X-ray Diffraction Analysis of Polymers Expanding Materials Characterization Capabilities Using the ICDD Powder Diffraction File TM Tom Blanton Stacy Gates, Soorya Kabekkodu, Justin Blanton, Cyrus Crowder and Tim Fawcett, International Centre for Diffraction Data (ICDD), Newtown Square, PA International Center for Diffraction Data
Polymer analysis using XRD Many techniques are used for polymer characterization IR, NMR, GC/MS, Raman, etc. Why use XRD? Polymers can have amorphous and crystalline regions Crystallite size is small and measurable by XRD Polymers are often used as the base component in composite materials
Searching for polymer entries in PDF-4+
Polymer entries in PDF-4+ Release 2014
First polymer entry in the ASTM/JCPDS/ICDD Powder Diffraction File Simulated XRD pattern
Polymer order: chemistry matters Highly crystalline - Teflon Semi crystalline polyethylene terephthalate Micro crystalline cellulose 1β Amorphous - polycarbonate
Polymer microstructure: all about the processing Melt,quench polyethylene terephthalate (PET) Amorphous PET ε Thermally crystallized PET Strain crystallized PET
Nonwoven fabrics: spunbond polypropylene with additive Backscattered SEM
XRD pattern for spunbond fabric composite M
Phase ID using the PDF: CaO exposed to ambient air
Phase ID using the PDF: CaO exposed to ambient air
RIR quantitative analysis using the PDF
XRD analysis of polyvinyl chloride (PVC) polymer Unit cell from fiber patterns
PVC XRD powder patterns calculated vs. observed Adjust crystallite size to 50Å Commercial PVC sample You need the raw data to correctly define the XRD pattern
Raw data patterns in the PDF
Raw data (PD3) in the today s PDF
Polymer PD3 entries in PDF-4+ Release 2014
Polymer PD3 entries in PDF-4+ Release 2014
Polymer PD3 entries in PDF-4+ Release 2014
PDF3 data for Kapton film two different data collection geometries Reflection mode Transmission mode
Name search in the PDF
PEN example
The problem with using only d and I data for polymer analysis poly(ethylene-2,6-naphthalate)
Simulated XRD pattern for α-pen using only d and I data poly(ethylene-2,6-naphthalate) Default Pseudo-Voigt profile parameters
Simulated vs. raw data XRD patterns for thermally crystallized α-pen poly(ethylene-2,6-naphthalate)
Simulated vs. raw data XRD patterns for α-pen poly(ethylene-2,6-naphthalate) Crystallite size simulation 65Å
If we only had an amorphous reference pattern for α-pen! poly(ethylene-2,6-naphthalate)
Simulated from d,i list vs. raw data XRD patterns for amorphous α-pen poly(ethylene-2,6-naphthalate) Crystallite size simulation 8Å
(Amor. + Sim.) vs. raw data XRD patterns for α-pen 75% crystalline, 65Å 25% amorphous PD3 raw data
Effect of processing on α-pen
Are they really the same PEN phase? Thermal crystallization Strain crystallization
Are they really the same PEN phase? Crystallite size simulation 65Å
Are they really the same PEN phase? 65Å crystallite size (-110) preferred orientation From semi crystalline d and I pattern Raw data
PD3 raw data pattern for PDF entry 00-061-1411, biaxially oriented α-pen
Similarity Index Can compare a raw data pattern to patterns in the PDF Especially useful when the sample contains amorphous or semicrystalline polymers
Similarity Index
Similarity Index Use Sieve, another SM program, or your knowledge for inorganic phase identification Use similarity index to confirm polymer identification
Rietveld refinement of Cellulose II with Si internal standard a = 8.076(13) Å b = 9.144(10) Å c = 10.386 20) Å γ = 117.00(8) V = 683.5(18) Å 3 S.G. P112 1 R wp =0.0589 χ 2 = 4.704 Observed (with a Si internal standard), calculated, and difference patterns from the Rietveld refinement used to determine the lattice parameters of cellulose II. The red crosses represent the observed data points, the green line through them the calculated pattern, with the magenta difference plotted below. Blanton, Kaduk, Johnson, Powd. Diff., 29(2), 2014, 108-112.
PDF-4+ Cellulose II PDF features Electron diffraction pattern Electron backscatter pattern Ring pattern Bond lengths/angles Simulated profile 3D structure Raw diffraction data PD3
Bragg Brentano reflection mode XRD patterns - effect of processing on Polypropylene Cast No heatset No stretch Heatset 120 C, 10s No stretch Heatset 6X Uniax stretch
2-D Transmission XRD patterns effect of processing on Polypropylene Cast No heatset No stretch Heatset 120 ºC, 10s No stretch Heatset 6X Uniax stretch
XRD data for polyvinylidene fluoride (PVF2) α-pvf 2 (random) γ-pvf 2 (random) β-pvf 2 (random) β-pvf 2 (uniax oriented) All have an amorphous component present
Ring patterns
β PVF2 2D XRD pattern PDF 00-061-1404 Ring pattern for β PVF2
Summary The ICDD Powder Diffraction File is the source for phase identification Beyond phase ID, the PDF provides property data that allows for a more complete characterization of a material and a better understanding of material properties Polymer PD3 data continue to be added the PDF helping the analyst get the right answer when analyzing materials 44 new PD3 polymer patterns will be included in PDF-4+ Release 2014
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