Recap of a-si and a-si cell technology Types of a-si manufacturing systems a-si cell and module manufacturing at Xunlight. Xunlight Corporation

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Thin-Film Silicon Technology and Manufacturing Recap of a-si and a-si cell technology Types of a-si manufacturing systems a-si cell and module manufacturing at Xunlight Xunlight products and installations Aarohi Vijh, Xunlight Corporation avijh@xunlight.com 3/20/2012

About Xunlight Founded in 2002; spinoff from UT Makes flexible, lightweight BIPV/BAPV modules Triple-Junction a-si Mk Makes own manufacturing equipment Plants in Toledo, OH and Kunshan, China About 80 people, 25 MW nameplate capacity

Recap Amorphous Silicon Inexpensive, abundant raw material End product non-toxic Strongly absorbing Low temperature coeff of power Low temperature processing possible Insensitive to water and oxygen Environmentally friendly process Substrate or superstrate configuration

Major Players Mitsubishi, Sharp, Kaneka Canon (until 2002), Xunlight, Unisolar Flexcell, Powerfilm, Fuji Electric Applied Materials (until last year) Oerlikon/Tokyo k Electron Dozens of small players in Asia

Recap Amorphous Silicon Behaves like a direct band-gap gp semiconductor Needs hydrogen for adequate electronic ect c quality Low carrier mobility (especially in doped a-si) means that p-i-n structures, rather than p-n structures must be used. Light enters through p-layer

Recap Amorphous Silicon Efficiency around 7% for a-si based structures Around 10% for uc-si based structures Light Induced Degradation Can be managed by using multijunction structures Can be greatly reduced by using uc-si

Focus of Talk Steel Substrate Roll-to-Roll Process Flexible Modules

Recap Substrate-Style Style Amorphous Silicon Cell I T O TCO p-type a-si I T O intrinsic a-si or a-sige (absorber) n-type a-si Sputtered TCOs and Metal Si by Plasma Enhanced CVD (SiH4+H2+dopants) Grid deposition by thin-film or thick-film processes TCO Reflective Metal Steel

The i layer Function is to absorb light of specific wavelengths, and not lose too many of the photogenerated carriers Bandgap is controlled by Ge alloying Ge alloying creates more defects Bandgap grading and buffer layers are often used Microcrystalline Si is also used instead of Ge alloying.

The n layer Must have high optical transmission in wavelength range of interest Doped with PH3 Generally not alloyed

The p layer Must have high optical transmission in the absorption wavelength range of the cell it is covering. Must form good junctions with ITO and with n-layer. Two major approaches a-sic:h (using SiH4+CH4+BF3 or SiH4+TMB) a-si:h based matrix with Si crystallites, with BF3 doping.

The Back Reflector

The Back-Reflector Allows thinner cells Stronger electric field, less material usage, faster deposition Usually Ag/ZnO or Al/ZnO Ag gives better NIR reflectivity but can only be used where moisture is not an issue (without special and expensive techniques) Texture/diffuse reflection is generally desirable

Design Consideration: Ag vs. Al in Moisture

The Top TCO (Window) ¼ wavelength ITO (around 70 nm)to maximize green transmission Sheet resistances sta of around 100-150 ohms achievable in production

ITO Thickness vs. QE

Recap Two-Terminal Terminal Multijunction Cell Blue Red Blue Red Vtop Contact Vbottom Vsingle = VBottom I 2I Ptandem = I * (Vbottom + Vtop) > Psingle = 2I * Vsingle because Vtop > Vbottom (and assuming contact loss is low). Current must be balanced Bandgap, thickness, reflectors are the usual knobs. Also AR. Contact/Junction loss must be low Thinner cells = stronger electric fields Many compromises in practice

Introduction Amorphous Silicon Triple Junction Cell Stack of 3 n-i-p cells i-layers have different Eg Lower light-induced i d degradation Voc ~ 2.2 V Jsc ~ 7-8 ma/cm 2 Stable Efficiency >11% with µc-si bottom cells (Transparent conductor) } Back Reflector Substrate Figure from: X. Deng, A. Vijh, et al., Optimization of a-sige based triple, tandem and single-junction solar cells, 31 st IEEE Photovoltaic Specialist Conference, Orlando, Florida, January, 2005.

IV/QE IVs: X. Deng, P. Agarwal and Q. Fan, University of Toledo

Types of Deposition Systems Cluster In-Line Single Piece/Batch Single Piece/Batch Roll to Roll In-Line

Cluster Individual chambers served by a robot Max process flexibility

In-Line Substrate moves from chamber to chamber in sequence If one chamber fails, entire e process stops

Batch Cluster Systems can be single or batch mode

Roll to Roll Systems

Characteristics of Roll-to to-roll Processing Simplicity Steady operation Well suited to high volume production Speed must be the same in all zones Time is transformed to length Pressure must generally be the same No cleanroom needed Patterning is difficult Batch sizes are large

Flexible a-si Manufacturing Process at Xunlight Sputter PECVD Sputter Back-Reflector Semiconductor Top TCO Cell Definition iti Passivation Contacts t & Buses Stringing Lamination Finishing

Xunlight 25MW PECVD/ITO Line

Xunlight 25MW PECVD/ITO Line 9 PECVD deposition zones (nip-nip-nip); p p p) each zone has single or multiple parallel plate electrodes, depending on deposition rates and thicknesses 1 sputter zone (ITO) Online QC capability 200 feet in length Capable of running lengths up to 8000 feet nonstop 36 wide substrate

Schematic of a Combined PECVD/ITO Roll to Roll Line Payout PECVD Section Differential ITO Section Online QC Takeup

Differential Pressure Devices 1:1000 pressure ratios achievable while allowing web to move freely, and allowing no significant cross-contamination Application number: 12/535,237 Publication number: US 2010/0029067 A1 Filing date: Aug 4, 2009

Photo of Coated Web

Back End I Singulation Edge Delete Shunt Passivation

Shunt Passivation Apparatus for light-assisted shunt passivation Bias Voltage 2.5-3 V ~1-30 seconds Electrolyte, AlCl 3 Light Source Shunt Electrode Metal a-si ITO (TCO) nipnipnip Mesh Electrode Combined Light and Electrical Bias Combined Light and Electrical Bias Reduces unwanted conversion of TCO Broadens process window

Shunt Passivation

Shunt Passivation 12 Efficiency before and after shunt passivation GD1196-2 AM1.5 Effi iciency (%) 10 8 6 4 2 0 before after 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 Cell #

Back End II Negative and Positive Buses Current Collection Grid Bypass Diodes Stringing Lamination i Testing

Efficiency Improvement 340 Stabilized Power (XR36 Module) 320 300 280 260 240 Production as of early 2012 (300 W) Best Modules as of early 2012 (315 W) 220 200 180 160

Reliability Challenges Uncontrolled user environment Not serviceable Very long lifetime expectation with combination of sun, wind, water, high voltage, heat. Good part: No moving parts

Functions of Package Let light through while protecting cells from environment (Light, UV, Heat, Water, Air, Mechanical). Be stable Provide electrical insulation: 1000 V continuous use. Be resistant to fire Provide a way to mount the module Be cheap Reliability is a big part of LCOE

Test Sequences for Compliance UL 1703 IEC 61646 IEC 61730-1 and -2

Package Considerations Example: UV Stability EVA1 EVA1 EVA3 EVA3 EVA4 EVA4

References TUDelft OCW Web Site http://ocw.tudelft.nl/courses/microelectronics/ solar-cells/lectures/ Handbook of Photovoltaic Science and Engineering, g Chapter on a-si by Deng and Schiff Images: AMAT/Voith/Hind High Vacuum/Google Image Search www.xunlight.com/products/installations/

Thank You.