Application of DO-254 Level A (Appendix B) Design Assurance Objectives of. Elemental Analysis. Mixed Signal (Analog/Digital) Discrete Circuitry

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Application of DO-254 Level A (Appendix B) Design Assurance Objectives of Elemental Analysis To Mixed Signal (Analog/Digital) Discrete Circuitry By Dave Duncan Purple Seal Inc. THE INFORMATION CONTAINED HEREIN IS PROPRIETARY TO PURPLE SEAL INCORPORATED AND SHALL NOT BE REPRODUCED OR DISCLOSED IN WHOLE OR IN PART EXCEPT WHEN SUCH USER POSSESSES DIRECT WRITTEN AUTHORIZATION FROM PURPLE SEAL INCORPORATED. Purple Seal Inc 2008

Executive Summary When distilled down DO-254 (Design Assurance) has three primary objectives: a) Control of the Configuration (Requirements, Documentation, Physical Hardware, Validation, etc) b) Requirements Based Design (Design Traceability) c) Requirements Based Verification (Verification Traceability) When these three objectives are applied with a level of independence the reduction in or elimination of common mode errors is the result. As part of DO-254 s guidance, Level A & B programs are to implement Advanced Verification according to Appendix B. Of the suggested methodologies Elemental Analysis is most often implemented by conducting a coverage analysis of a PLD/FPGA/ASIC design at the VHDL (design coding language) level of abstraction. What this is really accomplishing is an evaluation the quality of the implementation of the primary objectives as stated above: i.e. Does independent requirements based verification actually cover requirements based design? For PLD/FPGA/ASIC this analysis is semi automated by built-in tool suites that are used during verification by simulation. These tools track test vectors (from test cases) through the logic as the simulation is being run. The controls and outputs of typical tools allow a coverage analysis with example granularity showing: a) Line coverage - Coverage of each logical statement in the VHDL design during the tests b) Toggle coverage - Coverage of all variables (circuit nodes) toggling both high and low during the tests c) Combinational logic coverage - The logic has been covered by the tests, generally a reduced map of coverage not a 2 n coverage d) Assertion (functional) coverage - Generally the fact that each variable or node that can cause a transition in a state machine or output node, has shown that ability to do so in isolation of the other variables or nodes There is even a qualification exemption for integrated coverage tools, which are used to satisfy the completeness of verification. 1 But there are no tools, which closely mimic those coverage tools for, the discrete hardware designer. The challenge is to apply this concept (Code Coverage) to mixed signal discrete circuits, where there are no tools to automate the process, and the verification is performed on the physical circuits, not on an abstraction. This paper presents an approach that mimics the action of the "Coverage" tools in a VHDL design. This mimic is limited to specific nodes and criteria appropriate for the mixed signal (analog and digital) nature of this design. 1 DO-254 Section 11.4.1 Item 4. Purple Seal Inc 2008 Page 2 of 15

Release & Revision Revision Description Release Draft Initial draft for limited review 5/31/08 1.0 2 Release for inclusion in data package for: 2008 National Software and Airborne Electronic Hardware Standardization Conference 7/10/08 Dave Duncan Purple Seal Inc. 2121 County Road 143 Clearwater, MN 55320 dduncan@purple-seal.com 320-761-3949 Contact Information 2 Purple Seal hereby grants full use of this paper to attendees of the 2008 National Software and Airborne Electronic Hardware Standardization Conference. Purple Seal Inc 2008 Page 3 of 15

Table of Contents 1 Introduction... 5 1.1 Scope... 5 1.2 Acknowledgements... 5 1.3 Prerequisites... 5 1.3.1 Design Elements... 5 1.3.2 Verification... 6 2 Elemental Analysis... 7 2.1 Identification of Nodes... 7 2.2 Identification of Corner Cases... 8 2.2.1 FFP Cross Referencing... 8 2.3 Analysis of Case Coverage... 9 2.4 Analysis of Coverage... 10 2.4.1 Nodal Coverage... 10 2.4.2 Design Element Coverage... 10 2.5 Analysis Team... 10 2.6 Problems and Deficiencies... 10 2.7 Developing Process... 11 3 Appendix A (References)... 12 3.1 Documents... 12 3.2 Acronyms and Abbreviations... 12 3.3 Terminology... 12 4 Appendix B (Data Examples)... 13 5 Appendix C (Compliance Checklist)... 14 Figures Figure 1 Example LRM Functional Elements... 5 Figure 2 Example Aux Supply Design Elements... 6 Figure 3 Example Power Stage Implementation... 7 Figure 4 Example Circuit Nodes... 8 Figure 5 Coverage Analysis... 9 Tables Table 1 Example Node Data Sheet... 13 Table 3 FFP vs. Design Cross reference... 13 Table 4 Compliance Checklist... 14 Purple Seal Inc 2008 Page 4 of 15

1 Introduction 1.1 Scope This document presents an approach to applying DO-254 Level A to a mixed signal LRM. The primary content of this paper is a narrative describing the key activities which implement elemental analysis. As a part of that narrative the key points in the main processes that elemental analysis depends upon are highlighted. 1.2 Acknowledgements The examples used in this paper were derived from work that was performed to demonstrate this compliance by Purple Seal Inc. & Crane Aerospace and Electronics, ELDEC Applied Power Products Division. These descriptions are complete to the point of documenting the approach used without describing the details of process implementation, which are proprietary to Crane Aerospace. Additionally requirements, diagrams and other examples are representative only and are not intended complete enough to implement a design, or represent an actual design, and are included here only for illustrative purposes. 1.3 Prerequisites 1.3.1 Design Elements In order to effectively analyze the verification coverage, the design should be parsed into manageable sub circuits. The exact level is somewhat arbitrary but consideration should be given so that the scope of the test cases coverage can be analyzed with relative ease. The rule of thumb used is to parse sub circuits down until all anomalous behavior within the sub circuit is seen at the outputs as an out of failure of verification. This is the level where the design is traced to the requirements: i.e. Design Element to the Requirements and the Components BOM to the Design Element. The design should be complete in coverage (all requirements covered) and under configuration control. The example shown in Figure 1 shows a basic functional power supply. There are four primary or Functional Elements parsing these further takes us to the Design Element level seen in Figure 2. Figure 1 Example LRM Functional Elements Purple Seal Inc 2008 Page 5 of 15

1.3.2 Verification Figure 2 Example Aux Supply Design Elements There are no special considerations that need to be applied to verification. To effectively perform coverage analysis the test cases (physical test, simulation, analysis, etc.) should be complete in coverage (all requirements covered) and under configuration control. Purple Seal Inc 2008 Page 6 of 15

2 Elemental Analysis Elemental analysis provides confidence and evidence that design errors are precluded by separating a complex implementation of the FFP into elements at the level that the designer generated it. This analysis method provides a measurement of the verification process to support the determination of verification coverage and completeness, and is most suited where the detailed design is visible and under configuration control. 3 2.1 Identification of Nodes The first step in the analysis is identifying the various nodes within each design element. The data from this step will be identified and documented. An example of this documentation can be found in Appendix B (Data Examples) Table 1 Example Node Data Sheet. The guidance for determining what nodes to include is as follows: a) Design Element Inputs b) Design Element Outputs c) Critical Internal Nodes a. Transition between circuit types (analog to digital, logic families, across isolation barriers) b. Transition between circuits that have significant drive or current characteristics c. Transition between one sub-function and another To continue the examples from Section 1.3.1, the Power Stage of the Aux Supply Design Element might be implemented as shown in Figure 3. Figure 3 Example Power Stage Implementation Using the above guidelines the nodes identified would be as shown in Figure 4. 3 DO-254 Appendix B Purple Seal Inc 2008 Page 7 of 15

Transformer Aux Output Power Input Rectifier Output FET Output Gate Drive Current Feedback Figure 4 Example Circuit Nodes 2.2 Identification of Corner Cases Establishing the criteria, or Corner Cases, for the coverage analysis involves a qualitative assessment of the circuit function and the environmental or input parameters for which the performance should be verified. Typical corner variables would be: a) Temperature (High, Low, Step Changes) b) Input Power (High, Low, Step Changes, Transients) c) Output Load (High, Low, Step Changes, Transients) The idea is not to identify all the corner cases for a particular node, as this would be impractical bordering on impossible for an analog circuit, but to establish those corners of operation that push or stress the circuit or components. The above example would yield 75+ corners of operation that would need to be covered. Sound engineering judgment would parse down this list: For example, High Temperature, Low Input Voltage and High Output Load would maximize the current through the circuits and IR voltage impact on operation. Each corner case needs to identify a measurable quantity: Voltage, Current, Frequency, Duty Cycle, etc., and the quantifiable conditions under which those measurements should be valid (Temperature, Air Flow, Load Conditions, etc.). These corner cases must be documented in a manner that their traceability to a circuit node and eventually the case verifying that corner can be established. An example of this documentation can be found in Appendix B (Data Examples). 2.2.1 FFP Cross Referencing During the node determination a cross reference of Design Elements and Nodes should be developed. This is used to associate circuit nodes and their possible contributions to aircraft hazards. It may also be used to limit the scope of elemental analysis to only those FFP that could contribute to a Level A or B hazard. An example of this documentation can be found in Appendix B (Data Examples). Purple Seal Inc 2008 Page 8 of 15

2.3 Analysis of Case Coverage This implementation of Elemental Coverage Analysis takes advantage of the verification traceability requirements under DO-254. Each test case (physical test, simulation, analysis, etc.) will have an ID associated with it: these will be used either manually or with a tool to manage the traceability between verification and the requirements. These same IDs will also be used to document the coverage of the nodes achieved by each case. Requirements Design Verification Design Element Corner Case & Node Worksheets Design Element Coverage Report(s) Verification Coverage Analysis Figure 5 Coverage Analysis The coverage analysis takes the collated Design Element coverage reports and tabulates (within the design element worksheet) which corners of operation were covered. The tradeoffs of early vs. later Elemental Analysis are that the early analysis will allow feedback of deficiencies with minimal schedule impact, but the analysis is qualitative in nature. Later application is quantitative in nature, but is likely to have significant schedule impact. A reasonable compromise is to start the analysis as the verification procedures (cases) are going into the final review and approval stages: this will naturally extend the analysis into dry runs, if not actual for-credit runs, of the verification. Purple Seal Inc 2008 Page 9 of 15

2.4 Analysis of Coverage The analysis of the coverage can be done either manually or semi-automated with scripting tools to sort and compare the data. Depending on the tasks automated these tools should also fall under the qualification exemption of the code coverage tools 4 referenced in the Executive Summary. 2.4.1 Nodal Coverage Nodal coverage is simply a Yes/No analysis of the data sheets for coverage of every identified corner case for every identified node. This level of analysis should identify hardware that is not covered by verification. If this occurs, it is indicative of an incomplete verification case development, or perhaps an ambiguous or incomplete requirement and should trigger further investigation 2.4.2 Design Element Coverage Design element coverage has prerequisites of: a) 100% Design traceability to requirements b) 100% Verification traceability to requirements c) 100% Nodal coverage This coverage analysis reconciles the traceability using the following logic; a) A given design element traces to a sub-set of requirements, therefore the verification cases traceable to the same sub-set of requirements should provide full coverage of the design element. The test of this is that all of the case IDs documented in the node data sheets for a given design element do in fact also show up in the case IDs traceable to that design element s requirement sub-set. a. For the case ID s from above that were not documented in the nodal data sheets above, do they cover the design element, but perhaps cover a corner that was not identified as critical? If it is found that a case does not target the design element it is indicative of an incorrect verification trace, or perhaps an ambiguous or incomplete requirement and should trigger further investigation. 2.5 Analysis Team The purpose of elemental analysis is to evaluate the completeness of the requirements based verification activities against the targeted hardware. A level of independence should be maintained to continue the reduction in common mode errors. (Independence between coverage analysis and the verification cases being analyzed for coverage.) 2.6 Problems and Deficiencies The mechanism for feeding back problems or deficiencies is the same as what is used for the project as a whole; however, those PRs triggered by elemental analysis should be tracked so that regression elemental analysis can be accomplished with relative ease. The number of PRs also may serve as a metric as to the effectiveness of the initial requirements based design and verification. 4 DO-254 Section 11.4.1 Item 4. Purple Seal Inc 2008 Page 10 of 15

2.7 Developing Process Appendix C (Compliance Checklist) may be used along with this paper as an aid in developing processes or work instructions that will comply with the objectives in DO-254 Appendix B for Level A or B hardware designs. Purple Seal Inc 2008 Page 11 of 15

3 Appendix A (References) 3.1 Documents DO-254 Design Assurance Guidance for Airborne Electronic Hardware 3.2 Acronyms and Abbreviations ASIC BOM COTS PWM FET FFP FPGA ID (ID s) IR LRM PLD PR (PRs) VHDL Application Specific Integrated Circuit Bill Of Material Commercial Off the Shelf Pulse Width Modulator Field Effect Transistor Functional Failure Path Field Programmable Gate Array Identification Current * Resistance = Power (Ohms Law) Line Replaceable Module Programmable Logic Device Problem Report Very High Level Descriptive Language 3.3 Terminology Code Coverage Corner Case Design Element Functional Element Node Qualitative Quantitative Traceability A measure used to evaluate the completeness of software testing Conditions where multiple environmental or operational parameters are simultaneously at their extremes The lowest level of the design s architecture where requirements are captured. High level functional block or circuit A specific interconnection point within a discrete circuit Data that can not be traced to a physical or traceable measurement, the data is somewhat subjective Data that is traceable to a physical or traceable measurement An identifiable association between pieces of data Purple Seal Inc 2008 Page 12 of 15

4 Appendix B (Data Examples) Table 1 Example Node Data Sheet Circuit Node Voltage (H/L) Current (H/L) Freq. (H/L) H Temp L Temp H Load L Load Comments Power Input Next Node 13V 11V 90ma N/A N/A N/A Case ID Case ID Case ID N/A N/A N/A 13V 11V 90ma N/A N/A N/A Case ID Case ID Case ID N/A N/A N/A 13V 11V 90ma N/A N/A N/A Case ID Case ID Case ID N/A N/A N/A 13V 11V 90ma N/A N/A N/A Case ID Case ID Case ID N/A N/A N/A X X X X X X X X Next Node Table 2 FFP vs. Design Cross reference FFP (Fault Tree) Design Element Circuit Node Purple Seal Inc 2008 Page 13 of 15

5 Appendix C (Compliance Checklist) Table 3 Compliance Checklist DO-254 Reference DO-254 Section 3.3.1.1 Analysis Methodology - 1 DO-254 Section 3.3.1.1 Analysis Methodology - 2 DO-254 Section 3.3.1.1.1 Element Determination DO-254 Section 3.3.1.1.2 Performing Elemental Analysis Environment 1 DO-254 Section 3.3.1.1.2 Performing Elemental Analysis Environment 2 DO-254 Section 3.3.1.1.2 Performing Elemental Analysis Environment 3 DO-254 Section 3.3.1.1.2 Performing Elemental Analysis Environment 4 DO-254 Section 3.3.1.2 Analysis Resolution Shortcomings of Verification DO-254 Section 3.3.1.2 Analysis Resolution Inadequacies in Requirements DO-254 Section 3.3.1.2 Analysis Resolution Unused functions DO-254 Section 3.3.1.3 Life Cycle Data 1. Identify FFP DO-254 Guidance Identification and a definition of the elements at an appropriate level of the hardware design The verification coverage to which each element should be verified The analysis may show either that all the low-level primitive blocks, such as counters, registers, multiplexers, adders, op amps and filters, have been adequately tested or that all groups of interconnected primitives have been adequately tested and achieve the verification coverage criteria. Tests with the circuitry implementing the functional path installed in the target assembly. Tests performed on a standalone prototype. Such tests are typical for an ASIC or PLD. Manufacturing acceptance tests. Note: Since manufacturing tests often are not based on the requirements, manufacturing acceptance tests may be restricted in their application to elemental analysis. A post-layout simulation, typically for an ASIC or PLD, that has been assessed and, if necessary, qualified for use as a verification tool as described in Section 11.4. Shortcomings may arise if the test cases simply do not test the elements in the hardware item in compliance with the criteria in Appendix B, Section 3.3.1.1. The requirements should be modified or additional derived requirements identified. Additional verification tests should then be developed for the new or revised requirements, executed and analyzed. The hardware item may contain functions that are not used in its target circuit application, such as test structures used only for component-level acceptance tests. Such functions should either be shown to be isolated from the other used functions or shown to present no potential anomalous behavior that could have an adverse effect on safety. Identify the FFPs to be addressed by elemental analysis, and propose at what levels in the design hierarchy the elements are defined and how they are to be analyzed for verification adequacy, which are parts of the verification coverage completion criteria. Coverage Reference Purple Seal Inc 2008 Page 14 of 15

DO-254 Reference DO-254 Section 3.3.1.3 Life Cycle Data 2. Level of Analysis DO-254 Section 3.3.1.3 Life Cycle Data 3. Traceability Data DO-254 Section 3.3.1.3 Life Cycle Data 4. Additional Verification or Requirements DO-254 Section 3.3.1.3 Life Cycle Data 5. Verification Completeness DO-254 Guidance Describe the methods and identify the FFPs addressed in the analysis and the levels in the design hierarchy at which the analysis was performed. Ensure that the traceability data, as described in Section 10.4.1 shows the explicit relationship of the verification procedures to the elements in the elemental analysis. Identify the verification test cases and requirements added or modified as a result of the elemental analysis. State the level of the verification completeness achieved for the FFPs addressed by elemental analysis, including identification of the analysis discrepancies not resolved by modification to verification tests or requirements and the rationale for acceptability. Coverage Reference Purple Seal Inc 2008 Page 15 of 15