Technical Committee: LITD 02 LITD 02/T

Transcription

1 DRAFTS IN WIDE CIRCULATION DOCUMENT DESPATCH ADVICE Ref Date Technical Committee: LITD 02 LITD 02/T ADDRESSED TO: 1. All members of Reliability of Electronic and Electrical components and Equipment Sectional Committee, LITD All Principal Members of Electronics and Information Technology Department, LITDC 3. All others interested Dear Sir(s), Please find enclosed the documents listed in ANNEX Kindly examine these draft standards and forward your views stating any difficulties which you are likely to experience in your business or profession, if these are finally adopted as Indian Standards. Last date for comments: Comments if any, may please be made in the format attached and mailed to the undersigned/ sent to the address indicated. It may kindly be noted that the technical contents of the documents has not been enclosed as these are identical with the corresponding IEC standards. Thanking you, Yours faithfully, (Narendra Singh) Head (Electronics and IT) BUREAU OF INDIAN STANDARDS MANAK BHAVAN, 9 B.S.Z. Marg, NEW DELHI Telefax: hlitd@bis.org.in / litd@bis.org.in

2 ANNEX Sl Document No. No 1 LITD02(10366) /IEC 61882: LITD 02(10367) /IEC 62402: LITD 02(10369) /IEC LITD 02(10370) /IEC : LITD 02(10371) /IEC :2001 Title Hazard and operability studies (HAZOP Studies) Application guide Obsolescence management Application guide Dependability management Part 3: Application guide Sec 10 Maintainability Dependability management Part 3: Application guide Sec 2: Collection of dependability data from the field. Dependability management Part 3: Application guide Sec 5 Reliability test conditions and statistical test principles

3 य पक परच लन मस द ल ख ण स पन तकन क समत : एलआईटड 02 स दभ दन क एलआईटड 02/ट प न व ल क न म: 1) इल नक एव इल कल स घटक व उपकर क लए नभरण यत वषय समत, एलआईटड 02 क सभ सदय 2) इल नक एव स चन य गक वभ ग परषद क ध न सदय 3) च रखन व ल अय मह दय(य) मस द अन ब ध म सल न ह : क य इन मस द क अवल कन कर और अपन स मतय यह बत त ह ए क यद यह भ रत य म नक क शत ह त अमल करन म आप क यवस य म य कठन ईय आ सकत ह समत यद क ई ह त क य अध हत र क दए गय पत पर स लगन फ मट म भ ज द / मईल कर समतय भ जन क आखर तथ क पय न ट कर क मस द क तकन क वषय वत क स ल नत नह कय गय ह यक य मस द आई. ई. स. म नक क समप ह धयव द स लनक : उपर त भवदय (नर स ह) म ख (इल नक व आई ट) hlitd@bis.org.in/ litd@bis.org.in

4 स लनक. ल ख स य स. 1 एल आई ट ड 02(10366) / आई ई स 61882: एल आई ट ड 02(10367) / आई ई स 62402: एल आई ट ड 02(10369) / आई ई स : एल आई ट ड 02(10370) / आई ई स : एल आई ट ड 02(10371) / आई ई स :2001 श षक ज खम एव स क यत अययन - (ह ज़ प टड ज़) - अन य ग दश नदश अचलन बधन - अन य ग दश नदश नभरण यत बधन - भ ग 3 अन य ग म गदशत -अन भ ग 10: अन रण यत म गदशक नभरण यत बधन - भ ग 3 अन य ग म गदशत - अन भ ग 2 स नभरण यत ड ट क स ह नभरण यत बधन भ ग 3: अन य ग दश नदश - अन भ ग 5: ववसन यत परण अवथ य एव स यकय परण स त

5 FORMAT FOR COMMENTS Date Document No Doc: LITD 02 ( ) S.No. Name of the Organization Clause/ Sub clause Paragraph/ Figure/Table Type of Comment (General/ Technical/ Editorial Comments Proposed Change

6 Doc: LITD 02(10366) /IEC61882:2001 BUREAU OF INDIAN STANDARDS DRAFT FOR COMMENTS ONLY (Not to be reproduced without the permission of BIS or used as a STANDARD) Draft Indian Standard HAZARD AND OPERABILITY STUDIES (HAZOP STUDIES) APPLICATION GUIDE Last date of receipt of comments: 20 August 2016 Reliability of Electronic and Electrical Components and Equipment, LITD 02 NATIONAL FOREWORD This Indian Standard which is identical with IEC :2001 Hazard and operability studies (HAZOP studies) Application guide' issued by the International Electrotechnical Commission (IEC) was adopted by the Bureau of Indian Standards on the recommendations of the Reliability of Electronic and Electrical Components and Equipment Sectional Committee and approval of the Electronics and Information Technology Division Council. The text of IEC Standard has been approved as suitable for publication as an Indian Standard without deviations. Certain conventions and terminologies are, however, not identical to those used in Indian Standards. Attention is particularly drawn to the following: a) Wherever the words International Standard appear referring to this standard, they should be read as Indian Standard. b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to use a point (.) as the decimal marker. In this adopted standard, reference appears to the following International Standard for which Indian Standard also exists. The corresponding Indian Standard which is to be substituted in place is listed below along with its degree of equivalence for the editions indicated:

7 International Standard Corresponding Indian Standard Degree of Equivalence IEC 60812: 2006 Analysis IS (Part 2): 2012 Analysis Identical Techniques for system reliability Techniques for system reliability Procedure for failure mode and Part 2 Procedure for failure mode effects analysis (FMEA) and effects analysis (FMEA) The technical committee has reviewed the provisions of the following International Standards referred in this adopted standard and has decided that they are acceptable for use in conjunction with this standard: International Standard IEC IEC IEC Title Dependability Management Part 3: Application Guide Section 9 Risk Analysis of technological systems Fault tree analysis (FTA) Formal design review Only the English language text of the IEC Standard has been retained while adopting it as an Indian Standard, and as such the page numbers given here are not the same as in IEC Standard. For the purpose of deciding whether a particular requirement of this standard is complied with, the final value, observed or calculated, expressing the result of a test or analysis, shall be rounded off in accordance with IS 2:1960 Rules for rounding off numerical values (revised). The number of significant places retained in the rounded off value should be the same as that of the specified value in this standard.

8 Doc: LITD 02(10367) /IEC 62402: 2007 BUREAU OF INDIAN STANDARDS DRAFT FOR COMMENTS ONLY (Not to be reproduced without the permission of BIS or used as a STANDARD) Draft Indian Standard OBSOLESCENCE MANAGEMENT - APPLICATION GUIDE Last date of receipt of comments: 20 August 2016 Reliability of Electronic and Electrical Components and Equipment, LITD 02 NATIONAL FOREWORD This Indian Standard which is identical with IEC : 2007 Obsolescence management - Application guide issued by the International Electro technical Commission (IEC) was adopted by the Bureau of Indian Standards on the recommendation of the Reliability of Electronic and Electrical Components and Equipment Sectional Committee and approval of the Electronics and Information Technology Division Council. The text of IEC Standard has been approved as suitable for publication as an Indian Standard without deviations. Certain conventions and terminologies are, however, not identical to those used in Indian Standards. Attention is particularly drawn to the following: a) Wherever the words International Standard appear referring to this standard, they should be read as Indian Standard. b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to use a point (.) as the decimal marker. The technical committee has reviewed the provisions of the following International Standards referred in this adopted standard and has decided that they are acceptable for use in conjunction with this standard: International Standard Title IEC International Electrotechnical Vocabulary (IEV) - Part 191: Dependability and quality of service IEC Dependability management - Part 1: Dependability management systems

9 IEC IEC Dependability management Part 2: Guidelines for dependability management Project risk management - Application guidelines IEC/TS Process management for avionics Preparation of an electronic components management plan IEC (all parts) Semiconductor die products IEC Dependability of products containing reused parts - Requirements for functionality and tests With respect to Clause it is clarified, that it may not be possible to provide full access to parts data of OCM (Original Component Manufacturer) to the customer as there can be intellectual property involved. For the purpose of deciding whether a particular requirement of this standard is complied with, the final value, observed or calculated, expressing the result of a test or analysis, shall be rounded off in accordance with IS 2:1960 Rules for rounding off numerical values (revised). The number of significant places retained in the rounded off value should be the same as that of the specified value in this standard.

10 Doc: LITD 02(10369) /IEC : 2001 BUREAU OF INDIAN STANDARDS DRAFT FOR COMMENTS ONLY (Not to be reproduced without the permission of BIS or used as a STANDARD) Draft Indian Standard DEPENDABILITY MANAGEMENT PART 3 SEC 10: APPLICATION GUIDE - MAINTAINABILITY Last date of receipt of comments: 20 August 2016 Reliability of Electronic and Electrical Components and Equipment, LITD 02 NATIONAL FOREWORD This Indian Standard which is identical with IEC : 2001 Dependability management - Part 3-10 : Application guide Maintainability issued by the International Electrotechnical Commission (IEC) was adopted by the Bureau of Indian Standards on the recommendations of the Reliability of Electronic and Electrical Components and Equipment Sectional Committee and approval of the Electronics and Information Technology Division Council. The text of IEC Standard has been approved as suitable for publication as an Indian Standard without deviations. Certain conventions and terminologies are, however, not identical to those used in Indian Standards. Attention is particularly drawn to the following: a) Wherever the words International Standard appear referring to this standard, they should be read as Indian Standard. b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to use a point (.) as the decimal marker. In this adopted standard, reference appears to the following International Standard for which is Indian Standard also exist. The corresponding Indian Standard which is to be substituted in place is listed below along with its degree of equivalence for the edition indicated: International Standard Corresponding Indian Standard Degree of Equivalence IEC 60812: 2006 Analysis IS (Part 2): 2012 Analysis Techniques for system reliability Techniques for system reliability Identical Procedure for failure mode and Part 2 Procedure for failure mode effects analysis (FMEA) and effects analysis (FMEA)

11 IEC Dependability - IS 15474: 2004 Dependability - Identical Part 3: Application guide Application guide - Section 3: Life cycle costing Life cycle costing IEC Guide on IS 9692 (Part 7): 1984 Guide on Equivalent Maintainability of equipment maintainability of equipment - Part 3: Verification and Collection, analysis and presentation Collection, analysis and of data related to maintainability Presentation of data IEC Guide on IS 9692(Part 8/various sections) Identical Maintainability of equipment Guide on maintainability of Part 4 Section 8 Maintenance equipment Maintenance and And maintenance support planning maintenance support planning IEC Dependability IS 15474(Part 3/Section 11) - Identical Management Part 3-11: Dependability Management - Application guide Reliability Application guide Reliability Centred maintenance Centred maintenance The technical committee has reviewed the provisions of the following International Standards referred in this adopted standard and has decided that they are acceptable for use in conjunction with this standard: International Standard Title IEC International Electrotechnical Vocabulary (IEV) - Part 191: Dependability and quality of service IEC Dependability management - Part 1: Dependability management systems IEC Dependability management Part 2: Guidelines for dependability management IEC Dependability management - Part 3: Application guide IEC Dependability management Part 3: Application guide Section 2 Collection of dependability data from the field IEC Dependability management Part 3: Application guide Section 9 Risk analysis of technological systems IEC (all parts) Guide on maintainability of equipment IEC Guide on maintainability of equipment Part 2 Section 5 Maintainability studies during the design phase IEC Guide on maintainability of equipment - Part 5 Section 4 Diagnostic testing IEC Presentation of reliability, maintainability and availability Predictions

12 IEC IEC Fault tree analysis (FTA) Formal Design Review A brief write-up on Markov models are given in ANNEX Only the English language text has been retained while adopting it in this Indian Standard and as such the page numbers given here are not the same as in the IEC publication. For the purpose of deciding whether a particular requirement of this standard is complied with, the final value, observed or calculated, expressing the result of a test or analysis, shall be rounded off in accordance with IS 2:1960 Rules for rounding off numerical values (revised). The number of significant places retained in the rounded off value should be the same as that of the specified value in this standard.

13 ANNEX Markov models In 1907, Andrey Markov (the Russian mathematician) began the study of an important new type of random process. In this process, the outcome of a given experiment can affect the outcome of the next experiment. In order for the basic Markov approach to be applicable, the behavior of the system must be characterized by a lack of memory, that is, the future states of a system are independent of all past states except the immediately preceding one. Therefore the future random behavior of a system only depends on where it is at present, not on where it has been in the past or how it arrived at its present position. In addition the process must be stationary, sometimes called homogeneous, for the approach to be applicable. This means that the behavior of the system must be the same at all points of time irrespective of the point of time being considered, i.e., the probability of making a transition from one given state to another is the same (stationary) at all times in the past and future. Markov processes can be classified based on the nature of parameters (discrete or continuous) and also based on the nature of state space of the process. The state space is called discrete if it contains a finite (or countably infinite) number of states otherwise it is called as continuous. In this way we have four classifications of Markov processes based on time and state spaces, while each of them could be discrete or continuous. A Markov process whose state space is discrete is designated as a Markov-chain. The basic concepts of Markov modelling can be illustrated by considering the simple system shown in Figure 1. In this system two system states are identifiable, being designated as 1 and 2 The probabilities of remaining in or leaving a particular state in a finite time are also shown in the figure 1, and these probabilities are assumed to be constant for all times into the future. State probability can be defined as the probability that the system stays in a particular state, where as branch probability is the probability that the system moves from one state to another state. 1 / 2 1 / / 4 1 / 4 1 Represents State of the system Remaining in the same state Transition from one state to another state Figure 1: Discrete Markov Chain-A two state system Matrix solution techniques are used frequently for solving the state space markov model. In order to apply matrix techniques it is necessary to deduce a matrix which represents the probabilities of making

14 a transition from one state to another in a single step or time interval. A stochastic matrix is a square matrix whose columns are probability vectors which add up to one. A stochastic matrix which contains state transitional probabilities as elements is called stochastic transitional probability matrix. Consider the example of two state system shown in the Figure 1, the transition probabilities can be represented by the following matrix P. P P P P P / 2 1/ 4 1/ 2 3/ 4 (1) Where P ij = Probability of making a transition to state j after a time interval given that it was in state i at the beginning of the time interval Continuous Markov chains are normally concerned with systems that are discrete in space, i.e., they can exist in one of a number of discrete and identifiable states and continuous in time; i.e., they exist continuously in one of the system states until a transition occurs which takes them discretely to another state in which they then exist continuously until another transition occurs. The state space diagram for Continuous Markov chains is similar to the discrete time Markov chain, the only difference is the transitions in the case of discrete were represented by the value of transitional probability whereas in the case of continuous time Markov chains they are usually represented by a transition rate as shown in Figure 2, i.e., by the transitions λ and μ from the state 1 and 2 respectively. λ 1 2 μ Figure 2: State space diagram of Continuous Markov chain - two state system An incremental interval of time Δt can be introduced which is sufficiently small that the probability of two or more transitions occurring in the interval is negligible. A stochastic transitional probability matrix can be derived in terms of this discretised form of the continuous process since the probability of occurrence of a transition in this interval of time is equal to the transition rate times the time interval. If the transition rate from state 1 to state 2 is λ then the probability of transition in time Δt = λ Δt and the probability of no transition in time Δt = 1-λ Δt. The stochastic transitional probability matrix for the system can be written as 1 2 P 1 t t t 1 t (2)

15 where (1-λ Δt) = Probability of system staying in state 1 itself λ Δt = Probability of system transferring from state 1 to state 2 (1-μ Δt) = Probability of system staying in state 2 itself μ Δt = Probability of system transferring from state 2 to state 1 Consider now an incremental interval of time dt. The probability of being in the state 1 after this time interval dt i.e., at time (t + dt) is [Probability of being in state 1 at time t AND no transition to state 2 in time dt] + [Probability of being in state 2 at time t AND transition from state 2 to 1in time dt] This can be written as P1 ( t dt) P1 (1 dt) P2 ( dt) (3) Similarly, P2 ( t dt) P2 (1 dt) P1 ( dt) (4) From equation 3 P1 ( t dt) P1 P1 P2 dt as dt 0 P1 ( t dt) P1 dt thus, P( t) P P 1 1 dt0 2 dp1 P 1( t) dt P 2 P1 P1 (5b) (5a) Similarly, equation 4 from Equations 5 may be expressed in matrix form as P t) P( t) P P (5 ) 1( c

16 ) (6 ) (6 ) ( 2 ) ( 1 b e t P a e t P t t Markov models and evaluation techniques can play a vital role in the evaluation of system reliability. In the case of continuous processes the models are governed by sets of differential equations. The solution technique can be considerably simplified by constructing and using the stochastic transitional probability matrix. --xx--

17 Doc: LITD 02(10370) /IEC : 2004 BUREAU OF INDIAN STANDARDS DRAFT FOR COMMENTS ONLY (Not to be reproduced without the permission of BIS or used as a STANDARD) Draft Indian Standard Dependability management Part 3-2: Application guide Collection of dependability data from the field Last date of receipt of comments: 20 August 2016 Reliability of Electronic and Electrical Components and Equipment, LITD 02 NATIONAL FOREWORD This Indian Standard which is identical with IEC : 2004 Dependability management Part 3-2 : Application guide Collection of dependability data from the field issued by the International Electrotechnical Commission (IEC) was adopted by the Bureau of Indian Standards on the recommendations of the Reliability of Electronic and Electrical Components and Equipment Sectional Committee and approval of the Electronics and Information Technology Division Council. The text of IEC Standard has been approved as suitable for publication as an Indian Standard without deviations. Certain conventions and terminologies are, however, not identical to those used in Indian Standards. Attention is particularly drawn to the following: a) Wherever the words International Standard appear referring to this standard, they should be read as Indian Standard. b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to use a point (.) as the decimal marker. The technical committee has reviewed the provisions of the following International Standards referred in this adopted standard and has decided that they are acceptable for use in conjunction with this standard: International Standard Title IEC International Electrotechnical Vocabulary (IEV) - Part 191: Dependability and quality of service Only the English language text of the IEC Standard has been retained while adopting it as an Indian Standard, and as such the page numbers given here are not the same as in IEC Standard.

18 For the purpose of deciding whether a particular requirement of this standard is complied with, the final value, observed or calculated, expressing the result of a test or analysis, shall be rounded off in accordance with IS 2:1960 Rules for rounding off numerical values (revised). The number of significant places retained in the rounded off value should be the same as that of the specified value in this standard.

19 Doc: LITD 02(10371) /IEC : 2001 BUREAU OF INDIAN STANDARDS DRAFT FOR COMMENTS ONLY (Not to be reproduced without the permission of BIS or used as a STANDARD) Draft Indian Standard Dependability management Part 3-5: Application guide Reliability test conditions and statistical test principles Last date of receipt of comments: 20 August 2016 Reliability of Electronic and Electrical Components and Equipment, LITD 02 NATIONAL FOREWORD This Indian Standard which is identical with IEC : 2001 'Dependability management Part 3-5: Application guide Reliability test conditions and statistical test principles' issued by the International Electrotechnical Commission (IEC) was adopted by the Bureau of Indian Standards on the recommendation of the 'Reliability of Electronic and Electrical Components and Equipment' Sectional Committee and approval of the Electronics and Information Technology Division Council. The text of IEC Standard has been approved as suitable for publication as an Indian Standard without deviations. Certain conventions and terminologies are, however, not identical to those used in Indian Standards. Attention is particularly drawn to the following: a) Wherever the words International Standard appear referring to this standard, they should be read as Indian Standard. b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to use a point (.) as the decimal marker. In this adopted standard, reference appears to the following International Standard for which is Indian Standard also exist. The corresponding Indian Standard which is to be substituted in place is listed below along with its degree of equivalence for the edition indicated: International Standard Corresponding Indian Standard Degree of Equivalence IEC (all parts) IS 9000 (various parts) Identical Environmental testing

20 IEC Dependability IS 15474(Part 3/Section 7) Identical management Part 3 Application Dependability management Part 3 Guide Section 7 Reliability stress Application guide Section 7 Reliability Screening of electronic hardware stress screening of electronic hardware IEC Equipment reliability IS 8161 (Part 2) Equipment reliability Equivalent testing Part 2 Design of test cycles testing Part 2 Design of test cycles IEC Equipment reliability IS 8161 (Part 4) Equipment reliability Equivalent Testing Part 4 Procedures for testing Part 4 Procedures for Determining point estimates and determining point estimates and Confidence limits from equipment confidence limits from equipment Reliability determination tests reliability determination tests IEC Equipment reliability IS 8161 (Part 6/Section2) Equipment Equivalent Part 6 Tests for the validity of the reliability testing Part 6 Tests for Constant failure rate or constant validity of a constant failure rate Intensity assumptions assumption - Section 2 Kolmogorov- Smirnov test IEC Analysis techniques IS 11137(Part2) Analysis techniques Equivalent For system reliability Procedure For system reliability Part 2 Procedure For failure mode and effects For failure mode and effects Analysis (FMEA) Analysis (FMEA) IEC Analysis techniques IS Analysis techniques for Identical For dependability Reliability dependability Reliability block Block diagram method diagram and boolen methods IEC Reliability testing - IS 8161 (Part 5) Guide for equipment Identical Compliance test plans for reliability testing Part 5 Compliance test Success ratio plans for success ratio IEC Reliability testing IS 8161(Part 7) Guide for equipment Identical Compliance tests for constant reliability testing Part 7 Compliance tests Failure rate and constant failure for constant failure rate and constant failure Intensity intensity IEC Reliability growth - IS Reliability growth - Identical Statistical test and estimation Statistical test and estimation Methods methods The technical committee has reviewed the provisions of the following International Standards referred in this adopted standard and has decided that they are acceptable for use in conjunction with this standard:

21 International Standard Title IEC International Electrotechnical Vocabulary (IEV) - Part 191: Dependability and quality of service IEC Dependability management Part 2: Dependability programme elements and tasks IEC Dependability management Part 3: Application guide Section 2: Collection of dependability data from the field IEC Dependability management Part 3: Application guide Section 4: Guide to the specification of dependability requirements IEC Fault tree analysis (FTA) IEC Compliance test procedures for steady-state availability IEC Goodness of fit tests, confidence intervals and lower confidence limits for Weibull distributed data IEC Reliability data analysis techniques Procedures for comparison of two constant failure rates and two constant failure (event) intensities IEC Power law model Goodness of fit and estimation methods ISO Statistical interpretation of data Tests and confidence intervals relating to proportions ISO Statistics Vocabulary and symbols Part 1 Probability and general statistical terms Only the English language text of the IEC Standard has been retained while adopting it as an Indian Standard, and as such the page numbers given here are not the same as in IEC Standard. For the purpose of deciding whether a particular requirement of this standard is complied with, the final value, observed or calculated, expressing the result of a test or analysis, shall be rounded off in accordance with IS 2:1960 Rules for rounding off numerical values (revised). The number of significant places retained in the rounded off value should be the same as that of the specified value in this standard.