Lecture 10: MultiUser MEMS Process (MUMPS)

Transcription

1 MEMS: Fabrication Lecture 10: MultiUser MEMS Process (MUMPS) Prasanna S. Gandhi Assistant Professor, Department of Mechanical Engineering, Indian Institute of Technology, Bombay, 1

2 Recap Various VLSI based fabrication processes and details Some design fundamentals Sensors and actuators for MEMS 2

3 Today Pressure sensor: full fabrication animation MUMPS Details of PolyMUMPs process Design rules Ledit software to develop your device by polymumps process Examples of the devices made by polymumps 3

4 Fabrication steps for a piezoresistive gauge or differential, bulk micromachined pressure sensor Metal Insulator n-type epitaxial layer p-type diffusion p-type substrate Silicon nitride Glass 4: Electrochemical 3: Deposit 1: Deposit and etch pattern Insulator of backside material cavity 5: 2: Anodic Diffuse Glass piezoresistors bonding 4

5 Capactive bulk micromachined accelerometer Mass Hinge Silicon 4: Remove second masking layer ; 3: 1: Remove Etch recess first cavities masking in layer; silicon Anisotropic etch silicon 2: Deposit Anisotropic and pattern etch silicon 3 masking layers; Anisotropic etch silicon 5

6 Pressure sensor with diffused piezoresistive sense elements 6

7 Figure 4.7 A miniature silicon fusion bonded absolute pressure sensor. 7

8 MUMPs Process Multi User MEMS process Company MEMSCAP: offers PolyMUMPS, MetalMUMPS, and SOIMUMPS Developed at BSAC (Berkeley Sensors and Actuators Center) in late 80 s We will study PolyMUMPs a 3 level polysilicon micromachining process 8

9 Cleaned Silicon Wafer 9

10 Doping of Phosphorous on silicon wafer Using Standard diffusion furnace using POCL3 as Dopant source Prevent charge feed through to substrate from electrostatic devices on the surface 10

11 Deposition of Silicon Nitride layer of thickness 600nm Using Standard LPCVD (Low Pressure Chemical Vapor deposition) Acts as insulation layer 11

12 Deposition of polysilicon film Thickness 500nm Poly0 layer Using Standard LPCVD (Low Pressure Chemical Vapor deposition) 12

13 Deposition of Photo resist Thickness 500nm Spin Coating method Poly0 layer Photo resist layer 13

14 Mask Masking process Thickness 500nm UV Source and Mask Poly0 layer Photoresist layer 14

15 Mask Masking and Exposure with UV source followed with development of photoresist Thickness 500nm Poly0 layer Photoresist layer 15

16 Etching of poly0 layer Thickness 500nm Reactive Ion Etching (RIE) Poly0 layer After etching photoresist is stripped in solvent bath 16

17 Deposition of PSG (Phosphosilicate Glass) layer Thickness 2 µm Poly0 layer PSG layer (1 st Oxide) LPCVD process is used to deposit PSG (1 st Oxide Layer) layer this is first sacrificial layer 17

18 Lithographic patterning of DIMPLE Depth 750 nm Dimples Poly0 layer PSG layer (1 st Oxide) Wafer is coated with photoresist and second level (DIMPLE) is lithographically patterned. Dimples are reactive ion etched. After etching photoresist is stripped 18

19 Lithographic patterning of ANCHOR1 Dimples Anchor 1 Etch Poly0 layer PSG layer (1 st Oxide) Wafer is coated with photoresist and second level (ANCHOR1) is lithographically patterned. Anchor1 is reactive ion etched. After etching photoresist is stripped 19

20 Deposition of POLY1 Layer along with PSG hard mask PSG Mask Poly0 layer PSG layer (1 st Oxide) Poly1 Layer 20

21 Lithographic patterning of POLY1 layer 2 nd Oxide Layer Poly0 layer PSG layer (1 st Oxide) Poly1 Layer 2 nd Oxide layer Wafers are recoated with photoresist and third level (Poly1) is lithographically patterned. PSG is first etched to create a hard mask and then poly1 is etched by RIE after etching photoresist and PSG mask are removed 21

22 Deposition of 2 nd oxide layer 2 nd Oxide Layer Poly0 layer PSG layer (1 st Oxide) Poly1 Layer 2 nd Oxide layer Second oxide layer 0.75 µm of PSG is deposited on water. This layer is patterned twice to allow contact to both poly1 and substrate layers. 22

23 Lithographic patterning of P1_P2_Via Etch P1-P2 Via Etch P1-P2 Via Etch Poly0 layer PSG layer (1 st Oxide) Poly1 Layer 2 nd Oxide layer Wafer is coated with photoresist and fifth level (POLY1_POL2_VIA) is lithographically patterned. Unwanted second oxide is etched in RIE, stopping on POLY1 and photoresist is stripped 23

24 Lithographic patterning of using ANCHOR2 Etch Anchor 2 Etch Poly0 layer PSG layer (1 st Oxide) Poly1 Layer 2 nd Oxide layer Wafer is coated with photoresist and sixth level (ANCHOR2) is lithographically patterned. Second and first oxide are etched in RIE, stopping on either POLY0 or Nitride and photoresist is stripped 24

25 PSG Mask Deposition of polysilicon and PSG hard mask dopping process Poly0 layer PSG layer (1 st Oxide) Poly1 Layer 2 nd Oxide layer Poly2 Layer A 1.5 µm undoped polysilicon layer is deposited followed by 200 nm PSG hard mask layer. The wafers are annealed at C for one hr and dope the polysilicon and reduce residual stress 25

26 Lithographic patterning of POLY2 Poly0 layer PSG layer (1 st Oxide) Poly1 Layer 2 nd Oxide layer Poly2 Layer Wafer is coated with photoresist and seventh level (POLY2) is lithographically patterned. PSG hard mask and Poly2 layers are etched in RIE, 26

27 Deposition of Metal Layer Metal Layer Poly0 layer PSG layer (1 st Oxide) Poly1 Layer 2 nd Oxide layer Poly2 Layer Metal Layer Wafer is coated with photoresist and eighth level (METAL) is lithographically patterned. Metal (gold with this adhesion layer) is deposited by lift off patterning. 27

28 Releasing a structure Metal Layer Poly0 layer PSG layer (1 st Oxide) Poly1 Layer 2 nd Oxide layer Poly2 Layer Metal Layer The structure are released by immersing the chip in 49 % HF solution. POLY! rotor and POLY2 hub are relesed. 28

29 MUMPs Process Software Ledit for developing your own designs: Demo Some designs in the software How they look like after fabrication!! 29

30 Design I Poly0 Anchor1 Poly1 Poly1-Poly2 via Poly2 Metal 30

31 MUMPs Designs and Products Comb actuators by PolyMUMPS Ackn: University of Colorado, Boulder. Hrishikesh Panchwagh 31

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