DVT Report for PCIE-XXX-02-F-D-TH. Mated with Mating PCB Card

Transcription

1 Project Number: Requested by: Brandon Harpenau Date: 9/26/2005 Product Rev: 3 Lot #: 1 Tech: Troy Cook Eng: Mark Shireman Qty to test: 20 Test Start: 11/12/2005 Test Completed: 12/9/2005 DVT Report for PCIE-XXX-02-F-D-TH Mated with Mating PCB Card

2 CERTIFICATION All instruments and measuring equipment were calibrated to National Institute for Standards and Technology (NIST) traceable standards according to IS l and ANSI/NCSL , as applicable. All contents contained herein are the property of Samtec. No portion of this report, in part or in full shall be reproduced without prior written approval of Samtec. SCOPE To perform the following tests: Please complete DVTand full qual. APPLICABLE DOCUMENTS Standards: EIA Publication 364 TEST SAMPLES AND PREPARATION 1) All materials were manufactured in accordance with the applicable product specification. 2) All test samples were identified and encoded to maintain traceability throughout the test sequences. 3) After soldering, the parts to be used for LLCR and DWV/IR testing were cleaned according to TLWI ) Either an automated cleaning procedure or an ultrasonic cleaning procedure may be used. 5) The automated procedure is used with aqueous compatible soldering materials. 6) The ultrasonic procedure can be used with either aqueous or non-aqueous soldering components and follows: a. Sample test boards are to be ultrasonically cleaned after test lead attachment, preparation and/or soldering. b. Sample test boards are immersed into Branson 3510 cleaner containing Kyzen Ionox HC1 (or equivalent) with the following conditions: i. Temperature: C+/- 5 C ii. Frequency: KHz iii. Immersion Time: ---5 to 10 Minutes c. Sample test boards are removed and placed into the Branson 3510 cleaner containing deionized water with the following conditions: i. Temperature: C +/- 5 C ii. Frequency: KHz iii. Immersion Time: ---5 to 10 Minutes d. Sample test boards are removed and placed in a beaker positioned on a hot plate with a magnetic stirrer containing deionized water warmed to 55 C +/- 5 C for 1/2 to 1 minute. e. Upon removal, the sample boards are rinsed for ½ to 1 minute at room temperature with free flowing deionized water. f. After the final rinse, the sample test boards are dried in an air-circulating oven for 10 to 15 minutes at 50 C +/- 5 C. g. Sample test boards are then allowed to set and recover to room ambient condition prior to testing. 7) Parts not intended for testing LLCR and DWV/IR are visually inspected and cleaned if necessary. 8) Any additional preparation will be noted in the individual test sequences. 9) Solder Information: SN63/PB37 10) Re-Flow Time/Temp: See accompanying profile. 11) Internal Test PCBs used: PCB TST-XX

3 OVEN PROFILE (Soldering Parts to Test Boards)

4 FLOWCHARTS Current Carrying Capacity TEST STEP GROUP A 1 connector min All 6 contacts powered 01 CCC Tabulate calculated current at RT, 65 C, 75 C and 95 C after derating 20% and based on 105 C CCC, Temp rise = EIA Mating/Unmating/Normal Force TEST GROUP A GROUP B1 GROUP B2 STEP 10 Connectors 5 Connectors 5 Connectors 50 Cycles 01 Contact Gaps Setup Approve Setup Approve 02 Mating / Unmating Normal Force Thermal Aging (Mated) 03 Data Review Data Review Normal Force Cycles 05 Mating / Unmating 06 Contact Gaps 07 Data Review 08 Thermal Aging (Mated) 09 Mating / Unmating 10 Contact Gaps 11 Data Review 12 Humidity (Mated) 13 Mating / Unmating 14 Contact Gaps Thermal Aging = EIA , Test Condition 4, 105 deg C; Time Condition 'A' (96 hours) Humidity =EIA , Test Condition 'A' (96 Hours) and Method III (+25 C to %RH to 98% RH) ambient pre-condition and delete steps 7a and 7b Mating/Un-Mating Forces = EIA Normal Force = EIA Contact Gaps/Height - No standard method. Usually measured optically

5 IR / DWV FLOWCHARTS Continued TEST GROUP A GROUP B1 GROUP B2 GROUP B3 STEP 3 Connectors 3 Connectors 3 Connectors 3 Connectors Ambient Ambient Thermal Humidity 01 IR DWV/Working Voltage Thermal Aging Humidity 02 Data Review DWV/Working Voltage DWV/Working Voltage 03 Thermal Aging 04 IR 05 Data Review 06 Humidity 07 IR Thermal Aging = EIA , Test Condition 4,105 deg C; Time Condition 'A' (96 hours) Humidity =EIA , Test Condition 'A' (96 Hours) and Method III (+25 C to %RH to 98% RH) ambient pre-condition and delete steps 7a and 7b IR = EIA DWV = EIA Durability/Thermal Age/Cyclic Humidity TEST STEP GROUP A 96 Points 50 Cycles LLCR-1 Data Review 50 Cycles LLCR-2 Data Review Thermal Age LLCR-3 Data Review Cyclic Humidity LLCR-4 Thermal Aging = EIA , Test Condition 4, 105 deg C; Time Condition 'A' (96 hours) Humidity =EIA , Test Condition 'A' (96 Hours) and Method III (+25 C to %RH/98% RH) ambient pre-condition and delete steps 7a and 7b LLCR = EIA , LLCR use Keithley 580 in the dry circuit mode, 10 ma Max

6 FLOWCHARTS Continued Capacitance TEST STEP GROUP A 3 Connectors 01 Capacitance 02 Data Review 03 Thermal Aging 04 Capacitance Thermal Aging = EIA , Test Condition 3, 85 deg C; Time Condition 'A' (96 hours) Capacitance at 820 Hz, B&K 810C Gas Tight TEST STEP GROUP A 96 Points 01 LLCR-1 02 Gas Tight 03 LLCR-2 Gas Tight = EIA LLCR = EIA , LLCR use Keithley 580 in the dry circuit mode, 10 ma Max

7 ATTRIBUTE DEFINITIONS The following is a brief, simplified description of attributes. THERMAL: 1) EIA , Temperature Life with or without Electrical Load Test Procedure for Electrical Connectors. 2) Test Condition 4 at 105 C. 3) Test Time Condition B for 96 hours. 4) Connectors are sometimes mated and all samples are pre-conditioned at ambient. HUMIDITY: 1) Reference document: EIA , Humidity Test Procedure for Electrical Connectors. 2) Test Condition B, 96 Hours. 3) Method III, +25 C to + 65 C, 90% to 98% Relative Humidity excluding sub-cycles 7a and 7b. 4) Connectors are sometimes mated and all samples are pre-conditioned at ambient. TEMPERATURE RISE (Current Carrying Capacity, CCC): 1) EIA , Temperature Rise versus Current Test Procedure for Electrical Connectors and Sockets. 2) When current passes through a contact, the temperature of the contact increases as a result of I 2 R (resistive) heating. 3) The number of contacts being investigated plays a significant part in power dissipation and therefore temperature rise. 4) The size of the temperature probe can affect the measured temperature. 5) Copper traces on PC boards will contribute to temperature rise: a. Self heating (resistive) b. Reduction in heat sink capacity affecting the heated contacts 6) A de-rating curve, usually 20%, is calculated. 7) Calculated de-rated currents at three temperature points are reported: a. Ambient b. 65 о C c. 75 о C d. 95 о C 8) Typically, neighboring contacts (in close proximity to maximize heat build up) are energized. 9) The thermocouple (or temperature measuring probe) will be positioned at a location to sense the maximum temperature in the vicinity of the heat generation area. 10) A computer program, TR 803.exe, ensures accurate stability for data acquisition. 11) Hook-up wire cross section is larger than the cross section of any connector leads/pc board traces, jumpers, etc. 12) Hook-up wire length is longer than the minimum specified in the referencing standard. CONTACT GAP: 1) Contact gaps were measured before and after stressing the contacts (e.g. thermal aging, mechanical cycling, etc.). 2) Typically, all contacts on the connector are measured.

8 MATING/UNMATING: 1) Reference document: EIA , Mating and Unmating Forces Test Procedure for Electrical Connectors. 2) The full insertion position was to within to of the plug bottoming out in the receptacle to prevent damage to the system under test. 3) One of the mating parts is secured to a floating X-Y table to prevent damage during cycling. NORMAL FORCE (FOR CONTACTS TESTED IN THE HOUSING): 1) Reference document: EIA , Normal Force Test Procedure for Electrical Connectors. 2) The contacts shall be tested in the connector housing. 3) If necessary, a window shall be made in the connector body to allow a probe to engage and deflect the contact at the same attitude and distance (plus 0.05 mm [0.002 ]) as would occur in actual use. 4) The connector housing shall be placed in a holding fixture that does not interfere with or otherwise influence the contact force or deflection. 5) Said holding fixture shall be mounted on a floating, adjustable, X-Y table on the base of the Dillon TC 2, computer controlled test stand with a deflection measurement system accuracy of 5.0 µm ( ). 6) The nominal deflection rate shall be 5 mm (0.2 )/minute. 7) Unless otherwise noted a minimum of five contacts shall be tested. 8) The force/deflection characteristic to load and unload each contact shall be repeated five times. 9) The system shall utilize the TC 2 software in order to acquire and record the test data. 10) The permanent set of each contact shall be measured within the TC 2 software. 11) The acquired data shall be graphed with the deflection data on the X-axis and the force data on the Y-axis and a print out will be stored with the Tracking Code paperwork. INSULATION RESISTANCE (IR): To determine the resistance of insulation materials to leakage of current through or on the surface of these materials when a DC potential is applied. 1) PROCEDURE: a. Reference document: EIA , Insulation Resistance Test Procedure for Electrical Connectors. b. Test Conditions: i. Between Adjacent Contacts ii. Electrification Time 2.0 minutes iii. Test Voltage (500 VDC) corresponds to calibration settings for measuring resistances. 2) MEASUREMENTS: 3) When the specified test voltage is applied (VDC), the insulation resistance shall not be less than 5000 megohms. DIELECTRIC WITHSTANDING VOLTAGE (DWV): To determine if the sockets can operate at its rated voltage and withstand momentary over potentials due to switching, surges, and other similar phenomenon. Separate samples are used to evaluate the effect of environmental stresses so not to influence the readings from arcing that occurs during the measurement process. 1) PROCEDURE: a. Reference document: EIA , Withstanding Voltage Test Procedure for Electrical Connectors. b. Test Conditions: i. Between Adjacent Contacts ii. Rate of Application 500 V/Sec iii. Test Voltage (VAC) until breakdown occurs 2) MEASUREMENTS/CALCULATIONS a. The breakdown voltage shall be measured and recorded. b. The dielectric withstanding voltage shall be recorded as 75% of the minimum breakdown voltage.

9 c. The working voltage shall be recorded as one-third (1/3) of the dielectric withstanding voltage (onefourth of the breakdown voltage). LLCR: 1) EIA , Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets. 2) A computer program, LLCR 221.exe, ensures repeatability for data acquisition. 3) The following guidelines are used to categorize the changes in LLCR as a result from stressing a. <= +5.0 mohms: Stable b to mohms: Minor c to mohms: Acceptable d to mohms: Marginal e to mohms: Unstable f. >+2000 mohms: Open Failure GAS TIGHT: To provide method for evaluating the ability of the contacting surfaces in preventing penetration of harsh vapors which might lead to oxide formation that may degrade the electrical performance of the contact system. 1) EIA , Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets. 2) A computer program, LLCR 221.exe, ensures repeatability for data acquisition. 3) The following guidelines are used to categorize the changes in LLCR as a result from stressing a. <= +5.0 mohms: Stable b to mohms: Minor c to mohms: Acceptable d to mohms: Marginal e to mohms: Unstable f. >+2000 mohms: Open Failure 4) Procedure: a. Reference document: EIA , Test Procedure for Determination of Gas-Tight Characteristics for Electrical Connectors, Sockets and/or Contact Systems. b. Test Conditions: i. Class II--- Mated pairs of contacts assembled to their plastic housings. ii. Reagent grade Nitric Acid shall be used of sufficient volume to saturate the test chamber iii. The ratio of the volume of the test chamber to the surface area of the acid shall be less than 10. iv. The chamber shall be saturated with the vapor for at least 15 minutes before samples are added. v. Exposure time, 55 to 65 minutes. vi. The samples shall be no closer to the chamber walls than 1 inches and no closer to the surface of the acid than 3 inches. vii. The samples shall be dried after exposure for a minimum of 1 hour. viii. Drying temperature 50 о C ix. The final LLCR shall be conducted within 1 hour after drying. SUPPLEMENTAL TESTS CAPACITANCE: 1) Taken at 820 Hz

10 RESULTS Temperature Rise, CCC at a 20% de-rating CCC ( Linear) for a 30 C Temperature Rise A per contact with 6 adjacent contacts powered CCC ( Clustered) for a 30 C Temperature Rise A per contact with 6 adjacent contacts powered Contact Gaps Initial o Min o Max After 50 Cycles o Min o Max Thermal o Min o Max Humidity o Min o Max Mating Unmating Forces Initial o Mating Min Lbs. Max Lbs. o Unmating Min Lbs. Max Lbs. After 50 Cycles o o Mating Min Lbs. Max Lbs. Unmating Min Lbs. Max Lbs. Thermal o Mating Min Lbs. Max Lbs. o Unmating Min Lbs. Max Lbs. Humidity o Mating Min Lbs. Max Lbs. o Unmating Min Lbs. Max Lbs. Normal Force at.016 deflection Initial o Min Grams Set o Max Grams Set

11 Thermal o Min Grams o Max Grams Insulation Resistance minimums, IR Initial o Mated ,000 Meg Ω Pass o Unmated ,000 Meg Ω Thermal o Mated ,000 Meg Ω o Unmated ,000 Meg Ω Humidity o Mated ,000 Meg Ω o Unmated ,000 Meg Ω Dielectric Withstanding Voltage minimums, DWV Initial o Breakdown Mated VAC Unmated ,100 VAC o DWV Mated VAC Unmated VAC o Working voltage Mated VAC Unmated VAC Thermal o Breakdown Mated VAC Unmated ,100 VAC o o DWV Mated VAC Unmated VAC Working voltage Mated VAC Unmated VAC Humidity o Breakdown Mated VAC Unmated ,000 VAC o o DWV Mated VAC Unmated VAC Working voltage Mated VAC Unmated VAC LLCR Durability (200 LLCR test points) Initial mohms Max Durability, 50 Cycles o <= +5.0 mohms Points Stable o +5.1 to mohms Points Minor o to mohms Points Acceptable o to mohms Points Marginal o to mohms Points Unstable o >+2000 mohms Points Open Failure

12 Thermal o <= +5.0 mohms Points Stable o +5.1 to mohms Points Minor o to mohms Points Acceptable o to mohms Points Marginal o to mohms Points Unstable o >+2000 mohms Points Open Failure o Humidity o <= +5.0 mohms Points Stable o +5.1 to mohms Points Minor o to mohms Points Acceptable o to mohms Points Marginal o to mohms Points Unstable o >+2000 mohms Points Open Failure LLCR Gas Tight (200 LLCR test points) Initial mOhms Max Gas-Tight o <= +5.0 mohms Points Stable o +5.1 to mohms Points Minor o to mohms Points Acceptable o to mohms Points Marginal o to mohms Points Unstable o >+2000 mohms Points Open Failure SUPPLEMENTAL TESTING Capacitance Initial o Min pf o Max pf Thermal o Min pf o Max pf

13 DATA SUMMARIES TEMPERATURE RISE (Current Carrying Capacity, CCC): 1) High quality thermocouples whose temperature slopes track one another were used for temperature monitoring. 2) The thermocouples were placed at a location to sense the maximum temperature generated during testing. 3) Temperature readings recorded are those for which three successive readings, 15 minutes apart, differ less than 1 C (computer controlled data acquisition). 4) Adjacent contacts were powered: a. Linear configuration with six (1 X 6) adjacent conductors/contacts powered. Maximum Current, Amp per Contact Room Temp= 22.6 C TC contacts in linear series PCIE F-D-TH C Limit Base Curve Derated 20 % RT Peak Amp RT Derated Amp Measured Current 65 C 65 C Peak Amp 65 C Derated Amp 75 C 75 C Peak Amp 75 C Derated Amp Limit 95 C Peak Amp 95 C Derated Amp 95 C Room Temp 1.0 Useful Range Ambient Temperature, C

14 DATA SUMMARIES continued b. Clustered configuration with six (2 x 3) adjacent conductors/contacts powered. Maximum Current, Amp per Contact Room Temp= 21.9 C TC contacts in clustered series PCIE F-D-TH C Limit Base Curve Derated 20 % RT Peak Amp RT Derated Amp Measured Current 65 C 65 C Peak Amp 65 C Derated Amp 75 C 75 C Peak Amp 75 C Derated Amp Limit 95 C Peak Amp 95 C Derated Amp 95 C Room Temp 1.0 Useful Range Ambient Temperature, C CONTACT GAPS: Initial Measurements in inches After 50 Cycles Measurement in inches After Thermal Measurement in inches After Humidity Measurement in inches Minimum Minimum Minimum Minimum Maximum Maximum Maximum Maximum Average Average Average Average St. Dev St. Dev St. Dev St. Dev Count 164 Count 164 Count 164 Count 164

15 DATA SUMMARIES continued Height Measurements Upper GAP - Inches Nominal PCIE Upper Nominal Lower Lower Initial Mating Thermal Humidity Stress MATING/UNMATING: Force (Oz) Initial After 50 Cycles Mating Unmating Mating Unmating Force (Lbs) Force (Oz) Force (Lbs) Force (Oz) Force (Lbs) Force (Oz) Force (Lbs) Minimum Maximum Average After Thermal After Humidity Force (Oz) Mating Unmating Mating Unmating Force (Lbs) Force (Oz) Force (Lbs) Force (Oz) Force (Lbs) Force (Oz) Minimum Maximum Average Force (Lbs)

16 DATA SUMMARIES Continued Mating/Unmating Compare Forces, lbs Mating Unmating Initial After 50 Cycles After Thermal After Humidity Stress

17 DATA SUMMARIES Continued NORMAL FORCE (FOR CONTACTS TESTED IN THE HOUSING): 1) Calibrated force gauges are used along with computer controlled positioning equipment. 2) Typically, 8-10 readings are taken and the averages reported. 100 Normal Force Comparison Initial vs Thermal 90 Initial Thermal Grams Deflection, Inches Initial Deflections in inches Forces in Grams SET Averages Min Max St. Dev Count Thermal Deflections in inches Forces in Grams SET Averages Min Max St. Dev Count

18 INSULATION RESISTANCE (IR): DATA SUMMARIES Continued Initial, Meg Ohms Thermal, Meg Ohms Humidity, Meg Ohms Mated Unmated Mated Unmated Mated Unmated Insulation Resistance Insulation Resistance Insulation Resistance Insulation Resistance Insulation Resistance Insulation Resistance Average Min Max DIELECTRIC WITHSTANDING VOLTAGE (DWV): Initial, VAC Mated Initial, VAC Unmated Breakdown Voltage DWV Working Voltage Breakdown Voltage DWV Working Voltage Average Min Max Thermal, VAC Mated Thermal, VAC Unmated Breakdown Voltage DWV Working Voltage Breakdown Voltage DWV Working Voltage Average Min Max Humidity, VAC Mated Humidity, VAC Unmated Breakdown Voltage DWV Working Voltage Breakdown Voltage DWV Working Voltage Average Min Max

19 DATA SUMMARIES Continued LLCR: 1) A total of 200 points were measured. 2) EIA , Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets. 3) A computer program, LLCR 221.exe, ensures repeatability for data acquisition. 4) The following guidelines are used to categorize the changes in LLCR as a result from stressing. a. <= +5.0 mohms: Stable b to mohms: Minor c to mohms: Acceptable d to mohms: Marginal e to mohms Unstable f. >+2000 mohms: Open Failure Date Nov Nov Nov Nov Room Temp C RH 22% 22% 49% 39% Name Troy Cook Troy Cook Troy Cook Troy Cook mohm values Actual Delta Delta Delta Initial 50 Cycles Thermal Humidity Average St. Dev Min Max Count Board #1 40 delta LLCR mohms Initial 50 Cycles Thermal Humidity Sequence P1 P2 P3 P4 P5 P6 P7 P8 P9 P10 P11 P12 P13 P14 P15 P16 P17 P18 P19 P20 P21 P22 P23 P24 P25

20 DATA SUMMARIES Continued Board #2 40 delta LLCR mohms Initial 50 Cycles Thermal Humidity Sequence P1 P2 P3 P4 P5 P6 P7 P8 P9 P10 P11 P12 P13 P14 P15 P16 P17 P18 P19 P20 P21 P22 P23 P24 P25 Board #3 40 delta LLCR mohms Initial 50 Cycles Thermal Humidity Sequence P1 P2 P3 P4 P5 P6 P7 P8 P9 P10 P11 P12 P13 P14 P15 P16 P17 P18 P19 P20 P21 P22 P23 P24 P25

21 DATA SUMMARIES Continued Board #4 40 delta LLCR mohms Initial 50 Cycles Thermal Humidity Sequence P1 P2 P3 P4 P5 P6 P7 P8 P9 P10 P11 P12 P13 P14 P15 P16 P17 P18 P19 P20 P21 P22 P23 P24 P25 Board #5 40 delta LLCR mohms Initial 50 Cycles Thermal Humidity Sequence P1 P2 P3 P4 P5 P6 P7 P8 P9 P10 P11 P12 P13 P14 P15 P16 P17 P18 P19 P20 P21 P22 P23 P24 P25

22 DATA SUMMARIES Continued Board #6 40 delta LLCR mohms Initial 50 Cycles Thermal Humidity Sequence P1 P2 P3 P4 P5 P6 P7 P8 P9 P10 P11 P12 P13 P14 P15 P16 P17 P18 P19 P20 P21 P22 P23 P24 P25 Board #7 40 delta LLCR mohms Initial 50 Cycles Thermal Humidity Sequence P1 P2 P3 P4 P5 P6 P7 P8 P9 P10 P11 P12 P13 P14 P15 P16 P17 P18 P19 P20 P21 P22 P23 P24 P25

23 DATA SUMMARIES Continued Board #8 40 delta LLCR mohms Initial 50 Cycles Thermal Humidity Sequence P1 P2 P3 P4 P5 P6 P7 P8 P9 P10 P11 P12 P13 P14 P15 P16 P17 P18 P19 P20 P21 P22 P23 P24 P25 GAS TIGHT: 1) A total of 200 points were measured. 2) EIA , Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets. 3) A computer program, LLCR 221.exe, ensures repeatability for data acquisition. 4) The following guidelines are used to categorize the changes in LLCR as a result from stressing. a. <= +5.0 mohms: Stable b to mohms: Minor c to mohms: Acceptable d to mohms: Marginal e to mohms: Unstable f. >+2000 mohms: Open Failure Date Nov Dec Room Temp C RH 28% 17% Name Troy Cook Troy Cook mohm values Actual Delta Initial Gas Tight Average St. Dev Min Max Count

24 DATA SUMMARIES Continued Board #1 40 P1 delta LLCR mohms Initial Gas Tight P2 P3 P4 P5 P6 P7 P8 P9 P10 P11 P12 P13 P14 P15 P16 P17 P18 P19 P20 P21 P22 P23 P24 P25 Sequence Board #2 40 P1 delta LLCR mohms Initial Gas Tight P2 P3 P4 P5 P6 P7 P8 P9 P10 P11 P12 P13 P14 P15 P16 P17 P18 P19 P20 P21 P22 P23 P24 P25 Sequence

25 DATA SUMMARIES Continued Board #3 40 P1 delta LLCR mohms Initial Gas Tight P2 P3 P4 P5 P6 P7 P8 P9 P10 P11 P12 P13 P14 P15 P16 P17 P18 P19 P20 P21 P22 P23 P24 P25 Sequence Board #4 40 P1 delta LLCR mohms Initial Gas Tight P2 P3 P4 P5 P6 P7 P8 P9 P10 P11 P12 P13 P14 P15 P16 P17 P18 P19 P20 P21 P22 P23 P24 P25 Sequence

26 DATA SUMMARIES Continued Board #5 40 P1 delta LLCR mohms Initial Gas Tight P2 P3 P4 P5 P6 P7 P8 P9 P10 P11 P12 P13 P14 P15 P16 P17 P18 P19 P20 P21 P22 P23 P24 P25 Sequence Board #6 40 P1 delta LLCR mohms Initial Gas Tight P2 P3 P4 P5 P6 P7 P8 P9 P10 P11 P12 P13 P14 P15 P16 P17 P18 P19 P20 P21 P22 P23 P24 P25 Sequence

27 DATA SUMMARIES Continued Board #7 40 P1 delta LLCR mohms Initial Gas Tight P2 P3 P4 P5 P6 P7 P8 P9 P10 P11 P12 P13 P14 P15 P16 P17 P18 P19 P20 P21 P22 P23 P24 P25 Sequence Board #8 40 P1 delta LLCR mohms Initial Gas Tight P2 P3 P4 P5 P6 P7 P8 P9 P10 P11 P12 P13 P14 P15 P16 P17 P18 P19 P20 P21 P22 P23 P24 P25 Sequence

28 SUPPLEMENTAL TESTS DATA SUMMARIES Continued CAPACITANCE: Initial Pin - Pin Thermal Pin - Pin pf pf Averages 1.05 Averages 1.00 Min 0.60 Min 0.50 Max 1.50 Max 1.50 St. Dev 0.64 St. Dev 0.71 Count 2 Count 2

29 CONTACT GAPS: DATA Measurements in inches Initial After 50 Cycles After Thermal After Humidity Sample# B1 B2 B1 B2 B1 B2 B1 B

30

31 DATA continued MATING/UNMATING: Initial After 50 Cycles Mating Unmating Mating Unmating Sample# Force (Oz) Force (Lbs) Force (Oz) Force (Lbs) Force (Oz) Force (Lbs) Force (Oz) Force (Lbs) After Thermal After Humidity Mating Unmating Mating Unmating Sample# Force (Oz) Force (Lbs) Force (Oz) Force (Lbs) Force (Oz) Force (Lbs) Force (Oz) Force (Lbs)

32 DATA continued NORMAL FORCE (FOR CONTACTS TESTED IN THE HOUSING): Initial Deflections in inches Forces in Grams SET Averages Min Max St. Dev Count Initial Deflections in inches Forces in Grams Sample # SET Thermal Deflections in inches Forces in Grams SET Averages Min Max St. Dev Count Initial Deflections in inches Forces in Grams Sample # SET

33 INSULATION RESISTANCE (IR): DATA continued Initial, Meg Ohms Mated Unmated Sample # Insulation Resistance Insulation Resistance Thermal, Meg Ohms Mated Unmated Sample # Insulation Resistance Insulation Resistance Humidity, Meg Ohms Mated Unmated Sample # Insulation Resistance Insulation Resistance

34 DATA continued DIELECTRIC WITHSTANDING VOLTAGE (DWV): Initial, VAC Mated Initial, VAC Unmated Breakdown Voltage DWV Working Voltage Breakdown Voltage DWV Working Voltage Thermal, VAC Mated Thermal, VAC Unmated Breakdown Voltage DWV Working Voltage Breakdown Voltage DWV Working Voltage Humidity, VAC Mated Humidity, VAC Unmated Breakdown Voltage DWV Working Voltage Breakdown Voltage DWV Working Voltage

35 DATA Continued LLCR: Date Nov Nov Nov Nov Room Temp C RH 22% 22% 49% 39% Name Troy Cook Troy Cook Troy Cook Troy Cook mohm values Actual Delta Delta Delta Initial 50 Cycles Thermal Humidity Average St. Dev Min Max Count mohm values Actual Delta Delta Delta Board Position Initial 50 Cycles Thermal Humidity 1 P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P

36 2 P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P

37 4 P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P

38 6 P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P

39 8 P P P P P P P P P P P P P P P P P P P

40 GAS TIGHT: DATA Continued Date Nov Dec Room Temp C RH 28% 17% Name Troy Cook Troy Cook mohm values Actual Delta Initial Gas Tight Average St. Dev Min Max Count mohm values Actual Delta Board Position Initial Gas Tight 1 P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P

41 2 P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P

42 4 P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P

43 6 P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P

44 8 P P P P P P P P P P P P P P P P P P P

45 SUPPLEMENTAL CAPACITANCE: DATA Continued Initial Thermal Test Date: 12/9/2005 Test Date: 12/9/2005 Operator: Troy Cook Operator: Troy Cook Temperature: 24 Temperature: 24 Humidity: 22% Humidity: 22% Equipment ID: CAPM-01 Equipment ID: CAPM-01 Initial Pin - Pin Thermal Pin - Pin Sample # pf Sample # pf

46 EQUIPMENT AND CALIBRATION SCHEDULES Equipment #: THL-02 Description: Temperature/Humidity Chart Recorder Manufacturer: Dickson Model: THDX Serial #: Accuracy: Temp: +/- 1C; Humidity: +/-2% RH (0-60%) +/- 3% RH (61-95%). Last Cal: 06/16/05, Next Cal: 06/16/06 Equipment #: MO-02 Description: Multimeter /Data Acquisition System Manufacturer: Keithley Model: 2700 Serial #: Accuracy: See Manual Last Cal: 05/12/05, Next Cal: 05/12/06 Equipment #: MO-04 Description: Multimeter /Data Acquisition System Manufacturer: Keithley Model: 2700 Serial #: Accuracy: See Manual - DO NOT USE UNTIL CALIBRATED. Last Cal: 6/12/04, Next Cal: 6/12/05 Equipment #: PS-01 Description: System Power Supply Manufacturer: Hewlett Packard Model: HP 6033A Serial #: (HP) 3329A Accuracy: See Manual Last Cal: 05/12/05, Next Cal: 05/12/06 Equipment #: TC /105 Description: IC Thermocouple-103/105 Manufacturer: Samtec Model: Serial #: TC /105 Accuracy: +/- 1 degree C Last Cal:, Next Cal: Equipment #: OGP-01 Description: 6''X 6'' Video Measuring Machine Manufacturer: Optical Gauging Products Model: Smartscope 200 CFOV Serial #: SF Accuracy: See Manual Last Cal: 04/12/05, Next Cal: 04/12/06

47 Equipment #: TCT-01 Description: Test Stand Manufacturer: Chatillon Model: TCD-1000 Serial #: Accuracy: Speed Accuracy: +/-5% of max speed; Speed Accuracy: +/-5% of max speed; Last Cal: 6/23/05, Next Cal: 6/23/06 Equipment #: LC-50-2 Description: Chatillon Remote Load Cell, 50 Lb Range Manufacturer: Chatillon Model: Broken - Out of use and replaced. Serial #: F43963 Accuracy: Last Cal:, Next Cal: Equipment #: THC-01 Description: Temperature/Humidity Chamber Manufacturer: Thermotron Model: SM Serial #: Accuracy: See Manual Last Cal: 7/15/2005, Next Cal: 8/15/2006 Equipment #: OV-03 Description: Cascade Tek Forced Air Oven Manufacturer: Cascade Tek Model: TFO-5 Serial #: Accuracy: Temp. Stability: +/-.1C/C change in ambient Last Cal: 05/12/05, Next Cal: 05/12/06 Equipment #: HPM-01 Description: Hipot Megommeter Manufacturer: Hipotronics Model: H306B-A Serial #: Accuracy: 2 % Full Scale Accuracy Last Cal: 5/12/05, Next Cal: 05/12/06 Equipment #: TCT-04 Description: Dillon Quantrol TC mm/min series test stand Manufacturer: Dillon Quantrol Model: TC2 I series test stand Serial #: Accuracy: Speed Accuracy: +/- 5% of indicated speed; Speed Accuracy: +/- 5% of indicated speed; Last Cal: 4/28/2005, Next Cal: 4/28/2006

48 Equipment #: LC-5N (icell)-2 Description: 5 Newton load cell for Dillon Quantrol test stand Manufacturer: Dillon Quantrol Model: icell Serial #: Accuracy:.10 % of capacity Last Cal: 4/19/2005, Next Cal: 4/19/2006 Equipment #: MO-01 Description: Micro-Ohmeter Manufacturer: Keithley Model: 580 Serial #: Accuracy: See Manual Last Cal: 05/12/05, Next Cal: 05/12/06 Equipment #: MO-03 Description: Multimeter /Data Acquisition System Manufacturer: Keithley Model: 2700 Serial #: Accuracy: See Manual Last Cal: 05/12/05, Next Cal: 05/12/05 Equipment #: CAPM-01 Description: BK Precision 810C Capacitance Meter Manufacturer: BK Precision Model: 810C Serial #: Accuracy: See Manual for accuracy Last Cal: 5/9/2005, Next Cal: 6/9/2006