Fiber Textures: application to thin film textures

Size: px
Start display at page:

Download "Fiber Textures: application to thin film textures"

Transcription

1 1 Fiber Textures: application to thin film textures , Spring 2008 A. D. (Tony) Rollett Carnegie Mellon MRSEC Acknowledgement: the data for these examples were provided by Ali Gungor; extensive discussions with Ali and his advisor, Prof. K. Barmak are gratefully acknowledged.

2 2 Lecture Objectives Give examples of experimental textures of thin copper films; illustrate the OD representation for a simple case. Explain (some aspects of) a fiber texture. Show how to calculate volume fractions associated with each fiber component from inverse pole figures (from ODF). Explain use of high resolution pole plots, and analysis of results. Discuss the phenomenon of axiotaxy - orientation relationships based on plane-edge matching instead of the usual surface matching. Give examples of the relevance and importance of textures in thin films, such as metallic interconnects, high temperature superconductors and magnetic thin films.

3 3 Summary Thin films often exhibit a surprising degree of texture, even when deposited on an amorphous substrate. The texture observed is, in general, the result of growth competition between different crystallographic directions. In fcc metals, e.g., the 111 direction typically grows fastest, leading to a preference for this axis to be perpendicular to the film plane. Such a texture is known as a fiber texture because only one axis is preferentially aligned whereas the other two are uniformly distributed ( random ). Although vapor-deposited films are the most studied, similar considerations apply to electrodeposited films also, which are important in, e.g., copper interconnects. Especially in electrodeposition, many different fiber textures can be obtained as a function of deposition conditions (current density, chemistry of electrolyte etc., or substrate temperature, deposition rate). Even the crystal structure can vary from the equilibrium one for the conditions. Tantalum is known is known to deposit in a tetragonal form (with a strong 001 fiber) instead of BCC, for example. Thin film texture should be quantified with Orientation Distributions and volume fractions, not by deconvolution of peaks in pole figures, or pole plots. The latter approach may look straightforward (and similar to other types of analysis of x-ray data) but has many pitfalls.

4 4 Example 1: Interconnect Lifetimes Thin (1 µm or less) metallic lines used in microcircuitry to connect one part of a circuit with another. Current densities (~10 6 A.cm -2 ) are very high so that electromigration produces significant mass transport. Failure by void accumulation often associated with grain boundaries

5 5 Inter-Level-Dielectric ILD ILD liner M2 via M1 SiNx Interconnects provide a pathway to communicate binary signals from one device or circuit to another. Silicide W Silicide SiO2 SiO2 Si substrate A MOS transistor (Harper and Rodbell, 1997) Issues: - Performance - Reliability

6 6 Reliability: Electromigration Resistance Promote electromigration resistance via microstructure control: Strong texture Large grain size (Vaidya and Sinha, 1981)

7 7 Grain Orientation and Electromigration Voids Special transport properties on certain lattice planes cause void faceting and spreading Voids along interconnect direction vs. fatal voids across the linewidth Top view (111) Slide courtesy of X. Chu and C.L. Bauer, _ (111) e- _ (111)

8 8 Aluminum Interconnect Lifetime Stronger <111> fiber texture gives longer lifetime, i.e. more electromigration resistance H.T. Jeong et al.

9 9 References H.T. Jeong et al., A role of texture and orientation clustering on electromigration failure of aluminum interconnects, ICOTOM- 12, Montreal, Canada, p 1369 (1999). D.B. Knorr, D.P. Tracy and K.P. Rodbell, Correlation of texture with electromigration behavior in Al metallization, Appl. Phys. Lett., 59, 3241 (1991). D.B. Knorr, K.P. Rodbell, The role of texture in the electromigration behavior of pure Al lines, J. Appl. Phys., 79, 2409 (1996). A. Gungor, K. Barmak, A.D. Rollett, C. Cabral Jr. and J.M. E. Harper, Texture and resistivity of dilute binary Cu(Al), Cu(In), Cu(Ti), Cu(Nb), Cu(Ir) and Cu(W) alloy thin films," J. Vac. Sci. Technology, B 20(6), p (Nov/Dec 2002). Barmak K, Gungor A, Rollett AD, Cabral C, Harper JME Texture of Cu and dilute binary Cu-alloy films: impact of annealing and solute content. Materials Science In Semiconductor Processing 6: > YBCO textures

10 10 Fiber Textures Common definition of a fiber texture: circular symmetry about some sample axis. Better definition: there exists an axis of infinite cyclic symmetry, C, (cylindrical symmetry) in either sample coordinates or in crystal coordinates. Example: fiber texture in two different thin copper films: strong <111> and mixed <111> and <100>.

11 11 Research on Cu thin films by Ali Gungor,, CMU C See, e.g.: Gungor A, Barmak K, Rollett AD, Cabral C, Harper JME. Journal Of Vacuum Science & Technology B 2002;20:2314. substrate film 2 copper thin films, vapor deposited: e1992: mixed <100> & <111>; e1997: strong <111> {001} PF for strong <111> fiber

12 12 Epitaxial Thin Film Texture From work by Detavernier (2003): if the unit cell of the film material is a sufficiently close match (within a few %) the two crystal structures often align.

13 13 Axiotaxy - NiSi films on Si Detavernier C, Ozcan AS, Jordan-Sweet J, Stach EA, Tersoff J, et al An offnormal fibre-like texture in thin films on single-crystal substrates. Nature 426: Spherical projection of {103}:

14 14 Plane-edge matching Axiotaxy C. Detavernier

15 15 Possible Orientation Relationships

16 16 Fiber Textures: Pole Figure Analysis: Example of Cu Thin Film: e1992

17 17 Recalculated Pole Figures: e1992

18 18 COD: e1992: : polar plots: Note rings in each section

19 19 SOD: e1992: : polar plots: note similarity of sections

20 20 Crystallite Orientation Distribution (COD):e Lines on constant Θ correspond to rings in pole figure 2. Maxima along top edge = <100>; <111> maxima on Θ= 55 (φ = 45 )

21 21 Sample Orientation Distribution (SOD): e Self-similar sections indicate fiber texture: lack of variation with first angle (ψ). 2. Maxima along top edge -> <100>; <111> maxima on Θ= 55, φ = 45

22 22 Experimental Pole Figures: e1997

23 23 Recalculated Pole Figures: e1997

24 24 COD: e1997: : polar plots: Note rings in 40, 50 sections

25 25 SOD: e1997: : polar plots: note similarity of sections

26 26 Crystal Orientation Distribution (COD): e Lines on constant Θ correspond to rings in pole figure 2. <111> maximum on Θ= 55 (φ = 45 )

27 27 Sample Orientation Distribution (SOD): e Self-similar sections indicate fiber texture: lack of variation with first angle (ψ). 2. Maxima on <111> on Θ= 55, φ = 45, only!

28 28 Fiber Locations in SOD [Jae-Hyung Cho, 2002] <100> fiber <110> fiber <111> fiber <100>, <111> and <110> fibers

29 29 Inverse Pole Figures: e1997 Slight in-plane anisotropy revealed by the inverse pole figures. Very small fraction of non-<111> fiber.

30 30 Inverse Pole figures: e1992 <11n> <111> φ 2 <001> <110> Normal Direction ND Transverse Direction TD Rolling Direction RD Φ

31 31 Method 1: Volume fractions from IPF Volume fractions can be calculated from an inverse pole figure (IPF). Step 1: obtain IPF for the sample axis parallel to the C symmetry axis. Normalize the intensity, I, according to 1 = Σ I(Φ,φ 2 ) sin(φ) dφdφ 2. Partition the IPF according to components of interest. Integrate intensities over each component area (i.e. choose the range of Φ and φ 2 ) and calculate volume fractions: V i = Σ i I(Φ,φ 2 ) sin(φ) dφdφ 2. Caution: many of the cells in an IPF lie on the edge of the unit triangle, which means that only a fraction of each cell should be used. A simpler approach than working with only one unit triangle is to perform the integration over a complete quadrant or hemisphere (since popla files, at least, are available in this form). In the latter case, for example, the ranges of Φ and φ 2 are 0-90 and 0-360, respectively.

32 32 Volume fractions from IPF How to measure distance from a component in an inverse pole figure? - This is simpler than for general orientations because we are only comparing directions (on the sphere). - Therefore we can use the dot (scalar) product: if we have a fiber axis, e.g. f = [211], and a general cell denoted by n, we take f b (and, clearly use cos -1 if we want an angle). The nearer the value of the dot product is to +1, the closer are the two directions. Symmetry: as for general orientations one must take account of symmetry. However, it is sensible to simplify by using sets of symmetrically related points in the upper hemisphere for each fiber axis, e.g. {100,-100,010,0-10,001}. Be aware that there are 24 equivalent points for a general direction (not coincident with a symmetry element).

33 33 Method 2: Pole plots If a perfect fiber exists then it is enough to scan over the tilt angle only and make a pole plot. A perfect fiber means that the intensity in all pole figures is in the form of rings with uniform intensity with respect to azimuth (C, aligned with the film plane normal). High resolution is then feasible, compared to standard 5 x5 pole figures, e.g 0.1. High resolution inverse PF preferable but not measurable.

34 34 Intensity along a line from the center of the {001} pole figure to the edge (any azimuth) Intensity {001} Pole plots <100> <111> e1992: <100> & <111> e1997: strong Tilt ( )

35 35 High Resolution {111} Pole plots TIlt ( ) Tilt Angle ( ) e1992: mixture of <100> and <111> tilt = 0.1 e1997: pure <111>; very small fractions other?

36 36 Volume fractions Pole plots (1D variation of intensity): If regions in the plot can be identified as being uniquely associated with a particular volume fraction, then an integration can be performed to find an area under the curve. The volume fraction is then the sum of the associated areas divided by the total area. Else, deconvolution required, which, unfortunately, is the usual case. In other words, this method is only reasonable to use if the only components are a single fiber texture and a random background.

37 37 {111} Pole plots for thin Cu films 15 E1992: mixture of 100 and 111 fibers E1997: strong 111 fiber 10 Strong <111> Mixed <111> & <100> Intensity 5 <100> <111> Tilt Angle ( )

38 38 Log scale for Intensity NB: Intensities not normalized Intensity Strong <111> Mixed <111> & <100> Tilt Angle ( )

39 39 Area under the Curve Tilt Angle equivalent to second Euler angle, θ Φ Requirement: 1 = Σ I(θ) sin(θ) dθ; θ measured in radians. Intensity as supplied not normalized. Problem: data only available to 85 : therefore correct for finite range. Defocusing neglected.

40 40 Extract Random Fraction e pf.data 2 Mixed <100> and <111>, e1992 Intensity Fiber components Random Equivalent Random Component = 18% Tilt Angle ( )

41 41 Normalized 100 Intensity Normalized re-normalized Intensity Normalized Intensity random <100> fiber 10 Random component negligible ~ 4% Intensity e pf.data? Tilt Angle ( )

42 42 Deconvolution Method is based on identifying each peak in the pole plot, fitting a Gaussian to it, and then checking the sum of the individual components for agreement with the experimental data. Areas under each peak are calculated. Corrections must be made for multiplicities.

43 43 {111} Pole Plot 140 [111] Cu(Ir) - 400C-5hrs and Gauss Fit of Data Intensity <100> <110> <111> A A 1 A 2 0 A i = Σ i I(θ)sinθ dθ Tilt θ

44 44 {111} Pole Plot: Comparison of Experiment with Calculation Cu(Ir) - 400C-5hrs Convolution Raw Data <111> Intensity Tilt

45 45 {100} Pole figure: pole multiplicity: 6 poles for each grain <100> fiber component <111> fiber component North Pole South Pole 4 poles on the equator; 1 pole at NP; 1 at SP 3 poles on each of two rings, at ~55 from NP & SP

46 46 {100} Pole figure: Pole Figure Projection The number of poles present in a pole figure is proportional to the number of grains (-100) (001) (0-10) (010) (100) (010) (100) (001) <100> oriented grain: 1 pole in the center, 4 on the equator <111> oriented grain: 3 poles on the 55 ring.

47 47 {111} Pole figure: pole multiplicity: 8 poles for each grain <100> fiber component <111> fiber component 4 poles on each of two rings, at ~55 from NP & SP 1 pole at NP; 1 at SP 3 poles on each of two rings, at ~70 from NP & SP

48 48 {111} Pole figure: Pole Figure Projection (-111) (111) (-111) (1-11) (001) (111) (-1-11) (1-11) (-1-11) <100> oriented grain: 4 poles on the 55 ring <111> oriented grain: 1 pole at the center, 3 poles on the 70 ring.

49 49 {111} Pole figure: Pole Plot Areas After integrating the area under each of the peaks (see slide 35), the multiplicity of each ring must be accounted for. Therefore, for the <111> oriented material, we have 3A 1 = A 3 ; for a volume fraction v 100 of <100> oriented material compared to a volume fraction v 111 of <111> fiber, 3A 2 / 4A 3 = v 100 / v 111 and, A 2 / {A 1 +A 3 } = v 100 / v 111

50 50 Intensities, densities in PFs Volume fraction = number of grains total grains. Number of poles = grains * multiplicity Multiplicity for {100} = 6; for {111} = 8. Intensity = number of poles area For (unit radius) azimuth, φ, and declination (from NP), θ, area, da = sinθ dθ dφ.

51 51 YBCO High Temperature Superconductors : an example Theoretical pole figures for c & a films Ref: Heidelbach, F., H.-R. Wenk, R. E. Muenchausen, R. E. Foltyn, N. Nogar and A. D. Rollett (1996), Textures of laser ablated thin films of YBa 2 Cu 3 O 7-d as a function of deposition temperature. J. Mater. Res., 7, See also Chapter 6 in Kocks, Tomé, Wenk

52 52 Diagram of possible epitaxies 102 peaks close to equator [-102] [-102] [001] 102 peaks close to center [102] [001] [102] a c Superconduction occurs in this plane

53 53 YBCO (123) on various substrates Various epitaxial relationships apparent from the pole figures

54 54 Scan with α = 0.5, β = 0.2 Azimuth, β Tilt α

55 55 Dependence of film orientation on deposition temperature Ref: Heidelbach, F., H.-R. Wenk, R. E. Muenchausen, R. E. Foltyn, N. Nogar and A. D. Rollett (1996), Textures of laser ablated thin films of YBa 2 Cu 3 O 7-d as a function of deposition temperature. J. Mater. Res., 7, Impact: superconduction occurs in the c-plane; therefore c epitaxy is highly advantageous to the electrical properties of the film.

56 56 Summary: Fiber Textures Extraction of volume fractions possible provided that fiber texture established. Fractions from IPF simple but resolution limited by resolution of OD. Pole plot shows entire texture. Random fraction can always be extracted. Specific fiber components may require deconvolution when the peaks overlap; not advisable when more than one component is present (or, great care required). Calculation of volume fraction from pole figures/plots assumes that all corrections have been correctly applied (background subtraction, defocussing, absorption).

57 57 Summary: other issues If epitaxy of any kind occurs between a film and its substrate, the (inevitable) difference in lattice paramter(s) will lead to residual stresses. Differences in thermal expansion will reinforce this. Residual stresses broaden diffraction peaks and may distort the unit cell (and lower the crystal symmetry), particularly if a high degree of epitaxy exists. Mosaic spread, or dispersion in orientation is always of interest. In epitaxial films, one may often assume a Gaussian distribution about an ideal component and measure the standard deviation or full-width-half-maximum (FWHM). Off-axis alignment is also possible, which is known as axiotaxy.

58 58 Example 1: calculate intensities for a <100> fiber in a {100} pole figure Choose a 5 x5 grid for the pole figure. Perfect <100> fiber with all orientations uniformly distributed (top hat function) within 5 of the axis. 1 pole at NP, 4 poles at equator. Area of 5 radius of NP = 2π*[cos 0 - cos 5 ] = Area within 5 of equator = 2π*[cos 85 - cos 95 ] = {intensity at NP} = (1/4)*(0.1743/ ) = 11.5 * {intensity at equator}

59 59 Example 2: Equal volume fractions of <100> & <111> fibers in a {100} pole figure Choose a 5 x5 grid for the pole figure. Perfect <100> & <111> fibers with all orientations uniformly distributed (top hat function) within 5 of the axis, and equal volume fractions. One pole from <100> at NP, 3 poles from <111> at 55. Area of 5 radius of NP = 2π*[cos 0 - cos 5 ] = Area within 5 of ring at 55 = 2π*[cos 50 - cos 60 ] = {intensity at NP, <100> fiber} = (1/3)*( / ) = 12.5 * {intensity at 55, <111> fiber}

Strain. Two types of stresses: Usually:

Strain. Two types of stresses: Usually: Stress and Texture Strain Two types of stresses: microstresses vary from one grain to another on a microscopic scale. macrostresses stress is uniform over large distances. Usually: macrostrain is uniform

More information

Crystallographic orientation

Crystallographic orientation Crystallographic orientation Orientations and misorientations Orientation (g): The orientation of the crystal lattice with respect to some reference frame; usual a frame defined by the processing or sample

More information

Texture development during processing

Texture development during processing Texture development during processing Course objectives: 1. To introduce the typical deformation textures in metals and alloys with FCC, BCC and HCP crystal structures 2. To explain the micro-mechanism

More information

This lecture is part of the Basic XRD Course.

This lecture is part of the Basic XRD Course. This lecture is part of the Basic XRD Course. Basic XRD Course 1 A perfect polycrystalline sample should contain a large number of crystallites. Ideally, we should always be able to find a set of crystallites

More information

Towards the Epitaxial Growth of Silver on Germanium by Galvanic Displacement

Towards the Epitaxial Growth of Silver on Germanium by Galvanic Displacement Electronic Supplementary Material (ESI) for CrystEngComm. This journal is The Royal Society of Chemistry 2014 Towards the Epitaxial Growth of Silver on Germanium by Galvanic Displacement Sayed Youssef

More information

X ray diffraction in materials science

X ray diffraction in materials science X ray diffraction in materials science Goals: Use XRD spectra to determine the orientation of single crystals and preferred orientations in a thin film. Understand how grain size and strain affect the

More information

Thin Film Scattering: Epitaxial Layers

Thin Film Scattering: Epitaxial Layers Thin Film Scattering: Epitaxial Layers 6th Annual SSRL Workshop on Synchrotron X-ray Scattering Techniques in Materials and Environmental Sciences: Theory and Application May 29-31, 2012 Thin films. Epitaxial

More information

Symmetry and Anisotropy Structure, Properties, Sample and Material, Texture and Anisotropy, Symmetry

Symmetry and Anisotropy Structure, Properties, Sample and Material, Texture and Anisotropy, Symmetry Symmetry and Anisotropy Structure, Properties, Sample and Material, Texture and Anisotropy, Symmetry Objectives Symmetry Operators & Matrix representation. Effect of crystal and sample symmetry

More information

MEASURING RELATIVE GRAIN BOUNDARY ENERGIES AND MOBILITIES IN AN ALUMINUM FOIL FROM TRIPLE JUNCTION GEOMETRY

MEASURING RELATIVE GRAIN BOUNDARY ENERGIES AND MOBILITIES IN AN ALUMINUM FOIL FROM TRIPLE JUNCTION GEOMETRY v MEASURING RELATIVE GRAIN BOUNDARY ENERGIES AND MOBILITIES IN AN ALUMINUM FOIL FROM TRIPLE JUNCTION GEOMETRY C.-C. Yang, A. D. Rollett and W. W. Mullins Carnegie Mellon University, Materials Science and

More information

OD Calculation from Pole Figure Data

OD Calculation from Pole Figure Data 1 OD Calculation from Pole Figure Data 27-750 Texture, Microstructure & Anisotropy A.D. Rollett Last revised: 2 nd Feb. 14 2 p Intensity in pole figure α, β angles in pole fig. Ψ,Θ,φ Euler angles (Roe/Kocks)

More information

Orientation Distribution (OD)

Orientation Distribution (OD) Orientation Distribution (OD) The Orientation Distribution (OD) is a central concept in texture analysis and anisotropy. Normalized probability* distribution, is typically denoted by f in whatever space

More information

Texture Analysis using OIM

Texture Analysis using OIM Texture Analysis using OIM Stuart I. Wright Acknowledgements: David Field, Washington State University Karsten Kunze, ETH Zurich Outline What is crystallographic texture? Mathematical constructs Texture

More information

More Thin Film X-ray Scattering and X-ray Reflectivity

More Thin Film X-ray Scattering and X-ray Reflectivity Stanford Synchrotron Radiation Laboratory More Thin Film X-ray Scattering and X-ray Reflectivity Mike Toney, SSRL 1. Introduction (real space reciprocal space) 2. Polycrystalline film (no texture) RuPt

More information

Epitaxy and Roughness Study of Glancing Angle Deposited Nanoarrays. Hamid Alouach and G. J. Mankey

Epitaxy and Roughness Study of Glancing Angle Deposited Nanoarrays. Hamid Alouach and G. J. Mankey Epitaxy and Roughness Study of Glancing Angle Deposited Nanoarrays Hamid Alouach and G. J. Mankey Introduction Objective: Approach: Characterization: Fabrication of nanoscale magnetic wires for spin transport

More information

Thin Film Scattering: Epitaxial Layers

Thin Film Scattering: Epitaxial Layers Thin Film Scattering: Epitaxial Layers Arturas Vailionis First Annual SSRL Workshop on Synchrotron X-ray Scattering Techniques in Materials and Environmental Sciences: Theory and Application Tuesday, May

More information

Chapter 2 Representation of Texture

Chapter 2 Representation of Texture Chapter 2 Representation of Texture 2.1 Introduction As has been stated already, texture of a rolled sheet material is commonly represented as {hkl} uvw, which means that most of the grains in the sheet

More information

Fundamentals of X-ray diffraction and scattering

Fundamentals of X-ray diffraction and scattering Fundamentals of X-ray diffraction and scattering Don Savage dsavage@wisc.edu 1231 Engineering Research Building (608) 263-0831 X-ray diffraction and X-ray scattering Involves the elastic scattering of

More information

IF YOUR ONLY SINGLE CRYSTAL IS NOT REALLY SINGLE

IF YOUR ONLY SINGLE CRYSTAL IS NOT REALLY SINGLE THE RIGAKU JOURNAL VOL. 12 / NO.1 / 1995 IF YOUR ONLY SINGLE CRYSTAL IS NOT REALLY SINGLE L. W. FINGER Geophysical Laboratory and Center for High-Pressure Research, 5251 Broad Branch Road, N.W. Washington,

More information

Crystallographic Distribution of Low Angle Grain Boundary Planes in Magnesium Oxide

Crystallographic Distribution of Low Angle Grain Boundary Planes in Magnesium Oxide Citation & Copyright (to be inserted by the publisher ) Crystallographic Distribution of Low Angle Grain Boundary Planes in Magnesium Oxide D.M. Saylor 1, A. Morawiec 2, K.W. Cherry 1, F.H. Rogan 1, G.S.

More information

Growth of YBa 2 Cu 3 O 7 Films with [110] Tilt of CuO Planes to Surface on SrTiO 3 Crystals

Growth of YBa 2 Cu 3 O 7 Films with [110] Tilt of CuO Planes to Surface on SrTiO 3 Crystals ISSN 163-7745, Crystallography Reports, 213, Vol. 58, No. 3, pp. 488 492. Pleiades Publishing, Inc., 213. Original Russian Text E.A. Stepantsov, F. Lombardi, D. Winkler, 213, published in Kristallografiya,

More information

REEL-TO-REEL TEXTURE ANALYSIS OF HTS COATED CONDUCTORS USING A MODIFIED GADDS SYSTEM

REEL-TO-REEL TEXTURE ANALYSIS OF HTS COATED CONDUCTORS USING A MODIFIED GADDS SYSTEM Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 163 REEL-TO-REEL TEXTURE ANALYSIS OF HTS COATED CONDUCTORS USING A MODIFIED GADDS SYSTEM J.L. Reeves

More information

INVESTIGATION OF NANOCRYSTALS USING TEM MICROGRAPHS AND ELECTRON DIFFRACTION TECHNIQUE

INVESTIGATION OF NANOCRYSTALS USING TEM MICROGRAPHS AND ELECTRON DIFFRACTION TECHNIQUE INVESTIGATION OF NANOCRYSTALS USING TEM MICROGRAPHS AND ELECTRON DIFFRACTION TECHNIQUE CAMELIA OPREA, VICTOR CIUPINA, GABRIEL PRODAN Department of Physics, Ovidius University, Constanþa, 900527, Romania

More information

Evolution of texture in an ultrafine and nano grained magnesium alloy

Evolution of texture in an ultrafine and nano grained magnesium alloy Journal of Ultrafine Grained and Nanostructured Materials Vol.48, No.1, June 2015, pp.11-16 Evolution of texture in an ultrafine and nano grained magnesium alloy S.M. Fatemi 1* and Abbas Zarei-Hanzki 2

More information

Measurement of Residual Stress by X-ray Diffraction

Measurement of Residual Stress by X-ray Diffraction Measurement of Residual Stress by X-ray Diffraction C-563 Overview Definitions Origin Methods of determination of residual stresses Method of X-ray diffraction (details) References End Stress and Strain

More information

Polycrystalline and microcrystalline silicon

Polycrystalline and microcrystalline silicon 6 Polycrystalline and microcrystalline silicon In this chapter, the material properties of hot-wire deposited microcrystalline silicon are presented. Compared to polycrystalline silicon, microcrystalline

More information

CHAPTER FOUR METALLIC SUBSTRATES

CHAPTER FOUR METALLIC SUBSTRATES CHAPTER FOUR METALLIC SUBSTRATES This chapter falls broadly into two parts. Firstly the preparation of textured metallic substrates is described with emphasis on the degree of crystallographic alignment.

More information

Generation of 3d synthetic microstructures for two-phase titanium alloys

Generation of 3d synthetic microstructures for two-phase titanium alloys Generation of 3d synthetic microstructures for two-phase titanium alloys Sudipto Mandal A.D. (Tony) Rollett Carnegie Mellon University Introduction In order to understand microstructure and texture development

More information

Distribution and Energies of Grain Boundaries in Magnesia as a Function of. Five Degrees of Freedom

Distribution and Energies of Grain Boundaries in Magnesia as a Function of. Five Degrees of Freedom Distribution and Energies of Grain Boundaries in Magnesia as a Function of Five Degrees of Freedom David M. Saylor a, Adam Morawiec b, Gregory S. Rohrer c Materials Science and Engineering Dept., Carnegie

More information

Characterization of Cold Drawn Gold bonding Wire with EBSD

Characterization of Cold Drawn Gold bonding Wire with EBSD 499 Material Science Forum Vols. 408-412(2002) pp. 499-504 2002 Trans Tech Publications, Switzerland Characterization of Cold Drawn Gold bonding Wire with EBSD Jae-Hyung Cho 1,2, J.S. Cho 3, J.T. Moon

More information

The object of this experiment is to test the de Broglie relationship for matter waves,

The object of this experiment is to test the de Broglie relationship for matter waves, Experiment #58 Electron Diffraction References Most first year texts discuss optical diffraction from gratings, Bragg s law for x-rays and electrons and the de Broglie relation. There are many appropriate

More information

{001} Texture Map of AA5182 Aluminum Alloy for High Temperature Uniaxial Compression

{001} Texture Map of AA5182 Aluminum Alloy for High Temperature Uniaxial Compression Materials Transactions, Vol., No. (00) pp. 6 to 67 #00 The Japan Institute of Light Metals {00} Texture Map of AA8 Aluminum Alloy for High Temperature Uniaxial Compression Hyeon-Mook Jeong*, Kazuto Okayasu

More information

High Resolution X-ray Diffraction

High Resolution X-ray Diffraction High Resolution X-ray Diffraction Nina Heinig with data from Dr. Zhihao Donovan Chen, Panalytical and slides from Colorado State University Outline Watlab s new tool: Panalytical MRD system Techniques:

More information

DIFFRACTION METHODS IN MATERIAL SCIENCE. Lecture 7

DIFFRACTION METHODS IN MATERIAL SCIENCE. Lecture 7 DIFFRACTION METHODS IN MATERIAL SCIENCE PD Dr. Nikolay Zotov Tel. 0711 689 3325 Email: zotov@imw.uni-stuttgart.de Room 3N16 Lecture 7 Practicum 15.12.2016 15:15 Room 3P2! Lectures 16.12.2016 11:00 Room

More information

COMPARISON OF TEXTURE IN COPPER AND ALUMINUM THIN FILMS DETERMINED BY XRD AND EBSD *

COMPARISON OF TEXTURE IN COPPER AND ALUMINUM THIN FILMS DETERMINED BY XRD AND EBSD * COMPARISON OF TEXTURE IN COPPER AND ALUMINUM THIN FILMS DETERMINED BY XRD AND EBSD * 201 J. Müller 1, D. Balzar 1,2, R.H. Geiss 1, D.T. Read 1, and R.R. Keller 1 1 Materials Reliability Division, National

More information

LECTURE 8. Dr. Teresa D. Golden University of North Texas Department of Chemistry

LECTURE 8. Dr. Teresa D. Golden University of North Texas Department of Chemistry LECTURE 8 Dr. Teresa D. Golden University of North Texas Department of Chemistry Practical applications for lattice parameter measurements: -determine composition (stoichiometry) of the sample -determine

More information

Grazing Incidence X-Ray Diffraction of Longitudinal and Perpendicular Magnetic Recording Media for HDD

Grazing Incidence X-Ray Diffraction of Longitudinal and Perpendicular Magnetic Recording Media for HDD Grazing Incidence X-Ray Diffraction of Longitudinal and Perpendicular Magnetic Recording Media for HDD Michio OHSAWA, Fuji Electric Corporate Research and Development, Ltd. ohsawa-michio@fujielectric.co.jp

More information

Chapter 8 Strain Hardening and Annealing

Chapter 8 Strain Hardening and Annealing Chapter 8 Strain Hardening and Annealing This is a further application of our knowledge of plastic deformation and is an introduction to heat treatment. Part of this lecture is covered by Chapter 4 of

More information

Chapter 3 Silicon Device Fabrication Technology

Chapter 3 Silicon Device Fabrication Technology Chapter 3 Silicon Device Fabrication Technology Over 10 15 transistors (or 100,000 for every person in the world) are manufactured every year. VLSI (Very Large Scale Integration) ULSI (Ultra Large Scale

More information

Representation of Orientation

Representation of Orientation Representation of Orientation Lecture Objectives - Representation of Crystal Orientation Stereography : Miller indices, Matrices 3 Rotations : Euler angles Axis/Angle : Rodriques Vector, Quaternion - Texture

More information

Microstructural parameters from Multiple Whole Profile (MWP) or Convolutional Multiple Whole Profile (CMWP) computer programs

Microstructural parameters from Multiple Whole Profile (MWP) or Convolutional Multiple Whole Profile (CMWP) computer programs Microstructural parameters from Multiple Whole Profile (MWP) or Convolutional Multiple Whole Profile (CMWP) computer programs Iuliana Dragomir-Cernatescu School of Materials Science and Engineering, Georgia

More information

Philips Analytical, Lelyweg 1, 7602 EA Almelo, The Netherlands

Philips Analytical, Lelyweg 1, 7602 EA Almelo, The Netherlands Copyright(c)JCPDS-International Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol.44 284 MICRO-DIFFRACTION WITH MONO-CAPILLARIES M.J. Fransen, J.H.A. Vasterink and J. te Nijenhuis Philips

More information

9/29/2014 8:52 PM. Chapter 3. The structure of crystalline solids. Dr. Mohammad Abuhaiba, PE

9/29/2014 8:52 PM. Chapter 3. The structure of crystalline solids. Dr. Mohammad Abuhaiba, PE 1 Chapter 3 The structure of crystalline solids 2 Home Work Assignments HW 1 2, 7, 12, 17, 22, 29, 34, 39, 44, 48, 53, 58, 63 Due Sunday 12/10/2014 Quiz # 1 will be held on Monday 13/10/2014 at 11:00 am

More information

Grain boundary mobility under a stored-energy driving force: a comparison to curvature-driven boundary migration

Grain boundary mobility under a stored-energy driving force: a comparison to curvature-driven boundary migration M. L. Taheri a, D. Molodov b, G. Gottstein a, A. D. Rollett a a Materials Science & Engineering Department, Carnegie Mellon University b Institute of Physical Metallurgy and Metal Physics, RWTH Aachen

More information

Study of the Initial Stage and an Anisotropic Growth of Oxide Layers Formed on Zircaloy-4

Study of the Initial Stage and an Anisotropic Growth of Oxide Layers Formed on Zircaloy-4 16 th International Symposium on Zirconium in the Nuclear Industry, Chengdu, P. R. China, May 10-13, 2010 Study of the Initial Stage and an Anisotropic Growth of Oxide Layers Formed on Zircaloy-4 B. X.

More information

Carnegie Mellon MRSEC

Carnegie Mellon MRSEC Carnegie Mellon MRSEC Texture, Microstructure & Anisotropy, Fall 2009 A.D. Rollett, P. Kalu 1 ELECTRONS SEM-based TEM-based Koseel ECP EBSD SADP Kikuchi Different types of microtexture techniques for obtaining

More information

CHAPTER 3. Experimental Results of Magnesium oxide (MgO) Thin Films

CHAPTER 3. Experimental Results of Magnesium oxide (MgO) Thin Films CHAPTER 3 Experimental Results of Magnesium oxide (MgO) Thin Films Chapter: III ---------------------------------------------------------------- Experimental Results of Magnesium oxide (MgO) Thin Films

More information

Diffusional Transformations in Solids

Diffusional Transformations in Solids Diffusional Transformations in Solids The majority of phase transformations that occur in the solid state take place by thermally activated atomic movements. The transformations that will be dealt with

More information

X-Ray Diffraction. Nicola Pinna

X-Ray Diffraction. Nicola Pinna X-Ray Diffraction Nicola Pinna Department of Chemistry, CICECO, University of Aveiro, 3810-193 Aveiro, Portugal. School of Chemical and Biological Engineering, College of Engineering, Seoul National University

More information

LECTURE 7. Dr. Teresa D. Golden University of North Texas Department of Chemistry

LECTURE 7. Dr. Teresa D. Golden University of North Texas Department of Chemistry LECTURE 7 Dr. Teresa D. Golden University of North Texas Department of Chemistry Diffraction Methods Powder Method For powders, the crystal is reduced to a very fine powder or microscopic grains. The sample,

More information

Structural change during cold rolling of electrodeposited copper

Structural change during cold rolling of electrodeposited copper Materials Science Forum Vols. 539-543 (2007) pp. 5013-5018 online at http://www.scientific.net (2007) Trans Tech Publications, Switzerland Structural change during cold rolling of electrodeposited copper

More information

JOURNAL OF APPLIED PHYSICS 102,

JOURNAL OF APPLIED PHYSICS 102, JOURNAL OF APPLIED PHYSICS 102, 014306 2007 In situ reflection high energy electron diffraction surface pole figure study of biaxial texture evolution in anisotropic Mg nanoblades during shadowing growth

More information

Geometric and Crystallographic Characterization of WC Surfaces and Grain. Boundaries in WC-Co Composites

Geometric and Crystallographic Characterization of WC Surfaces and Grain. Boundaries in WC-Co Composites Geometric and Crystallographic Characterization of WC Surfaces and Grain Boundaries in WC-Co Composites Chang-Soo Kim and Gregory S. Rohrer Department of Materials Science and Engineering, Carnegie Mellon

More information

Appendix 1 TEXTURE A1.1 REPRESENTATION OF TEXTURE

Appendix 1 TEXTURE A1.1 REPRESENTATION OF TEXTURE Appendix 1 TEXTURE The crystallographic orientation or texture is an important parameter describing the microstructure of a crystalline material. Traditionally, textures have been determined by x-ray diffraction

More information

1. Introduction. What is implantation? Advantages

1. Introduction. What is implantation? Advantages Ion implantation Contents 1. Introduction 2. Ion range 3. implantation profiles 4. ion channeling 5. ion implantation-induced damage 6. annealing behavior of the damage 7. process consideration 8. comparison

More information

Metallization. Typical current density ~10 5 A/cm 2 Wires introduce parasitic resistance and capacitance

Metallization. Typical current density ~10 5 A/cm 2 Wires introduce parasitic resistance and capacitance Metallization Interconnects Typical current density ~10 5 A/cm 2 Wires introduce parasitic resistance and capacitance RC time delay Inter-Metal Dielectric -Prefer low dielectric constant to reduce capacitance

More information

Problems to the lecture Physical Metallurgy ( Materialkunde ) Chapter 6: Mechanical Properties

Problems to the lecture Physical Metallurgy ( Materialkunde ) Chapter 6: Mechanical Properties Institut für Metallkunde und Metallphysik Direktor: Prof. Dr. rer. nat. Günter Gottstein RWTH Aachen, D-52056 Aachen Internet: http://www.imm.rwth-aachen.de E-mail: imm@imm.rwth-aachen.de Tel.: +49 241

More information

Recrystallization temperature influence upon texture evolution of a SPD processed Ti-Nb-Ta-Zr- O alloy

Recrystallization temperature influence upon texture evolution of a SPD processed Ti-Nb-Ta-Zr- O alloy IOP Conference Series: Materials Science and Engineering OPEN ACCESS Recrystallization temperature influence upon texture evolution of a SPD processed Ti-Nb-Ta-Zr- O alloy To cite this article: V D Cojocaru

More information

Rietveld refinement of ZrSiO 4 : application of a phenomenological model of anisotropic peak width

Rietveld refinement of ZrSiO 4 : application of a phenomenological model of anisotropic peak width Rietveld refinement of ZrSiO 4 : application of a phenomenological model of anisotropic peak width A. Sarkar, P. Mukherjee, P. Barat Variable Energy Cyclotron Centre 1/A Bidhan Nagar, Kolkata 700064, India

More information

Effect of barrier layers on the texture and microstructure of Copper films

Effect of barrier layers on the texture and microstructure of Copper films Mat. Res. Soc. Symp. Proc. Vol. 766 2003 Materials Research Society E2.2.1 Effect of barrier layers on the texture and microstructure of Copper films Tejodher Muppidi and David P Field School of MME, Washington

More information

9/28/2013 9:26 PM. Chapter 3. The structure of crystalline solids. Dr. Mohammad Abuhaiba, PE

9/28/2013 9:26 PM. Chapter 3. The structure of crystalline solids. Dr. Mohammad Abuhaiba, PE Chapter 3 The structure of crystalline solids 1 2 Why study the structure of crystalline solids? Properties of some materials are directly related to their crystal structure. Significant property differences

More information

Homework 6: Misorientations; Solution A.D. Rollett, , Texture, Microstructure and Anisotropy. Due date: 26 th March, 2014

Homework 6: Misorientations; Solution A.D. Rollett, , Texture, Microstructure and Anisotropy. Due date: 26 th March, 2014 Homework 6: Misorientations; Solution A.D. Rollett, 27-75, Texture, Microstructure and Anisotropy Due date: 26 th March, 214 Q1. [1 points] Starting with a set of Euler angles {155.9419988793937, 8.5275738913345,

More information

Orientation / Texture Polyethylene films

Orientation / Texture Polyethylene films Application Note PT-002 Orientation / Texture Polyethylene films Polyethylene (PE) film is one of the most commonly used polymeric products and orientation measurements of this material are of great interest.

More information

Energy and Packing. typical neighbor bond energy. typical neighbor bond energy. Dense, regular-packed structures tend to have lower energy.

Energy and Packing. typical neighbor bond energy. typical neighbor bond energy. Dense, regular-packed structures tend to have lower energy. Energy and Packing Non dense, random packing Energy typical neighbor bond length typical neighbor bond energy r Dense, regular packing Energy typical neighbor bond length typical neighbor bond energy r

More information

Interconnects. Outline. Interconnect scaling issues Aluminum technology Copper technology. Properties of Interconnect Materials

Interconnects. Outline. Interconnect scaling issues Aluminum technology Copper technology. Properties of Interconnect Materials Interconnects Outline Interconnect scaling issues Aluminum technology Copper technology 1 Properties of Interconnect Materials Metals Silicides Barriers Material Thin film Melting resistivity point ( C)

More information

DIFFRACTION METHODS IN MATERIAL SCIENCE. PD Dr. Nikolay Zotov Tel Room 3N16.

DIFFRACTION METHODS IN MATERIAL SCIENCE. PD Dr. Nikolay Zotov Tel Room 3N16. DIFFRACTION METHODS IN MATERIAL SCIENCE PD Dr. Nikolay Zotov Tel. 0711 689 3325 Email: zotov@imw.uni-stuttgart.de Room 3N16 Lecture 7 OUTLINE OF THE COURSE 0. Introduction 1. Classification of Materials

More information

High Anisotropy L1 0 FePt Media for Perpendicular Magnetic Recording Applications

High Anisotropy L1 0 FePt Media for Perpendicular Magnetic Recording Applications DISKCON 2008 High Anisotropy L1 0 FePt Media for Perpendicular Magnetic Recording Applications Boon Chow LIM Agency for Science Technology & Research (A*STAR) DATA STORAGE INSTITUTE 5 Engineering Drive

More information

Heterostructures of Oxides and Semiconductors - Growth and Structural Studies

Heterostructures of Oxides and Semiconductors - Growth and Structural Studies Heterostructures of Oxides and Semiconductors - Growth and Structural Studies Beamline 17B1 W20 X-ray Scattering beamline Authors M. Hong and J. R. Kwo National Tsing Hua University, Hsinchu, Taiwan H.

More information

Preparation and characterization of Co BaTiO 3 nano-composite films by the pulsed laser deposition

Preparation and characterization of Co BaTiO 3 nano-composite films by the pulsed laser deposition Journal of Crystal Growth 289 (26) 48 413 www.elsevier.com/locate/jcrysgro Preparation and characterization of Co BaTiO 3 nano-composite films by the pulsed laser deposition Wu Weidong a,b,, He Yingjie

More information

LaboTex Version 3.0. Texture Analysis Software for Windows. Texture Analysis on the Basis of EBSD Data

LaboTex Version 3.0. Texture Analysis Software for Windows. Texture Analysis on the Basis of EBSD Data LaboTex Version 3.0 Texture Analysis Software for Windows Texture Analysis on the Basis of EBSD Data LaboSoft s.c. Telephone: +48 502 311 838 Fax: +48 12 3953 891 E-mail: office@labosoft.com.pl LaboSoft

More information

Deposition of biaxially aligned YSZ layers by dual unbalanced magnetron sputtering.

Deposition of biaxially aligned YSZ layers by dual unbalanced magnetron sputtering. Deposition of biaxially aligned YSZ layers by dual unbalanced magnetron sputtering. S. Mahieu, G. De Winter, R. De Gryse University of Ghent, Department of Solid State Sciences, Krijgslaan 281/S1 9000

More information

Supplimentary Information. Large-Scale Synthesis and Functionalization of Hexagonal Boron Nitride. Nanosheets

Supplimentary Information. Large-Scale Synthesis and Functionalization of Hexagonal Boron Nitride. Nanosheets Electronic Supplementary Material (ESI) for Nanoscale. This journal is The Royal Society of Chemistry 2014 Supplimentary Information Large-Scale Synthesis and Functionalization of Hexagonal Boron Nitride

More information

How to use Matlab Texture, Microstructure & Anisotropy A.D. Rollett. Last revised: 25 th Feb. 14

How to use Matlab Texture, Microstructure & Anisotropy A.D. Rollett. Last revised: 25 th Feb. 14 1 How to use Matlab 27-750 Texture, Microstructure & Anisotropy A.D. Rollett Last revised: 25 th Feb. 14 2 In- Class Questions What is the procedure that one can follow to use Matlab+MTex to construct

More information

Chapter Outline. How do atoms arrange themselves to form solids?

Chapter Outline. How do atoms arrange themselves to form solids? Chapter Outline How do atoms arrange themselves to form solids? Fundamental concepts and language Unit cells Crystal structures! Face-centered cubic! Body-centered cubic! Hexagonal close-packed Close packed

More information

Relation Between Internal Stress and Surface Roughness of Titanium Nitride Films Deposited by HCD Ion Plating

Relation Between Internal Stress and Surface Roughness of Titanium Nitride Films Deposited by HCD Ion Plating No.22,28 65 Relation Between Internal Stress and Surface Roughness of Titanium Nitride Films Deposited by HCD Ion Plating Itsuo Ishigami Ken-ichi Miura Hideaki Hoshino Tomoyuki Mizukoshi (28 6 17 ) An

More information

Dept.of BME Materials Science Dr.Jenan S.Kashan 1st semester 2nd level. Imperfections in Solids

Dept.of BME Materials Science Dr.Jenan S.Kashan 1st semester 2nd level. Imperfections in Solids Why are defects important? Imperfections in Solids Defects have a profound impact on the various properties of materials: Production of advanced semiconductor devices require not only a rather perfect

More information

MICROSTRUCTURAL INVESTIGATION OF SPD PROCESSED MATERIALS CASE STUDY

MICROSTRUCTURAL INVESTIGATION OF SPD PROCESSED MATERIALS CASE STUDY TEQIP Workshop on HRXRD, IIT Kanpur, 05 Feb 2016 MICROSTRUCTURAL INVESTIGATION OF SPD PROCESSED MATERIALS CASE STUDY K.S. Suresh Department of Metallurgical and Materials Engineering Indian Institute of

More information

Evolution of the microstructure in nanocrystalline copper electrodeposits during room temperature storage

Evolution of the microstructure in nanocrystalline copper electrodeposits during room temperature storage Downloaded from orbit.dtu.dk on: Dec 17, 217 Evolution of the microstructure in nanocrystalline copper electrodeposits during room temperature storage Pantleon, Karen; Somers, Marcel A. J. Published in:

More information

X-RAY DIFFRACTIO N B. E. WARREN

X-RAY DIFFRACTIO N B. E. WARREN X-RAY DIFFRACTIO N B. E. WARREN Chapter 1 X-Ray Scattering by Atom s 1.1 Classical scattering by a free electron 1 1.2 Polarization by scattering 4 1.3 Scattering from several centers, complex representation

More information

Texture of Alumina by neutron diffraction and SEM-EBSD

Texture of Alumina by neutron diffraction and SEM-EBSD Materials Science Forum Vols. 495-497 (2005) pp. 1395-1400 online at http://www.scientific.net 2005 Trans Tech Publications, Switzerland 105 Texture of Alumina by neutron diffraction and SEM-EBSD E. Guilmeau

More information

Deposition and characterization of sputtered ZnO films

Deposition and characterization of sputtered ZnO films Superlattices and Microstructures 42 (2007) 89 93 www.elsevier.com/locate/superlattices Deposition and characterization of sputtered ZnO films W.L. Dang, Y.Q. Fu, J.K. Luo, A.J. Flewitt, W.I. Milne Electrical

More information

EFFECT OF CRYSTALLOGRAPHIC ORIENTATION ON MECHANICAL PROPERTIES OF STEEL SHEETS BY DEPTH SENSING INDENTATION

EFFECT OF CRYSTALLOGRAPHIC ORIENTATION ON MECHANICAL PROPERTIES OF STEEL SHEETS BY DEPTH SENSING INDENTATION EFFECT OF CRYSTALLOGRAPHIC ORIENTATION ON MECHANICAL PROPERTIES OF STEEL SHEETS BY DEPTH SENSING INDENTATION Peter BURIK 1, Ladislav PEŠEK 2 1 Technical University of Liberec, Faculty of Mechanical Engineering,

More information

Heteroepitaxial B12As2 on silicon substrates

Heteroepitaxial B12As2 on silicon substrates This is the author s final, peer-reviewed manuscript as accepted for publication. The publisher-formatted version may be available through the publisher s web site or your institution s library. Heteroepitaxial

More information

Annealing Effect on Elastic Constant of Ultrathin Films Studied by Acoustic-Phonon Resonance Spectroscopy

Annealing Effect on Elastic Constant of Ultrathin Films Studied by Acoustic-Phonon Resonance Spectroscopy 1st International Symposium on Laser Ultrasonics: Science, Technology and Applications July 16-18 28, Montreal, Canada Annealing Effect on Elastic Constant of Ultrathin Films Studied by Acoustic-Phonon

More information

Recrystallization textures in tantalum sheet and wire

Recrystallization textures in tantalum sheet and wire International Journal of Refractory Metals & Hard Materials 18 (2000) 1±8 Recrystallization textures in tantalum sheet and wire C.L. Briant a, *, E. MacDonald a, R.W. Balliett b, T. Luong b a Division

More information

Electron backscattered diffraction study of poly-si by Ni-mediated crystallization of amorphous silicon using a SiO 2 nanocap

Electron backscattered diffraction study of poly-si by Ni-mediated crystallization of amorphous silicon using a SiO 2 nanocap Electron backscattered diffraction study of poly-si by Ni-mediated crystallization of amorphous silicon using a SiO 2 nanocap Y. J. Chang, a) J. H. Oh, K. H. Kim, and Jin Jang b) Advanced Display Research

More information

Single Crystal Growth of Aluminum Nitride

Single Crystal Growth of Aluminum Nitride Single Crystal Growth of Aluminum Nitride Hiroyuki Kamata 1, Yuu Ishii 2, Toshiaki Mabuchi 3, Kunihiro Naoe 1, Shoji Ajimura 4, Kazuo Sanada 5 Single crystalline aluminum nitride (AlN) is a promising material

More information

Finding Grain and Antigrains. Matt Nowell May 2016

Finding Grain and Antigrains. Matt Nowell May 2016 Finding Grain and Antigrains Matt Nowell May 2016 1 Grains Grain Boundaries Grain Size Measurements Special Boundaries Grain Shape Antigrains Outline Acknowledgements Stuart Wright, Rene de Kloe (EDAX),

More information

Texture and properties - II

Texture and properties - II Texture and properties - II Texture and Hall-Petch strength The Hall-Petch equation 0 k d - ½ where, 0 = k = d = lattice frictional stress locking parameter average grain size modifies for textured polycrystals

More information

Chapter Outline How do atoms arrange themselves to form solids?

Chapter Outline How do atoms arrange themselves to form solids? Chapter Outline How do atoms arrange themselves to form solids? Fundamental concepts and language Unit cells Crystal structures Face-centered cubic Body-centered cubic Hexagonal close-packed Close packed

More information

The manufacturing of an electroplated Ni layer on texturedcusubstratefor Cu-based HTS coated conductors

The manufacturing of an electroplated Ni layer on texturedcusubstratefor Cu-based HTS coated conductors INSTITUTE OF PHYSICS PUBLISHING Supercond. Sci. Technol. 18 (25) 17 111 SUPERCONDUCTOR SCIENCE AND TECHNOLOGY doi:1.188/953-248/18/1/17 The manufacturing of an electroplated Ni layer on texturedcusubstratefor

More information

Thermal stability of the microstructure of severely deformed copper

Thermal stability of the microstructure of severely deformed copper Thermal stability of the microstructure of severely deformed copper L. Balogh 1,*, J. Gubicza 2, R. J. Hellmig 3, Y. Estrin 3, and T. Ungár 1 1 Department of General Physics, Eötvös University, Budapest,

More information

DESCRIPTION OF FIBER TEXTURES IN CUBIC METALS

DESCRIPTION OF FIBER TEXTURES IN CUBIC METALS Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 510 Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42

More information

Problems. 104 CHAPTER 3 Atomic and Ionic Arrangements

Problems. 104 CHAPTER 3 Atomic and Ionic Arrangements 104 CHAPTER 3 Atomic and Ionic Arrangements Repeat distance The distance from one lattice point to the adjacent lattice point along a direction. Short-range order The regular and predictable arrangement

More information

Metallization. Typical current density ~105 A/cm2 Wires introduce parasitic resistance and capacitance

Metallization. Typical current density ~105 A/cm2 Wires introduce parasitic resistance and capacitance Metallization Interconnects Typical current density ~105 A/cm2 Wires introduce parasitic resistance and capacitance RC time delay Inter-Metal Dielectric -Prefer low dielectric constant to reduce capacitance

More information

Background Statement for SEMI Draft Document 5945 New Standard: Test Method for Determining Orientation of A Sapphire Single Crystal

Background Statement for SEMI Draft Document 5945 New Standard: Test Method for Determining Orientation of A Sapphire Single Crystal Background Statement for SEMI Draft Document 5945 New Standard: Test Method for Determining Orientation of A Sapphire Single Crystal Notice: This background statement is not part of the balloted item.

More information

Evolution of Microstructure and Texture Associated with Ridging in Ferritic Stainless Steels

Evolution of Microstructure and Texture Associated with Ridging in Ferritic Stainless Steels , pp. 100 105 Evolution of Microstructure and Texture Associated with Ridging in Ferritic Stainless Steels SooHo PARK, KwangYuk KIM, YongDeuk LEE and ChanGyung PARK 1) Stainless Steel Research Group, Technical

More information

Energy and Packing. Materials and Packing

Energy and Packing. Materials and Packing Energy and Packing Non dense, random packing Energy typical neighbor bond length typical neighbor bond energy r Dense, regular packing Energy typical neighbor bond length typical neighbor bond energy r

More information

Crystallographic Textures Measurement

Crystallographic Textures Measurement Crystallographic Textures Measurement D. V. Subramanya Sarma Department of Metallurgical and Materials Engineering Indian Institute of Technology Madras E-mail: vsarma@iitm.ac.in Macrotexture through pole

More information

Microanalysis with high spectral resolution: the power of QUANTAX WDS for SEM

Microanalysis with high spectral resolution: the power of QUANTAX WDS for SEM Microanalysis with high spectral resolution: the power of QUANTAX WDS for SEM Bruker Nano Analytics, Berlin, Germany Webinar, September 14, 2017 Innovation with Integrity Presenters Dr. Jörg Silbermann

More information

HIGH RESOLUTION TEXTURE ANALYSIS OF THIN BLANKET FILMS AND DISCREET TEST STRUCTURES IN SEMICONDUCTOR DEVICES

HIGH RESOLUTION TEXTURE ANALYSIS OF THIN BLANKET FILMS AND DISCREET TEST STRUCTURES IN SEMICONDUCTOR DEVICES Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol.44 314 HIGH RESOLUTION TEXTURE ANALYSIS OF THIN BLANKET FILMS AND DISCREET TEST STRUCTURES IN SEMICONDUCTOR DEVICES K. J. Kozaczek, R. I.

More information