COST Action MP1307. Harald Hoppe Past Experience & Future Plans

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1 COST Action MP1307 Stable Next Generation Photovoltaics: Unraveling Degradation Mechanisms of Organic Solar Cells by Complementary Characterization Techniques. 2 nd MC Meeting and 1 st WG Meeting Harald Hoppe Past Experience & Future Plans Hotel Condes de Barcelona, Barcelona, Spain. 8 th -9 th October, 2014 COST is supported by the EU Framework Programme ESF provides the COST Office through a European Commission contract

2 Past: ISOS-3 experience

3 Everything started at ISOS-3 Initiated by Frederic Krebs during ISOS-3 Several experiments were suggested First experiences on large-scale collaborations for the investigation of OPV degradation Constitutes kind of early example for this COST Action 3

4 The ISOS-3 inter-laboratory collaboration (3 rd International Summit on OPVs Stability) David M. Tanenbaum Markus Hösel Henrik F. Dam Mikkel Jørgensen Suren Gevorgyan Kion Norrman Birgitta Andreasen Morten V. Madsen Eva Bundgaard Frederik C. Krebs Ronn Andriessen Roland Rösch Harald Hoppe Agnès Rivaton Gülşah Y. Uzunoğlu David Germack Gerardo Teran-Escobar Monica Lira-Cantu Eszter Voroshazi Martin Hermenau Matthew T. Lloyd Yulia Galagan Birger Zimmermann Suleyman Kudret Wouter Maes Dirk Vanderzande Laurence Lutsen Uli Würfel

5 Devices under testing SEMI or UN-ENCAPSULATED Inverted OPVs ENCAPSULATED ITO-free OPVs Small-molecule OPV 2.5 cm IMEC

6 Stability Test Performed Degraded under identical conditions at DTU 1.- Dark storage in ambient air Analysis at ~ T Low level indoor fluorescent lighting 3.- Acelerated full sun simulation ~ T 50 ~ T 10 DEVICES TESTED ALTOGETHER

7 Efficiencies of all the devices degraded under accelerated full sun simulation plotted as a function of time IAPP HOLST ISE DTU Risø P DTU Risø S NREL IMEC Encapsulated PCE (%) Time (hours) Semi or Not encapsulated - Tanenbaum, D.M. et al., RSC Adv. 2, (2012).

8 Multiple reports from this inter-laboratory collaboration: 1) Efficiency degradation with time 2) Different Imaging characterization techniques Dark Lock-In Thermography (DLIT) Photoluminescence Imaging (PLI) 1) IPCE and in-situ IPCE analysis - Tanenbaum, D.M. et al., RSC Adv. 2012, 2, Light-Beam-Induced-Current (LBIC) Electroluminescence Imaging (ELI) - Rösch, R., et al., Energy and Environmental Science 2012, 5, G. Teran-Escobar, et al., et al. Physical Chemistry Chemical Physics 2012, 14, ) TOF-SIMS analysis - Andreasen, B.; Physical Chemistry Chemical Physics 2012, 14,

9 Past: ISOS-3 cycle experiment

10 The ISOS-3 Cycle Experiment

11 DoE: ISOS-3 Cycle Experiment Recurring characterization and degradation of selected photovoltaic devices. Enables to follow certain degradation features with course of stressing time. Here we report on combined imaging and IVcharacterizations.

12 ISOS-3 Cycle Experiment Fabrication IAPP Fabrication ISE Fabrication HOLST Fabrication IMEC Fabrication NREL Fabrication Risø Non-destructive Characterization: IV + Risø Non-destructive Characterization: Imaging TU Ilmenau Degradation: Accelerated aging & in situ Risø

13 ISOS-3 Cycle Experiment: Stress!!! Accelerated test conditions for life-time measurements: 100mW/cm² (full sun) intensity under a KHS 1200 solar simulator up to 85 C constant temperature Conditions

14 ISOS-3 Cycle Experiment: Lifetime 3 groups for device behavior: i) HOLST and NREL degrade rather quickly ii) ISE, IAPP, RisøP degrade steadily with time iii) IMEC and RisøS show considerably slowed down degradation Overview

15 HOLST Solar Cell Degradation Just one example

16 HOLST Solar Cell Degradation: encapsulated

17 HOLST Solar Cell Degradation: encapsulated DLIT forward (no LBIC signal) LBIC

18 HOLST Solar Cell Degradation: encapsulated Stages of degradation: 60 1) water release from PEDOT:PSS upon thermal stress ( 85 C) 2) localized aluminum oxidation blocking layer formation 3) complete aluminum oxidation Current (ma) Holst-cycle 0 h, T h, T h, T Voltage (V)

19 Back to the future: Suggestion

20 Background: Suggested Experiment: P3HT Large variation of device stabilities reported JUST for P3HT:PCBM Suspicion: Different suppliers different stability! need to understand the cause! (purity, molecular weight,?) Approach: Stability Get X different BIG BATCHES of commercial P3HT of different suppliers Get X different Cell Producers from WG2 Equally share P3HT of different suppliers among cell producers Make conventional and inverted devices based on X different P3HTs & cell producers 3D parameter space!!! 20

21 Fabrication TÜBITAK Fabrication ICN2 Fabrication CLARET P3HT Stability Fabrication EIT+ Fabrication HOLST Fabrication TU Ilmenau WG4 Leader WG4: Non-destructive Characterization: Imaging TU Ilmenau WG3: Degradation: Accelerated aging & in situ IV WG4: Non-destructive Characterization: ISE WG4: Non-destructive Characterization: Fluxim Joint decision WG2, WG3, WG4, WG5 WG5: Destructive Characterization TOF- DTU WG5: Destructive Characterization UMONS WG5: Destructive Characterization TCD

22 Tomorrow: Experimental Design

23 Design of COST Experiments Tomorrow we will have a closer look on: Introduction to all Working Groups What kind of Samples will be investigated? Which Experiments will be conducted? Design of Experiments Scheduling Experiments Administration of Experiments WG Leader and Chair of Experiment (CoE) Potential Hurdles and Obstacles Hints for Efficient Experiments Escalation Steps and Flow Charts 23

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25 Samples: Solliance (NL) Layer Material Thickness (nm) Printed (P) Or Evaporated (E) Substrate glass 0.7 cm Transparent Electrode ITO 120 Transport Layer ZnO ~30 P Active Layer P3HT:PCBM ~220 P PCDTBT:PC(70)BM Transport Layer PEDOT:PSS ~100 P Metal electrode Ag 100 E Encapsulation Contacts (4 point, 2 point) Metal lid 2-point Number of samples to deliver: ± 20 25