JECP/HOLZ, an Interactive Computer Program for Simulation of HOLZ Pattern

Similar documents
Diffraction Going further

TEM and Electron Diffraction Keith Leonard, PhD (1999) U. Cincinnati

TEM imaging and diffraction examples

Electron Microscopy. Dynamical scattering

TEM imaging and diffraction examples

Signals from a thin sample

Simulation of PolyCrystalline Electron Diffraction & Phase Identification. (PCED3i) User s manual. X.Z. LI, Ph. D.

Microstructural Characterization of Materials

ISIS-SYMMETRY. interdisciplinary Symposium. Abstracts. Edited by GY. Darvas and D. Nagy

Advances in EBSD Analysis Using Novel Dynamical Pattern Simulation Software

UNIVERSITY OF OSLO. Faculty of Mathematics and Natural Sciences

Practical 2P8 Transmission Electron Microscopy

11.3 The analysis of electron diffraction patterns

LECTURE 7. Dr. Teresa D. Golden University of North Texas Department of Chemistry

Diffraction Basics. The qualitative basics:

Crystallographic Textures Measurement

X-RAY DIFFRACTIO N B. E. WARREN

Single crystal X-ray diffraction. Zsolt Kovács

Supplementary Figure 1: Geometry of the in situ tensile substrate. The dotted rectangle indicates the location where the TEM sample was placed.

EMSE Weak-Beam Dark-Field Technique

Principles & Practice of Electron Diffraction

Why does the growth rate slow down as a precipitate thickens during diffusion-controlled growth?

Fundamentals of Crystalline State p. 1 Introduction p. 1 Crystalline state p. 2 Crystal lattice and crystal structure p. 4 Shape of the unit cell p.

Fundamentals of X-ray diffraction and scattering

Crystal symmetry of La 3 Cu 2 VO 9 and La 4 Cu 3 MoO 12 derived from the YAlO 3 hexagonal structure by transmission electron microscopy

Fundamentals of Crystalline State and Crystal Lattice p. 1 Crystalline State p. 2 Crystal Lattice and Unit Cell p. 4 Shape of the Unit Cell p.

X-RAY DIFFRACTION IN SEMICONDUCTOR INDUSTRY AND RESEARCH

INTERPRETATION OF TRANSMISSION ELECTRON MICROGRAPHS

This experiment is included in the upgrade packages: XRC 4.0 X-ray characteristics and XRS 4.0 X-ray structural analysis.

Strain. Two types of stresses: Usually:

Seminar: Structural characterization of photonic crystals based on synthetic and natural opals. Olga Kavtreva. July 19, 2005

Time-resolved diffraction profiles and structural dynamics of Ni film under short laser pulse irradiation

Earth & Planetary Science Applications of X-Ray Diffraction: Advances Available for Research with our New Systems

7-2E. Photonic crystals

X-Ray Diffraction by Macromolecules

Optical Characterization of Epitaxial Semiconductor Layers

Practical 2P8 Transmission Electron Microscopy

Dynamical Scattering and Defect Imaging

ARTICLE IN PRESS. Ultramicroscopy

Key crystallographic concepts: Theory of diffraction. (Crystallography y without tears, Part 1)

Faceted inversion domain boundary in GaN films doped with Mg

Electron channelling contrast imaging (ECCI) an amazing tool for observations of crystal lattice defects in bulk samples

and high-angle annular dark-field scanning transmission electron microscope

High Resolution X-ray Diffraction

CHEM-E5225 :Electron Microscopy Imaging II

Example: Compute the wavelength of a 1 [kg] block moving at 1000 [m/s].

Carbon nanostructures. (

Supplementary Figure 1. Cutaway view of in-situ environmental gas cell. Gas flows

Bio5325 Fall Crystal Vocabulary

Interpenetrative and transverse growth process of self-catalyzed ZnO nanorods

STUDY & ANALYSIS OF ALUMINIUM FOIL AND ANATASE TITANIUM OXIDE (TiO2) USING TRANSMISSION ELECTRON MICROSCOPY

Imaging with Diffraction Contrast

The object of this experiment is to test the de Broglie relationship for matter waves,

The structure of near-spherical carbon nano-shells

X-Ray Diffraction. Nicola Pinna

A Modeling Platform for Ultrasonic Immersion Testing of Polycrystalline Materials with Flaws

Answer All Questions. All Questions Carry Equal Marks. Time: 20 Min. Marks: 10.

LECTURE 25 and 26. Simple Bending Theory OR Theory of Flexure for Initially Straight Beams

Structure factors and crystal stacking

Electron diffraction data: new perspectives

E. Buffagni, C. Ferrari, L. Zanotti, A. Zappettini

A NEW APPROACH TO STUDYING CAST CB2 STEEL USING SLOW AND VERY SLOW ELECTRONS

Basics of XRD part I. 1 KIT 10/31/17. Name of Institute, Faculty, Department. The Research University in the Helmholtz Association

Dislocations Linear Defects

General Objective. To develop the knowledge of crystal structure and their properties.

Microsoft Office Project 2010 Basic Course 01: Getting Started

Supplementary Material for: Grain Boundary Specific Segregation in Nanocrystalline Fe(Cr)

Combining symmetry operations

Principles of depth-resolved Kikuchi pattern simulation for electron backscatter diffraction

Practical Application of Training tasks Based on Flexible Manufacturing System Hongmei Fan

Chapter 3 Basic Crystallography and Electron Diffraction from Crystals. Lecture 9. Chapter 3 CHEM Fall, L. Ma

Background Statement for SEMI Draft Document 5945 New Standard: Test Method for Determining Orientation of A Sapphire Single Crystal

EBSD Basics EBSD. Marco Cantoni 021/ Centre Interdisciplinaire de Microscopie Electronique CIME. Phosphor Screen. Pole piece.

To receive technical support and updates, you need to register your Intel(R) Software Development Product. See the Technical Support section.

CURVATURE MEASUREMENTS OF STRESSED SURFACE-ACOUSTIC- WAVE FILTERS USING BRAGG ANGLE CONTOUR MAPPING

Thin Film Scattering: Epitaxial Layers

Morphological Transition of Isotactic Polybutene-1 Tetragonal Crystals: Optical and Transmission Electron Microscopy Observation

Density Computations

Rietveld analysis of policrystalline materials using precession of electron diffraction

Electron Probe Micro-Analysis (EPMA)

X-ray diffraction

Twins & Dislocations in HCP Textbook & Paper Reviews. Cindy Smith

Agilent VEE Pro 9.3. Data Sheet

Quantitative Analysis of Atomic-scale Alloying Elements Using TEM

Microstructures and dislocations in the stressed AZ91D magnesium alloys

Instytut Fizyki Doświadczalnej Wydział Matematyki, Fizyki i Informatyki UNIWERSYTET GDAŃSKI

This lecture is part of the Basic XRD Course.

Symmetry in crystalline solids.

Agilent VEE Pro 9.2 and Agilent VEE Express 9.2

Kinematical theory of contrast

Workshop RIETVELD REFINEMENT OF DIFFRACTION PATTERNS Program Monday June 1st, Introduction to Rietveld refinement S.

Magnetic structures and excitations in rare-earth earth metals. Jens Jensen Ørsted Laboratory Niels Bohr Institute Denmark

Supplementary Materials for

Lecture course on solid state physics for Nano, 2019

Experiment 2b X-Ray Diffraction* Optical Diffraction Experiments

Enhanced electrochemical performance of Li-rich cathode materials through microstructural control

Physical structure of matter. Monochromatization of molybdenum X-rays X-ray Physics. What you need:

Transmission Electron Microscopy (TEM) Prof.Dr.Figen KAYA

System Dynamics Tutorial

ACD MIS SUPERVISOR S GUIDE

Transcription:

JECP/HOLZ, an Interactive Computer Program for Simulation of HOLZ Pattern (Version 2t) X.Z. Li, Ph. D Copyright(C) 2002-2017 LANDYNE All Rights Reserved. Contents: 1. Purpose of the program 2. Graphic user interface and program design 3. Formulas for calculating the positions of the HOLZ lines 4. Installation and user instruction 5. Feedback and licenses 6. References 1. Purpose of the program JECP/HOLZ (Li, 2005) is one computer program in the Java Electron Crystallography Package (JECP), which is designed and written by Dr. X.Z. Li. The package is developed for (semi-)quantitative electron diffraction analysis and image processing purpose. JECP/HOLZ is an interactive program for simulation of the higher-order Laue zone (HOLZ) lines using kinematical approximation and a first-order dynamic correction. JECP/HOLZ2a is the second version of JECP/HOLZ. HOLZ2a has improvement over HOLZ including but not limited to the following, improved GUI with a display panel and a HOLZ dialog. add intensity threshold in HOLZ dialog for easy adjustments. a new display system to better show the labels for CBED pattern. a new display system to better show the HOLZ index. crystal constraint for fine tuning of lattice parameters. allow to save the HOLZ pattern to.jpg and.tif. improved i/o fold system for easy input/output data/patterns. incorporate with Landyne launcher. JECP/HOLZ2t is the current version of JECP/HOLZ. HOLZ2t updates the GUI menu and upgraded with the elemental periodic table and the space group table, HOLZ2t can be used as a 1

teaching aid for students on fundamental crystallography as well as a tool for scientists working on TEM experiments. 2. Graphic user interface (GUI) and program design A snapshots of the JECP/HOLZ2t panel with a HOLZ pattern. This is snapshots of the JECP/HOLZ2 panel with a CBED pattern. 2

This is the HOLZ dialog and index dialogs for HOLZ and CBED patterns. 3

3. Formulas for calculating the positions of the HOLZ lines 3.1 Formulas of the HOLZ lines under kinematical theory A HOLZ line in the kinematical approximation is the locus of the Bragg condition for a HOLZ reflection g. The incident beam k is described as kn along -z and kt in (x, y) plane. We may think of the HOLZ line as a function of Kt, a vector which originates in the center of the zone axis and extends to a point of interest in the central disk, the trajectory is described by the following two equations (Spencer and Zuo, 1992): (1) (2) 4

Here. If we use a paraboloid equation, as an approximation of the sphere equation,, we end up with an equation for the HOLZ line trajectory (Li, 2007): (3). In the early work by Tanaka and Terauchi (1985) and also in a book by De Graef (2003), the formation of the HOLZ is interpreted as the intersection of a HOLZ reflection disk with the Ewald sphere. If we increase the beam convergence angle to obtain a convergent beam pattern, then each reciprocal lattice point becomes a disk, with each point in the disk corresponding to a difference incident beam direction. The HOLZ reflections also become disks that are parallel to the HOLZ layers. The intersection of these disks with the Ewald sphere, which is inclined with respect to the HOLZ layer, is a (curved) line segment across the disk. For the beam orientations corresponding to this line segment, electrons will be dynamically scattered out of the transmitted beam and into the HOLZ beam. Thus the equation for HOLZ trajectory is, (4) 3.2 Formulas of the HOLZ lines under a first-order dynamical correction The first-order dynamical correction was developed for the simplicity in calculation (Bithell and Stobbs, 1989; Lin et al. 1989; Zuo, 1992). In the first-order dynamical correction, it is assumed that only weak interactions occur between HOLZ reflections, the position of a HOLZ line in the central disc can be approximated by finding the intersection between the zero-layer dispersion surface (k1=k0+γ (1), here γ (1) is the distance of the topmost excited branch of the dispersion surface from the sphere at the zone axis itself) and a plane-wave sphere centered on the HOLZ reflection. When the incident beam is far away from a zone axis, the first branch of the dispersion surface can be approximately considered as sphere with radii of k1=k0+γ (1). Thus, the dynamically corrected HOLZ-line equation is derived as (Li, 2007): (5) Here. When the incident beam is near or at a zone axis, the first branch of the dispersion surface can be approximately considered as a flat plane with a distant of k1=k0+ (1) to the origin of reciprocal lattice [2, 8]. Thus, the dynamically corrected HOLZ-line equation is derived as (LI, 2007) 5

(6) 4. Installation and user instruction JECP/HOLZ2t is coded mainly in Java and partially coded for PC with Microsoft windows only. To run the software, a recent version of Java Runtime Environment (e.g., JRE 1.8.0_60), must be installed on a PC for XP or up version of Microsoft window. The executable bytecodes (holz2.exe and jecp_holz2.jar) are packed in.z7 form. The compressed file is available at http://www.unl.edu/ncmn-cfem/xzli/computer-programs. For the latest updates and news about JECP/HOLZ2 and other Landyne programs, please visit in this website. Decompress the installation file holz2.z7 in a selected directory and execute holz2.exe by double click or use Landyne launcher. The basic steps for using JECP/HOLZ2, i) Crystal data file can be read in menu bar and modified in the fields of the lattice parameters in HOLZ dialog. ii) Select the graphic mode for the HOLZ reflections, the HOLZ lines (straight or curve lines) from menu bar Pattern. iii) HOLZ pattern can be displayed while an interactively changing of high voltage, beam direction, lattice parameters, convergent angle. iv)there are dialogs to index the HOLZ pattern and CBED pattern. 5. Feedback and license Suggestion and comments are welcome, please send to Dr. X.Z. Li (jlandyne@gmail.com). License can be purchased from LANDYNE (jlandyne@gmail.com). Without validated license this program works in demo mode. 6. References Bithell, E.G. and Stobbs, W.M. (1989). J. Microscopy 153, 39. De Graef, M. (2003).Introduction to Conventional Transmission Electron Microscopy, Cambridge University Press. Eades, J.A., Moore, S., Pfullmann, T. and Hangas, J. (1993). Micros. Res. Tech. 24, 509. Li, X.Z. (2005). J. Appl. Cryst. 38, 576 Li, X.Z. (2007). J. Mater. Educ. 29, 177. Lin, Y.P., Bird, D.M. and Vincent, R. (1989). Ultramicroscopy27, 233-240. Spence, J.C.H. and Zuo, J.M. (1992). Electron microdiffraction, Plenum Press. Tanaka, M. and Terauchi, M. (1985). Convergent-Beam Electron Diffraction, JEOL LTD. Zuo, J.M. (1992). Ultramicroscopy 41, 211. 6