RECONSTRUCTION OF ORIGINAL INTENSITY FROM COVERED SAMPLES
|
|
- Brittany Kennedy
- 5 years ago
- Views:
Transcription
1 RECONSTRUCTION OF ORIGINAL INTENSITY FROM COVERED SAMPLES 163 R.I. Barabash, T.R. Watkins, R.A. Meisner, T.D. Burchell, T.M. Rosseel Oak Ridge National Laboratory, Oak Ridge TN 37831, USA ABSTRACT The characterization of the surface of activated samples with x-rays often necessitates a thin film covering for containment to eliminate any potential for contamination of equipment. While candidate covering films appear visually transparent, they are not necessarily x-ray transparent. Each film material has unique beam attenuation. Further amorphous peaks can be superimposed onto those from the sample. To reconstruct the scattering of only the underlying activated sample alone, the effect of x-ray attenuation and signal due to the film need to be removed from that of the sample. This requires the calculation of unique attenuation parameters for the covering film. The development of a reconstruction procedure for a contained/covered samples is described for -2 scans and applied to pole figures. Key words: diffraction, pole figures, absorption, attenuation, reconstruction
2 This document was presented at the Denver X-ray Conference (DXC) on Applications of X-ray Analysis. Sponsored by the International Centre for Diffraction Data (ICDD). This document is provided by ICDD in cooperation with the authors and presenters of the DXC for the express purpose of educating the scientific community. All copyrights for the document are retained by ICDD. Usage is restricted for the purposes of education and scientific research. DXC Website ICDD Website -
3 INTRODUCTION 164 Diffraction measurements of activated samples often require a sealed container for the sample or an encapsulating covering around the sample to avoid particulate contamination of the instruments and people. The problem with such diffraction measurements is that the intensity of the sample is inhomogeneously attenuated by the covering film due to the changing angle of x- ray incidence and that the film often contributes to the diffraction pattern. To reconstruct the intensity of the contained activated sample alone, the contribution from the film should be calculated, and the sample diffraction intensity should be recovered from the total or observed intensity. A reconstruction procedure developed for covered samples is described below. EXPERIMENTAL A. MEASUREMENT METHODS AND DATA PROCESSING Measurements were performed in Bragg-Brentano symmetric geometry. Continuous - 2 scans were collected from 5 to 90 2 at a rate of 0.5 /min. Pole figures were also collected with continuous azimuthal/phi,, rotation of 100 /min, recorded at 5 intervals and at 5 chi tilts from 0 to 70 (Fig. 1). All scans were taken on a 4-axis ( ) Scintag PTS goniometer (Krause and Haase, 1986) using CoK radiation ( = Å) at 40 kv, 36 ma and a Scintag liquid N 2 -cooled Ge detector. The incident beam was collimated using 1.7 Soller slits and a 1.5mm diameter pinhole collimator, and the diffracted beam was collimated with a 0.25 radial divergence limiting (RDL) Soller slits. Specimen alignment was accomplished using a dial gauge probe accurate to ±5 µm.
4 165 Figure 1. Sketch of the goniometer geometry and definitions of chi and phi angles. B. ENCAPSULATING FILMS Four different encapsulating films were examined: mylar (1), tape plus kapton (2), polyethylenelinear low density (LLDPE; re-sealable zipper storage bag) (3) or kapton (4). A comparison of diffraction patterns obtained from the plain polycrystalline silicon standard disk uncovered and covered by each one of the above materials is shown in Fig. 2. A visible difference is apparent in both background and attenuation of the silicon peaks from each film. For three of the films, additional peaks appear. Consequently, kapton was chosen for further evaluation due to the smaller change in background, minimal attenuation of the silicon peaks and no additional diffraction peaks.
5 166 Figure 2. XRD patterns of a standard silicon disk covered with mylar (5), Tape plus kapton (4), LLDPE (re-sealable zipper storage bag) (3), kapton film (2) along with the bare or uncovered polycrystalline silicon standard disk (1). C. SAMPLES Graphite samples for the advanced gas-cooled reactor moderator were measured with and without a kapton film. The kapton film thickness was ~ 30µm. RESULTS AND DISCUSSION A. MAIN EQUATIONS To recover the intensity, I, diffracted from the covered sample, the contribution of the kapton film is calculated. A sketch of the beam path of the diffracted radiation (Fig. 3) illustrates that the
6 To 167 be clear, since the angle of incidence changes with both -2 scans and pole figures, the intensity of the sample is inhomogeneously attenuated by the covering film. Attenuation of the film can be calculated using the attenuation law (Cowley, 1995; Warren, 1969):, (1) where is the intensity of the incident beam, µ is the mass absorption coefficient of the kapton film, and l (or L as in Fig. 3) is the total length of the beam path within the kapton film. This equation can be re-written as follows:, (2) where is incident angle, an X is a film thickness (Fig. 3). For measuring single crystals or for texture measurements, the dependence of on and was taken into account as follows:, (3) where = 0 when the surface normal is in the diffraction plane of the goniometer. The dependence of on and is further illustrated in Table I. B. CALCULATION OF THE ABSORPTION COEFFICIENT OF THE FILM Absorption coefficient can be exactly evaluated using the following equation (Brennan and Cowan, 1992; Chantler, 1995; Elam et al., 2002; Henke et al., 1993; Hubbell, 1982): =, (4)
7 168 Figure 3. Schematic of the X-ray paths diffracted from the graphite sample covered with kapton film. Table I. Dependence of alpha, the angle of incidence, on omega and chi. omega ( ) chi ( ) alpha ( ) omega ( ) chi ( ) alpha ( )
8 where,, and are is the mass density of the material as a whole, the mass fraction, and 169 mass absorption coefficient of the i th element, respectively. The chemical formula of kapton is C 22 H 10 N 2 O 5. The following parameters were chosen for the elemental composition of the film (see Chantler, 1995; Henke et al., 1993; McMaster et al., 1969): O =2.106; C =0.881; N =1.386; H =0.397; =80/M; =264/M; =28/M; =10/M; and M=382 g/mol, the molecular weight of the compound. For example, with these parameters the absorption coefficient for kapton is equal to m -1 at 14 kev for the synchrotron radiation. Absorption further depends on the radiation energy or wavelength and on the incident angle of the beam relative to the sample surface, (Eq. 2 and Fig. 3). Mass absorption coefficient is equal to , and m -1 for Cu, Co and Cr k radiations, respectively. The comparison of the intensity attenuation of kapton, namely the ratio between the diffracted intensity from the covered sample, I, to the intensity of the sample without cover,,, is shown in Fig. 4 for three different wavelengths of incident radiation from Cu, Co, Cr targets in a broad range of incident angles. C. APPLICATION OF RECONSTRUCTION - s (Fig. 5) and pole figures. The - blue and green from the covered and uncovered graphite samples correspondingly (Fig. 5). The reconstructed original intensity for covered sample is shown in red color. Complete diffraction pattern is shown in the Fig.5a. Dashed rectangles mark the part of the pattern around reflection (002) (Fig.5b) and around (100),
9 170 Figure 4. Comparison of attenuation of kapton for different wavelengths as a function of incidence angle.
10 Figure 5. (a) Experimentally measured ߠ ʹߠ scan for covered (blue) and uncovered (green) graphite samples; (b) Enlarged (002) reflection region; (c) Enlarged region of the scan with (100), (101) and (004) reflections. 1- Experimentally measured ߠ ʹߠ scan with cover (blue); 2for uncovered (green) graphite sample; 3- reconstructed from covered sample (red). 171
11 (101) and (004) reflections (Fig. 5b). The attenuation is larger for small incidence angles, =, as 172 it increases with the length of the X-ray beam path in the film. At the same time, the maxima positions remain the same. To reconstruct a pole figure, the absorption of the intensity due to the film was first calculated. The ratio for the pole figure is shown in Fig. 6, which demonstrates that the attenuation over the pole figure differs for large and small angles of incidence. Hence, the pole figure will be distorted by the kapton film. An example of the reconstruction of the experimental pole figure is shown in Fig. 7. Here, the sample was measured with and without kapton film and compared to the reconstructed intensity. The numbers near the isointensity contours (shown by thin black lines) mark relative values of the intensity. It is visible that kapton film reduces the intensity by almost twice for certain contours. After reconstruction the intensity values are recovered (Compare Figs. 7 b and c). SUMMARY A reconstruction formula was developed to determine the intensities of both -2 scans and pole figures by accounting for a semi-transparent x-ray covering. Specifically, absorption of diffracted radiation from a kapton film covering a graphite sample was removed. The covering was needed to prevent contamination from an activated sample. The reconstruction depends upon the thickness of the film, wavelength and incidence angle. While the reconstruction does not change the maximum position, it does change the background and the relative intensities with the shallow angles of incidence needing the most correction.
12 173 Figure 6. A pole figure showing the calculated attenuation of the (002) graphite reflec intensity by a 30 m thick kapton film as a function of the angle of incidence. Figure 7. Comparison of the (002) graphite pole figures: intensity diffracted from the graphite sample without kapton film (a), covered with kapton film (b), and (b) reconstructed using experimental intensity from the covered sample and the approach in section III (removing the influence of kapton attenuation) (c).
13 174 ACKNOWLEDGEMENT This research was performed at the Oak Ridge National Laboratory (ORNL) and sponsored by EDF-Energy Nuclear Generation, Ltd under the Work-for-Others Program, project number NFE , with the U.S. Department of Energy under contract with UT-Battelle, LLC. REFERENCES Brennan, S. and Cowan, P. L. (1992). of programs for calculating x-ray absorption, reflection, and diffraction performance for a variety of materials at arbitrary wavelengths, Rev. Sci. Instrum. 63, Chantler, C. T. (1995). Theoretical form factor, attenuation, and scattering tabulation for Z=1-92 from E=1-1- ev to E= MeV, J. Phys. Chem. Ref. Data 24, Cowley J. M. (1995). Diffraction Physics (Elsevier, Amsterdam), 3 rd ed. Elam, W. T., Ravel, B., and Sieber, J. R. (2002). -ray Radiat. Phys. Chem. 63, Henke, B. L., Gullikson, E. M., and Davis, J. C. (1993). X-ray interactions photoabsorption, scattering, transmission and reflection at E=50-30,000 ev, Z=1-92, Atomic Data and Nuclear Data Tables 54, Hubbell, J. H. (1982). Photon Mass Attenuation and Energy-Absorption Coefficients from 1 kev to 20 MeV, Int. J. Appl. Radiat. Isot. 33,
14 Krause, H. and Haase, A. (1986). X-ray diffraction system PTS for powder, texture and stress 175 analysis, in Experimental Techniques of Texture Analysis, edited by H. J. Bunge (DGM ) pp McMaster, W. H., Kerr Del Grande, N., Mallett, J. H., and Hubbell, J. H. (1969). Compilation of X-ray Cross Sections Section IV (Report UCRL Sec. IV). Lawrence Radiation Laboratory, University of California, Livermore. Warren, B. E. (1969). X-ray Diffraction (Addison-Wesley, Reading, MA).
X-ray Diffraction and Vibrational Spectroscopy of Catalysts for Exhaust Aftertreatment
Copyright (c)jcpds-international Centre for Diffraction Data 2002, Advances in X-ray Analysis, Volume 45. 139 X-ray Diffraction and Vibrational Spectroscopy of Catalysts for Exhaust Aftertreatment Roger
More informationLECTURE 7. Dr. Teresa D. Golden University of North Texas Department of Chemistry
LECTURE 7 Dr. Teresa D. Golden University of North Texas Department of Chemistry Diffraction Methods Powder Method For powders, the crystal is reduced to a very fine powder or microscopic grains. The sample,
More informationPhilips Analytical, Lelyweg 1, 7602 EA Almelo, The Netherlands
Copyright(c)JCPDS-International Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol.44 284 MICRO-DIFFRACTION WITH MONO-CAPILLARIES M.J. Fransen, J.H.A. Vasterink and J. te Nijenhuis Philips
More informationSYSTEMATIC ERRORS IN LINEAR PSD BASED HTXRD SYSTEMS
Copyright(c)JCPDS-International Centre for Diffraction Data 2,Advances in X-ray Analysis,Vol.43 267 SYSTEMATIC ERRORS IN LINEAR PSD BASED HTXRD SYSTEMS E.A. Payzant and W.S. Harrison, III * Metals and
More informationF. J. Cadieu*, I. Vander, Y. Rong, and R. W. Zuneska, Physics Department, Queens College of CUNY, Flushing, NY
Copyright JCPDS-International Centre for Diffraction Data 2012 ISSN 1097-0002 1 X-Ray Measurements of Nanometer Thick Ta x O 1-x and Hf x O 1-x Films on Silicon Substrates for Thickness and Composition
More informationThis lecture is part of the Basic XRD Course.
This lecture is part of the Basic XRD Course. Basic XRD Course 1 A perfect polycrystalline sample should contain a large number of crystallites. Ideally, we should always be able to find a set of crystallites
More informationCopyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume
Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 240 SIMULTANEOUS MEASUREMENTS OF X-RAY DIFFRACTION (XRD) AND DIFFERENTIAL SCANNING CALORIMETRY (DSC)
More informationPARALLEL BEAM METHODS IN POWDER DIFFRACTION AND TEXTURE IN THE LABORATORY.
Copyright(c)JCPDS-International Centre for Diffraction Data 2000,Advances in X-ray Analysis,Vol.43 135 PARALLEL BEAM METHODS IN POWDER DIFFRACTION AND TEXTURE IN THE LABORATORY. R.A. Clapp and M.Halleti
More informationX-ray diffraction
2.2.3.- X-ray diffraction 2.2.3.1.- Origins and fundamentals of the technique The first experimental evidence concerning x-ray diffraction was given by Max von Laue who in 1912 demonstrated that x-rays
More informationIN SITU STRUCTURAL ANALYSIS OF BPDA-PPD POLYIMIDE THIN FILM USING TWO-DIMENSITIONAL GRAZING INCIDENCE X-RAY DIFFRACTION
IN SITU STRUCTURAL ANALYSIS OF BPDA-PPD POLYIMIDE THIN FILM USING TWO-DIMENSITIONAL GRAZING INCIDENCE X-RAY DIFFRACTION 150 J. Kikuma, 1 T. Nayuki, 1 T. Ishikawa, 1 G. Asano, 2 and S. Matsuno 1 1 Analysis
More informationMEASUREMENT AND ANALYSIS OF RESIDUAL STRESS IN ε- PHASE IRON NITRIDE LAYERS AS A FUNCTION OF DEPTH
Copyright(c)JCPDS-International Centre for Diffraction Data 2,Advances in X-ray Analysis,Vol.43 31 MEASUREMET AD AALYSIS OF RESIDUAL STRESS I ε- PHASE IRO ITRIDE LAYERS AS A FUCTIO OF DEPTH Thomas R. Watkins,
More informationBragg diffraction using a 100ps 17.5 kev x-ray backlighter and the Bragg Diffraction Imager
LLNL-CONF-436071 Bragg diffraction using a 100ps 17.5 kev x-ray backlighter and the Bragg Diffraction Imager B. R. Maddox, H. Park, J. Hawreliak, A. Comley, A. Elsholz, R. Van Maren, B. A. Remington, J.
More informationStrain. Two types of stresses: Usually:
Stress and Texture Strain Two types of stresses: microstresses vary from one grain to another on a microscopic scale. macrostresses stress is uniform over large distances. Usually: macrostrain is uniform
More informationStress Mitigation of X-ray Beamline Monochromators using a Topography Test Unit
128 Stress Mitigation of X-ray Beamline Monochromators using a Topography Test Unit J. Maj 1, G. Waldschmidt 1 and A. Macrander 1, I. Koshelev 2, R. Huang 2, L. Maj 3, A. Maj 4 1 Argonne National Laboratory,
More informationAN INNOVATED LABORATORY XAFS APPARATUS
Copyright (c)jcpds-international Centre for Diffraction Data 2002, Advances in X-ray Analysis, Volume 45. 397 AN INNOVATED LABORATORY XAFS APPARATUS TAGUCHI Takeyoshi XRD Division, Rigaku Corporation HARADA
More informationCHARACTERIZATION OF X-RAY DIFFRACTION SYSTEM WITH A MICROFOCUS X-RAY SOURCE AND A POLYCAPILLARY
Copyright(c)JCPDS-International Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol.44 278 CHARACTERIZATION OF X-RAY DIFFRACTION SYSTEM WITH A MICROFOCUS X-RAY SOURCE AND A POLYCAPILLARY OPTIC
More informationRESIDUAL STRESS MEASUREMENTS OF CAST ALUMINUM ENGINE BLOCKS USING DIFFRACTION
Copyright JCPDS - International Centre for Diffraction Data 2005, Advances in X-ray Analysis, Volume 48. 136 RESIDUAL STRESS MEASUREMENTS OF CAST ALUMINUM ENGINE BLOCKS USING DIFFRACTION D.J. Wiesner a,
More informationDi rect beam J' / o 20, " - l To tally reftected. 20, X Scan / "-
THE RIGAKU JOURNAL VOl. 8 / NO. 1 / 1991 Technical Note THIN FILM X-RAY DIFFRACTOMETRY H. ARAKI Rigaku Corporation. Tokvo. Japan 1. Introduction X-ray diffraction methods have been very popular in recent
More informationIdentification of Crystal Structure and Lattice Parameter. for Metal Powders Using X-ray Diffraction. Eman Mousa Alhajji
Identification of Crystal Structure and Lattice Parameter for Metal Powders Using X-ray Diffraction Eman Mousa Alhajji North Carolina State University Department of Materials Science and Engineering MSE
More informationPhysical structure of matter. Monochromatization of molybdenum X-rays X-ray Physics. What you need:
X-ray Physics Physical structure of matter Monochromatization of molybdenum X-rays What you can learn about Bremsstrahlung Characteristic radiation Energy levels Absorption Absorption edges Interference
More informationCharacterization of Surfaces and Thin Films Using a High Performance Grazing Incidence X-ray Diffractometer
Copyright(c)JCPDS-International Centre for Diffraction Data 2000,Advances in X-ray Analysis,Vol.43 177 Characterization of Surfaces and Thin Films Using a High Performance Grazing Incidence X-ray Diffractometer
More informationTHE ANALYSIS OF STRESS DISTRIBUTION BASED ON MEASUREMENTS USING TWO METHODS OF X-RAY APPLICATION
182 THE ANALYSIS OF STRESS DISTRIBUTION BASED ON MEASUREMENTS USING TWO METHODS OF X-RAY APPLICATION ABSTRACT Barbara Kucharska Institute of Materials Engineering, Czestochowa University of Technology,
More informationCURVATURE MEASUREMENTS OF STRESSED SURFACE-ACOUSTIC- WAVE FILTERS USING BRAGG ANGLE CONTOUR MAPPING
86 CURVATURE MEASUREMENTS OF STRESSED SURFACE-ACOUSTIC- WAVE FILTERS USING BRAGG ANGLE CONTOUR MAPPING ABSTRACT Paul M. Adams The Aerospace Corporation Los Angeles, CA 90009 Surface-acoustic-wave (SAW)
More informationInstrument Configuration for Powder Diffraction
Instrument Configuration for Powder Diffraction Advanced X-ray Workshop S.N. Bose National Centre for Basic Sciences, 14-15/12/2011 Innovation with Integrity Overview What is the application? What are
More informationHANDY WAVEGUIDE TXRF SPECTROMETER FOR NANOGRAM SENSITIVITY
213 HANDY WAVEGUIDE TXRF SPECTROMETER FOR NANOGRAM SENSITIVITY Shinsuke Kunimura and Jun Kawai Department of Materials Science and Engineering, Kyoto University, Sakyo-ku, Kyoto 606-8501, Japan ABSTRACT
More informationX-Ray Analytical Methods
X-Ray Analytical Methods X-rays were discovered by W.C. Röentgen in 1895, and led to three major uses: X-ray radiography is used for creating images of light-opaque materials relies on the relationship
More informationCOMPARISON OF TEXTURE IN COPPER AND ALUMINUM THIN FILMS DETERMINED BY XRD AND EBSD *
COMPARISON OF TEXTURE IN COPPER AND ALUMINUM THIN FILMS DETERMINED BY XRD AND EBSD * 201 J. Müller 1, D. Balzar 1,2, R.H. Geiss 1, D.T. Read 1, and R.R. Keller 1 1 Materials Reliability Division, National
More informationLesson 1 Good Diffraction Data
Lesson 1 Good Diffraction Data Nicola Döbelin RMS Foundation, Bettlach, Switzerland Digital Diffractometers Transmission Geometry Debye-Scherrer Geometry Reflective Geometry Bragg-Brentano Geometry Glass
More informationPrecision Without Compromise
D1 EVOLUTION Precision Without Compromise Versatile and user-friendly high resolution and multipurpose X-ray diffractometer for the characterization of advanced materials www.jvsemi.com D1 Overview Introduction
More informationENERGY-DISPERSIVE X-RAY FLUORESCENCE ANALYSIS OF MONO- AND POLYCRYSTALS OF SELENIDE SPINELS BY FUNDAMENTAL PARAMETER METHOD
322 ENERGY-DISPERSIVE X-RAY FLUORESCENCE ANALYSIS OF MONO- AND POLYCRYSTALS OF SELENIDE SPINELS BY FUNDAMENTAL PARAMETER METHOD ABSTRACT Rafa Sitko, Beata Zawisza, Ewa Malicka Institute of Chemistry, Silesian
More informationREEL-TO-REEL TEXTURE ANALYSIS OF HTS COATED CONDUCTORS USING A MODIFIED GADDS SYSTEM
Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 163 REEL-TO-REEL TEXTURE ANALYSIS OF HTS COATED CONDUCTORS USING A MODIFIED GADDS SYSTEM J.L. Reeves
More informationAN IN SITU HIGH-TEMPERATURE X-RAY DIFFRACTION STUDY OF PHASE TRANSFORMATIONS IN SILVER BEHENATE
Copyright JCPDS - International Centre for Diffraction Data 2005, Advances in X-ray Analysis, Volume 48. 27 AN IN SITU HIGH-TEMPERATURE X-RAY DIFFRACTION STUDY OF PHASE TRANSFORMATIONS IN SILVER BEHENATE
More informationGRAZING INCIDENCE X-RAY DIFFRACTION CHARACTERIZATION OF CORROSION DEPOSITS INDUCED BY CARBON DIOXIDE ON MILD STEEL
Copyright(c)JCPDS-International Centre for Diffraction Data 2000,Advances in X-ray Analysis,Vol.43 319 GRAZING INCIDENCE X-RAY DIFFRACTION CHARACTERIZATION OF CORROSION DEPOSITS INDUCED BY CARBON DIOXIDE
More informationInfluence of Bulk Graphite Thickness on the Accuracy of X-Ray Diffraction Measurement. I. Introduction
Influence of Bulk Graphite Thickness on the Accuracy of X-Ray Diffraction Measurement Jane Y. Howe 1*, Burl O. Cavin 1, Amy E. Drakeford 2, Roberta A. Peascoe 1, Tracy L. Zontek 2, and Douglas J. Miller
More informationFundamentals of X-ray diffraction and scattering
Fundamentals of X-ray diffraction and scattering Don Savage dsavage@wisc.edu 1231 Engineering Research Building (608) 263-0831 X-ray diffraction and X-ray scattering Involves the elastic scattering of
More informationX-RAY DIFFRACTION CHARACTERIZATION OF MOVPE ZnSe FILMS DEPOSITED ON (100) GaAs USING CONVENTIONAL AND HIGH- RESOLUTION DIFFRACTOMETERS
77 X-RAY DIFFRACTION CHARACTERIZATION OF MOVPE ZnSe FILMS DEPOSITED ON (100) GaAs USING CONVENTIONAL AND HIGH- RESOLUTION DIFFRACTOMETERS T.N. Blanton 1), C.L. Barnes 1), M. Holland 1), K.B. Kahen 1),
More informationOPTIMIZING XRD DATA. By: Matthew Rayner
OPTIMIZING XRD DATA By: Matthew Rayner 1 XRD Applications PANalytical classifies XRD applications in 4 groups 1. Powders 2. Nanomaterials 3. Solid objects 4. Thin films Many day-to-day samples cross these
More informationSmithsonian Museum Conservation Institute
Smithsonian Museum Conservation Institute XRD Analysis of the Corrosion Products from a Tlingit Copper Rattle MCI#6241 Object: Tlingit Stikine Rattle Owner/Custodian: National Museum of the American Indian
More informationZINC/IRON PHASE TRANSFORMATION STUDIES ON GALVANNEALED STEEL COATINGS BY X-RAY DIFFRACTION
Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 291 ZINC/IRON PHASE TRANSFORMATION STUDIES ON GALVANNEALED STEEL COATINGS BY X-RAY DIFFRACTION S.
More informationX-RAY DIFFRACTION STUDY ON HIGHLY ORDERED MESOSTRUCTURED THIN FILMS
Copyright (c)jcpds-international Centre for Diffraction Data 22, Advances in X-ray Analysis, Volume 45. 359 X-RAY DIFFRACTION STUDY ON HIGHLY ORDERED MESOSTRUCTURED THIN FILMS T. Noma a, H. Miyata a, K.
More informationATTACHMENTES FOR EXPLORER DIFFRACTOMETER. Monochromators
Monochromators Secondary flat and curved graphite monochromators suitable for Ag, Cr, Fe, Cu, Co and Mo radiations This attachment is installed in the X-ray detection unit. It is designed to remove continuous
More informationCrystal structure analysis of spherical silicon using X-ray pole figure
Solid State Phenomena Vol. 9 (00) pp 9-56 (00) Trans Tech Publications, Switzerland doi:0.08/www.scientific.net/ssp.9.9 Tel.No.:+8-77-56-98 FaxNo.:+8-77-56-98 e-mail: ro00986@se.ritsumei.ac.jp Crystal
More informationQuantitative phase analysis using the Rietveld method for samples in the Ti-Cr binary systems
586 Quantitative phase analysis using the Rietveld method for samples in the Ti-Cr binary systems Ofer Beeri and Giora Kimmel Nuclear Research Center Negev, P.O.Box 9001, Beer-Sheva, 84190 Israel Abstract
More informationLesson 1 X-rays & Diffraction
Lesson 1 X-rays & Diffraction Nicola Döbelin RMS Foundation, Bettlach, Switzerland February 11 14, 2013, Riga, Latvia Electromagnetic Spectrum X rays: Wavelength λ: 0.01 10 nm Energy: 100 ev 100 kev Interatomic
More informationLesson 3 Sample Preparation
Lesson 3 Sample Preparation Nicola Döbelin RMS Foundation, Bettlach, Switzerland January 14 16, 2015, Bern, Switzerland Repetition: Bragg-Brentano Diffractometer Typical Configuration (with Kβ filter)
More informationSingle crystal X-ray diffraction. Zsolt Kovács
Single crystal X-ray diffraction Zsolt Kovács based on the Hungarian version of the Laue lab description which was written by Levente Balogh, Jenő Gubicza and Lehel Zsoldos INTRODUCTION X-ray diffraction
More informationHIGH RESOLUTION TEXTURE ANALYSIS OF THIN BLANKET FILMS AND DISCREET TEST STRUCTURES IN SEMICONDUCTOR DEVICES
Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol.44 314 HIGH RESOLUTION TEXTURE ANALYSIS OF THIN BLANKET FILMS AND DISCREET TEST STRUCTURES IN SEMICONDUCTOR DEVICES K. J. Kozaczek, R. I.
More informationDiffraction: Powder Method
Diffraction: Powder Method Diffraction Methods Diffraction can occur whenever Bragg s law λ = d sin θ is satisfied. With monochromatic x-rays and arbitrary setting of a single crystal in a beam generally
More informationA. KISHI AND H. TORAYA
THE RIGAKU JOURNAL VOL. 21 / NO. 1 / 2004, 25 30 SIMULTANEOUS MEASUREMENTS OF X-RAY DIFFRACTION (XRD) AND DIFFERENTIAL SCANNING CALORIMETRY (DSC) DATA UNDER CONTROLLED HUMIDITY CONDITION: INSTRUMENTATION
More informationINVESTIGATION OF LOCAL TEXTURES IN EXTRUDED MAGNESIUM BY SYNCHROTRON RADIATION
Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 151 INVESTIGATION OF LOCAL TEXTURES IN EXTRUDED MAGNESIUM BY SYNCHROTRON RADIATION Heinz-Günter
More information3D INTERACTIVE DATA LANGUAGE POLE FIGURE VISUALIZATION
111 3D INTERACTIVE DATA LANGUAGE POLE FIGURE VISUALIZATION ABSTRACT Colleen S. Frazer, Mark A. Rodriguez, and Ralph G. Tissot Sandia National Laboratories, Albuquerque, NM 87185-1411 The Interactive Data
More informationHIGH-RESOLUTION PARALLEL-BEAM POWDER DIFFRACTION MEASUREMENT OF SUB-SURFACE DAMAGE IN ALUMINA-SILICON CARBIDE NANOCOMPOSITE
169 HIGH-RESOLUTION PARALLEL-BEAM POWDER DIFFRACTION MEASUREMENT OF SUB-SURFACE DAMAGE IN ALUMINA-SILICON CARBIDE NANOCOMPOSITE B K Tanner, H Z Wu + and S G Roberts * Department of Physics, University
More informationTechnical articles Micro-area X-ray diffraction measurement by SmartLab μ
Technical articles Micro-area X-ray diffraction measurement by SmartLab μhr diffractometer system with ultra-high brilliance microfocus X-ray optics and two-dimensional detector HyPix-3000 Yuji Shiramata*
More informationCopyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol
Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 407 Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42
More informationEarth & Planetary Science Applications of X-Ray Diffraction: Advances Available for Research with our New Systems
Earth & Planetary Science Applications of X-Ray Diffraction: Advances Available for Research with our New Systems James R. Connolly Dept. of Earth & Planetary Sciences University of New Mexico 401/501
More informationDiffraction Basics. The qualitative basics:
The qualitative basics: Diffraction Basics Coherent scattering around atomic scattering centers occurs when x-rays interact with material In materials with a crystalline structure, x-rays scattered in
More informationThe object of this experiment is to test the de Broglie relationship for matter waves,
Experiment #58 Electron Diffraction References Most first year texts discuss optical diffraction from gratings, Bragg s law for x-rays and electrons and the de Broglie relation. There are many appropriate
More informationThin Film Scattering: Epitaxial Layers
Thin Film Scattering: Epitaxial Layers 6th Annual SSRL Workshop on Synchrotron X-ray Scattering Techniques in Materials and Environmental Sciences: Theory and Application May 29-31, 2012 Thin films. Epitaxial
More informationDETERMINING OPERATING LIFETIME OF LANDING WHEEL HUBS WITH PRD PORTABLE DIFFRACTOMETER
Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 345 DETERMINING OPERATING LIFETIME OF LANDING WHEEL HUBS WITH PRD PORTABLE DIFFRACTOMETER A.V. Lutzau
More informationMEASUREMENT OF RESIDUAL PHASE STRESS OF THE METAL, MATRIX COMPOSITE MATERIAL USING SYNCHROTRON RADIATION
Copyright(c)JCPDS-International Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol.44 215 MEASUREMENT OF RESIDUAL PHASE STRESS OF THE METAL, MATRIX COMPOSITE MATERIAL USING SYNCHROTRON RADIATION
More informationTowards the Epitaxial Growth of Silver on Germanium by Galvanic Displacement
Electronic Supplementary Material (ESI) for CrystEngComm. This journal is The Royal Society of Chemistry 2014 Towards the Epitaxial Growth of Silver on Germanium by Galvanic Displacement Sayed Youssef
More informationMICROSTRUCTURE OF THE PLASTIC BONDED EXPLOSIVE KS32
Copyright JCPDS-International Centre for Diffraction Data 2012 ISSN 1097-0002 65 MICROSTRUCTURE OF THE PLASTIC BONDED EXPLOSIVE KS32 M. Herrmann 1, P. B. Kempa 1, U. Förter-Barth 1, W. Arnold 2 1 Fraunhofer
More informationAPPLICATION OF A PORTABLE TXRF SPECTROMETER TO DETERMINE TRACE AMOUNTS OF TOXIC ELEMENTS
18 APPLICATION OF A PORTABLE TXRF SPECTROMETER TO DETERMINE TRACE AMOUNTS OF TOXIC ELEMENTS Shinsuke Kunimura 1 and Jun Kawai 2 1 Materials Fabrication Laboratory, RIKEN (The Institute of Physical and
More informationANALYSIS OF THE SURFACE MORPHOLOGY OF CVD-GROWN DIAMOND FILMS WITH X-RAY DIFFRACTION
Copyright JCPDS - International Centre for Diffraction Data 23, Advances in X-ray Analysis, Volume 46. 185 ANALYSIS OF THE SURFACE MORPHOLOGY OF CVD-GROWN DIAMOND FILMS WITH X-RAY DIFFRACTION M.J. Fransen
More informationATTACHMENTES FOR APD 2000 PRO POWDER X-RAY DIFFRACTOMETER. Monochromators
Monochromators Secondary graphite monochromator Johansson Ka 1 monochromator Parabolic monochromator Secondary flat and curved graphite monochromators suitable for Ag, Cr, Fe, Cu, Co and Mo radiations
More informationDefect depth profiling of CdZnTe using high-energy diffraction measurements
Defect depth profiling of CdZnTe using high-energy diffraction measurements M.S. Goorsky, a H. Yoon, a M. Ohler, b K. Liss b a Department of Materials Science and Engineering University of California,
More informationBackground Statement for SEMI Draft Document 5945 New Standard: Test Method for Determining Orientation of A Sapphire Single Crystal
Background Statement for SEMI Draft Document 5945 New Standard: Test Method for Determining Orientation of A Sapphire Single Crystal Notice: This background statement is not part of the balloted item.
More informationTEXTURE DETERMINATION IN HIGHLY STRESSED PVD THIN FILMS
Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 492 Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42
More informationAPPLICATIONS OF X-RAY STRESS MEASUREMENT FOR INTERFACE AREA OF Ni 3 Al SYSTEM INTERMETALLIC COMPOUND COATING
Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 385 APPLICATIONS OF X-RAY STRESS MEASUREMENT FOR INTERFACE AREA OF Ni 3 Al SYSTEM INTERMETALLIC
More informationMETHODS FOR MOUNTING RADIOACTIVE POWDERS FOR XRD ANALYSIS
54 METHODS FOR MOUNTING RADIOACTIVE POWDERS FOR XRD ANALYSIS Leah N. Squires, Robert D. Mariani, Thomas Hartmann* and J. Rory Kennedy Idaho National Laboratory, Fuel Fabrication and Characterization Department,
More informationStructure of crystallographically challenged hydrogen storage materials using the atomic pair distribution function analysis
Structure of crystallographically challenged hydrogen storage materials using the atomic pair distribution function analysis H. Kim, 1 K. Sakaki, 1 K. Asano, 1 M. Yamauchi, 2 A. Machida, 3 T. Watanuki,
More informationPractical X-Ray Diffraction
Typical Example Practical X-Ray Diffraction White powder sample of NaCl,KCl,KNO 3 (trace of H 2 O) Département de chimie Université Laval Prof. Josée BRISSON Dr. Wenhua BI 2014-03-20 Powder X-Ray Diffraction
More informationMore Thin Film X-ray Scattering and X-ray Reflectivity
Stanford Synchrotron Radiation Laboratory More Thin Film X-ray Scattering and X-ray Reflectivity Mike Toney, SSRL 1. Introduction (real space reciprocal space) 2. Polycrystalline film (no texture) RuPt
More informationEXPERIMENTAL STUDY OF X-RAY ENERGY SPECTRUM FORMED BY PLANAR WAVEGUIDE-RESONATOR WITH SPECIFIC ELEMENT COMPOSITION REFLECTORS
EXPERIMENTAL STUDY OF X-RAY ENERGY SPECTRUM FORMED BY PLANAR WAVEGUIDE-RESONATOR WITH SPECIFIC ELEMENT COMPOSITION REFLECTORS V.K. Egorov, E.V. Egorov IMT RAS, Chemogolovka, Moscow District, 142432 Russia
More informationMaterials Lab 1(MT344) X-ray Diffractometer Operation and Data Analysis. Instructor: Dr. Xueyan Wu ( 吴雪艳 )
Materials Lab 1(MT344) X-ray Diffractometer Operation and Data Analysis Instructor: Dr. Xueyan Wu ( 吴雪艳 ) Goals To give students a practical introduction into the use of X-ray diffractometer and data collection.
More informationX-RAY DIFFRACTION CHARACTERIZATION OF MULTILAYER EPITAXIAL THIN FILMS DEPOSITED ON (0001) SAPPHIRE
The Rigaku Journal Vol. 13/No. 1/ 1996 CONTRIBUTED PAPERS X-RAY DIFFRACTION CHARACTERIZATION OF MULTILAYER EPITAXIAL THIN FILMS DEPOSITED ON (0001) SAPPHIRE THOMAS N. BLANTON AND LIANG-SUN HUNG Imaging
More informationSpreadsheet Applications for Materials Science
Spreadsheet Applications for Materials Science Introduction to X-ray Powder Diffraction Introduction X-ray powder diffraction is a powerful analytical technique that is widely used in many fields of science
More informationFOCUSING POLYCAPILLARY OPTICS FOR DIFFRACTION
Copyright (c)jcpds-international Centre for Diffraction Data 2002, Advances in X-ray Analysis, Volume 45. 325 FOCUSING POLYCAPILLARY OPTICS FOR DIFFRACTION H. Huang a, C. A. MacDonald a, W. M. Gibson a,b,
More informationMultiple film plane diagnostic for shocked lattice measurements invited
REVIEW OF SCIENTIFIC INSTRUMENTS VOLUME 74, NUMBER 3 MARCH 2003 Multiple film plane diagnostic for shocked lattice measurements invited Daniel H. Kalantar, a) E. Bringa, M. Caturla, J. Colvin, K. T. Lorenz,
More informationCopyright JCPDS-International Centre for Diffraction Data 2006 ISSN Advances in X-ray Analysis, Volume 49
POWDER X-RAY DIFFRACTION DETECTION OF CRYSTALLINE PHASES IN AMORPHOUS PHARMACEUTICALS B. A. Sarsfield, 1 M. Davidovich, 1 S. Desikan, 1 M. Fakes, 1 S. Futernik, 1 J. L. Hilden, 1 J. S. Tan, 2 S. Yin 1,
More informationCONTROL OF SPHERICAL OPTICS STRESS BY X-RAY TOPOGRAPHY. Stanislaw Mikula 5,
CONTROL OF SPHERICAL OPTICS STRESS BY X-RAY TOPOGRAPHY Richard Vitt 1, Jozef Maj 1, Szczesny Krasnicki 2, Lec Maj 3, Gary Navrotski 1, Paul Chow 4, 59 Stanislaw Mikula 5, 1 Argonne National Laboratory,
More informationCHANGES IN ELASTIC-STRAIN PROFILES AROUND A CRACK TIP DURING TENSILE LOADING AND UNLOADING CYCLES
Copyright JCPDS - International Centre for Diffraction Data 25, Advances in X-ray Analysis, Volume 48. 117 CHANGES IN ELASTIC-STRAIN PROFILES AROUND A CRACK TIP DURING TENSILE LOADING AND UNLOADING CYCLES
More informationCRYSTAL STRUCTURE DETERMINATION OF PHARMACEUTICALS WITH ELECTRON DIFFRACTION
CRYSTAL STRUCTURE DETERMINATION OF PHARMACEUTICALS WITH ELECTRON DIFFRACTION Dr. Partha Pratim Das Application Specialist, NanoMEGAS SPRL, Belgium pharma@nanomegas.com www.nanomegas.com This document was
More informationThis manuscript has been authored by UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy.
1 This manuscript has been authored by UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy. The United States Government retains and the publisher, by accepting the
More informationRESIDUAL STRAIN MEASUREMENT IN THERMAL BARRIER COATINGS. Thomas R. Watkins, Scott P. Beckman and Camden R. Hubbard
RESIDUAL STRAIN MEASUREMENT IN THERMAL BARRIER COATINGS Thomas R. Watkins, Scott P. Beckman and Camden R. Hubbard Oak Ridge National Laboratory P.O. Box 2008 Oak Ridge, TN 3783 l-6064 ABSTRACT The residual
More informationPossibilities and limitations of X-ray diffraction using high-energy X-rays on a laboratory system
Z. Kristallogr. Suppl. 30 (2009) 163-169 / DOI 10.1524/zksu.2009.0023 163 by Oldenbourg Wissenschaftsverlag, München Possibilities and limitations of X-ray diffraction using high-energy X-rays on a laboratory
More informationChapter 3 Basic Crystallography and Electron Diffraction from Crystals. Lecture 9. Chapter 3 CHEM Fall, L. Ma
Chapter 3 Basic Crystallography and Electron Diffraction from Crystals Lecture 9 Outline The geometry of electron diffraction Crystallography Kinetic Theory of Electron diffraction Diffraction from crystals
More informationXRD AND XAFS STUDIES OF CARBON SUPPORTED Pt-Ru ELECTROCATALYST IN A POLYMER-ELECTROLYTE-FUEL-CELL
Copyright JCPDS - International Centre for Diffraction Data 4, Advances in X-ray Analysis, Volume 47. 56 XRD AND XAFS STUDIES OF CARBON SUPPORTED Pt-Ru ELECTROCATALYST IN A POLYMER-ELECTROLYTE-FUEL-CELL
More informationGRAZING INCIDENCE X-RAY DIFFRACTION (HTGIXRD) Mark A. Rodriguez and Ralph G. Tissot, Sandia National Laboratories Albuquerque, NM
IN SITU THIN FILM CRYSTALLIZATION STUDIES USING HIGH TEMPERATURE GRAZING INCIDENCE X-RAY DIFFRACTION (HTGIXRD) Mark A. Rodriguez and Ralph G. Tissot, Sandia National Laboratories Albuquerque, NM 87185-1405
More informationANALYSIS OF RESIDUAL STRESS STATES USING DIFFRACTION METHODS w. REIMERS
Vol. 96 (1999) ACTA PHYSICA POLONICA A No. 2 Proceedings of the III Int. School and Symposium on Physics in Materials Science, Jaszowiec '98 ANALYSIS OF RESIDUAL STRESS STATES USING DIFFRACTION METHODS
More informationON-STREAM XRF ANALYSIS OF HEAVY METALS AT PPM CONCENTRATIONS
Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 130 ABSTRACT ON-STREAM XRF ANALYSIS OF HEAVY METALS AT PPM CONCENTRATIONS G Roach and J Tickner
More informationCharacterization of Materials Using X-Ray Diffraction Powder Diffraction
Praktikum III, Fall Term 09 Experiment P1/P2; 23.10.2009 Characterization of Materials Using X-Ray Diffraction Powder Diffraction Authors: Michael Schwarzenberger (michschw@student.ethz.ch) Philippe Knüsel
More informationTEM imaging and diffraction examples
TEM imaging and diffraction examples Duncan Alexander EPFL-CIME 1 Diffraction examples Kikuchi diffraction Epitaxial relationships Polycrystalline samples Amorphous materials Contents Convergent beam electron
More informationCorrelation of Near Surface Morphology of Polypropylene and Paint Adhesion Studied by Grazing Incidence X-Ray Diffraction
Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 646 Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42
More informationAdvanced Methods for Materials Research. Materials Structure Investigations Materials Properties Investigations
Advanced Methods for Materials Research Materials Structure Investigations Materials Properties Investigations Advanced Methods for Materials Research 1. The structure and property of sample and methods
More informationAssessment of Gamma Dose Rate for Hypothetical Radioactive Waste Container
Research Article imedpub Journals http://www.imedpub.com International Journal of Applied Science - Research and Review DOI: 10.21767/2394-9988.100055 Assessment of Gamma Dose Rate for Hypothetical Radioactive
More informationX-Ray Diffraction. Nicola Pinna
X-Ray Diffraction Nicola Pinna Department of Chemistry, CICECO, University of Aveiro, 3810-193 Aveiro, Portugal. School of Chemical and Biological Engineering, College of Engineering, Seoul National University
More informationq-calibration with silver behenate
q-calibration with silver behenate Page 2 of 5 Theory Silver Behenate is one of the most frequently used standards for calibration of the medium to low angle q-range, both at synchrotrons as well as for
More informationDISLOCATION DENSITIES AND CHARACTER EVOLUTION IN COPPER DEFORMED BY ROLLING UNDER LIQUID NITROGEN FROM X-RAY PEAK PROFILE ANALYSIS
Copyright JCPDS - International Centre for Diffraction Data 2005, Advances in X-ray Analysis, Volume 48. 67 DISLOCATION DENSITIES AND CHARACTER EVOLUTION IN COPPER DEFORMED BY ROLLING UNDER LIQUID NITROGEN
More informationChapter 4 Collection of EXAFS data from oxidised and reduced Plastocyanin
36 Chapter 4 Collection of EXAFS data from oxidised and reduced Plastocyanin 4.1 Preferred crystal orientations for collecting polarised EXAFS from poplar Pc Poplar Pc crystallises in the orthorhombic
More information