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. The following is a summary of the observed data: 4 LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Std. Avg. Max. Dev. Vib. 3.14G s, R Vib. 5.35G s, R Vib. 7.35G s, R Vib. 9.26G s, R Note: R represents change in resistance. 3. See data file for individual data points. 4. One board assembly was used for monitoring discontinuity. A second board assembly was used for measuring LLCR throughout the total sequence including mechanical shock. TR#206271, 16 of 30

17 Low Level Contact Resistance Project: Spec: IDI Test Plan Customer: IDI Subgroup: N/A Product: File #: Description: Probe Assy. Open circuit voltage: 20mv Current: 100ma Delta values units: milliohms Temp ºC R.H. % Date: 08Aug06 08Aug06 08Aug06 09Aug06 09Aug06 10Aug06 Pos. ID Initial Mech Shk Vibration Vibration Vibration Vibration 3.1 grms 5.35 grms 7.56 grms 9.26 grms TR#206271, 17 of 30

18 Product: File #: Description: Probe Assy. Open circuit voltage: 20mv Current: 100ma Delta values units: milliohms Temp ºC R.H. % Date: 08Aug06 08Aug06 08Aug06 09Aug06 09Aug06 10Aug06 Pos. ID Initial Mech Shk Vibration Vibration Vibration Vibration 3.1 grms 5.35 grms 7.56 grms 9.26 grms MAX MIN AVG STD Open Tech BE BE BE BE BE BE Equip ID TR#206271, 18 of 30

19 Random Channel 1 [g²/hz] 0.1 Project# X-Axis Date:8/08/06 Test Conditions: 3.1 grms 1 hr Axis Tech:BE [Hz] TR#206271, REV of 30

20 Random Channel 1 [g²/hz] Project# Y Axis-Axis Date:8/08/06 Test Conditions: 3.1 grms 1 hour Axis Tech:BE [Hz] TR#206271, 20 of 30

21 Random Channel 1 [g²/hz] 0.1 Project# Z-Axis Date:8/08/06 Test Conditions: 3.1 grms 1 hour Axis Tech:BE [Hz] TR#206271, 21 of 30

22 Random Channel 1 [g²/hz] Project# X-Axis Date: 8/08/06 Test Conditions: 5.35 grms 1 hr Axis Tech:BE [Hz] TR#206271, 22 of 30

23 Random Channel 1 [g²/hz] Project# Y-Axis Date:8/09/06 Test Conditions: 5.35 grms 1 hr Axis Tech:BE [Hz] TR#206271, 23 of 30

24 Random Channel 1 [g²/hz] Project# Z-Axis Date:8/09/06 Test Conditions: 5.35 grms 1 hr Axis Tech:BE [Hz] TR#206271, 24 of 30

25 Random Channel 1 [g²/hz] Project# X-Axis Date:8/09/06 Test Conditions: 7.56 grms 1 hr Axis Tech:BE [Hz] TR#206271, 25 of 30

26 Random Channel 1 [g²/hz] Project# Y-Axis Date:8/09/06 Test Conditions: 7.56 grms 1 hr Axis Tech:BE [Hz] TR#206271, 26 of 30

27 Random Channel 1 [g²/hz] Project# Z-Axis Date:8/09/06 Test Conditions: 7.56 grms 1 hr Axis Tech: [Hz] TR#206271, 27 of 30

28 Random Channel 1 [g²/hz] 1 Project# X-Axis Date:8/09/06 Test Conditions: 9.26 grms 1 hr Axis Tech:BE [Hz] TR#206271, 28 of 30

29 Random Channel 1 [g²/hz] Project# Y-Axis Date:8/10/06 Test Conditions: 9.26 grms 1 hr Axis Tech:BE [Hz] TR#206271, 29 of 30

30 Random Channel 1 [g²/hz] Project# Z-Axis Date:8/10/06 Test Conditions: 9.26 grms 1 hr Axis Tech:BE [Hz] TR#206271, 30 of 30

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