Space, Avionics & Defense
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1 Space, Avionics & Defense Capacitors makes it possible. Electronic Components
2 Tantalum Defense and Aerospace Parts QPL (Qualified Product Listing) Style MIL-PRF/DLA/ Specification Series Thermal Shock Surge Current Capacitance/ DC Leakage ESR 3 Sigma Screening Seal Test Voltage Aging Weibull Grading X-Ray Reflow Conditioning Lead Pull Strength Visual/Mechanical Surge Voltage PDA Temperature Stability Solderability F-Tech Stimulated Breakdown Screening (SBDS) Step Stress Surge Test (SSST) Polymer Reliability Assessment Method Group C Group B QPL 4937 QPL 4937 QPL 4937 QPL QPL QPL T GR500 T20/T220/T240 2 CSS3/33 MIL-PRF-39003/0 T26/T256 2 CSR3 MIL-PRF-39003/0 T22/T25 CSR09 MIL-PRF-39003/02 T222/T225 CSR23 MIL-PRF-39003/03 T242/T245 CSR9 MIL-PRF-39003/04 T23 CSR33 MIL-PRF-39003/06 T252/T255 CSR2 MIL-PRF-39003/09 T262 CX0, CX05 MIL-PRF-4937//5 T323 CX02, CX2 MIL-PRF-4937/2 T363, T369 CX06 MIL-PRF-4937/6 T378 DLA 3030 T550 Polymer Hermetic Seal 25ºC T55 Polymer Hermetic Seal Modules M550/M55* CWR MIL-PRF-55365/8 T492 CWR09/9/29 MIL-PRF-55365/4/ T409/T49/T429 CWR09//9/29 MIL-PRF-55365/4/8/ T492/T409/T49/T429 DLA 0405 T540 DLA T54 KO- (Polymer) COTS T543 KO- (Polymer) Fused COTS T546 DLA T496 DLA 9558 T495 DLA 0706 T493 MnO2 COTS T493/T497/T53/T496 Ta MnO2 Stacks TSM KO (Polymer) Stacks TSP Space Grade T493/T496/T497/T50 HVE T428 KEY Standard Optional Plane Indicated per PIN T Weibull / Level T * Applies to discrete components; 2 2 Plane Sample on PIN, Stacks 00% modules receive 00% Cap//ESR/Lkg Terminology Guide C-SAM: C-Mode Scanning Acoustic Microscopy (ceramic only) : Destructive Physical Analysis : Dielectric Withstanding Voltage (ceramic only) ESR: Equivalent Series Resistance (ESR) is the preferred high-frequency statement of the resistance unavoidably appearing in these capacitors. ESR is not a pure resistance, and it decreases with increasing frequency. F-Tech: s optional manufacturing process to eliminate hidden defects in the tantalum dielectric (tantalum only). For more information, please see page 7. PDA: Percent Defective Allowed Polymer Reliability Assessment Method: Sample test under accelerated conditions to demonstrate long-term device reliability (polymer only). Please contact for details. SBDS: s patented nondestructive testing technique which simulates the breakdown voltage of a capacitor without damage to its dielectric (tantalum only). For more information, please see page 7. Thermal Shock: Parts are temperature cycled. : Parts receive a voltage conditioning at X rated voltage and X C for a minimum and maximum amount of hours (ceramic only).
3 Ceramic Defense and Aerospace Parts QPL (Qualified Product Listing) Style MIL-PRF/DLA/ Specification Series CSAM In-Process - 00% Visual Inspection In-Process In-Process Lead Pull Strength Thermal Shock Hot IR (+25 C) PDA Visual/Mechanical X-Ray Solderability (each lot) Group B (each lot) Periodic Group B Group C Lot Test per MIL-PRF-5568 Periodic Group C Data Pack (standard w/ order) Pb (lead) Content Humidity Steady State Low Voltage (LVH) Final X-Ray Fluorescence (XRF) Analysis Additional Thermal Shock Cycles (applies to Group A only) 00% Final Visual Inspection Hot C (X7R, C (X5R) QPL M23/, /2, /3 QPL M23/0, /, /2, /3, /2, /22, /23 QPL M23/2, /22, /23 QPL 49470/ QPL 49470/2 QPL 5568/ QPL 5568/2 QPL 5568/3 QPL 5568/7, 8, 9, 0, QPL 20/27, 28, 29, 30, 3 QPL 20/27, 28, 29, 30, 32 QPL 20/35 QPL 20/37, 28 QPL 20/37, 38 QPL 3904/ QPL 3904/2 QPL 3904/5 GR900 B Spec Through-Hole GR900 A Spec SMD MIL-PRF-23, In-Process, Group A Tested Q Spec Through-Hole MIL-PRF-23, In-Process, Group A Tested Q Spec SMD CKS05, CKS06, CKS07 MIL-PRF-23/, /2, /3 * C052Z, C062Z, C52Z CKS5, CKS52, CKS53, CKS54 MIL-PRF-23/0, /, /2, /3 * C0805Z, C20Z, C808Z, C2225Z CKS55, CKS56, CKS57 MIL-PRF-23/2, /22, /23 * C206Z, C82Z, C825Z PS0 MIL-PRF-49470/ T Level LXN, LRN, LQN PS02 MIL-PRF-49470/ B Level LXN, LRN, LQN PS02 MIL-PRF-49470/2 B Level LXN, LRN, LQN CDR0, 02, 03, 04 MIL-PRF-5568/ C0805P, C805P, C808P, C82P CDR05 MIL-PRF-5568/2 C825P CDR06 MIL-PRF-5568/3 C2225P CDR3, 32, 33, 34, 35 MIL-PRF-5568/7, 8, 9, 0, C0805N, C206N, C20N, C82N, C825N CCR/75, 76, 77, 78, 79 MIL-PRF-20/27, 28, 29, 30, 3 C4G, C24G, C92G, C202G, C222G CC/75, 76, 77, 78, 80 MIL-PRF-20/27, 28, 29, 30, 32 C4G, C24G, C92G, C202G, C222G (no FR) CCR05 MIL-PRF-20/35 C052G, C056G CC05 MIL-PRF-20/36 C052G, C056G (no FR) CCR06 MIL-PRF-20/36 C062G, C065G, C066G CC06 MIL-PRF-20/36 C062G, C065G, C066G (no FR) CCR/07, 08 MIL-PRF-20/37, 38 C52G, C522G CC/07, 08 MIL-PRF-20/37, 38 C52G, C522G (no FR) CKR05 MIL-PRF-3904/ C052T, C056T CKR06 MIL-PRF-3904/2 C062T, C066T CKR, 2, 4, 5, 6 MIL-PRF-3904/5 C4T, C24T, C92T, C202T, C222T DLA 03028, 03029, 05006, D Spec 0603, 0805, 0402, 206 DLA 909 E Spec 2220 T Spec 0402, 0603, 0805, 206 *** QPL 05/8, /9, /20 T Spec 20, 82, 825, 2220, 2225 *** CK05, CK06 MIL-PRF-05/8, /9, /20 C052K, C062K, C4K, C24K, C92K, C202K, C222K Note: All series are tested for capacitance, dielectric withstanding voltage, insulation resistance at room temperature, and dissipation factor. KEY Standard Optional - with fee JAN Branding will be affected S Failure Rate Optional tests performed on military specification parts will affect JAN branding. Non-stocking Item MIL-PRF-5568 Group A Tested. BME Dielectric, PME also available on select part numbers.
4 High Reliability Ceramic Capacitors High Reliability Tantalum Capacitors COTS MLCCS DLA 05006/7, 03028/9 & 909 Benefit from advances in commercial grade with tests and screening designed to identify suitable parts for High Reliability Applications POLYMER HERMETIC SEAL T550/ DLA Drawing 3030, T-Level Reliability High capacitance, low ESR, lightweight alternative to wet tantalum axial capacitors Based on polymer cathode technology Ceramic COTS Test Levels F-Tech Advantage Simulated Breakdown Screening (SBDS) Test Level A Test Level B Test Level C PDA 8% PDA 8% PDA 8% s optional F-Tech eliminates hidden defects in the tantalum dielectric. This unique manufacturing process minimizes oxygen and carbon content in the anode, provides a stronger mechanical connection between anode and lead wire and significantly enhances capacitor robustness. F-Tech is available on select tantalum capacitor families and can be combined with SBDS. Breakdown voltage (BDV) is the ultimate test of a capacitor s robustness but is a destructive test. To simulate the results of a breakdown screening, developed a patented Simulated Breakdown Screening (SBDS). This nondestructive testing technique simulates the BDV of a capacitor without damage to its dielectric. This 00% population screening identifies hidden defects in the dielectric, providing the highest level of dielectric testing. SBDS is available on select tantalum capacitor families and can be combined with F-Tech. 85/85 SPACE GRADE MLCCS MIL-PRF-23 Intensive screening and testing protocols with numerous termination options T540 & T54 POLYMER COTS DLA Drawing 0405/2 Only polymer electrolytic capacitors available today with Reliability Assessment testing criteria KPS MIL STACKED ACITORS MIL-PRF-49470, T-Level Reliability Available Higher capacitance in the same footprint Robust termination system MIL-PRF MnO 2 MIL & Space Grade Numerous custom testing/screening options and termination finishes available
5 Product Grades is the undisputed global leader in delivering high performance ceramic and tantalum capacitors. Our Defense and Space Grade products comply with the most stringent reliability requirements in the industry. Commercial Automotive COTS MIL-PRF Space Grade Custom Testing Beyond MIL-PRF and Space Grade Increasing Reliability Catalogs and Technical Data Capacitor Simulation Tool ksim.kemet.com Made for Engineers by Engineers engineeringcenter.com 3D Models, Specifications, and Search Copyright 206 Corporation. All rights reserved. SADC
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