System Level Effects on Solder Joint Reliability

Similar documents
TEMPERATURE CYCLING AND FATIGUE IN ELECTRONICS

Thermo-Mechanical FEM Analysis of Lead Free and Lead Containing Solder for Flip Chip Applications

Effect of Encapsulation Materials on Tensile Stress during Thermo-Mechanical Cycling of Pb-Free Solder Joints

Effect of local grain distribution and Enhancement on edgebond applied wafer-level chip-scale package (WLCSP) thermal cycling performance

White Paper. Discussion on Cracking/Separation in Filled Vias. By: Nathan Blattau, PhD

HOW THE MOLD COMPOUND THERMAL EXPANSION OVERRULES THE SOLDER COMPOSITION CHOICE IN BOARD LEVEL RELIABILITY PERFORMANCE

Reliability of Lead-Free Solder Connections for Area-Array Packages

ENHANCING WLCSP RELIABILITY THROUGH BUILD-UP STRUCTURE IMPROVEMENTS AND NEW SOLDER ALLOYS

Solder joint reliability of plastic ball grid array with solder bumped flip chip

Design for Plastic Ball Grid Array Solder Joint Reliability. S.-W. R. Lee, J. H. Lau*

RELIABILITY OF DOPED LEAD-FREE SOLDER JOINTS UNDER ISOTHERMAL AGING AND THERMAL CYCLING

EVOLUTION OF INTERNAL STATES IN A SN-PB SOLDER JOINT DURING RE-FLOW AND THERMAL CYCLES

Solder joint reliability of cavity-down plastic ball grid array assemblies

EFFECT OF Ag COMPOSITION, DWELL TIME AND COOLING RATE ON THE RELIABILITY OF Sn-Ag-Cu SOLDER JOINTS. Mulugeta Abtew

REWORKABLE EDGEBOND APPLIED WAFER-LEVEL CHIP-SCALE PACKAGE (WLCSP) THERMAL CYCLING PERFORMANCE ENHANCEMENT AT ELEVATED TEMPERATURE

NUMERICAL MODELING OF CYCLIC STRESS-STRAIN BEHAVIOR OF Sn-Pb SOLDER JOINT DURING THERMAL FATIGUE

Basic Project Information. Background. Version: 2.0 Date: June 29, Project Leader: Bart Vandevelde (imec) inemi Staff: Grace O Malley

inemi Statement of Work (SOW) inemi Packaging TIG Impact of Low CTE Mold Compound on 2nd Level Solder Joint Reliability Phase 1 & Phase 2

BOARD LEVEL RELIABILITY COMPARISON OF LEAD FREE ALLOYS

Green IC packaging: A threath to electronics reliability

Effects of Design, Structure and Material on Thermal-Mechanical Reliability of Large Array Wafer Level Packages

Effect of Chip Dimension and Substrate Thickness on the Solder Joint Reliability of Plastic Ball Grid Array Packages* S.-W. Lee, J.H.

Simulations and Characterizations for Stress Reduction Designs in Wafer Level Chip Scale Packages

Field Condition Reliability Assessment for SnPb and SnAgCu Solder Joints in Power Cycling Including Mini Cycles

Reliability of Interconnects in LED Lighting Assemblies Utilizing Metal Clad Printed Circuit Boards Stefano Sciolè BDM I.M.S.

Simulation of Embedded Components in PCB Environment and Verification of Board Reliability

Board Level Reliability of BGA Multichip Modules

Sherlock 4.0 and Printed Circuit Boards

A Solder Joint Reliability Model for the Philips Lumileds LUXEON Rebel LED Carrier Using Physics of Failure Methodology

THERMAL MECHANICAL FATIGUE OF A 56 I/O PLASTIC QUAD-FLAT NOLEAD (PQFN) PACKAGE

Component Palladium Lead Finish - Specification Approved by Executive Board 1997-xx-xx August 22 Version

Modeling Constitutive Model Effect on Reliability of Lead-Free Solder Joints

IMPACT OF MICROVIA-IN-PAD DESIGN ON VOID FORMATION

Low-Silver BGA Assembly Phase II Reliability Assessment Fifth Report: Preliminary Thermal Cycling Results

Low Cycle Fatigue Testing of Ball Grid Array Solder Joints under Mixed-Mode Loading Conditions

EVALUATION OF HIGH RELIABILITY REWORKABLE EDGE BOND ADHESIVES FOR BGA APPLICATIONS

ALT of Lead Free CCAs

Finite Element Analysis of a High Power Resistor

EXTRA FINE PITCH FLIP CHIP ASSEMBLY PROCESS, UNDERFILL EVALUATION AND RELIABILITY

room and cold readouts were performed every 250 cycles. Failure data and Weibull plots were generated. Typically, the test vehicles were subjected to

Reliability Testing of Ni-Modified SnCu and SAC305 - Vibration. Keith Sweatman, Nihon Superior Joelle Arnold, DfR Solutions March 2008

2006 DMSMS Conference Pb-free Solder Technical Issues (Not Including Tin Whiskers)

Modeling Printed Circuit Boards with Sherlock 3.2

Lifetime Prediction and Design Tool Development for Power Electronics Modules

SOLDER JOINT RELIABILITY TEST SUMMARY

Creep Rates and Stress Relaxation for Micro-sized Lead-free Solder Joints

ALPHA SACX Plus Product Guide

Manufacturing and Reliability Challenges With QFN

Solder Joint Reliability Summary Report PART DESCRIPTION. DPAM H-8-1 mated with DPAF H CERTIFICATION

Comparison of Creep Behavior of Lead & Lead Free Solders

ENHANCING MECHANICAL SHOCK PERFORMANCE USING EDGEBOND TECHNOLOGY

2ND LEVEL INTERCONNECT RELIABILITY OF CERAMIC AREA ARRAY PACKAGES

Freescale Semiconductor Tape Ball Grid Array (TBGA) Overview

Qualification of Thin Form Factor PWBs for Handset Assembly

Parametric Design and Reliability Analysis of Wire Interconnect Technology Wafer Level Packaging

3D-WLCSP Package Technology: Processing and Reliability Characterization

DEVELOPMENT OF LEAD-FREE ALLOYS WITH ULTRA-HIGH THERMO- MECHANICAL RELIABILITY

A New Creep Constitutive Model for Eutectic Solder Alloy

On the failure path in shear-tested solder joints

Thermal Fatigue Result for Low and No-Ag Alloys - Pb-Free Alloy Characterization Speaker: William Chao, Cisco Chair: Elizabeth Benedetto, HP

4.10 Exemption no. 8a stakeholder proposal part C (i)

ELEC 6740 Electronics Manufacturing Chapter 5: Surface Mount Design Considerations

ELEC 6740 Electronics Manufacturing Chapter 5: Surface Mount Design Considerations

MICROSTRUCTURE AND RELIABILITY OF LOW AG, BI-CONTAINING SOLDER ALLOYS

Comparison of thermo-mechanical behavior of lead-free copper and tin lead column grid array packages

Lead-free Solder Material Characterization For Themomechanical Modeling

Acceptance Testing Of Low-Ag Reflow Solder Alloys

Welcome to SMTA Brazil Chapter Brook Sandy-Smith Dr. Ron Lasky Tim Jensen

Reliability Enhancement of Wafer Level Packages with Nano-Column-Like Hollow Solder Ball Structures

BOARD LEVEL ASSEMBLY AND RELIABILITY CONSIDERATIONS FOR QFN TYPE PACKAGES

THE competitive nature of electronic packaging industry

Thermal stress analysis of leads in Quad Flat Package: a parametric study

New Pb-Free Solder Alloy for Demanding Applications. Presented by Karl Seelig, VP Technology, AIM

Modeling Temperature Cycle Fatigue Life of Select SAC Solders

Reliability of RoHS-Compliant 2D and 3D 1С Interconnects

Automotive Electronic Material Challenges. Anitha Sinkfield, Delphi

White Paper 0.3mm Pitch Chip Scale Packages: Changes and Challenges

Low Temperature Lead-Free Production Versus SAC

White Paper Quality and Reliability Challenges for Package on Package. By Craig Hillman and Randy Kong

JOINT INDUSTRY STANDARD

Thermo-Mechanical Reliability of Through-Silicon Vias (TSVs)

Modelling Reliability of Power Electronics Modules Current Status and Future Challenges Prof Chris Bailey University of Greenwich

Reliability Study of Subsea Electronic Systems Subjected to Accelerated Thermal Cycle Ageing

Available online at ScienceDirect. Procedia Engineering 79 (2014 )

FEM Analysis on Warpage and Stress at the Micro Joint of Multiple Chip Stacking

Solder Alloy Evolution and Development

S/C Packaging Assembly Challenges Using Organic Substrate Technology

ALPHA OM-5100 FINE PITCH SOLDER PASTE

Modeling the Effect of Microstructure in BGA Joints

Koki no-clean LEAD FREE solder paste. High-reliability Low Ag Lead Free Solder Paste

MARCH National Physical Laboratory Hampton Road Teddington Middlesex United Kingdom TW11 0LW

IPC -7095C Design and Assembly Process Implementation For BGAs

Discrete Capacitor & Resistor Issues. Anthony Primavera Boston Scientific CRM 11/13/06

IMPACT OF LEAD-FREE COMPONENTS AND TECHNOLOGY SCALING FOR HIGH RELIABILITY APPLICATIONS

COMPONENT LEVEL RELIABILITY FOR HIGH TEMPERATURE POWER COMPUTING WITH SAC305 AND ALTERNATIVE HIGH RELIABILITY SOLDERS

CHARACTERISATION OF INTERFACIAL CRACKING IN MICROELECTRONIC PACKAGING

Manufacturing and Reliability Modelling

Best Practice Guide for Thermocycling and Reliability Assessment of Solder Joints

Manufacturability and Reliability Impacts of Alternate Pb-Free BGA Ball Alloys. June 2007

Composition/wt% Bal SA2 (SABI) Bal SA3 (SABI + Cu) Bal

Transcription:

System Level Effects on Solder Joint Reliability Maxim Serebreni 2004 2010

Outline Thermo-mechanical Fatigue of solder interconnects Shear and tensile effects on Solder Fatigue Effect of Glass Style on Solder Fatigue Effect of Improper Conformal Coating Effect of Mirroring Influence of Board Mounting and Housing Physics of Failure Methodology Solder Alloy Selection Approach

Solder Fatigue in Microelectronics Solder fatigue in electronics components is the results of temperature fluctuations or mechanical loads transmitted to the components through the assembly. Lead and package geometry influences solder joint response to mechanical loads. Solder geometry will dictate the stress distribution at the interface. Temperature fluctuations in field environments are not the same as accelerated thermal cycling conditions as defined by many standards. 3

Thermo-mechanical Fatigue of solder interconnects

Thermomechanical Fatigue of Solder Interconnects: Underfill Reduced fatigue life in BGA packages with underfill Axial strain and shear strain contribution to thermo-mechanical fatigue life How does axial loading contributes to reduction in fatigue life of BGA components

Shear and tensile effects on Solder Fatigue

Shear and tensile effects on Solder Fatigue Fatigue sensitivity of bulk solder alloys to loading direction translates to thermomechanical fatigue of solder interconnects of electronic components. Ratcheting strain accumulation due to secondary strain accumulation significantly reduces cycles to failure. Experimental loading path Liang, Ting, et al. "Torsional fatigue with axial constant stress for Sn 3Ag 0.5 Cu lead-free solder." International Journal of Fatigue 67 (2014): 203-211.

Shear and tensile effects on Solder Fatigue Lower cycles to failure observed for underfill with certain materials properties Partial flow underfill - slightly lower fatigue life. CSP package 12x12, 228 I/O, 0.5mm pitch, SAC305 solder, 0.3mm ball diameter, 1 mm thick FR4 PCB. -40ºC to 125ºC, 10 min dwell, 15ºC/min ramp thermal cycles Shi, Hong-Bin, and Toshitsugu Ueda. "Mitigation of thermal fatigue failure in fully underfilled lead-free array-based package assemblies using partial underfills." Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th. IEEE, 2011.

Effect of Glass Style on Solder Fatigue

Effect of Glass Style on Solder Fatigue Different glass style type will result in different CTE which in turn affects solder fatigue Larger component are more sensitive to changes in the board CTE 7628 7 layers (63 mil PCB) 1080 19 layers (63 mil PCB) 1 x1 44 32 Isola-group.com 1 x1 60 47

Effect of Glass Style on Solder Fatigue Incremental change in temperature and CTE range are directly proportional to shear strain range experienced by solder interconnects Glass style and board thickness can drastically influence thermo-mechanical fatigue life as illustrated using Physics of Failure models. Calculated elastic modulus and CTE for different glass styles Fatigue life of a 2512 resistor mounted on a PCB with different glass styles and board thickness Sharon, Gilad, and Cheryl Tulkoff. "Temperature Cycling and Fatigue in Electronics." DfR Solutions. Acesso em 10 (2015).

Effect of Improper Conformal Coating

Effect of Improper Conformal Coating Components used are 17x17mm, 256 IO BGA Test vehicle was a 2.05 mm (81mil) thick, 8 layer PCB that was populated with 60 BGAs Thick coating was applied to components on one side of the board with a syringe to ensure that it wicked under the BGAs Standard coating was then sprayed on the other half of the board Multiple test vehicles were produced for different conformal coatings and test conditions Test Vehicle after Thick conformal coating had been applied to the right side (coating visible due to UV light)

Effect of Improper Conformal Coating Temperature Profile 1: temperature range of -55 C to +125 C 620 cycles total cycles Temperature Profile 2: temperature range of -20 C to +80 C 2020 cycles total cycles. Temperature profiles per IPC- 9701 minimum 15 minute dwell time at each temperature extreme ramp rate of 5-10 C per minute

Effect of Improper Conformal Coating Effect of conformal coating on stress distribution in BGA during thermal cycling. Worst case: Conformal coating flowed underneath component. 17x17 mm 256 IO BGA Mechanical behavior of solder alloy is sensitive to simulation methodology. Interaction of deformation mode needs to be considered by accurately modeling material behavior at each condition

Effect of Improper Conformal Coating Corner joint with Pb-free solder exhibits slight distance to neutral effect. Die shadow joint exhibits a more uniform axial strain distribution Peak strain occurs at the interface of the solder and copper pad Maximum axial strain location shifts from the top to bottom copper pads throughout the thermal profile and dwell periods Von Mises stress distribution in SAC305 BGA with Thick conformal coating at 125 C

Effect of Improper Conformal Coating Von Mises stress of corner Pbfree solder joints was similar to stress profile of SnPb solder joint at both temperature extremes and profiles Higher magnitude of stress with Thick conformal coating is shown at the cold dwell temperature than at the hot dwell temperature Due to the higher stiffness and lack of creep and relaxation in Pb-free solder joints at the cold temperature Mechanical deformation alternates between creep and plasticity with transition of the temperature extremes (a) (b) Von Mises stress for corner joint with thick conformal coating at (a) 125 C (b) -55 C (a ) (b ) Von Mises stress for corner joint with thick conformal coating at (a) 80 C (b) -20 C

Effect of Improper Conformal Coating Similar strain distribution for SnPb corner joint with Standard and Thick conformal coating at high dwell temperature Larger diagonal shear strain accumulation for corner joints with the Thick conformal coating Control sample showed a more uniform strain distribution at the cold temperature dwell with high magnitude SnPb37 BGA Min. principal strains at 125 C for corner joint (a) with Thick coating (b) without Thick coating. SnPb37 BGA Min. principal strains at -55 C for corner joint (a) with Thick coating (b) without Thick coating.

Effect of Improper Conformal Coating Acrylic conformal coating carries compressive pre-strain on Pb-free and SnPb solder joints to the subsequent thermal cycles. The amount of compressive pre-strain applied by the acrylic depends on the glass transition temperature (Tg) and the thermal profile. Difference in thermal conduction between materials can introduce lag in mechanical response which could affect numerical results. Strain in the axial direction dominates loading mode and places solder joints under mean compressive strain during thermal cycling. Maximum principal strain with and without conformal coating Axial stress with and without conformal coating. SAC305 corner solder joint with Thick Conformal Coat, Temperature Profile 1

Effect of Improper Conformal Coating Distinct difference in solder joint failure mechanism between standard and heavy conformal coating processes Distance to Neutral Point (DNP) effect contributes to failure location and is dependent on temperature profile SnPb BGA with acrylic Standard coating showing cracking in upper left size of solder joint at 1600 cycles. SnPb BGA with Thick acrylic coating survived 1600 cycles a) corner joint b) joint in middle row SnPb BGA with Thick conformal coating failed at 1055 thermal cycles (-20 to 80 C) a) corner joint b) joints in the middle of a row.

Effect of Improper Conformal Coating Results show a distinct difference in solder joint failure mechanism between Standard and Thick conformal coating processes Higher loads transfer to Pb-free solder resulting in severe plastic deformation Pb-free solder is less compliant than SnPb solder, which led to shorter fatigue life under similar test conditions SAC305 Control sample (no coating) showing cracking along bottom pad Failure of SAC305 BGA with acrylic conformal coating (-55 to 125 C): a) Standard b) Thick coating

Effect of Improper Conformal Coating BGA with SAC305 (Pb-Free) solder joints under temperature profile 2 with thick coating found to have lowest fatigue life High β value for the thick coating indicates influence of failure mechanism on transition from wearout dependent failure BGA with SnPb solder joints with standard and thick application of acrylic conformal coating shows greater fatigue resistance compared to the Pb-free components under equivalent test conditions 2 parameter Weibull fit Alloy SAC305 SnPb Application method n F( n) 1 exp q Temp Profile β q First failure Control 1 7.9 256 173 Standard 1 5.7 448 245 Thick 1 16.7 197 171 Control 2 8.4 2600 1532 Standard 2 4.2 2054 935 Thick 2 3.8 191 88 Control 1 16.9 631 514 Standard 1 14.6 567 472 Thick 1 6.1 573 364 Control 2 N/A N/A N/A Standard 2 13.5 1453 1060 Thick 2 4.8 1554 756

Effect of Mirroring

Effect of Mirroring Previous researchers have shown the negative effect of double sided configuration on the thermo-mechanical fatigue life of area array components. A 2x to 3x decrease in reliability can occur in mirror image assemblies compared to single sides configurations. Meifunas, M., et al. "Measurement and prediction of reliability for double-sided area array assemblies." Electronic Components and Technology Conference, 2003. Proceedings. 53rd. IEEE, 2003.

Effect of Mirroring FEA modeling on 17x17mm BGA with 256 IO. Over-constraining of the PCB resulting in reduced package compliance and larger strain transfer to solder joints along with the DNP effect.

Effect of Mirroring Corners joints for mirrored BGA package show a 25% increase in strain magnitude compared to single sided configuration at the start of the first high temperature dwell of 125 C. After 3 thermal cycles, peak difference between mirrored and control boards indicate 2x increase in strain energy density. Single Sided Mirrored

Influence of Board Mounting and Housing

Influence of Board Mounting and Housing Mounting points directly influence board strains during thermal expansion and vibration loading. Proximity of mounting points and connectors to components should be factored in reliability assessment with the intended use environment. Interaction of potting compounds with housing and thermal management of assembly should be considered.

Physics of Failure Methodology

Physics of Failure (PoF) Approach Accuracy of the models depend on simplifying assumption of material properties. PoF models are deterministic in nature and cannot be applied to all failure mechanisms. PoF approach enables us to track effects of material change on component reliability under wear out failure mechanisms. Models offer the ability to evaluate reliability performance based on both extrinsic and intrinsic parameters of electronic components. An accurate PoF approach consists of a combination of analytical equations, numerical simulations.

Physics of Failure Approach Case study: Reliability of Quad-flat no-lead (QFN) packages. Steps: 1. Create geometric dependency with material properties 2. Simplify material properties dependence on loading conditions 3. Apply constitutive models with material properties to calculate mechanical behavior of interconnects. 4. Introduce appropriate damage parameter to fatigue behavior of solder interconnects.

Solder Alloy Selection Approach

Solder Alloy Selection Approach With an increase variety of electronic packages there is an inherent decrease in overall board reliability. Reliability of solder alloys depends on a combination of package type, board properties, operational environment and manufacturing quality. Fatigue crack propagation path is sensitive to as reflowed solder grain morphology and loading orientation. Bieler, T. R., et al. "Influence of Sn grain size and orientation on the thermomechanical response and reliability of Pb-free solder joints." Electronic Components and Technology Conference, 2006. Proceedings. 56th. IEEE, 2006. Cyclic axial loading

Solder Alloy Selection Approach Example of drop and thermal cycling performance of BGA with SAC alloys of different silver content. Reliability of solder alloys greatly depends on the test type and alloy content. (a) Drop impact test (b) Temperature cycling test Global loading conditions dominate thermal Mechanical Fatigue loading which overcome the benefits of increase fatigue Resistance of some high temperature solder alloys Shnawah, Dhafer Abdulameer, Mohd Faizul Mohd Sabri, and Irfan Anjum Badruddin. "A review on thermal cycling and drop impact reliability of SAC solder joint in portable electronic products." Microelectronics reliability 52.1 (2012): 90-99.

Tools for Solder Fatigue Free solder fatigue calculator available at dfrsolutions s website along with a extensive resources for electronics reliability. http://www.dfrsolutions.com/reliability-calculators 35

Conclusion & Recommendations Thermomechanical fatigue of solder interconnects largely depends on configuration and material properties of the components used. PCB selection for qualification tests and production should consist of the same materials and geometries to avoid inconsistencies in failure rates. Board selection should take into consideration the CTE and modulus of the final assembly. Avoid acrylics with glass transition temperature within operating or environmental temperature change. PoF approach should be implemented along with solder alloy selection procedures. Simulation results should be assessed with evaluation of test data to prevent early fatigue failures.

Thank you for your attention!!! Maxim Serebreni mserebreni@dfrsolutions.com Mark Musitano mmusitano@dfrsolutions.com 301-640-5809