NEBRASKA NANOSCALE FACILITY CHARACTERIZATION FACILITIES
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1 NEBRASKA NANOSCALE FACILITY CHARACTERIZATION FACILITIES Jeff Shield Department of Mechanical & Materials Engineering Nebraska Center for Materials and Nanoscience National Nanotechnology Coordinated Infrastructure University of Nebraska March 22-23, 2016
2 NNF NNF WORKSHOP NEBRASKA NANOSCALE FACILITY 2
3 NNF NNF WORKSHOP NNF Core Facilities Nanoengineering Research Scanning Probe & Materials Characterization X-ray Structural Characterization Electron Microscopy 3
4 NNF CSI: Lincoln Utilize materials characterization capabilities to uncover the secrets of a material s behavior Probe microstructure properties/behavior Within the Nebraska Nanoscale Facility, we have many tools to probe microstructures at our disposal 4
5 NNF Functionalized Surfaces Scanning a femtosecond laser over a smooth surface creates various features that can alter behavior Hydrophobic/hydrophyllic laser X-ray diffraction can be used to characterize the base material The NNF has a number of x-ray diffractometers capable of a wide range of measurement techniques 5
6 Functionalized Surfaces NNF Surface structure characterization 100 μm 20 μm Scanning electron microscopy (SEM) reveals surface morphology The NNF has a number of SEM instruments, most with chemical analysis capabilities Laser scanning confocal microscope (Keyence VK-X) provides quantification of surface Surface morphology parameters such as relative surface area, peak-to-valley height, peak-topeak distance 6
7 Functionalized Surfaces NNF Sub-surface characterization Dual-beam FIB/SEM (FEI Helios 660) The focused ion beam (FIB) removes material, allowing cross-sectional imaging and a view of the effects of processing on the material 10 μm 7
8 3D Imaging Nebraska Sample 3 Avizo Movie.avi
9 Scanning/Transmission Electron NNF Microscopy Dual-beam FIB/SEM (FEI Helios 660) The focused ion beam (FIB) can be used to selectively make transmission electron microscope samples, too 1 μm S/TEM (FEI Osiris, JEOL 2010) Probe microstructure at a high magnification (grain structure, structural defects, chemistry) 9
10 NNF What s inside these? 10
11 NNF What s inside these? ChemiSTEM collect x-rays from small regions to determine (very) local chemistry 1 m 10 nm 11
12 NNF And structural imaging 12
13 NNF Other Capabilities Stratasys Objet 500 Connex3 3D printer (polymers) Atomic force microscopy (AFM)... and coming soon: Metal 3D printing! Microhardness Optical Microscopy Differential Scanning Calorimetry (DSC) Thermal Gravimetric Analysis (TGA) Thin film processing (RF/DC magnetron sputtering) 13
14 NNF WORKSHOP NNF We have a wide variety of stateof-the-art capabilities to both fabricate and characterize materials at many length scales 10 nm 14
15 NNF Facility for Scanning Probe & Materials Characterization NNF Thermal Analysis- DSC Thermal Analysis- TGA 15
16 NNF Facility for Scanning Probe & Materials Characterization NNF Optical Microscopy Tukon 2500 Hardness Tester Polyhydroxyaalkanoate (PHA) Knoop and Vickers Hardness 16
17 NNF Facility for X-ray NNF Characterization Rigaku D/Max B Bragg-Brentano (BB), 0D, Co-radiation PANalytical Empyrean Bragg-Brentano (0 2D), Cu-radiation Bruker D8 Discover Parallel Beam (PB), 2D Large Area Detector & 0D, Hi-res Optics, Cu-radiation Rigaku SmartLab BB & PB, Ultra Hi-Res optics 0D & 1D detector, Cu-radiation Bruker Photon Parallel beam, CMOS detector (2D), Mo-radiation Rigaku Multiflex Bragg-Brentano (0D), Cu-radiation Powder XRD: Phase ID & Quantification, Residual stress analysis, Ideal for Ferrous samples, vertical sample mount Powder XRD: Fast data collection, sample spinner, Automatic sample batch processing, Horizontal sample mount Powder and Hi-Res XRD, Fast data collection, High Temperature XRD, XRR, Pole-Figure, vertical sample mount, capillary diffraction Powder and Ultra Hi-Res XRD, XRR, Grazing incidence In-plane XRD, In-plane pole figure, Small Angle X-ray Scattering (SAXS), reciprocal space mapping Small Molecular Crystallography with Temperature range T ~ K Powder XRD: Phase ID & Quantification, Horizontal sample mount 17
18 NNF Facility for Scanning Probe & Materials Characterization NNF Quantitatively nanomechanical properties (modulus: 1MPa--50GPa; adhesion: 10pN--10μN.) Conductivity mapping : charge distribution, surface potential distribution, etc. Nanomanipulation (indentation and lithography) Heating and Cooling: 30 C to +250 C Bruker Dimension ICON SPM EnviroScope Atomic Force Microscope Dimension 3100 SPM System
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