The Agilent Atomic Spectroscopy portfolio for Environmental applications AA, MP-AES, ICP-OES, ICP-MS & ICP-QQQ 1
History of Technology Leadership in Atomic Spectroscopy 62 AAS instruments manufactured under license from CSIRO 71 84 Provisional patent awarded for Zeeman background correction for Furnace AAS First computer controlled AAS released (SpectrAA) 87 First computer controlled ICP-MS released (PMS 100) 91 High resolution sequential ICP-OES released (Liberty) 94 97 98 01 11 HP4500 Worlds first bench top ICP-MS released Fast Sequential AAS released doubling productivity for AAS (SpectrAA 220FS) Vista ICP-OES released featuring patented CCD for true simultaneous analysis 7500 released with first generation ORS to overcome polyatomic interferences commonly seen in ICP-MS 4100 MP-AES atomic spectroscopy with energy source that runs on air 12 8800 Worlds First ICP-MS triple quad released
And still leading the way with recent innovative releases! The New 7800 ICP-MS Quadrupole ICP-MS for routine applications Easy setup and operation for routine applications Simplify analytical workflow with method setup and auto-optimization tools Proven robust performance and unique HMI minimizes suppression and reduces need for sample dilution Simple, consistent interference removal using proven He mode collision/reaction cell performance Minimize over-range results with 10 orders wide dynamic range detector Agilent 4200 MP-AES Safer, more cost effective elemental analysis that is uniquely suited for a wide range of sample types and applications. - Reduce your analysis cost - Improve your laboratory safety - Simplify your workflow - Increase analytical performance Agilent 5100 ICP-OES The world s most productive, high performance ICP-OES. - World s first and only non-sequential dual view instrument; Synchronous Vertical Dual View (SVDV) - Highest throughput reduces your analysis cost - Vertical plasma runs your toughest sample - Dichroic Spectral Combiner (DSC) simplifies method development
The Agilent Atomic Spectroscopy Portfolio Agilent s 55 and 200 Series includes the world s fastest flame AA and the world s most sensitive furnace. Agilent s 4200 MP-AES runs on air for the lowest cost of ownership and improved safety. Agilent s 5100 ICP-OES includes the world s most productive, and only Synchronous Vertical Dual View ICP-OES. Agilent s 7800 & 7900 ICP-MS are robust, sensitive, accurate, and easy to use quadrupole ICP- MS Agilent s 8800 ICP-QQQ with MS/MS mode provides unique control of interference removal in reaction mode Leading the way in atomic spectroscopy innovation
Typical Environmental Applications Elemental Contamination Soil, water, air Critical for health Sample Prep: Leachates and total acid digests Large number of elements and samples Medium to low ppb detection limits required Single nanoparticle analysis for pollution or remediation Coupled chromatographic methods for speciation of oxidation states and organometallic compounds (Cr(VI), arsenic, methy-mercury, organo-tin, etc.) Monitoring of industrial effluent before disposal Aqueous and organic process streams Unregulated screening methods Sample Prep: Direct measurement of effluent 5-10 elements High frequency measurement (process control) ppm to high ppb detection limits required
Atomic Absorption Spectroscopy Why choose FAAS/GFAAS for environmental? Performance Simple operation and simple routine maintenance Reliable Low system cost Fit for purpose Low sample numbers or only a few elements ppm to high ppb DLs GFAAS has software wizards to simplify method optimization with ppb to high ppt DLs Established methods Many established regulated methods for water, soil & sludge i.e. FAAS - Trade waste, plant/soil macronutrient i.e. GFAAS Trace contamination of soil, water and air
Microwave Plasma Atomic Emission Spectroscopy Why choose MP-AES for environmental analysis? Safe No flammable gases compared to FAAS Low Cost of Ownership Uses Nitrogen extracted from the air to sustain the plasma Easy to Use Simple, intuitive next generation software Plug and play torch High Performance 4200 MP-AES Customer testimonials Results we have seen for our aqua regia soil extract samples are in very good agreement with round robin performed Europe Wide Superior linear dynamic range compared to FAAS Lower detection limits compared to FAAS
Why choose ICP-OES for environmental analysis? Lowest Cost of Ownership Highest throughput means lowest argon consumption per sample Enhanced Performance Incredible long term stability Simple Operation 5100 ICP-OES New sample introduction system Software with intuitive workflow Many methods available ASTM / ISO / US EPA
ICP-MS and ICP-QQQ Why choose ICP-MS for environmental? Simplicity Easy setup and operation with application packs and SOPs Minimal method development and sample prep required All regulated elements incl. Hg measured in single acquisition Performance >10 orders linear dynamic range major & traces in one run Accuracy ensured by proven He mode interference removal High & variable matrix samples handled easily using (U)HMI Ultra-low DLs (ppt to ppq range) for critical toxic contaminants
Today s Agilent: Atomic Spectroscopy More choices Agilent provides the best choice for every lab through: A full range of atomic spectroscopy instrumentation Optimal product offering for any budget / application Continued focus on reliability and performance
Regardless of your application needs and drivers, Agilent s unique and comprehensive Atomic Spectroscopy Portfolio provides the right solution for your Environmental analysis requirements. Stay tuned for some application examples for environmental analysis
U.S. EPA Method 6010C using the 5100 SVDV ICP-OES Neli Drvodelic Agilent Technologies Melbourne, Australia
Key Agilent 5100 SVDV ICP-OES benefits Lowest cost of ownership Fastest sample throughput of difficult samples Low gas consumption Enhanced Performance Analytical performance System robustness and reliability Simple Operation Hardware (e.g. Torch) Software (e.g. Fitted, FACT, Applets) Agilent Confidential July 2, 2015 13
The unique Dichroic Spectral Combiner that make it possible. The Agilent 5100 Synchronous Vertical Dual View ICP-OES measures both axial and radial view of the vertical plasma at the same time. Vertical torch is ideal for difficult applications, like environmental samples. Mirror Hole Dichroic Spectral Combiner 5100 SVDV Pre-optics 14
Experimental Instrumentation Instrument: Ailent 5100 Synchronous Vertical Dual View ICP-OES Sample introduction system: Sea Spray nebulizer, Double-pass glass cyclonic spray chamber and Standard 1.8 mm dual view quartz injector torch Accessories: SPS 4 Autosampler with the SVS 2+ switching valve to deliver samples to the instrument... 15
Experimental Instrument Operating Parameters Parameter Torch Nebulizer Spray chamber Read Time Replicates 2 Sample uptake delay Stabilization time Rinse time Fast Pump (80 rpm) Background correction Nebulizer Pressure RF power Plasma flow Aux flow Setting Standard DV torch (1.8 mm ID injector) Seaspray Glass cyclonic (double-pass) 20 sec 0 sec 10 sec 3 sec No OPBC for analyte/iec standard 0.70 L/min 1.4 KW 12.0 L/min 1.0 L/min Internal Standard Y 488.368 and Lu 261.541 and Lu 547.668 16
Experimental SVS 2+ Operating Parameters Condition Setting 1 Loop uptake delay 6.4 s Uptake pump speed refill 350 rpm Uptake pump speed inject 130 rpm Sample loop size Time in sample Bubble inject time 1.0 ml 4.5 s 6.2 s
Results and discussion - SRM Recoveries Elements Certified mg/kg Found mg/kg SD %Rec Ag 328.068 (4.68) 4.70 0.154 101% Al 308.215 28000 27572 0.287 101% As 188.980 38.0 40.0 0.624 107% B 249.678 (29.3 ) 29.6 0.045 102% Ba 233.527 (466) 473 0.027 102% Be 313.042 (1.59) 1.58 0.025 99% Ca 318.127 31000 31442 1.87 102% Cd 214.439 6.29 5.91 0.031 96% Ce 446.021 (38.9) 37.4 0.350 97% Co 228.615 13.4 13.6 0.099 100% Cr 205.560 124 129 0.078 104% Cu 324.754 127 129 0.079 101% Fe 273.358 37300 38068 7.51 102% Hg 184.887 1.86 1.81 0.250 97% K 766.491 4560 4502 5.669 99% Li 610.365 (32.2 ) 34.5 1.437 107% Mg 279.078 6980 7129 0.574 102% Mn 257.610 847 830.6 0.020 98% Mo 202.032 (1.91) 1.85 0.154 97% Na 588.995 432 436 37.608 101% Ni 231.476 59.3 60.5 1.893 102% P 213.618 3810 3727 102.685 98% Pb 220.353 192 176 3.680 92% Sb 206.834 (2.18 ) 2.05 0.033 94% Se 196.026 (1.59) 1.59 0.130 100% Sn 189.925 (21.2) 19.6 0.366 92% Sr 421.552 (131) 134 2.670 103% Ti 334.188 (339) 358 20.540 106% Tl 190.794 (1.19) 1.21 0.061 101% V 292.401 (50.8) 50.9 0.816 100% Zn 313.857 816 800 10.673 98% Confidentiality Label July 2, 2015 18
Results and discussion - Method Detection Limits (MDL) and Linear Dynamic Range (LDR) LDR, mg/l MDL, µg/l LDR, mg/l MDL, µg/l Elements Elements Ag 328.068 50 0.48 Mg 279.078 1000 3.5 Al 308.215 2000 3.6 Mn 257.610 50 0.08 As 188.980 50 4.6 Mo 202.032 50 0.48 B 249.678 200 0.81 Na 588.995 1000 50 Ba 233.527 50 0.18 Ni 231.476 100 3.7 Be 313.042 5.0 0.04 P 213.618 500 6.3 Ca 318.127 1000 5.9 Pb 220.353 200 3.1 Cd 214.439 25 0.35 Sb 206.834 200 4.0 Ce 446.021 100 2.3 Se 196.026 25 5.1 Co 228.615 250 0.54 Sn 189.925 100 3.8 Cr 205.560 100 0.47 Sr 421.552 2.5 0.05 Cu 324.754 100 0.42 Ti 334.188 25 0.14 Fe 273.358 10000 53 Tl 190.794 100 4.4 Hg 184.887 250 1.4 V 292.401 100 0.73 K 766.491 1000 21 Zn 313.857 20 0.22 Li 610.365 50 0.31 Confidentiality Label July 2, 2015 19
Wide Linear Range for K766.491 in SVDV Mode Standards Concentration (ppm) % Error Blank 0 N/A Standard 1 5 1.17 Standard 2 50 0.99 Standard 3 500 0.16 Standard 4 1000 1.36 Confidentiality Label July 2, 2015 20
Instrument Stability 1.2 Long Term Stability with SVS2+ 1.1 1 Normalize Concentration 0.9 0.8 0.7 0.6 0.5 0:00 0:48 1:36 2:24 3:12 4:00 4:48 5:36 6:24 7:12 8:00 Time (Hrs) Ag 328.068 Al 308.215 As 188.980 B 249.678 Ba 233.527 Be 313.042 Ca 318.127 Cd 214.439 Ce 446.021 Co 228.615 Cr 205.560 Cu 324.754 Fe 273.358 Hg 194.164 K 766.491 Li 610.365 Mg 279.078 Mn 257.610 Mo 202.032 Na 588.995 Ni 231.604 P 213.618 Pb 220.353 Sb 206.834 Se 196.026 Sn 189.925 Sr 421.552 Ti 334.941 Tl 190.794 V 292.401 Zn 213.857 Confidentiality Label July 2, 2015 21
Sample Throughput and Ar Consumption Rapid throughput enabled by SVS 2 + (including 3 sec rinse time) Sample measurement = 60 seconds per samples and 60 samples per hour over 480 samples for an 8 hr day Total Ar Consumed = 20 L Ar/sample July 2, 2015 22
Conclusion The Agilent 5100 ICP-OES with synchronous vertical dual view meet the requirements outlined in the US EPA method 6010C. SVDV means only one reading of the samples which gives high sample throughput and quicker sample measurement leading to considerable gas savings of only 20 L of Ar per sample. SRM samples were analyzed on SVDV and good recoveries (92-107%) were achieved for all elements. Ionization interferences was eliminated using SVDV with radial view plasma leading to wide dynamic range for EIE elements. Excellent Long term stability is achieved as no moving optical part in SVDV instrument Exceptional MDL s, linearity for all elements Confidentiality Label July 2, 2015 23