PRODUCT/PROCESS CHANGE NOTICE (PCN)

Similar documents
Package Qualification Report Reliability By Design

Package Qualification Report

Product Change Notification - GBNG-28HRUQ041

QUALIFICATION PLAN RELIABILITY LABORATORY

Package Qualification Report Reliability By Design

Package Qualification Report Reliability By Design

Quality and Reliability Report

800 W. 6 th Street, Austin, TX 78701

CYPRESS SEMICONDUCTOR ADVANCED PRODUCT CHANGE NOTIFICATION

Platform Flash PROM VOG48 Package Lead Finish Conversion to NiPdAu

If you have any questions concerning this change, please contact:

800 W. 6 th Street, Austin, TX 78701

PRODUCT/PROCESS CHANGE NOTICE (PCN)

PCN Title: Qualification of Additional Bill of Materials (BOM), Fab Source, AT Site and Top Marking Change on Select Product

Product Change Notification - JAON-14PIGR452 (Printer Friendly)

Quality and Reliability Report

PRODUCT/PROCESS CHANGE NOTICE (PCN)

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

Cypress Semiconductor Mold Compound Qualification Report

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

800 W. 6 th Street, Austin, TX 78701

Product Change Notification - JAON-07LFEV539 (Printer Friendly)

800 W. 6 th Street, Austin, TX 78701

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

PRODUCT/PROCESS CHANGE NOTICE (PCN)

QUALIFICATION REPORT RELIABILITY LABORATORY

Product Change Notification - KSRA-24MSDO763

Product Change Notification - KSRA-20KRVB706 (Printer Friendly)

Assembly Site: JCET, China Package Types: SOT-23 3L, SOD-323, SC-79 Report No: QUAL08-WB

Cypress Semiconductor Mold Compound Qualification Report

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

Reliability Qualification Report ACP R Package

FINAL PRODUCT/PROCESS CHANGE NOTIFICATION Generic Copy. 11-Apr SUBJECT: ON Semiconductor Final Product/Process Change Notification #15507

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

Cypress Semiconductor Package Qualification Report

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

RE: PCN # ESU SR70-02CTG Alternate Manufacturing Location Approval for Wafer Foundry & Backend Assembly, Test and Packing

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

Product Change Notification - KSRA-31AOHM485

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

Product Qualification Report

SE2618F with Cu wire at Carsem Package Qualification Plan

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

IPC RELIABILITY - CASTELLETTO. Reliability Report. Combo IC for PFC and ballast control Assembly plant location

Analog & MEMS Group (AMS)

Process Change Notice #


If you have any questions concerning this change, please contact: NAME: Hank Chou PHONE:

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

PCN Title: Additional FAB Source (TPSCo), Additional Assembly/Test Site (SAT) and BOM (Bill of Materials) on select devices

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

Analog, MEMS and Sensors Group

Product Change Notification - KSRA-30CVPA719

RoHS Compliance Document

Cypress Semiconductor Package Qualification Report. 60 FBGA (8 x 20 x 1.2mm) SnPb, MSL3, 220 C Reflow Unisem-Indonesia

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

Environmental Management and Materials Information

Cypress Semiconductor Package Qualification Report

Cypress Semiconductor Snap Cure Epoxy Qualification Report

Cypress Semiconductor Package Qualification Report

PRODUCT/PROCESS CHANGE NOTICE (PCN)

Product Change Notification - LIAL-20HILO069

Analog, MEMS and Sensor Group (AMS)

PRODUCT CHANGE NOTIFICATION

PCN Product/Process Change Notification

AN-400. Dimensions Format Pins Body Height Lead Pitch Thickness wide wide 0.100

Environmentally Preferred Products

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

Customer Process Change Notification Form

Product Change Notification - JAON-14OICS710 (Printer Friendly)

Environmental Management and Materials Information

Product Change Notifications

Qualification Report CASCADEABLE FIFOS. November 1995, QTP# Version 1.2 DEVICE DESCRIPTION MARKETING PART NUMBER. 1K x 9 Cascadeable FIFO

ELEC 6740 Electronics Manufacturing Chapter 5: Surface Mount Design Considerations

ELEC 6740 Electronics Manufacturing Chapter 5: Surface Mount Design Considerations

PRODUCT / PROCESS CHANGE NOTIFICATION. 1. PCN basic data

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

PCN Number: B PCN Date: 12/08/2015

RoHS Compliance Document

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

Analog & MEMS Group (AMG)

Process Change Notice #

FINAL PRODUCT/PROCESS CHANGE NOTIFICATION #16230A Generic Copy

IPC/JEDEC J-STD-020D. Moisture/Reflow Sensitivity Classification for Non-hermetic Solid State Surface Mount Devices


Report Title: ADSP-BF538F8 /ADSP-BF539F8 Alternate Fab Site Qualification

Environmental Management and Materials Information

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

PCN Details Description of Change:

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

Freescale Semiconductor Tape Ball Grid Array (TBGA) Overview

Cypress Semiconductor Qualification Report QTP# 97092VERSION 1.0 June, 1997

CPG (CMPG) Quality & Reliability Monitoring Program

PCN Product/Process Change Notification

Manufacturing Notes for RFFM8504

PCN Product/Process Change Notification

DS32KHZ 0.8um Fab Process 6" to 8" Conversion. Dallas Semiconductor

Transcription:

3545 North First Street San Jose, CA 95134 USA PRODUCT/PROCESS CHANGE NOTICE (PCN) PCN Number: 06-07 Date Issued: December 13, 2006 Product(s) Affected: Products using TQFN/TDFN type packages Manufacturing Location Affected: SPEL, Chennai, India. Date Effective: January 12, 2007-30-day notification Adding SPEL s new package offering in these Very Thin Dual and Quad No-leads package types that have been previously qualified by other Pericom subcontractors. Means of Distinguishing Changed Devices: Product Mark: Back Mark Date Code: SPEL letter code* Other * The second to last letter code will be an X, designating SPEL as the assembly supplier. Contact: Ed Mello Title: Director, Quality Systems Phone: (408) 435-0800, Ext. 207 Fax: (408) 321-0324 email: emello@pericom.com Description and Purpose of Change: Pericom has qualified SPEL s production of these very thin, no-lead package types in both Dual and Quad configurations. See Pericom s TQFN/TDFN Package information on our website at: http://www.pericom.com/products/packaging/mechanicals.php SPEL has been a valued package assembly subcontractor to Pericom for over 8 years in gull-wing small outline packages, and we have now qualified their new package types in the Thin Quad Flat No lead and Thin Dual Flat No lead package configurations. Please see the attached generic package qualification data of key environmental tests for representative products in each package family. More information on SPEL is available at: http://www.spel.com/ Reliability/Qualification Summary: See attached Qual Reports. Attachment: Yes; No See attached Qualification data. Samples: Available upon request Die Technology Wafer Fabrication Assembly Process Equipment Material Testing Manufacturing Site Data Sheet Other: New Package type offering from SPEL Customer Acknowledgement of Receipt: Customer: Name: Title: Date: E-Mail: Phone: Fax: Approval for shipments prior to effective date Customer Comments (Optional): PSC Form - FR-0320 (02/03/04) Page 1 of 13

Green Compound / Pb-free Package 12TDLMP (3.5 X3.0) Lead / Package : 12 Lead TDLMP Package Code : 12 ZE Lead Finish : 100% matte Sn Customer : Pericom, USA. Device Type : PI3USB10 Fab Lot # : SH58489 Assembly Location : SPEL Semiconductor Ltd India. Reported By : N.J.Chandrasekar Head (QA) Date : Sep 14, 2006 Page 1 of 6

Green Compound / Pb-free Package 12TDLMP (3.5 X3.0) INTRODUCTION The purpose of this MSL qualification report is to document the results of MSL qualification tests (Level 1) performed on the following Pb-free packages assembled at SPEL with the green molding compound Sumitomo G770HCD. Evaluated Package Device Type 12 TDLMP (3.5X3.0) PI3USB10 (6V48-L301A2) PROCEDURE The following environmental reliability stress tests & mechanical tests have been performed to determine the reliability of the units that were processed in accordance to SPEL assembly standards and the details are listed herewith. ENVIRONMENTAL STRESS TESTS Preconditioned Temperature Cycling test. Preconditioned Autoclave test. Moisture Sensitivity Level tests. MECHANICAL TESTS X-Ray Inspection Solderability Test RAW MATERIALS USED Evaluated Package (mm) Die size (mm) Lead frame die pad size (mm) 12 TDLMP (3.5x3.0) 2.85X1.19 3.3 x 2.0 Leadframe Material A194 Ring Ag plated Die Attach Adhesive Sumitomo CRM 1076 Gold Wire 1.0 mil GW Wire Bond Thermosonic Molding Compound SUMITOMO G770HCD Mold Type Auto Mark Laser Mark Lead Finish 100% matte Sn Page 2 of 6

Green Compound / Pb-free Package 12TDLMP (3.5 X3.0) Stress Name Environmental Reliability tests Electrical Reference Standard Stress Condition & Duration Test quantity (nos) In Out Electrical Test Result External Visual @ 40X. Preconditioning test JESD22-A113E LEVEL 1 Temperature Cycle @ Ta = -40 +60 C, 5 Cycles Stabilization Bake @ Ta = 125 C, 24 Hrs. Moisture soak @ Ta/RH = 85 C/85%, 168 Hrs. IR reflow @ 260 C, 3 Cycles. 200 200 Pass Preconditioned Temperature Cycling Test JESD22-A104C +150 C -65 C, 500 Cycles 77 77 Pass Preconditioned Unbiased Autoclave Test JESD22-A102C 121 C; 100% Rh, 15 psig, 168 Hrs 77 77 Pass Page 3 of 6

Green Compound / Pb-free Package 12TDLMP (3.5 X3.0) MECHANICAL TESTS X-Ray Inspection: SOLDERABILITY TEST Bath Sn/Pb Sample Size : 5 Units Pre-conditioning : 8 Hrs Steam aging Test Conditions : Bath Temperature 215±5 C Flux type : Kester R Type Solder bath composition : Sn:Pb / 60:40 Acceptance criteria : 95% coverage (min) Coverage : 98% Test Result : PASS SOLDERABILITY TEST Bath: Sn/Ag/Cu Sample Size : 5 Units Pre-conditioning : 8 Hrs Steam aging Test Conditions : Bath Temperature 245±5 C Flux type : Kester R Type Solder bath composition : Sn: 95.5%, Ag (3.0-4.0),Cu(0.5-1) Acceptance criteria : 95% coverage (min) Coverage : 99% Test Result : PASS Page 4 of 6

Green Compound / Pb-free Package 12TDLMP (3.5 X3.0) Preconditioning Test: All the units were subjected to preconditioning tests as follows: Conditions: JEDEC JESD22-A113E LEVEL 1 a) External visual examination @ 40X to screen for mechanical failures b) Temperature cycle @ Ta= -40 C to +60 C, 5 cycles to simulate shipping conditions. c) Stabilization bake @ Ta=125 C, 24 hours to remove all moisture from the package. d) Moisture soak @ Ta / RH =85 C / 85 %, 168 hours to simulate to maximum floor life. e) Solder reflow @ Tmax = 260 C, 3 cycles to simulate one solder reflow and two rework cycles. Electrical Test Result: Pass CSAM performed on all the units as per the test conditions: J-STD-020C before and after the preconditioning tests (Level 1). C-SAM Pictures before Preconditioning tests: C-SAM Pictures after Preconditioning tests: Page 5 of 6

Green Compound / Pb-free Package 12TDLMP (3.5 X3.0) MSL Test Result: Inspection details External Crack Nil Internal Crack Nil Delamination in critical areas: Die \ Mold compound Nil Leads \ Mold Compound Nil Conclusion: Moisture Sensitivity Level for 12 lead TDLMP: Level 1 Dry Pack is not required for this package. Recommended Peak Solder Reflow temperature is 260+0/-5 C & maximum of 3 reflow passes allowed per component. Page 6 of 6

Green Compound / Pb-free Package 56TQLMP (5.0 X11.0) Lead / Package : 56 Lead TQLMP (ZF56) Lead Finish : Preplated NiPdAu Customer : Pericom, USA. Device Type : PI3L500-AZFE Fab Lot # : SHD1013 Assembly Location : SPEL Semiconductor Ltd India. Reported By : N.J.Chandrasekar Head (QA) Date : Nov 06, 2006 Page 1 of 6

Green Compound / Pb-free Package 56TQLMP (5.0 X11.0) INTRODUCTION The purpose of this qualification report is to document the results of Reliability and MSL qualification tests (Level 1) performed on the following Pb-free packages assembled at SPEL with the Preplated NiPdAu leadframes and green molding compound Sumitomo G770HCD. Evaluated Package Device Type 56 TQLMP (5.0 X 11) PI3L500-AZFE (E656-L500EBM) PROCEDURE The following environmental reliability stress tests & mechanical tests have been performed to determine the reliability of the units that were processed in accordance to SPEL assembly standards and the details are listed herewith. ENVIRONMENTAL STRESS TESTS Preconditioned Temperature Cycling test. Preconditioned Autoclave test. Moisture Sensitivity Level tests. MECHANICAL TESTS X-Ray Inspection Solderability Test RAW MATERIALS USED Evaluated Package (mm) Die size (mm) Lead frame die pad size (mm) 56 TQLMP (5.0X11) 1.3X2.7 2.7 X 8.7 Leadframe Material C194 Preplated Die Attach Adhesive Sumitomo CRM 1076 Gold Wire 1.0 mil GW Wire Bond Thermosonic Molding Compound(S) Sumitomo G770HCD Mold Type Auto Mark Laser Mark Lead Finish Preplated NiPdAu Page 2 of 6

Green Compound / Pb-free Package 56TQLMP (5.0 X11.0) Stress Name Environmental Reliability tests Electrical Reference Standard Stress Condition & Duration Test quantity (nos) In Out Electrical Test Result External Visual @ 40X. Preconditioning test JESD22-A113E LEVEL 1 Temperature Cycle @ Ta = -40 +60 C, 5 Cycles Stabilization Bake @ Ta = 125 C, 24 Hrs. Moisture soak @ Ta/RH = 85 C/85%, 168 Hrs. IR reflow @ 260 C, 3 Cycles. 200 200 Pass Preconditioned Temperature Cycling Test JESD22-A104C +150 C -65 C, 500 Cycles 77 77 Pass Preconditioned Unbiased Autoclave Test JESD22-A102C 121 C; 100% Rh, 15 psig, 168 Hrs 77 77 Pass Page 3 of 6

Green Compound / Pb-free Package 56TQLMP (5.0 X11.0) MECHANICAL TESTS PACKAGE CONSTRUCTION DETAILS: Package clearance: 0.15mm Loop Height: 0.15mm Die: 0.2mm Lead frame: 0.2mm TYPICAL PACKAGE CONSTRUCTION IN MM Lead frame Thickness 0.20 Bond Line Thickness 0.01 Die Thickness 0.20 Loop Height 0.15 Laser Mark depth 0.04 Total Package Thickness 0.75 Package Clearance 0.15 X-RAY Inspection Page 4 of 6

Green Compound / Pb-free Package 56TQLMP (5.0 X11.0) SOLDERABILITY TEST Bath Sn/Pb Sample Size : 5 Units Pre-conditioning : 8 Hrs Steam aging Test Conditions : Bath Temperature 215±5 C Flux type : Kester R Type Solder bath composition : Sn:Pb / 60:40 Acceptance criteria : 95% coverage (min) Coverage : 97% Test Result : PASS SOLDERABILITY TEST Bath: Sn/Ag/Cu Sample Size : 5 Units Pre-conditioning : 8 Hrs Steam aging Test Conditions : Bath Temperature 245±5 C Flux type : Kester R Type Solder bath composition : Sn: 95.5%, Ag (3.0-4.0),Cu(0.5-1) Acceptance criteria : 95% coverage (min) Coverage : 98% Test Result : PASS Preconditioning Test: All the units were subjected to preconditioning tests as follows: Conditions: JEDEC JESD22-A113E LEVEL 1 a) External visual examination @ 40X to screen for mechanical failures b) Temperature cycle @ Ta= -40 C to +60 C, 5 cycles to simulate shipping conditions. c) Stabilization bake @ Ta=125 C, 24 hours to remove all moisture from the package. d) Moisture soak @ Ta / RH =85 C / 85 %, 168 hours to simulate to maximum floor life. e) Solder reflow @ Tmax = 260 C, 3 cycles to simulate one solder reflow and two rework cycles. Electrical Test Result: Pass CSAM performed on all the units as per the test conditions: J-STD-020C before and after the preconditioning tests (Level 1). Page 5 of 6

Green Compound / Pb-free Package 56TQLMP (5.0 X11.0) C-SAM Pictures before Preconditioning tests: C-SAM Pictures after Preconditioning tests: MSL Test Result: Inspection details External Crack Nil Internal Crack Nil Delamination in critical areas: Die \ Mold compound Nil Leads \ Mold Compound Nil Conclusion: MSL for 56 Lead TQLMP (ZF56):1. Dry Pack is not required for this package. Recommended Peak Solder Reflow temperature is 260+0/-5 C & maximum of 3 reflow passes allowed per component. Page 6 of 6