Test report for external use R&M E-2000 fakes. Introduction

Transcription

1 Introduction Motivation The intention behind R&M products is to generate durable, reliably functioning networks for end users. Counterfeit R&M-labelled E-2000 connectors, adapters and patch cords damage the image of R&M products and the reputation of all R&M partners along the logistics chain right up to the end customer. Selection of tests performed In the'better connected' information campaign, R&M summarizes all product features and services that fully meet specific requirements for a network and its components during the various phases of the life cycle: - Planning - Installation - Operation - Maintenance - Expansions - Compliance (international requirements) With the faked E-2000 plugs, adapters and patch cords only test procedures were carried out, which allow well-founded conclusions about the reliability of the products in operation and their longevity in the installed network. Using the test report The test report is freely available to all interested parties. No reference to the source of supply of the counterfeit products is included in the report. Wetzikon, August 2018 Hermann Christen C.Compare Development & Test Laboratory page 1 / 43

2 Evaluation of E2000 fake or unknown suppliers Inspections Visual inspection IEC Ed. 2.0 ( ) Photo Ferrule length / dimension IEC Ed. 2.0 ( ) Optical tests Interferometer IEC Ed. 1.0 ( ) Visual inspection of connector surface IEC Ed. 2.0 ( ) Active monitoring of changes in attenuation IEC Ed. 3.0 ( ) IL random mated IEC Ed. 3.0 ( ) RL random mated IEC Ed. 3.0 ( ) Mechanical tests Static side load (pigtails) IEC Ed. 3.0 ( ) Flexing IEC Ed. 3.0 ( ) Cable retention test IEC Ed. 1.0 ( ) Adapter strength IEC Ed. 2.0 ( ) Adapter bending moment IEC Ed. 2.0 ( ) Ferrule compression force IEC Ed. 2.0 ( ) Environmental tests Change of temperature IEC Ed. 2.0 ( ) Flammability test IEC / 2 Ed. 1.0 (2004) In each chapter the failed test are shown in red and the measurement values that exceed the product specification limits are marked in yellow. C.Compare Development & Test Laboratory page 2 / 43

3 Conclusion Most of fake E2000 are bad assembled. Their instability is just proved by hand, where most of them split apart just pulling the components with the fingers. Some connector-sets also found on the market mix up different spare parts that do not match together. The optical performance proved with some of those products are extremely abnormal. Some assemblies were checked in detail, the optical fiber gluing process is completely wrong and that jeopardizes the mechanical stability. This kind of assemblies go broken within days or weeks when employed for an installation, having a well-known impact on the system. Some cable assemblies are done with wrong spare parts and by a wrong process; these cables fixation (crimping) damage the cable with a bad impact on the mechanical stability and the consequent, short or long term optical failure. These are very well recognizable form the totally wrong geom etry of the crimping metal sleeve underneath the protection boot. We proved anyway some crimped parts, the mechanical stability is practically inconsistent and the guarantee of stable optical performance is completely gone. Some fake E2000 have the ferrule end polished in a completely wrong manner; the inspection by the interferometer show the ferrules end geometry completely out of specification. In some cases the polishing process and the successive end face geometry verification is done without the E2000 outer body which in some lucky cases lead to a first PASS on the interferometer, then is mounted the unknown E2000 outer body with a completely wrong orientation, up to 180 degrees orientation. Some fake E2000 connectors show completely wrong layout, mainly the ferrule length is below the specifications; the ferrules are too short and cannot guarantee any optical connection. Some E2000 fake connectors show a completely contaminated ferrule end face, in the best cases cleanable with alcohol, completely useless if only cleaned with cleaning cassettes or lint-free paper. Some of these have been disassembled and show a great contamination all around the ferrule and the ferrule s holder. In some cases, residuals of adhesive used to glue the optical fiber, overflowed and dried off around the holder. This compromises the complete functionality of the E2000 connector. C.Compare Development & Test Laboratory page 3 / 43

4 Table of contents 1. RELATED DOCUMENTS LIST OF COMPONENTS TESTS SEVERITIES AND REQUIREMENTS LIST OF EQUIPMENT LIST OF ABBREVIATIONS VISUAL INSPECTION VISUAL EXAMINATION VISUAL INSPECTION OF CONNECTOR SURFACE OPTICAL MEASUREMENTS ACTIVE MONITORING OF CHANGES IN ATTENUATION AND RETURN LOSS ATTENUATION RANDOM MATED RETURN LOSS RANDOM MATED MECHANICAL TESTS STATIC SIDE LOAD FLEXING TEST ADAPTER BENDING MOMENT STRENGTH OF COUPLING MECHANISM (PLUG ADAPTER) CABLE RETENTION FERRULE COMPRESSION FORCE CLIMATIC TESTS CHANGE OF TEMPERATURE FLAMMABILITY TESTS FLAMMABILITY TEST C.Compare Development & Test Laboratory page 4 / 43

5 1. Related documents [1] IEC General & guidance 2. List of components Cables types E2000 APC green, 3 mm, 3 m, yellow patch cables Double pigtails E2000 APC green, 4 m, yellow 0.9 mm E2000 plug adapters green, green dust cap R&M logo E2000 plug adapters blue, blue dust cap R&M logo E2000 green connector set E2000 APC green, 3 mm, 3 m, duplex yellow patch E2000 plug adapters green, black dust cap Double pigtails E2000 APC green, 1 m, white 0.9 mm pigtails E2000 plug adapters green, green dust cap (no logo) E2000 APC green, 2 mm, 3 m yellow patch cables E2000 APC green, 3 mm, 3 m yellow patch Double pigtails E2000 APC green, 4 m, yellow 0.9 mm pigtails E2000 plug adapters green, green dust cap (no logo no fake) E2000 APC green, 3 mm, 3 m, yellow patch cables E2000 plug adapters green, green dust cap (no logo no fake) E2000 plug adapters blue, blue dust cap (no logo no fake) Pigtail E2000 APC green, 1 m, yellow 0.9 mm pigtails E2000 PC blue 3 mm, 3 m yellow patch cable Short name Group A Pigtail Group A Adapter green Group A Adapter blue Group A Group A set Group B Adapter green Group B Pigtail Group C Adapter green Group C Group D 2 mm Group D 3 mm Pigtail Group D Adapter green Group D Group E Adapter green Group E Adapter blue Group E Group F Group G 3. Tests severities and requirements Test description Standard Test parameters Requirements Visual inspection Naked eyes No damages No missing parts photo photo Camera microscope Interferometer APC, 2.5 mm ferrule Ferrule length Length -vs- mechanical reference Dimension 12 mm ( / ) mm Ferrule compression force Mated position 7,8 N F 11.8 N Attenuation random mated IEC Wavelengths: IL mean 0.25 db 97% IL 0.50 db Return Loss IEC nm and 1550 nm RL 60 db Static side load IEC N, 5 minutes for pigtails 1550 nm C.Compare Development & Test Laboratory page 5 / 43 ΔIL 0.2 db during test

6 Test description Standard Test parameters Requirements Flexing test Fibre cable retention IEC IEC N, ± cycles 900 μm pigtails 5.0 ± 0.5 N, 60 s 2 mm cable 70 ± 2.0 N, 120 s 3 mm cable 100 ± 2.0 N, 120 s ΔIL 0.2 db during test ΔIL 0.2 db during test Adapter strength IEC N, 2 N/s, 120 s ΔIL 0.2 db during test Adapter bending moment IEC N, 10 s ΔIL 0.2 db during test Change of temperature IEC Temperature ( 25 ± 2) C to (+70 ± 2) C Dwell at extremities: 60 min Temperature changes: 1 C / min 12 stress cycles ΔIL 0.2 db during test ΔIL 0.1 db after test Flammability IEC / 2 Small flame, 3 s Self-extinguishing, low smoke emission 4. List of equipment Equipment name Inventory no. Short name Optotest OP 930 SM OP 930 Exfo IQS 600 main frame Exfo IQS-3250 IL-RL module Exfo IQS 2100 LD Exfo IQS 1700 power meter Zwick pull tester Easy-Check 250x fiber microscope Photo-camera Canon ixus Microscope Leica DMS 1000 Exfo mf Exfo IL-RL Exfo LD Exfo pm Zwick Easy-Check Canon Leica 5. List of abbreviations Name Insertion Loss Variation of insertion loss Single-mode Return Loss IL ΔIL SM RL Abbreviation C.Compare Development & Test Laboratory page 6 / 43

7 6. Visual Inspection Test conditions Time frame: 18 th 22 nd May 2018 Temperature: 23 C ± 2 C R. humidity: 40 % ± 10 % Operator/s: Sta / Cc 6.1. Visual examination IEC Specimen All samples Specimen preparation Storage at room temperature > 24 hours Requirements No damages, no contamination, no missing parts. No different colors Results See photos. Some assemblies are bad or show different colors (different parts not matching together). Most of them easily split apart pulling by fingers. Group A Figure 1 unknown supplier parts do not match together gaps and different colors are well visible C.Compare Development & Test Laboratory page 7 / 43

8 Figure 2 and Figure 3 details, edges damaged may cause mechanical failures Figure 4 gap visible between boot and E2000 body. The boot does not belong to the R&M connector set. The boot mounted in this way is not mechanical stable and cannot guarantee its functionality. Figure 5 Fake E2000 plug adapter. Geometry and colors are wrong Figure 6 Figure 7 Fig. 6 and Fig. 7 details of plug adapter; damaged edges and surface C.Compare Development & Test Laboratory page 8 / 43

9 Group B Figure 8 source xxx Figure 9 duplex assembly Figure 10 detail of assembly Figure 11 detail of crimping sleeve Figure 12 the crimped metal sleeve has an irregular geometry which cannot guarantee any mechanical stability. In addition the cable looks damaged (small cut visible) and bent, which may exhibit fiber stress during operation. C.Compare Development & Test Laboratory page 9 / 43

10 Group C Figure 13 source xxx Figure 14 connector set parts do not match together. Different colors. Figure 15 Ferrule too short and mount with a wrong angle (180 ) Figure 16 ferrule fall apart by inserting in the plug adapter C.Compare Development & Test Laboratory page 10 / 43

11 Group D Figure 17 and Figure 18 E2000 pigtail. Source xxxx. The elements do not match together. Different colors, different geometry. Figure 19 the E2000 inner part is not inserted correctly into the outer body Figure 20 the two parts can be split apart by a tiny shear force applied by fingers Figure 21 and Figure 22 the fibre assembly into the ferrule (gluing) is totally wrong. This kind of fixation causes fiber stress when spring loaded (mated) and fiber breakage. In addition the end of ferrule holder and the ferrule are extremely contaminated. Figure 23 - E2000 patch cable. Source xxx. The elements do not match together. Different colors and different geometry. C.Compare Development & Test Laboratory page 11 / 43

12 Group E Figure 24 and Figure 25 E2000 patch cable. Source xxx. Figure 26 the E2000 parts split apart easily; pulled by finger. Figure 27 gluing process completely wrong. This kind of fixation causes fiber stress when spring loaded (mated) and fiber breakage. In addition the end of ferrule holder and the ferrule are extremely contaminated Figure 28 and Figure 29 E 2000 connector set; the spare parts do not match together, primarily the ferrule holder is not compatible with the E2000 outer body. They split apart easily by pulling. C.Compare Development & Test Laboratory page 12 / 43

13 Group F Figure 30 and Figure 31 E2000 pigtail. The components easily split apart by pulling by fingers. these parts do not match together Group G Figure 32 and Figure 33 - E2000 patch cable. The components easily split apart by pulling by fingers. these parts do not match together. Different colors, different geometry. C.Compare Development & Test Laboratory page 13 / 43

14 6.2. Visual inspection of connector surface IEC Equipment Easy-Check Specimen All samples before any test Specimen preparation Ferrules end faces cleaned Test parameters According to IEC , very small particles, very tiny scratches and defects are allowed. Results See photos Summary A B C D E F G Visual Inspection fail fail fail fail fail n.a. n.a. Group A Figure 34 Figure 35 Figure 36 Figure 37 Figures 39 to 42 examples of cleaned ferrule end faces of Group A. The particles left are not easily removable or permanent. Some scratches are too wide. C.Compare Development & Test Laboratory page 14 / 43

15 Group B Figure 38 permanent contamination. The darkening shadow (top right) shows that the ferrule angle is wrong Figure 39 three scratches are detected over the fiber surface Group C Figure 40 - permanent contamination. The darkening shadow (top right) shows that the ferrule angle is wrong Figure 41 - permanent contamination. The darkening shadow (top right) shows that the ferrule angle is wrong Group D C.Compare Development & Test Laboratory page 15 / 43

16 Figure 42 Figure 43 Figure 44 Figure 45 Figures 47 to 50 examples of cleaned ferrule end faces of Group D. The particles left are not easily removable or permanently printed on the fiber. Some scratches are well visible.. Group E Figure 46 Figure 47 Figure 48 Figure 49 Figures 51 to 54 examples of cleaned ferrule end faces of Group E. The particles left are not easily removable or permanently printed on the fiber. Scratches well visible. C.Compare Development & Test Laboratory page 16 / 43

17 7. Optical measurements Test conditions Time frame: 23 rd 25 th May 2018 Temperature: 23 C ± 2 C R. humidity: 40 % ± 10 % Operator/s: Sta / Cc 7.1. Active monitoring of changes in attenuation and return loss IEC Equipment Exfo mf Exfo LD Exfo pm Test parameter Wavelength/s; 1310 nm and 1550 nm Requirements ΔIL 0.20 db per connector during mechanical stress ΔIL 0.50 db for whole DUT during climatic test Results See the relevant chapters C.Compare Development & Test Laboratory page 17 / 43

18 7.2. Attenuation random mated IEC Method Equipment OP 930 Specimen 5 patch cables, group A 5 patch cables, group B 5 pigtails, group C 5 patch cables 2 mm, group D 5 patch cables 3 mm, group D 2 double-pigtails, group D 5 patch cables, group E Test parameter Wavelength/s; 1310 nm and 1550 nm Requirements Grade B, IL mean = 0.12 db, 97 % IL 0.25 db Grade C, IL mean = 0.25 db, 97 % IL 0.50 db Summary Random mated IL C1 A B C D E F G fail pass n.a. fail fail fail n.a. C.Compare Development & Test Laboratory page 18 / 43

19 Results Group A IL mean = 0.31 db, 76.3 % IL 0.50 db Test FAIL.. Group B IL mean = 0.23 db, 97.5 % IL 0.50 db Test PASS for Grade C1 IL mean = 0.23 db, 60 % IL 0.25 db Test FAIL for Grade B C.Compare Development & Test Laboratory page 19 / 43

20 Group C Test not possible. The ferrules show a complete wrong polishing angle. Actually the ferrules holder have been mounted into the E2000 outer body with a random orientation. Additionally the ferrule length measured is too short. In the lucky case that they were assembled correctly (we dismounted two samples and re-mounted them correctly), we had: IL min. = 0.43 db, IL max. = 0.73 db Test FAIL (see RL results). Group D E2000 assemblies, 2 mm patch cables IL mean = 0.30 db, 81.1 % IL 0.50 db Test FAIL E2000 assemblies, 3 mm patch cables IL mean = 0.35 db, 70 % IL 0.50 db Test FAIL E2000 pigtails IL mean = 0.21 db, IL max. = 0.86 db Test FAIL (see RL results) C.Compare Development & Test Laboratory page 20 / 43

21 Group E IL mean = 0.26 db, 91.3 % IL 0.50 db Test FAIL C.Compare Development & Test Laboratory page 21 / 43

22 7.3. Return loss random mated IEC Method Equipment OP 930 Specimen 5 patch cables, group A 5 patch cables, group B 5 pigtails, group C 5 patch cables 2 mm, group D 5 patch cables 3 mm, group D 2 double-pigtails, group D 5 patch cables, group E Test parameter Wavelength/s; 1310 nm and 1550 nm Requirements RL - 60 db Summary Random mated RL A B C D E F G fail fail fail fail fail n.a. n.a. Results Group A Max. RL value = db; 22 % RL > - 60 db Test FAIL. Group B Max. RL value = db; 1 % RL > - 60 db Test FAIL. C.Compare Development & Test Laboratory page 22 / 43

23 Group C Max. RL value = db; 100 % RL > - 60 db (after ferrules orientation adjustment) Test FAIL. Group D Pigtails: Max. RL value = db; 100 % RL > - 60 db Test FAIL. 2 mm patch cables: Max. RL value = db; 24 % RL > - 60 db Test FAIL. 3 mm patch cables: Max. RL value = db; 10 % RL > - 60 db Test FAIL. Group E Max. RL value = db; 3 % RL > - 60 db Test FAIL. C.Compare Development & Test Laboratory page 23 / 43

24 8. Mechanical tests Test conditions Time frame: 23 rd 31 st May 2018 Operator/s: Sta / Cc 8.1. Static side load IEC Method Equipment Exfo mf Exfo LD Exfo pm Test parameter 0.2 N load Duration 5 minutes Main axis only Specimen 4 pigtails Group C 4 pigtails Group D Requirements ΔIL 0.20 db Wavelength 1550 nm Summary Static side load pigtails A B C D E F G n.a. n.a. fail fail n.a. n.a. n.a. C.Compare Development & Test Laboratory page 24 / 43

25 Results Group C 1550 nm Ch1 Ch2 Ch3 Ch4 max ΔIL [db] > 1 > 1 > 1 > 1 Group D 1550 nm Ch1 Ch2 Ch3 Ch4 max ΔIL [db] > 1 > 1 > 1 > 1 Test FAIL. Group C Group D Figure 50 pigtails Group C Figure 51 pigtails Group D C.Compare Development & Test Laboratory page 25 / 43

26 8.2. Flexing test IEC Method Equipment Exfo mf Exfo LD Exfo pm Test parameter 5 N load ± 90 º 100 cycles Main axis only Specimen 2 patch cables, group A 3 patch cables, group B 2 patch cables 2 mm, group D 2 patch cables 3 mm, group D 3 patch cables, group E Requirements ΔIL 0.20 db Wavelength 1550 nm Summary A B C D E F G Flexing test fail pass fail fail fail n.a. n.a. C.Compare Development & Test Laboratory page 26 / 43

27 Results Group A 1550 nm Ch1 Ch2 Ch3 Ch4 max ΔIL [db] Test FAIL. Group B 1550 nm Ch1 Ch2 Ch3 Ch4 Ch5 Ch6 max ΔIL [db] Test FAIL. Group D 2 mm patch cables 1550 nm Ch1 Ch2 Ch3 Ch4 max ΔIL [db] 0.47 broken Test FAIL. C.Compare Development & Test Laboratory page 27 / 43

28 3 mm patch cables 1550 nm Ch1 Ch2 Ch3 Ch4 Ch5 Ch6 max ΔIL [db] Test FAIL. Group E 1550 nm Ch1 Ch2 Ch3 Ch4 Ch5 Ch6 max ΔIL [db] broken broken broken broken Figure 52 broken sample Test FAIL. C.Compare Development & Test Laboratory page 28 / 43

29 8.3. Adapter bending moment IEC Test method Equipment Exfo mf Exfo LD Exfo pm Zwick Test parameter Push force 10 ± 1 N, 10 s Requirements ΔIL 0.20 db Wavelength 1550 nm Specimen Adapter blue group A Adapter green group A Adapter green group C Adapter green group D Adapter blue group E Adapter green group E Summary Adapter bending moment A B C D E F G pass n.a. pass pass pass n.a. n.a. Results Group A adapters blue 1550 nm Ch1 Ch2 Ch3 Ch4 max ΔIL [db] < 0.1 < 0.1 < 0.1 < 0.1 adapters green 1550 nm Ch1 Ch2 Ch3 Ch4 max ΔIL [db] < 0.1 < 0.1 < 0.1 < 0.1 Group C adapters green 1550 nm Ch1 Ch2 Ch3 Ch4 max ΔIL [db] < 0.1 < 0.1 < 0.1 < 0.1 C.Compare Development & Test Laboratory page 29 / 43

30 Group D adapters green 1550 nm Ch1 Ch2 Ch3 Ch4 max ΔIL [db] < 0.1 < 0.1 < 0.1 < 0.1 Group E adapters blue 1550 nm Ch1 Ch2 Ch3 Ch4 max ΔIL [db] < 0.1 < 0.1 < 0.1 < 0.1 adapters green 1550 nm Ch1 Ch2 Ch3 Ch4 max ΔIL [db] < 0.1 < 0.1 < 0.1 < 0.1 Test PASS. The adapters stand to a bending moment of 10 N for 10 s 8.4. Strength of coupling mechanism (plug adapter) IEC Test method Equipment Exfo mf Exfo LD Exfo pm Zwick Test parameter Pull force 40 ± 2 N, 2 N/s, 120 s Specimen LSH Adapter blue group A LSH Adapter green group A LSH adapter green group C LSH adapter green group D LSH Adapter blue group E LSH adapter green group E Requirements ΔIL 0.20 db Wavelength 1550 nm Summary Strength coupling mechanism A B C D E F G pass n.a. pass pass pass n.a. n.a. C.Compare Development & Test Laboratory page 30 / 43

31 Results Group A adapters blue 1550 nm Ch1 Ch2 Ch3 Ch4 max ΔIL [db] < 0.1 < 0.1 < 0.1 < 0.1 adapters green 1550 nm Ch1 Ch2 Ch3 Ch4 max ΔIL [db] < 0.1 < 0.1 < 0.1 < 0.1 Group C adapters green 1550 nm Ch1 Ch2 Ch3 Ch4 max ΔIL [db] < 0.1 < 0.1 < 0.1 < 0.1 Group D adapters green 1550 nm Ch1 Ch2 Ch3 Ch4 max ΔIL [db] < 0.1 < 0.1 < 0.1 < 0.1 Group E adapters blue 1550 nm Ch1 Ch2 Ch3 Ch4 max ΔIL [db] < 0.1 < 0.1 < 0.1 < 0.1 adapters green 1550 nm Ch1 Ch2 Ch3 Ch4 max ΔIL [db] < 0.1 < 0.1 < 0.1 < 0.1 Test PASS. The adapters stand to an axial pull force of 40 N for 120 s 8.5. Cable retention IEC Test method Equipment Exfo LD Exfo pm Zwick Test parameter Pull force 5 ± 0.5 N, 0.5 N/s, 60 s for pigtails Pull force 70 ± 2 N, 5 N/s, 120 s for 2 mm cables Pull force 100 ± 2 N, 5 N/s, 120 s for 3 mm cables C.Compare Development & Test Laboratory page 31 / 43

32 Specimen Group A, 3 mm patch cables Group B, 3 mm patch cables Group C, pigtails Group D, pigtails Group D, 2 mm patch cables Group D, 3 mm patch cables Group E, 3 mm patch cables Requirements ΔIL 0.20 db Wavelength 1550 nm for SM Summary Cable retention patch cord Cable retention pigtail A B C D E F G fail fail n.a. fail pass n.a. n.a. n.a. n.a. pass pass n.a. n.a. n.a. C.Compare Development & Test Laboratory page 32 / 43

33 Results Group A, 3 mm patch cables 1550 nm Ch1 Ch2 Ch3 Ch4 Ch5 Ch6 Ch7 Ch8 max ΔIL [db] broken slid out n/a* Note (*) - not measurable, one side of patch cable broken F max Kommentar Legende Nr N Connector 1 broken Crimping 2 slid out Group A_3mm_ Group A_3mm_ Group A_3mm_ Group A_3mm_ Group A_3mm_ Group A_3mm_8 Test FAIL. Group B, 3 mm patch cables 1550 nm Ch1 Ch2 Ch3 Ch4 max ΔIL [db] broken < 0.1 broken broken F max Kommentar Legende Nr N Group B cable 1, crimp hold, aramid and fiber broken * Group B_cable Group B, cable 3, crimp hold, aramid and fiber broken * Group B_cable 4, crimp hold, aramid and fiber broken * Note (*) the aramid yarn slid out the crimping sleeve; the outer jacket gets curled. The fiber goes broken because the cable is no longer reinforced. Test FAIL. C.Compare Development & Test Laboratory page 33 / 43

34 Group C, pigtails 1550 nm Ch1 Ch2 max ΔIL [db] < 0.1 < 0.1 F max Kommentar Legende Nr N Group C_pigtail Group C_pigtail 2 Test PASS. Group D, pigtails 1550 nm Ch1 Ch2 max ΔIL [db] < 0.1 < 0.1 F max Kommentar Legende Nr N Group D_pigtail Group D_pigtail 2 Test PASS. Group D, 2 mm patch cables F max Kommentar Legende Nr N Group D_2mm cable 1, broken Group D_2mm cable 2, broken Group D_2mm cable 3, broken Group D_2mm cable 4, broken Test FAIL. C.Compare Development & Test Laboratory page 34 / 43

35 Group D, 3 mm patch cables F max Kommentar Legende Nr N Group D_3mm cable 1, crimp holds, fiber broken Group D_3mm cable Group D_3mm cable 3, crimp holds, fiber broken Group D_3mm cable Group D_3mm cable 5, crimp holds, fiber broken Group D_3mm cable 6, crimp holds, fiber broken Test FAIL. Group E, 3 mm patch cables 1550 nm Ch1 Ch2 Ch3 Ch4 max ΔIL [db] < 0.1 < 0.1 < 0.1 < 0.1 F max Kommentar Legende Nr N Group E_cable Group E_cable Group E_cable Group E_cable 4 Test PASS. C.Compare Development & Test Laboratory page 35 / 43

36 8.6. Ferrule compression force IEC Equipment Zwick Test parameter 1 mm/s, up to 0.9 mm run Specimen Group A, pigtail Group A, 3 mm patch cables Group B, 3 mm patch cables Group C, pigtails Group D, pigtails Group D, 2 mm patch cables Group D, 3 mm patch cables Group E, 3 mm patch cables Requirements 7.8 N F 11.8 N Summary Ferrule compression strength A B C D E F G fail pass fail fail n.a. n.a. n.a. Results Group A, pigtail F max dl bei F max Bemerkung Legende Nr N mm 1 > Pigtail group A 2 > Pigtail group A The ferrule compression force in mated conditions corresponds to a stroke of around 0.5 mm hence the compression force is around 13 N. too strong spring Test FAIL. C.Compare Development & Test Laboratory page 36 / 43

37 Group A, 3 mm patch cables F max dl bei F max Bemerkung Legende Nr N mm mm patch cables The spring load distribution is too wide. That means different springs are used or their assembly in the connector set is wrong. We cannot work out reliable results. Half of the samples available have a ferrule spring load too weak. One sample shows a too strong spring load. Test FAIL. Group B, 3 mm patch cables F max dl bei F max Bemerkung Legende Nr N mm mm patch cables The ferrule spring force around the mating stroke is within the specification. However the spring constant is too flat; aiming the correct spring force in mated condition the pre-loading is too strong. This test per-se is alright, the high pre-load may result in long term connections instability. This test is numerically PASS. Group C, pigtails F max dl bei F max Bemerkung Legende Nr N mm pigtails Spring load far too high The ferrule spring force around the mating stroke is over 16 N. Far too high force. Wrong construction. Test FAIL. C.Compare Development & Test Laboratory page 37 / 43

38 Group D, pigtails F max dl bei F max Bemerkung Legende Nr N mm LSH fake, pigtails Group D, 2 mm patch cables F max dl bei F max Bemerkung Legende Nr N mm LSH 2 mm patch cables Group D, 3 mm patch cables F max dl bei F max Bemerkung Legende Nr N mm LSH 3 mm patch cables Inner part slid out on the back side The ferrule spring force around the mating stroke is between12 and 19 N. Far too high force. Wrong construction. Test FAIL. C.Compare Development & Test Laboratory page 38 / 43

39 9. Climatic tests Test conditions Time frame: 5 th 8 th May 2018 Operator: Sta / Cc 9.1. Change of temperature IEC Test method According to IEC Test parameter Temperature range ( 25 ± 2) C to (+70 ± 2) C Dwell 60 minutes at low and high temperature Changes of temperature: 1 C / min. Duration 12 cycles Requirements ΔIL 0.50 db RL - 60 db ( 60 db) Specimen & setup Group A, pigtail (channel 1) Group A, 3 mm patch cables (channels 2 to 4) Group B, 3 mm patch cables (channels 5 to 7) Group D, pigtails (channels 8 and 9) Group D, 2 mm patch cables (channels 10 and 11) Group D, 3 mm patch cables (channels 12 and 13) Group E, 3 mm patch cables (channels 14 to 16) Summary Temperature change A B C D E F G fail fail n.a. fail fail n.a. n.a. C.Compare Development & Test Laboratory page 39 / 43

40 Results Group A 1310 nm Ch1 Ch2 Ch3 Ch4 max ΔIL [db] min RL [db] nm Ch1 Ch2 Ch3 Ch4 max ΔIL [db] min RL [db] Group B 1310 nm Ch5 Ch6 Ch7 max ΔIL [db] min RL [db] nm Ch5 Ch6 Ch7 max ΔIL [db] min RL [db] Group D 1310 nm Ch8 Ch9 Ch10 Ch11 Ch12 Ch13 max ΔIL [db] min RL [db] nm Ch8 Ch9 Ch10 Ch11 Ch12 Ch13 max ΔIL [db] min RL [db] Group E 1310 nm Ch14 Ch15 Ch16 max ΔIL [db] min RL [db] nm Ch14 Ch15 Ch16 max ΔIL [db] min RL [db] Test FAIL. Many assemblies digress the product specifications. C.Compare Development & Test Laboratory page 40 / 43

41 10. Flammability tests Test conditions Time frame: 6 th June 2018 Operator: Sta / Cc The object of this test is to determine the flammability of a connector when exposed to a small-flame The test is intended to simulate the effect of small flames which may result from fault conditions within the equipment. Because of the non-conformity of this test to the referenced standard, the results are purely informative and judged as: Good Bad Flammability test IEC / 2 Equipment small flame Test parameter 3 s flame application Specimen E2000 R&M E2000 Group A E2000 Group B E2000 Group C E2000 Group D E2000 Group E Requirements Self-extinguishing / low smoke emission Results E2000 R&M The R&M connector does not burn and does not produce any smoke The R&M adapter made of the same material has the same properties C.Compare Development & Test Laboratory page 41 / 43

42 Group A The Group A burn slightly and produce very shortly a white smoke Group B The Group B burn shortly and melt Group C The Group C burn shortly and produce a dense white smoke C.Compare Development & Test Laboratory page 42 / 43

43 Group D The Group D is self-extinguishing, however produce a terrible smell. Absolutely not recommended for indoor installation Group E Group E burns shortly, the start melting and produce a terrible smell Absolutely not recommended for indoor installation Conclusions of flammability test Some manufacturers use unknown material which can be dangerous for the safety of the infrastructure and above all for the human being. Unfortunately an exact analysis of the materials and of the gas produced by burning these samples is costly. Simply the smoke produced in case of a large sized installation can be dramatic. The smell that we detected was awful, in a large scale it could be harmful, toxic. In case the material is not self-extinguishing, the results of a fire accident are totally unpredictable. C.Compare Development & Test Laboratory page 43 / 43