Optimizing SiP Test Cost with a Platform Approach

Transcription

1 Optimizing SiP Test Cost with a Platform Approach SiP Conferences China 2018 Pearl He APAC Semi BDM Manager National Instruments ni.com

2 Mission Statement NI equips engineers and scientists with systems that accelerate productivity, innovation, and discovery. ni.com

3 $1.23 7,500+ EMPLOYEES 50+ COUNTRIES BILLION IN ,000+ CUSTOMERS WORLDWIDE OVER 18% INVESTMENT IN R&D $1,400 $1,200 Long-Term Track Record of Growth Revenue in millions USD $1,000 $800 $600 $400 $200 $0 '87 '88 '89 '90 '91 '92 '93 '94 '95 '96 '97 '98 '99 '00 '01 '02 '03 '04 '05 '06 '07 '08 '09 '10 '11 '12 '13 '14 '15 '16

4 The World of Converged Devices More capability defined in software Functions change rapidly Increasingly complex to design and test

5 Unique Attributes of Smart Devices - Common Test Needs CONVERGENCE LOWER PRICE RAPID CHANGE More functionality Ensure high reliability Lowest cost Fast time to market

6 Markets for System-in-Package RF and wireless devices Integrated Passive Devices Solid-state drives (SSDs) Automotive applications IoT for wearable and machine to machine (M2M) products Power modules Source:

7 System-in-Package Implications on Test Diverse markets and applications Demand for plug-and-play Demand for lower total cost High volumes and rapid ramp cycles Economics of traditional test solutions disrupted!

8 Challenges with SiP Production Testing Long Test Time Comparing to Traditional SOC 1. Complexity of functions leads to complexity of test 2. Test mode may not be supported, system level of test is required. No Industrial Standard SiP testing lacks of standard test coverage metrics, choice of tests to be applied at SiP has been selected based on different company testing strategy. Higher Complexity Load Boards SiP load boards resemble that of a reference design of the end-application device High-level communication (Protocol Support) Communicating with an SiP usually use device specific protocols which is usually an IP developed by the SiP maker but may not be readily available to the test vendor.

9 Different SiP Test Scenarios Traditional ATE Custom System Custom System Parametric etc. traditional ATE System Level Test Required System Level Test Required DUT DUT LB DUT Build a system on loadboard DUT is a system Considering different scenarios needs to balance cost and time!

10 Different Solutions to Architect SiP Testing Stability and Reliability Traditional ATE Traditional ATE HW+SW Solution Hard to scale for customization Open Architecture Platform Easy to extension and customization NI STS for production environment In House Design Solution Not reliable for production environment High cost Need time to build and design Handler Centric Solution Using system level test handler software with traditional instruments User Friendly

11 Vendor Strategies for Test and Measurement C L O S E D P L A T F O R M Vendor knows best Fixed-functionality Closed ecosystem Customer pays Customer knows best Customizable solution Open, vibrant ecosystem Customer designs

12 ONE-PLATFORM APPROACH NI SERVICES AND SUPPORT NI ECOSYSTEM Community 300,000+ Online Members 450+ User Groups 9,000+ Code Examples Academia 8,000+ Classrooms Worldwide Partners 1,000+ Alliance Partners Industry-Leading Technology Partners THIRD-PARTY SOFTWARE NI PRODUCTIVE DEVELOPMENT SOFTWARE NI MODULAR HARDWARE THIRD-PARTY HARDWARE Support 700+ Field Engineers 700+ Support Engineers 50+ Worldwide Offices Add-Ons 400+ Software Add-Ons 5M+ Tools Network Downloads Open Connectivity 10,000+ Instrument and Device Drivers 1,000+ Sensor and Motor Drivers NI ECOSYSTEM

13 PXI System Overview PXI Backplane Data Transfer Timing Synchronization Triggering PXI Chassis Power Cooling System Monitoring Enclosure Multicore Embedded Controller PXI I/O Modules 600+ Products RF, DC, DIO

14 Broad Modular Instrumentation Portfolio DAQ and Control Multifunction I/O Counter / Timer / Clock Digital I/O Analog Input / Output Vision and Motion FPGA / Reconfigurable I/O Instrumentation Oscilloscopes High-Speed Digital I/O DMM & SMU Signal Generators Switching RF Analyzers & Generators Interfaces GPIB, USB, LAN RS232 / RS485 CAN, LIN, DeviceNet SCSI, Ethernet VXI - VME Boundary Scan / JTAG

15 NI Semiconductor Test Software Suite of software for test development, execution, and debug TestStand + TestStand Semiconductor Module Sequence Editor/Operator Interface Binning, Handler Integration, Pin/Channel Map, STDF, Multisite Built-in steps for common measurements (e.g. continuity, V cc, etc) Open interface to integrate 3 rd party instruments with multi-site support Digital Pattern Editor Code module development with NI LabVIEW/LabVIEW FPGA or C#/.NET STS Calibration and Diagnostics Software

16 Common Platform that Scales PXI Chassis and Controller PXI Instrumentation and Measurement Software LabVIEW or C# (Code Module Development) and TestStand (Test Management) STS Standardized Docking and Cabling Interface NI PXI NI STS T1 NI STS T2 NI STS T4

17 The NI STS T4 is used for FEM Production Test Dual sites on Turret Handler STS Benefits: Roadmap support to 5G Short Test Time Lower tester capital cost ni.com

18 The NI STS T1 is used for SiP(WiFi +BT) Test Quad site tester that communicates to a custom-designed handler STS Benefits: Vendor-supported ATE platform Test time: 17s vs 65s rack & stack solution Lower tester capital cost Zero footprint ni.com

19 Case Study : IPD Production Test Traditional testers do not have parallel capacitance/inductance instruments at low cost Traditional boxes missing factory integration features Production-ready Operator Interface Handler Control Binning Standard Datalogging (STDF) System calibration and diagnostics Integrated Passive Devices STS T2 Manipulator Support Electrical interface Docking interface STS T2 ni.com

20 Summary P L A T F O R M Customer knows best Customizable solution Open, vibrant ecosystem Customer designs The diversity of SiP markets and applications require test solutions that can scale to meet targeted needs. Traditional approaches for IC package and module test over-serve some requirements while not meeting others. A platform approach to SiP test allows customers to use the elements they need while avoiding the elements (and costs) they don t. When these elements are available on the same platform or within the ecosystem they can be effectively leveraged to reduce overall cost of test.