Radiation Performance Data Package VRG8661-S

Transcription

1 January 28, 2010 Radiation Performance Data Package VRG8661-S VRG8661-S, DSCC SMD Part Number: KXC Voltage regulator, negative (RH137), adjustable Prepared by: Aeroflex Plainview, Inc. 35 South Service Road Plainview, NY 11803

2 1. Part Descriptions: 1.1 VRG8661-S Voltage regulator, negative (RH137), adjustable, SMD-0.5 surface mount. 2. Applicable Documents 2.1 Appendix A: Data Sheet: SCD8661 ADJUSTABLE NEGATIVE REGULATOR 2.2 Appendix B: Die Spec: MICROCIRCUIT, LINEAR, RH137H AND RH137K NEGATIVE ADJUSTABLE REGULATOR DICE 2.3 Appendix C: Rad Report 05/31/07 RH137 ICS RADIATION TEST RESULTS 2.4 Appendix D: DSCC SMD: MICROCIRCUIT, HYBRID, VOLTAGE REGULATOR, NEGATIVE, ADJUSTABLE 3. Radiation Performance 3.1 Total Dose: 100 krads(si), Dose rate = rads(si)/s See Appendix B: RH137 per IC manufacturer's Die Specification Every wafer lot is subjected to RLAT testing at the stated total dose and dose rate. 3.2 ELDRS: 50 krads(si), Dose rate = 10 mrads(si)/s See Appendix C: RH137 ELDRS Radiation Test Results. PAGE 2 of 2

3 Standard Products VRG8661 Adjustable Regulator Negative Voltage Radiation Tolerant January 7, 2009 FEATURES Manufactured using Linear Technology Corporation Space Qualified RH137 die Radiation performance - Total dose: 100 krads(si), Dose rate = rads(si)/s Thermal shutdown Output voltage adjustable: -1.25V to -27V 3-Terminal Output current: 1.5A Voltage reference: -1.25V ±4% Load regulation: 1.0% max Line regulation: 0.05% max Ripple rejection: >66dB Packaging Hermetic Ceramic -SMD-0.5 Surface mount - 3 Pads,.301"W x.405"l x.130"ht max - Power package - Weight - 2 gm max Designed for aerospace and high reliability space applications DSCC SMD pending Note: Aeroflex Plainview does not currently have a DSCC certified Radiation Hardened Assurance Program. DESCRIPTION The Aeroflex Plainview VRG8661 consists of a Negative Adjustable (RH137) voltage regulator capable of supplying 1.5Amps over the output voltage range as defined under recommended operating conditions. The VRG8661 offers excellent line and load regulation specifications and ripple rejection. Dropout (Vin - Vout) decreases at lower load currents. The VRG8661 serves a wide variety of applications including High Efficiency Linear Regulators, Post Regulators for Switching Supplies, Constant Current Regulators, Battery Chargers and Microprocessor Supply. The VRG8661 has been specifically designed to meet exposure to radiation environments and is configured for a SMD-0.5 SMT power package. It is guaranteed operational from -55 C to +125 C. Available screened to MIL-STD-883, the VRG8661 is ideal for demanding military and space applications. For detailed performance characteristic curves, applications information and typical applications see the latest Linear Technology Corporation data sheets for their RH137, which is available on-line at 3 ADJ 2 VOUT RH137 Negative Regulator VIN 1 SCD8661 Rev B FIGURE 1 BLOCK DIAGRAM / SCHEMATIC

4 ABSOLUTE MAXIMUM RATINGS PARAMETER RANGE UNITS Lead temperature (soldering 10 Sec) 300 C Input-Output Voltage Differential -30 VDC ESD / KV Operating Junction Temperature Range -55 to +150 C Storage Temperature Range -65 to +150 C 1/ Meets ESD testing per MIL-STD-883, method 3015, Class 1C. NOTICE: Stresses above those listed under "Absolute Maximums Rating" may cause permanent damage to the device. These are stress rating only; functional operation beyond the "Operation Conditions" is not recommended and extended exposure beyond the "Operation Conditions" may effect device reliability. RECOMMENDED OPERATING CONDITIONS PARAMETER RANGE UNITS Output Voltage Range to -27 VDC Case Operating Temperature Range -55 to +125 C ELECTRICAL PERFORMANCE CHARACTERISTICS 1/ PARAMETER SYM CONDITIONS (P PMAX) MIN MAX UNITS Reference Voltage VREF -3V < (VIN - VOUT) < VDIFF MAX, 10mA < IOUT < IMAX V Line Regulation 2/ ΔVOUT ΔVIN -3V < (VIN - VOUT) < -27V, %/V Load Regulation 2/ ΔVOUT ΔIOUT 10mA < IOUT < IMAX, VOUT < -5V 10mA < IOUT < IMAX, VOUT > -5V mv % Thermal Regulation IOUT = 1.5A, (VIN - VOUT) = -13.3V, 20ms Pulse, 20W, TC = +25 C %/W Ripple Rejection VOUT = -10V, f = 120Hz, CADJ = 10µF 66 - db Adjustment Pin Current IADJ µa Adjustment Pin Current ΔIADJ 10mA < IOUT < IMAX - 5 Change -3V < (VIN - VOUT) < -27V - 5 Minimum Load Current 3/ IMIN (VIN - VOUT) = -27V - 5 (VIN - VOUT) < -10V - 3 Current Limit IMAX (VIN - VOUT) < -15V (VIN - VOUT) = -27V, TC = +25 C µa ma A Long Term Stability 3/ ΔVOUT ΔTIME TA = +125 C - 1 % Thermal Resistance (Junction to Case) 3/ ΘJC - 3 C/W Notes: 1. Unless otherwise specified, these specifications apply for post radiation, (Vin - Vout) = 5V, Iout = 0.5A and -55 C < Tc < +125 C. 2. Regulation is measured at a constant junction temperature, using pulse testing with a low duty cycle. Changes in output voltage due to heating effects are covered under the specification for thermal regulation. Measurements taken at the output lead must be adjusted for lead resistance. 3. Not tested. Shall be guaranteed to the specified limits. SCD8661 Rev B 1/7/09 2 Aeroflex Plainview

5 60 50 Maximum Power Dissipation (Watts) Case Temperature ( C) FIGURE 2 MAXIMUM POWER vs CASE TEMPERATURE The maximum Power dissipation is limited by the thermal shutdown function of the regulator chip in the VRG8661. The graph above represents the achievable power before the chip shuts down. The line in the graph represents the maximum power dissipation of the VRG8661 This graph is based on the maximum junction temperature of 150 C and a thermal resistance (ΘJC) of 3 C/W. VIN 1 2 VRG8661 VOUT VREF = 1.25V, IADJ = 50µA VOUT = -VREF (1+R2/R1) + (-IADJ x R2) 3 ADJ R1 R2 Adjustable Regulator SCD8661 Rev B 1/7/09 FIGURE 3 TYPICAL APPLICATIONS 3 Aeroflex Plainview

6 .301 MAX ID Mark (Colored Dot) PAD 3 R.025 MAX 6 Places Places.030 MIN Places.405 MAX.030 MIN X R MAX Places NOTE: Package & Lid are electrically isolated from signal pads. FIGURE 4 PACKAGE OUTLINE SURFACE MOUNT SCD8661 Rev B 1/7/09 4 Aeroflex Plainview

7 ORDERING INFORMATION MODEL DSCC SMD # SCREENING PACKAGE VRG8661-S - Military Temperature, -55 C to +125 C Screened in accordance with MIL-PRF-38534, Class K. SMD-0.5 Power Pkg VRG Commercial Flow, +25 C testing only VRG S VRG S KXC KXA In accordance with DSCC SMD EXPORT CONTROL: This product is controlled for export under the International Traffic in Arms Regulations (ITAR). A license from the U.S. Department of State is required prior to the export of this product from the United States. EXPORT WARNING: Aeroflex s military and space products are controlled for export under the International Traffic in Arms Regulations (ITAR) and may not be sold or proposed or offered for sale to certain countries. (See ITAR for complete information.) PLAINVIEW, NEW YORK Toll Free: 800-THE-1553 Fax: SE AND MID-ATLANTIC Tel: Fax: INTERNATIONAL Tel: Fax: WEST COAST Tel: Fax: NORTHEAST Tel: Fax: CENTRAL Tel: Fax: info-ams@aeroflex.com Aeroflex Microelectronic Solutions reserves the right to change at any time without notice the specifications, design, function, or form of its products described herein. All parameters must be validated for each customer's application by engineering. No liability is assumed as a result of use of this product. No patent licenses are implied. Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused and the Linear Technology logo are registered trademarks and RH137 are a copyright of Linear Technology Corporation. SCD8661 Rev B 1/7/09 5

8 SPEC NO REV. F RH137H AND RH137K NEGATIVE ADJUSTABLE REGULATOR DICE REVISION RECORD REV DESCRIPTION DATE 0 INITIAL RELEASE 07/14/99 A PAGE 10, FIGURE 5, CHANGED θjc. 11/17/99 B PAGE 3, PARAGRAPH 3.8 CHANGED VERBIAGE ADDED HEREIN AFTER TABLE 1. 12/13/99 PAGE 4, PARAGRAPH 5.0 CHANGED VERBIAGE ADDED HEREIN AFTER TABLE 3. PARAGRAPH 5.2 ADDED HEREIN AFTER TABLE 2. PAGE 5, PARAGRAPH 6.2, 6.3 CHANGED VERBIAGE ADDED HEREIN AFTER TABLE 3. C PAGE 3, PARAGRAPH 3.7.1, CHANGED THE DOSAGE RATE FROM APPROXIMATELY 20 RADS PER SECOND TO LESS THAN OR EQUAL TO 10 RADS PER SECOND. 11/08/02 PAGE 4, PARAGRAPH 6.1 CHANGED QUALITY ASSURANCE PROVISIONS TO STATE THAT LTC IS QML CERTIFIED AND THAT RAD HARD CANDIDATES ARE ASSEMBLED ON QUALIFIED ON CLASS S MANUFACTURING LINES. PAGES 6 THROUGH 12, ALL FIGURE TITLES CHANGED TO HAVE DEVICE OPTIONS AND PACKAGE TYPES AT TOP OF PAGE, AND HAVE ALL FIGURES AT BOTTOM OF PAGE. CONVERSION OF SPECIFICATION FROM WORD PERFECT TO MICROSOFT WORD. BURN-IN VOLTAGES CHANGED FROM V1 OF [+20V T0 +22V] TO V1 OF [+15V TO +16.5V]; FROM V2 OF [-20V TO 22V] TO [-15V TO 16.5V] FOR BOTH OPTIONS. CHANGE θjc ON FIGURE 5 FROM 15 C/W TO 40 C/W. TABLE I AND TABLE II CONDITIONS FOR [V IN - V OUT ] CHANGED FROM < 40V TO < 30V. MAXIMUM IRRADIATION TOLERANCE IS 100K RADS. D PAGE 3, CHANGED INITIAL RATE OF RADS TO 240 RADS/SEC. 03/22/05 (CONTINUED ON NEXT PAGE) CAUTION: ELECTROSTATIC DISCHARGE SENSITIVE PART REVISION PAGE NO INDEX REVISION F F F F F F F F F F F F F F F F REVISION PAGE NO. INDEX REVISION LINEAR TECHNOLOGY CORPORATION ORIG MILPITAS, CALIFORNIA DSGN TITLE: MICROCIRCUIT, LINEAR, ENGR RH137H AND RH137K NEGATIVE MFG ADJUSTABLE REGULATOR DICE CM QA SIZE CAGE CODE DRAWING NUMBER REV PROG F APPLICATION FUNCT SIGNOFFS DATE CONTRACT: FOR OFFICIAL USE ONLY LINEAR TECHNOLOGY CORPORATION Page 1 of 16

9 SPEC NO REV. F RH137H AND RH137K NEGATIVE ADJUSTABLE REGULATOR DICE REVISION RECORD REV DESCRIPTION DATE E PAGE 4, PARAGRAPH CHANGED VERBIAGE. PAGE 5, PARAGRAPH 5.8 CHANGED ALLOY 42 TO ALLOY 52 FOR TO3 PACKAGE. PAGE 14,15 CHANGED DATASHEET TO INCLUDE 200K (POST-IRRADIATION) 05/01/08 F PAGE 16, CHANGED RH CANNED SAMPLE TABLE III FOR QUALIFYING DICE SALES 02/17/09 ADDED TEMPERATURE CYCLE, CONSTANT ACCELERATION & REMOVED PIND TEST. LINEAR TECHNOLOGY CORPORATION Page 2 of 16

10 SPEC NO REV. F RH137H AND RH137K NEGATIVE ADJUSTABLE REGULATOR DICE 1.0 SCOPE: 1.1 This specification defines the performance and test requirements for a microcircuit processed to a space level manufacturing flow. 2.0 APPLICABLE DOCUMENTS: 2.1 Government Specifications and Standards: the following documents listed in the Department of Defense Index of Specifications and Standards, of the issue in effect on the date of solicitation, form a part of this specification to the extent specified herein. SPECIFICATIONS: MIL-PRF MIL-STD-883 MIL-STD-1835 Integrated Circuits (Microcircuits) Manufacturing, General Specification for Test Method and Procedures for Microcircuits Microcircuits Case Outlines 2.2 Order of Precedence: In the event of a conflict between the documents referenced herein and the contents of this specification, the order of precedence shall be this specification, MIL-PRF and other referenced specifications. 3.0 REQUIREMENTS: 3.1 General Description: This specification details the requirements for the RH137, Negative Adjustable Regulator Dice and Element Evaluation Test Samples, processed to space level manufacturing flow as specified herein. 3.2 Part Number: OPTION 1 RH137H DICE OPTION 2 RH137K DICE 3.3 Special Handling of Dice: Rad Hard dice require special handling as compared to standard IC dice. Rad Hard dice are susceptible to surface damage due to the absence of silicon nitride passivation as on standard dice. Silicon nitride protects the dice surface from scratches by it s hard and dense properties. The passivation on Rad Hard dice is silicon dioxide which is much softer than silicon nitride. LTC recommends that dice handling be performed with extreme care so as to protect the dice surface from scratches. If the need arises to move the die around from the chip tray, use a Teflon tipped vacuum wand. This wand can be made by pushing a small diameter of Teflon tubing onto the tip of a steel tipped wand. The inside diameter of the Teflon tip should match the dice size for efficient pickup. The tip of the Teflon should be cut square and flat to ensure good vacuum to dice surface. Ensure the Teflon tip remains clean from debris by inspecting under stereo scope. During die attach, care must be exercised to ensure no tweezers touch the top of the dice. LINEAR TECHNOLOGY CORPORATION Page 3 of 16

11 SPEC NO REV. F RH137H AND RH137K NEGATIVE ADJUSTABLE REGULATOR DICE 3.4 The Absolute Maximum Ratings: Power Dissipation Internally Limited Input-Output Voltage Differential V Operating Junction Temperature Range C to 150 C Storage Temperature Range C to 150 C Lead Temperature (Soldering, 10 sec) C 3.5 Design, Construction, and Physical Dimensions: Detail design, construction, physical dimensions, and electrical requirements shall be specified herein. 3.6 Outline Dimensions and Pad Functions: Dice outline dimensions, pad functions, and locations shall be specified in Figure Radiation Hardness Assurance (RHA): The manufacturer shall perform a lot sample test as an internal process monitor for total dose radiation tolerance. The sample test is performed with MIL-STD-883 TM1019 Condition A as a guideline For guaranteed radiation performance to MIL-STD-883, Method 1019, total dose irradiation, the manufacturer will provide certified RAD testing and report through an independent test laboratory when required as a customer purchase order line item Total dose bias circuit is specified in Figure Wafer (or Dice) Probe: Dice shall be 100% probed at Ta = +25 C to the limits shown in Table I herein. All reject dice shall be removed from the lot. This testing is normally performed prior to dicing the wafer into chips. Final specifications after assembly are sample tested during the element evaluation. 3.9 Wafer Lot Acceptance: Wafer lot acceptance shall be in accordance with MIL-PRF-38535, Appendix A, except for the following: Top side glassivation thickness shall be a minimum of 4KÅ Wafer Lot Acceptance Report: SEM is performed per MIL-STD-883, Method Copies of SEM photographs shall be supplied with the Wafer Lot Acceptance Report as part of a Space Data Pack when specified as a customer purchase order line item Traceability: Wafer Diffusion Lot and Wafer traceability shall be maintained through Quality Conformance Inspection. 4.0 QUALITY CONFORMANCE INSPECTION: Quality Conformance Inspection shall consist of the tests and inspections specified herein. 5.0 SAMPLE ELEMENT EVALUATION: A sample from each wafer supplying dice shall be assembled and subjected to element evaluation per Table III herein Percent Visual Inspection: All dice supplied to this specification shall be inspected in accordance with MIL-STD-883, Method 2010, Condition A. All reject dice shall be removed from the lot. 5.2 Electrical Performance Characteristics for Element Evaluation: The electrical performance characteristics shall be as specified in Table I and Table II herein. LINEAR TECHNOLOGY CORPORATION Page 4 of 16

12 SPEC NO REV. F RH137H AND RH137K NEGATIVE ADJUSTABLE REGULATOR DICE 5.3 Sample Testing: Each wafer supplying dice for delivery to this specification shall be subjected to element evaluation sample testing. No dice shall be delivered until all the lot sample testing has been performed and the results found to be acceptable unless the customer supplies a written approval for shipment prior to completion of wafer qualification as specified in this specification. 5.4 Part Marking of Element Evaluation Sample Includes: LTC Logo LTC Part Number Date Code Serial Number ESD Identifier per MIL-PRF-38535, Appendix A Diffusion Lot Number Wafer Number 5.5 Burn-In Requirement: Burn-In circuit for TO39 package is specified in Figure 3 and Burn-In circuit for TO3 package is specified in Figure Mechanical/Packaging Requirements: Case Outline and Dimensions are in accordance with Figure 5 and Figure Terminal Connections: The terminal connections shall be as specified in Figure 7 and Figure Lead Material and Finish: The lead material and finish shall be Kovar for device option 1 and Alloy 52 for device option 2, with hot solder dip (Finish letter A) in accordance with MIL-PRF VERIFICATION (QUALITY ASSURANCE PROVISIONS) 6.1 Quality Assurance Provisions: Quality Assurance provisions shall be in accordance with MIL-PRF Linear Technology is a QML certified company and all Rad Hard candidates are assembled on qualified Class S manufacturing lines. 6.2 Sampling and Inspection: Sampling and Inspection shall be in accordance with Table III herein. 6.3 Screening: Screening requirements shall be in accordance with Table III herein. 6.4 Source Inspection: The manufacturer will coordinate Source Inspection at wafer lot acceptance and pre-seal internal visual The procuring activity has the right to perform source inspection at the supplier s facility prior to shipment for each lot of deliverables when specified as a customer purchase order line item. This may include wafer lot acceptance, die visual, and final data review. LINEAR TECHNOLOGY CORPORATION Page 5 of 16

13 SPEC NO REV. F RH137H AND RH137K NEGATIVE ADJUSTABLE REGULATOR DICE 6.5 Deliverable Data: Deliverable data that will ship with devices when a Space Data Pack is ordered: Lot Serial Number Sheets identifying all Canned Sample devices accepted through final inspection by serial number % attributes (completed element evaluation traveler) Element Evaluation variables data, including Burn-In and Op Life SEM photographs (3.10 herein) Wafer Lot Acceptance Report (3.9 herein) A copy of outside test laboratory radiation report if ordered Certificate of Conformance certifying that the devices meet all the requirements of this specification and have successfully completed the mandatory tests and inspections herein. Note: Items and will be delivered as a minimum, with each shipment. 7.0 Packaging Requirements: Packaging shall be in accordance with Appendix A of MIL-PRF All dice shall be packaged in multicavity containers composed of conductive, anti-static, or static dissipative material with an external conductive field shielding barrier. LINEAR TECHNOLOGY CORPORATION Page 6 of 16

14 SPEC NO REV. F RH137H AND RH137K NEGATIVE ADJUSTABLE REGULATOR DICE DICE OUTLINE DIMENSIONS AND PAD FUNCTIONS OPTION 1, RH137H DICE AND OPTION 2, RH137K DICE FIGURE 1 LINEAR TECHNOLOGY CORPORATION Page 7 of 16

15 SPEC NO REV. F RH137H AND RH137K NEGATIVE ADJUSTABLE REGULATOR DICE TOTAL DOSE BIAS CIRCUIT FIGURE 2 LINEAR TECHNOLOGY CORPORATION Page 8 of 16

16 SPEC NO REV. F RH137H AND RH137K NEGATIVE ADJUSTABLE REGULATOR DICE TO39 STATIC BURN-IN CIRCUIT OPTION 1, T039 METAL CAN / 3 LEADS FIGURE 3 LINEAR TECHNOLOGY CORPORATION Page 9 of 16

17 SPEC NO REV. F RH137H AND RH137K NEGATIVE ADJUSTABLE REGULATOR DICE STATIC BURN-IN CIRCUIT OPTION #2, TO3 / 2 LEADS FIGURE 4 LINEAR TECHNOLOGY CORPORATION Page 10 of 16

18 SPEC NO REV. F RH137H AND RH137K NEGATIVE ADJUSTABLE REGULATOR DICE DEVICE OPTION # 1 (H) TO39 METAL CAN / 3 LEADS CASE OUTLINE FIGURE 5 θja = +150 C/W θjc = +40 C/W LINEAR TECHNOLOGY CORPORATION Page 11 of 16

19 SPEC NO REV. F RH137H AND RH137K NEGATIVE ADJUSTABLE REGULATOR DICE DEVICE OPTION # 2 (K) TO3 METAL CAN / 2 LEADS CASE OUTLINE θja = +35 C/W θjc = +3 C/W FIGURE 6 LINEAR TECHNOLOGY CORPORATION Page 12 of 16

20 SPEC NO REV. F RH137H AND RH137K NEGATIVE ADJUSTABLE REGULATOR DICE TERMINAL CONNECTIONS DEVICE OPTION #1, TO39 / 3 LEAD METAL CAN FIGURE 7 DEVICE OPTION #2, TO3 / 2 LEAD METAL CAN FIGURE 8 LINEAR TECHNOLOGY CORPORATION Page 13 of 16

21 SPEC NO REV. F RH137H AND RH137K NEGATIVE ADJUSTABLE REGULATOR DICE TABLE I DICE ELECTRICAL CHARACTERISTICS Element Evaluation (Note 1) TABLE II ELECTRICAL CHARACTERISTICS (POSTIRRADIATION) (Notes 1 and 4) NOTES: REMAINDER OF THE TABLE II ELECTRICAL CHARACTERISTICS (POST-IRRADIATION) AND NOTES ARE ON PAGE 14. LINEAR TECHNOLOGY CORPORATION Page 14 of 16

22 SPEC NO REV. F RH137H AND RH137K NEGATIVE ADJUSTABLE REGULATOR DICE TABLE II ELECTRICAL CHARACTERISTICS (POST-IRRADIATION)(Notes 1 and 4) (Continued) LINEAR TECHNOLOGY CORPORATION Page 15 of 16

23 SPEC NO REV. F RH137H AND RH137K NEGATIVE ADJUSTABLE REGULATOR DICE TABLE III RH ELEMENT EVALUATION TABLE QUALIFICATION OF DICE SALES LINEAR TECHNOLOGY CORPORATION Page 16 of 16

24 ICS Radiation Test Results RH137H NEGATIVE ADJUSTABLE REGULATOR BIASED (LINEAR TECHNOLOGY CORPORATION) P.O. # 46147L DEVICE TYPE: RH137H NEGATIVE ADJUSTABLE REGULATOR BIASED.. (LINEAR TECHNOLOGY CORPORATION).. RADIATION SOURCE: SHEPHERD 484 (Co60), 1.25MeV.... D/C 0709A PACKAGE TO-39, 3 LEAD CAN LOT# W-5. LOG# 1603 TEST DATE 05/31/07 RTP# P.O.# 46147L.... Test Conductor: AJ Kenna.. Test Administrator: Michael K. Gauthier ICS RADIATION TECHNOLOGIES, INC Florence Ave, Suite 207 Downey, CA TEL: TEL: FAX: INTERNET support@icsrad.com

25 Radiation Test Results RH137H Negative Adjustable Regulator Linear Technology Corporation D/C 0709A, Lot# , Wafer # 5 Test Date Log# 1603 and 1604, TID Test P.O.# 46147L This test consisted of two test logs, 1603 and The test was to compare the radiation effects differences between two bias conditions: Log 1603, had +30 volts and Log 1604 was unbiased with all leads grounded. The 16 test requirements and two information only test are stated in test procedure RTP 690, dated March 23, The test results indicated was very little difference between the two bias conditions for all parameters tested except for the Voltage Reference parameters (VR1-VR4). The test results of the two tests (biased and unbiased) were less than the LTC data sheet limits of 20krad(Si) at the 50krad(Si) test level. There were two differences noted with the four Voltage Reference parameters. 1. There was annealing taking place during the 168-hour at 100ºC Anneal on the biased devices Log Typically, this was about 6mV. The unbiased devices (Log 1604) indicated very little, if any, annealing. 2. The minimum reference voltage difference was within 1mV between the biased and unbiased conditions. The maximum reference voltage indicated up to an 8mV difference between the two bias conditions, with the unbiased devices indicating the greatest change. MAXIMUM VOLTAGE MINIMUM VOLTAGE PARAMETER BIASED UNBIASED BIASED UNBIASED VR VR VR VR

26 These lots PASSED the 16 test requirements as stated in the Radiation Test Procedure RTP 690, dated March 23, NOTE: To simplify the following data analysis, all negative numbers, except for the Voltage Reference parameters have been converted to Absolute numbers. This matches with the Absolute numbers used on the manufacturers data sheets. TID BIASED DEVICES, Log 1603 Voltage Reference VDIFF=3V IL=10mA: The Post-Radiation limit at 50krad(Si) was V maximum. The parameter minimum was V. The maximum voltage was 1.251V and minimum voltage was 1.254V. Voltage Reference VDIFF=40V IL=10mA: The Post-Radiation limit at 50krad(Si) was V maximum. The parameter minimum was V. The maximum voltage was 1.252V and minimum voltage was 1.254V. Voltage Reference VDIFF=3V IL=0.5A: The Post-Radiation limit at 50krad(Si) was V maximum. The parameter minimum was V. The maximum voltage was 1.242V and minimum voltage was 1.243V. Voltage Reference VDIFF=40V IL=0.05A: The Post-Radiation limit at 50krad(Si) was V maximum. The parameter minimum was V. The maximum voltage was 1.251V and minimum voltage was 1.253V. Line Regulation 1 VDEFF=3V TO 36V IL=10mA: The Post-Radiation limit at 50krad(Si) was 0.02%/V maximum. The parameter maximum was %/V. Line Regulation 2 VDEFF=3V TO 40V IL=10mA: The Post-Radiation limit at 50krad(Si) was 0.02%/V maximum. The parameter maximum was %/V. Load Regulation 1 VOUT<=5V IL=10mA 0.5A: The Post-Radiation limit at 50krad(Si) was 25mV maximum. The parameter maximum was 11.8mV. INFORMATION ONLY Load Regulation 2 VOUT>=5V IL=10mA 0.5A: At 50krad(Si), the parameter maximum was %. Bias Current 1 VDIFF=3V IL=10mA: The Post-Radiation limit at 50krad(Si) was 100µA maximum. The parameter maximum was 75.2µA. Bias Current 2 VDIFF=5V IL=10mA: The Post-Radiation limit at 50krad(Si) was 100µA maximum. The parameter maximum was 73.7µA. Bias Current 3 VDIFF=40V IL=10mA: The Post-Radiation limit at 50krad(Si) was 100µA maximum. The parameter maximum was 71.6µA. Bias Change VDIFF=5V IL=10mA to 0.5A: The Post-Radiation limit at 50krad(Si) was 5µA maximum. The parameter maximum was 0.697µA. Bias Change VDIFF=3V to 36V IL=10mA: The Post-Radiation limit at 50krad(Si) was 5µA maximum. The parameter maximum was 0.89µA. Bias Change VDIFF=3V to 40V IL=10mA: The Post-Radiation limit at 50krad(Si) was 5µA maximum. The parameter maximum was 0.45µA. Minimum Load Current VDIFF=40V: The Post-Radiation limit at 50krad(Si) was 5mA maximum. The parameter maximum was 1.32mA. Short Circuit Current VDIFF=15V: The Post-Radiation limit at 50krad(Si) was 0.5A minimum. The parameter minimum was 1.17A. 2

27 Short Circuit Current VDIFF=40V: The Post-Radiation limit at 50krad(Si) was 0.15A minimum. The parameter minimum was 0.296A. INFORMATION ONLY Ripple Rejection CADJ=10µF, Vout=10V: At 50krad(Si), the parameter minumum was 122dB. TID UNBIASED (GROUNDED) DEVICES, Log 1604 Voltage Reference VDIFF=3V IL=10mA: The Post-Radiation limit at 50krad(Si) was V maximum. The parameter minimum was V. The maximum voltage was 1.244V and minimum voltage was 1.253V. Voltage Reference VDIFF=40V IL=10mA: The Post-Radiation limit at 50krad(Si) was V maximum. The parameter minimum was V. The maximum voltage was 1.244V and minimum voltage was 1.253V. Voltage Reference VDIFF=3V IL=0.5A: The Post-Radiation limit at 50krad(Si) was V maximum. The parameter minimum was V. The maximum voltage was 1.234V and minimum voltage was 1.243V. Voltage Reference VDIFF=40V IL=0.05A: The Post-Radiation limit at 50krad(Si) was V maximum. The parameter minimum was V. The maximum voltage was 1.244V and minimum voltage was 1.253V. Line Regulation 1 VDEFF=3V TO 36V IL=10mA: The Post-Radiation limit at 50krad(Si) was 0.02%/V maximum. The parameter maximum was %/V. Line Regulation 2 VDEFF=3V TO 40V IL=10mA: The Post-Radiation limit at 50krad(Si) was 0.02%/V maximum. The parameter maximum was %/V. Load Regulation 1 VOUT<=5V IL=10mA 0.5A: The Post-Radiation limit at 50krad(Si) was 25mV maximum. The parameter maximum was 11.3mV. INFORMATION ONLY Load Regulation 2 VOUT>=5V IL=10mA 0.5A: At 50krad(Si), the parameter maximum was %. Bias Current 1 VDIFF=3V IL=10mA: The Post-Radiation limit at 50krad(Si) was 100µA maximum. The parameter maximum was 76.1µA. Bias Current 2 VDIFF=5V IL=10mA: The Post-Radiation limit at 50krad(Si) was 100µA maximum. The parameter maximum was 72.5µA. Bias Current 3 VDIFF=40V IL=10mA: The Post-Radiation limit at 50krad(Si) was 100µA maximum. The parameter maximum was 71.7µA. Bias Change VDIFF=5V IL=10mA to 0.5A: The Post-Radiation limit at 50krad(Si) was 5µA maximum. The parameter maximum was 1.6µA. Bias Change VDIFF=3V to 36V IL=10mA: The Post-Radiation limit at 50krad(Si) was 5µA maximum. The parameter maximum was 0.4µA. Bias Change VDIFF=3V to 40V IL=10mA: The Post-Radiation limit at 50krad(Si) was 5µA maximum. The parameter maximum was 1.00µA. Minimum Load Current VDIFF=40V: The Post-Radiation limit at 50krad(Si) was 5mA maximum. The parameter maximum was 1.42mA. Short Circuit Current VDIFF=15V: The Post-Radiation limit at 50krad(Si) was 0.5A minimum. The parameter minimum was 1.12A. Short Circuit Current VDIFF=40V: The Post-Radiation limit at 50krad(Si) was 0.15A minimum. The parameter minimum was 0.28A. 3

28 INFORMATION ONLY Ripple Rejection CADJ=10µF, Vout=10V: At 50krad(Si), the parameter minimum was 124dB. ANOMOLIES: There was one anomaly in the parameter test list. Load Regulation 2 VOUT>=5V IL=10mA 0.5A was an INFORMATION ONLY test. The Load Regulation test condition of 10mA-500mA exceeds datasheet test condition of 10mA-200mA so, the datasheet limit of 0.5% does not apply to Load Regulation test as performed in this analysis. If you should require any further clarification on this matter, please contact me directly: TEL , FAX , or mike@icsrad.com. ICS Radiation Technologies, Inc. Dr. Michael K. Gauthier, P.E. President August 29,

29 March 23, 2007 RADIATION TEST PROCEDURE No. 690 Device Type: Manufacturer: Lot No: RH137H Negative Voltage Regulator Linear Technology Corp. Date Code: Package Type: H 3-lead Can (TO-39) No. of Devices Supplied: 11 No. of Devices to be tested: Bias Condition #1, 5 Devices Bias Condition #2, 5 Devices Control, 1Device ================================================================= RADIATION CONDITIONS: MIL-STD-883E, Method Facility: Shepherd 484, Co60 Energy: 1.25 MeV Total Dose krad(si) Dose Rate rad(si)/s Biased Anneal 24 25ºC 50 Biased Anneal ºC BIAS CONDITIONS DURING IRRADIATION: ON BIAS CONDITION # 1 Pin # Name Voltage 1 Adjust 2kΩ to +15Volts,. 2 Output 243Ω to +15 Volts 3 Input -15 Volts, NOTE: 0.1µF from +15V to -15 Volts. OFF BIAS CONDITION # 2 All pins to GROUND. Page 1 of 3

30 March 23, 2007 RADIATION TEST PROCEDURE No. 690 Device Type: Manufacturer: RH137H Negative Voltage Regulator Linear Technology Corp. TEST TEST NAME TEST CONDITIONS Limits Exposure Levels rad(si) Units 20k 50k 100k NOTE: Vin MAX = 30V 1 Voltage Reference VDIF=3V, IL=10mA V Min V Max 2 Voltage Reference VDIF=40V, IL=10mA V Min V Max 3 Voltage Reference VDIF=3V, IL=0.5A V Min V Max 4 Voltage Reference VDIF=40V, IL=0.05A V Min V Max 5 Line Regulation 1 3V (Vin-Vout) 36V %/V Max Iout=10mA 6 Line Regulation 2 3V (Vin-Vout) 40V %/V Max Iout=10mA 7 Load Regulation 1 10mA Iout 0.5A mv Max Vout 5V 8 Load Regulation 2 10mA Iout 0.5A % Max Vout 5V 9 Adjust Pin Current 1 VDIF=3V, IL=10mA µa Max 10 Adjust Pin Current 2 VDIF=5V, IL=10mA µa Max 11 Adjust Pin Current 3 VDIF=40V, IL=10mA µa Max 12 Adjust Pin Current Change VDIF=5V µa Max 10mA Iout 0.5A 13 Adjust Pin Current Change VDIF=3V to 36V µa Max IL=10mA 14 Adjust Pin Current Change VDIF=3V to 40V µa Max IL=10mA Page 2 of 3

31 March 23, 2007 RADIATION TEST PROCEDURE No. 690 Device Type: Manufacturer: RH137H Negative Voltage Regulator Linear Technology Corp. TEST TEST NAME TEST CONDITIONS Limits Exposure Levels rad(si) Units 20k 50k 100k 15 Minimum Load Current VDIF=40V ma Max 16 Short Circuit Current VDIF=15V A Min 17 Short Circuit Current VDIF=40V A Min 18 Ripple Rejection CADJ=10µF, Vout=10V Record Record Record db Measurements shall be made at room (ambient) temperature. Test conducted using an Analog Devices LTS-2020 Component Test System, with the LTS-2101 Family Board, LTS0606 Regulator Socket Assembly, LTS0325/RH137 DUT board. Software: RH137H/K 1.04 program. RH137HK.SR4 Data Processing use King Program: P99/90 Ktl =4.666 for 5 devices Return samples to customer. Page 3 of 3

32 I C S Radiation Test Results RH137H NEGATIVE ADJUSTABLE REGULATOR (LTC) "BIASED" ================================================================================= REFERENCE OUTPUT VDIFF=3V IL=10mA (V) ==================================================================================== FLUENCE krad(si) INITIAL 2.00E E E HOUR 168 HOUR FLUX rad(si)/sec 5.00E E E+01 "BIASED" "BIASED" ANNEAL ANNEAL 25C 100C S/N CONTROL E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E+00 MINIMUM E E E E E E+00 MEAN E E E E E E+00 MAXIMUM E E E E E E+00 +P 99/ E E E E E E+00 -P 99/ E E E E E E+00 SIGMA 8.165E E E E E E REFERENCE OUTPUT VDIFF=3V IL=10mA (V) [DELTA] ===================================================================================== FLUENCE krad(si) INITIAL 2.00E E E HOUR 168 HOUR FLUX rad(si)/sec 5.00E E E+01 "BIASED" "BIASED" ANNEAL ANNEAL 25C 100C S/N CONTROL E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E+00 MINIMUM 1.000E E E E E-03 MEAN 1.750E E E E E-04 MAXIMUM 2.000E E E E E+00 +P 99/ E E E E E-03 -P 99/ E E E E E-03 SIGMA 5.000E E E E E-04 DEVICE TYPE: RH137H NEGATIVE ADJUSTABLE REGULATOR (LTC) "BIASED" RADIATION SOURCE: SHEPHERD 484 (Co60), 1.25MeV D/C 0709A PACKAGE TO-39, 3-PIN LOT# WAFER# 5 LOG# 1603 TEST DATE 05/31/07 RTP# 690 P.O# 46147L I C S RADIATION TECHNOLOGIES, INC. Page 1 of 35

33 I C S Radiation Test Results RH137H NEGATIVE ADJUSTABLE REGULATOR (LTC) "BIASED" ================================================================================ REFERENCE OUTPUT VDIFF=40V IL=10MA (V) ==================================================================================== FLUENCE krad(si) INITIAL 2.00E E E HOUR 168 HOUR FLUX rad(si)/sec 5.00E E E+01 "BIASED" "BIASED" ANNEAL ANNEAL 25C 100C S/N CONTROL E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E+00 MINIMUM E E E E E E+00 MEAN E E E E E E+00 MAXIMUM E E E E E E+00 +P 99/ E E E E E E+00 -P 99/ E E E E E E+00 SIGMA 8.165E E E E E E REFERENCE OUTPUT VDIFF=40V IL=10MA (V) [DELTA] ===================================================================================== FLUENCE krad(si) INITIAL 2.00E E E HOUR 168 HOUR FLUX rad(si)/sec 5.00E E E+01 "BIASED" "BIASED" ANNEAL ANNEAL 25C 100C S/N CONTROL E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E+00 MINIMUM 1.000E E E E E-03 MEAN 1.000E E E E E-03 MAXIMUM 1.000E E E E E-03 +P 99/ E E E E E-03 -P 99/ E E E E E-03 SIGMA 1.282E E E E E-16 DEVICE TYPE: RH137H NEGATIVE ADJUSTABLE REGULATOR (LTC) "BIASED" RADIATION SOURCE: SHEPHERD 484 (Co60), 1.25MeV D/C 0709A PACKAGE TO-39, 3-PIN LOT# WAFER# 5 LOG# 1603 TEST DATE 05/31/07 RTP# 690 P.O# 46147L I C S RADIATION TECHNOLOGIES, INC. Page 2 of 35

34 Page 3 of 35

35 I C S Radiation Test Results RH137H NEGATIVE ADJUSTABLE REGULATOR (LTC) "BIASED" =============================================================================== REFERENCE OUTPUT VDIFF=3V IL=0.5A (V) ==================================================================================== FLUENCE krad(si) INITIAL 2.00E E E HOUR 168 HOUR FLUX rad(si)/sec 5.00E E E+01 "BIASED" "BIASED" ANNEAL ANNEAL 25C 100C ---- S/N CONTROL E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E+00 MINIMUM E E E E E E+00 MEAN E E E E E E+00 MAXIMUM E E E E E E+00 +P 99/ E E E E E E+00 -P 99/ E E E E E E+00 SIGMA 5.774E E E E E E REFERENCE OUTPUT VDIFF=3V IL=0.5A (V) [DELTA] ===================================================================================== FLUENCE krad(si) INITIAL 2.00E E E HOUR 168 HOUR FLUX rad(si)/sec 5.00E E E+01 "BIASED" "BIASED" ANNEAL ANNEAL 25C 100C S/N CONTROL E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E-03 MINIMUM 3.000E E E E E-03 MEAN 4.000E E E E E-03 MAXIMUM 5.000E E E E E-03 +P 99/ E E E E E-03 -P 99/ E E E E E-03 SIGMA 8.165E E E E E-03 DEVICE TYPE: RH137H NEGATIVE ADJUSTABLE REGULATOR (LTC) "BIASED" RADIATION SOURCE: SHEPHERD 484 (Co60), 1.25MeV D/C 0709A PACKAGE TO-39, 3-PIN LOT# WAFER# 5 LOG# 1603 TEST DATE 05/31/07 RTP# 690 P.O# 46147L I C S RADIATION TECHNOLOGIES, INC. Page 4 of 35

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37 I C S Radiation Test Results RH137H NEGATIVE ADJUSTABLE REGULATOR (LTC) "BIASED" =============================================================================== REFERENCE OUTPUT VDIFF=40V IL=0.05A (V) ==================================================================================== FLUENCE krad(si) INITIAL 2.00E E E HOUR 168 HOUR FLUX rad(si)/sec 5.00E E E+01 "BIASED" "BIASED" ANNEAL ANNEAL 25C 100C S/N CONTROL E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E+00 MINIMUM E E E E E E+00 MEAN E E E E E E+00 MAXIMUM E E E E E E+00 +P 99/ E E E E E E+00 -P 99/ E E E E E E+00 SIGMA 8.165E E E E E E REFERENCE OUTPUT VDIFF=40V IL=0.05A (V) [DELTA] ===================================================================================== FLUENCE krad(si) INITIAL 2.00E E E HOUR 168 HOUR FLUX rad(si)/sec 5.00E E E+01 "BIASED" "BIASED" ANNEAL ANNEAL 25C 100C S/N CONTROL E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E+00 MINIMUM 2.000E E E E E-03 MEAN 2.000E E E E E-03 MAXIMUM 2.000E E E E E-02 +P 99/ E E E E E-02 -P 99/ E E E E E-02 SIGMA 0.000E E E E E-03 DEVICE TYPE: RH137H NEGATIVE ADJUSTABLE REGULATOR (LTC) "BIASED" RADIATION SOURCE: SHEPHERD 484 (Co60), 1.25MeV D/C 0709A PACKAGE TO-39, 3-PIN LOT# WAFER# 5 LOG# 1603 TEST DATE 05/31/07 RTP# 690 P.O# 46147L I C S RADIATION TECHNOLOGIES, INC. Page 6 of 35

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39 I C S Radiation Test Results RH137H NEGATIVE ADJUSTABLE REGULATOR (LTC) "BIASED" =============================================================================== LINE REG 1 VDIFF=3V TO 36V IL=10MA (%/V) ==================================================================================== FLUENCE krad(si) INITIAL 2.00E E E HOUR 168 HOUR FLUX rad(si)/sec 5.00E E E+01 "BIASED" "BIASED" ANNEAL ANNEAL 25C 100C S/N CONTROL E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E-04 MINIMUM 3.00E E E E E E-04 MEAN 4.80E E E E E E-04 MAXIMUM 9.00E E E E E E-04 +P 99/ E E E E E E-03 -P 99/ E E E E E E-04 SIGMA 2.71E E E E E E LINE REG 1 VDIFF=3V TO 36V IL=10MA (%/V) [DELTA] ===================================================================================== FLUENCE krad(si) INITIAL 2.00E E E HOUR 168 HOUR FLUX rad(si)/sec 5.00E E E+01 "BIASED" "BIASED" ANNEAL ANNEAL 25C 100C S/N CONTROL E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E+00 MINIMUM -1.00E E E E E-04 MEAN 5.00E E E E E-05 MAXIMUM 3.00E E E E E-04 +P 99/ E E E E E-03 -P 99/ E E E E E-03 SIGMA 1.73E E E E E-04 DEVICE TYPE: RH137H NEGATIVE ADJUSTABLE REGULATOR (LTC) "BIASED" RADIATION SOURCE: SHEPHERD 484 (Co60), 1.25MeV D/C 0709A PACKAGE TO-39, 3-PIN LOT# WAFER# 5 LOG# 1603 TEST DATE 05/31/07 RTP# 690 P.O# 46147L I C S RADIATION TECHNOLOGIES, INC. Page 8 of 35

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41 I C S Radiation Test Results RH137H NEGATIVE ADJUSTABLE REGULATOR (LTC) "BIASED" =============================================================================== LINE REG 2 VDIFF=3V TO 40V IL=10MA (%/V) ==================================================================================== FLUENCE krad(si) INITIAL 2.00E E E HOUR 168 HOUR FLUX rad(si)/sec 5.00E E E+01 "BIASED" "BIASED" ANNEAL ANNEAL 25C 100C S/N CONTROL E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E-04 MINIMUM 4.00E E E E E E-04 MEAN 8.00E E E E E E-04 MAXIMUM 1.10E E E E E E-03 +P 99/ E E E E E E-03 -P 99/ E E E E E E-04 SIGMA 2.87E E E E E E LINE REG 2 VDIFF=3V TO 40V IL=10MA (%/V) [DELTA] ===================================================================================== FLUENCE krad(si) INITIAL 2.00E E E HOUR 168 HOUR FLUX rad(si)/sec 5.00E E E+01 "BIASED" "BIASED" ANNEAL ANNEAL 25C 100C S/N CONTROL E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E-04 MINIMUM -5.00E E E E E-04 MEAN 2.75E E E E E-05 MAXIMUM 8.00E E E E E-04 +P 99/ E E E E E-03 -P 99/ E E E E E-03 SIGMA 5.56E E E E E-04 DEVICE TYPE: RH137H NEGATIVE ADJUSTABLE REGULATOR (LTC) "BIASED" RADIATION SOURCE: SHEPHERD 484 (Co60), 1.25MeV D/C 0709A PACKAGE TO-39, 3-PIN LOT# WAFER# 5 LOG# 1603 TEST DATE 05/31/07 RTP# 690 P.O# 46147L I C S RADIATION TECHNOLOGIES, INC. Page 10 of 35

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43 I C S Radiation Test Results RH137H NEGATIVE ADJUSTABLE REGULATOR (LTC) "BIASED" =============================================================================== LOAD REG1 VOUT<=5V IL=10MA TO 0.5A (MV) ==================================================================================== FLUENCE krad(si) INITIAL 2.00E E E HOUR 168 HOUR FLUX rad(si)/sec 5.00E E E+01 "BIASED" "BIASED" ANNEAL ANNEAL 25C 100C S/N CONTROL E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E+00 MINIMUM -9.26E E E E E E+00 MEAN -8.59E E E E E E+00 MAXIMUM -7.65E E E E E E+00 +P 99/ E E E E E E-01 -P 99/ E E E E E E+01 SIGMA 7.42E E E E E E LOAD REG1 VOUT<=5V IL=10MA TO 0.5A (MV) [DELTA] ===================================================================================== FLUENCE krad(si) INITIAL 2.00E E E HOUR 168 HOUR FLUX rad(si)/sec 5.00E E E+01 "BIASED" "BIASED" ANNEAL ANNEAL 25C 100C S/N CONTROL E E E E E E E E E E E E E E E E E E E E E E E E E E E E E E+00 MINIMUM -3.13E E E E E-01 MEAN -2.27E E E E E+00 MAXIMUM -9.94E E E E E+00 +P 99/ E E E E E+01 -P 99/ E E E E E+00 SIGMA 9.73E E E E E+00 DEVICE TYPE: RH137H NEGATIVE ADJUSTABLE REGULATOR (LTC) "BIASED" RADIATION SOURCE: SHEPHERD 484 (Co60), 1.25MeV D/C 0709A PACKAGE TO-39, 3-PIN LOT# WAFER# 5 LOG# 1603 TEST DATE 05/31/07 RTP# 690 P.O# 46147L I C S RADIATION TECHNOLOGIES, INC. Page 12 of 35