Appendix International Standards

Transcription

1 1097 Appendix International Standards Standardisation of materials characterisation methods is needed for various reasons, for example: To provide the basis for measurements and tests that can be compared confidently with thosemadebyothersaroundtheworld, To ensure that a material conforms to a technical specification of characteristics, To be used in the design of a component or structure To support investigations into the reasons for failures in service. In addition, the results achieved from materials measurement and testing help guarantee the quality, safety and reliability of products, components, and technical systems. The importance of measurement, testing and standardisation to science, technology, and economy was expressed as follows by the Commission of the European Union: There is no science without measurements, no quality without testing and no global markets without standards. AATCC ANSI Introducing the compilation of standards in the Appendix of this Handbook, some general remarks on standardisation in this field should be made. Work on standardisation of materials measurement and test methods started between 1920 and 1930 for the various methods in the individual countries. Therefore, the National, European and ISO standards partly have contained different specifications. Whereas it is generally accepted to strive for a complete alignment of standards at all standardization levels, problems can arise from the interlining of existing national standards and new supranational standards (e.g. ISO/EN). When adopting a supranational standard as a national standard, it must be ensured that the supranational standard adopted e.g. as DIN EN ISO in no way contradict relevant national standards. In most cases the relevant national standard will be cancelled. However, it might happen that the new EN ISO standard covers only a part of the existing national standard. In these cases it must be decided whether the part not covered by the new EN ISO standard can be abandoned or whether this part contains specifications that must be retained due to their relevance for the national economic region. In the latter case it will be maintained as a so-called residual standard. A further important purpose of standardization work is to decrease the measurement uncertainty of the test methods and to give the users of standards guidelines to handle. With the publication of EN ISO/IEC General requirements for the competency of testing and calibrating laboratories, the test or calibration certificates provided by the laboratories shall incorporate the measurement results received including the measurement uncertainty. From these data it shall be possible to gather that the metrological specifications have been fulfilled. Moreover, it shall be ensured that the measurement results are converted back to SI units using a metrological chain. In this Appendix of the Springer Handbook of Materials Measurement Methods a collection of standards related to the different chapters of this Handbook is compiled. The chapter standard collections are selective and not complete; they differ in scope and volume and depend on the field and the state of the art of the pertinent standards developments. The references listed comprise the symbol S for standard, the number of the chapter, the continued numbers (separate for each chapter), the name of the editing standards organization, the standards notation, the year of publication, and the title of the standard. For the abbreviations of the standards organizations see the following explanation including the internet adress: American Association of Textile Chemists and Colorists PO Box 12215, Research Triangle Park, NC 27709, USA, American National Standards Institute 11 West 42nd Street, 13th floor, New York, NY 10036, USA, Int. Standards

2 1098 Part Appendix International Standards Int. Standards AS AS/NZS, Standards Australia, available: Beuth Verlag, Berlin, Germany, Foreign Standards Service, ASTM American Society for Testing and Materials 1916 Race Street, Philadelphia, PA , USA, AWPA American Wood-Preserver s Association, P.O. Box 388, Selma, AL USA, BSI British Standards Instituion 389 Chiswick High Road, London W4 4AL, UK, DIN German Standard (Deutsches Institut für Normung, DIN) Berlin, Germany, EN European Standard (CEN-European Committee for Standardization) Rue de Stassart 36, B-1050 Brussels, Belgium, IEC International Electrotechnical Committee Rue de Varembé 3 P.O. Box 131, CH-1211 Geneva 20, Switzerland, ISO International Standards Organization Rue de Varembé 1 P.O. Box 56, CH-1211 Geneva 20, Switzerland, JIS Japanese Standard (JISC - Japanese Industrial Standards Committee) Agency of Industrial Science and Technology Ministry of International Trade and Industry 1-3-1, Kasumigaseki, Chiyoda-Ku, Tokyo 100, Japan, NF French Standard (AFNOR - Association française de normalisation) 11, avenue Francis de Pressensé, Saint-Denise La Phaine Cedex, France, OIML Organisation Internationale de Métrologie Légale 11, Rue Turgot, Paris, France, SEP Stahl-Eisen-Prüfblatt Verein Deutscher Eisenhüttenleute, Verlag Stahleisen GmbH, P.O. BOX , Düsseldorf, Germany, SN Swiss Association for Standardization (SNV) Mühlebachstraße 54, CH-8008 Zurich, Switzerland, VDI Verein Deutscher Ingenieure P.O. Box , Düsseldorf, Germany, Part B Measurement Methods for Composition and Structure Chapter 4 Chemical Composition Chemical Separations (4.1.2) S-4-1 ANSI/ASTM D 6042: S-4-2 ANSI/ASTM D 6060: S-4-3 ANSI/ASTM D 6159: S-4-4 ANSI/ASTM D 6420: S-4-5 ANSI/ASTM D 6733: S-4-6 ASTM D 4626: Test Method for Determination of Phenolic Antioxidants and Erucamide Slip Additives in Polypropylene Homopolymer Formulations Using Liquid Chromatography (LC) Practice for Sampling of Process Vents with a Portable Gas Chromatograph Test Method for Determination of Hydrocarbon Impurities in Ethylene by Gas Chromatography/Note: reaffirmation of ANSI/ASTM D Test Method for Determination of Gaseous Organic Compounds by Direct Interface Gas Chromatography-Mass Spectrometry Test Method for Determination of Individual Components in Spark Ignition Engine Fuels by 50 Meter Capillary High Resolution Gas Chromatography Standard Practice for Calculation of Gas Chromatographic Response Factors / Note: Reapproved 2000

3 Appendix International Standards Part B Measurement Methods for Composition and Structure 1099 S-4-7 ASTM D 5399: Standard Test Method for Boiling Point Distribution of Hydrocarbon Solvents by Gas Chromatography/ Note: Reapproved 2000 S-4-8 ASTM D 5917: Standard Test Method for Trace Impurities in Monocyclic Aromatic Hydrocarbons by Gas Chromatography and External Calibration S-4-9 ASTM D 6060: Standard Practice for Sampling of Process Vents With a Portable Gas Chromatograph / Note: Reapproved 2001 S-4-10 ASTM E 260: Standard Practice for Packed Column Gas Chromatography / Note: Reapproved 2001 S-4-11 ASTM E 355: Standard Practice for Gas Chromatography Terms and Relationships / Note: Reapproved 2001 S-4-12 ASTM E 682 ANSI E 682: S-4-13 ASTM E 685 ANSI E 685: S-4-14 ASTM E 697: S-4-15 ASTM E 840: S-4-16 ASTM E 1140: S-4-17 ASTM E 1303: S-4-18 ASTM E 1449: S-4-19 ASTM E 1510: S-4-20 ASTM E 1642: S-4-21 ASTM E 1657: S-4-22 ASTM E 1698: S-4-23 ISO 2718: S-4-24 JIS K 0114: S-4-25 JIS K 0115: S-4-26 JIS K 0123: S-4-27 OIML R 83: S-4-28 OIML R 113: Standard Practice for Liquid Chromatography Terms and Relationships / Note: Reapproved 2000 Standard Practice for Testing Fixed-Wavelength Photometric Detectors Used in Liquid Chromatography / Note: Reapproved 2000 Standard Practice for Use of Electron-Capture Detectors in Gas Chromatography / Note: Reapproved 2001 Standard Practice for Using Flame Photometric Detectors in Gas Chromatography / Note: Reapproved 2000 Standard Practice for Testing Nitrogen/Phosphorus Thermionic Ionization Detectors for Use In Gas Chromatography / Note: Reapproved 2000 Practice for Refractive Index Detectors Used in Liquid Chromatography / Note: Reapproved 2000 Standard Guide for Supercritical Fluid Chromatography Terms and Relationships / Note: Reapproved 2000 Standard Practice for Installing Fused Silica Open Tubular Capillary Columns in Gas Chromatographs / Note: Reapproved 2000 Standard Practice for General Techniques of Gas Chromatography Infrared (GC/IR) Analysis Standard Practice for Testing Variable-Wavelength Photometric Detectors Used in Liquid Chromatography / Note: Reapproved 2001 Standard Practice for Testing Electrolytic Conductivity Detectors (ELCD) Used in Gas Chromatography / Note: Reapproved 2000 Standard layout for a method of chemical analysis by gas chromatography General rules for gas chromatographic analysis General rules for molecular absorptiometric analysis General rules for analytical methods in gas chromatography mass spectrometry Gas chromatograph/mass spectrometer/data system for analysis of organic pollutants in water Portable gas chromatographs for field measurements of hazardous chemical pollutants; Int. Standards Elemental Analysis (4.1.3) S-4-29 ANSI/ASTM D 4739: Test Method for Base Number Determination by Potentiometric Titration (05.03) / Note: revision of ANSI/ASTM S-4-30 ANSI/ASTM E 1775: Guide for Evaluating the Performance of On-Site Extraction and Field-Portable Electrochemical or Spectrophotometric Analysis for Lead / Note: revision of ANSI/ASTM E S-4-31 ASTM D 3610: Standard Test Method for Total Cobalt In Alumina-Base Cobalt-Molybdenum Catalyst by Potentiometric Titration Method S-4-32 ASTM D 3908: Standard Test Method for Hydrogen Chemisorption on Supported Platinum on Alumina Catalysts and Catalyst Carriers By Volumetric Vacuum Method S-4-33 ASTM D 4739: Standard Test Method for Base Number Determination by Potentiometric Titration S-4-34 ASTM E 473: Standard Terminology Relating to Thermal Analysis

4 1100 Part Appendix International Standards Int. Standards S-4-35 ASTM E 967: S-4-36 ASTM E 1356: S-4-37 ASTM E 1371: S-4-38 ASTM E 1775: S-4-39 ASTM E 1782: S-4-40 ASTM E 1805: S-4-41 ASTM E 1867: S-4-42 ASTM E 1952: S-4-43 ASTM E 1953: S-4-44 ASTM E 1970: S-4-45 ASTM E 2038: S-4-46 ASTM E 2046: S-4-47 ASTM E 2161: S-4-48 DIN : S-4-49 DIN 28417: S-4-50 DIN 50502: S-4-51 DIN 50507: S-4-52 DIN 50508: S-4-53 DIN 51004: S-4-54 DIN 51005: S-4-55 DIN 51005: S-4-56 DIN 51006: S-4-57 DIN 51006: S-4-58 DIN 51007: S-4-59 DIN : S-4-60 DIN EN 10036: S-4-61 DIN EN 10071: S-4-62 DIN EN : S-4-63 DIN EN 24938: S-4-64 DIN EN 27527: S-4-65 DIN EN ISO 4934: Standard Practice for Temperature Calibration of Differential Scanning Calorimeters and Differential Thermal Analyzers Standard Test Method for Assignment of the Glass Transition Temperatures by Differential Scanning Calorimetry or Differential Thermal Analysis Standard Test Method for Gravimetric Determination of Phosphorus in Phosphorus- Copper Alloys or Phosphorus-Copper-Silver Alloys / Note: Reapproved 1999 Standard Guide for Evaluating Performance of On-Site Extraction and Field-Portable Electrochemical or Spectrophotometric Analysis for Lead Standard Test Method for Determining Vapor Pressure by Thermal Analysis Standard Test Method for Fire Assay Determination of Gold in Copper Concentrates by Gravimetry Standard Test Method for Temperature Calibration of Dynamic Mechanical Analyzers Standard Test Method for Thermal Conductivity and Thermal Diffusivity by Modulated Temperature Differential Scanning Calorimetry Standard Practice for Description of Thermal Analysis Apparatus Standard Practice for Statistical Treatment of Thermoanalytical Data Standard Test Method for Temperature Calibration of Dielectric Analyzers Standard Test Method for Reaction Induction Time by Thermal Analysis Standard Terminology Relating to Performance Validation in Thermal Analysis Mechanical, physical and electrical laboratory apparatus; piston operated volumetric apparatus; testing of the metrological reliability, photometrically, titrimetrically and with volumetric calibrated vessels Vacuum technology; measurement of throughput by the volumetric method at constant pressure Chemical analysis of copper and copper alloys Determination of copper in unalloyed copper containing not less than 99.90% of copper Chemical analysis of copper and copper alloys; determination of lead, extractingtitration method Chemical analysis of copper and copper alloys; determination of tin as alloying element, volumetric method Thermal analysis; determination of melting temperatures of crystalline materials by differential thermal analysis Thermal Analysis (TA) Terms Thermal analysis; terms Thermal analysis (TA) Thermogravimetry (TG) Principles Thermal analysis; principles of thermogravimetry Thermal analysis; differential thermal analysis; principles Determination of hydroxyl value Part 2: Method with catalyst Chemical analysis of ferrous materials; determination of total carbon in steel and iron; gravimetric method after combustion in a stream of oxygen; german version EN 10036:1989 Chemical analysis of ferrous materials; determination of manganese in steel and iron; electrometric titration method; German version EN 10071:1989 Zinc and zinc alloys Chemical analysis Part 1: Determination of aluminium in zinc alloys; Titrimetric method; German version EN :2001 Determination of nickel content of steel and iron by gravimetry or volumetric analysis (ISO 4938:1988); German version EN 24938:1990 Nickel, ferronickel and nickel alloys; determination of sulfur content; iodimetric titration method after induction furnace combustion (ISO 7527:1985); German version EN 27527:1991 Steel and iron Determination of sulphur content Gravimetric method (ISO/DIS 4934:2002); German version pren ISO 4934:2002

5 Appendix International Standards Part B Measurement Methods for Composition and Structure 1101 S-4-66 DIN EN ISO : S-4-67 DIN EN ISO : S-4-68 DIN EN ISO : S-4-69 DIN EN ISO : S-4-70 DIN EN ISO : S-4-71 DIN EN ISO : S-4-72 DIN ISO 4748: S-4-73 DIN ISO 6142: S-4-74 DIN ISO 6144: S-4-75 ISO 648: S-4-76 ISO 760: S-4-77 ISO 3111: S-4-78 ISO 3112: S-4-79 ISO 4748: S-4-80 ISO 4938: S-4-81 ISO 9055: S-4-82 JIS B 7607: S-4-83 JIS K 0067: S-4-84 JIS K 0113: S-4-85 JIS K 0129: S-4-86 JIS K 0213: S-4-87 JIS K 0214: S-4-88 NF B , NF ISO : S-4-89 NF B35-042: S-4-90 NF B , NF EN ISO : S-4-91 NF T , NF ISO /AD2: S-4-92 OIML R 31: S-4-93 OIML R 32: Piston-operated volumetric apparatus Part 1: Terminology, general requirements and user recommendations (ISO :2002); German version EN ISO :2002 Piston-operated volumetric apparatus Part 2: Piston pipettes (ISO :2002); German version EN ISO :2002 Piston-operated volumetric apparatus Part 3: Piston burettes (ISO :2002); German version EN ISO :2002 Piston-operated volumetric apparatus Part 4: Dilutors (ISO :2002); German version EN ISO :2002 Piston-operated volumetric apparatus Part 5: Dispenser (ISO :2002); German version EN ISO :2002 Piston-operated volumetric apparatus Part 6: Gravimetric methods for the determination of measurement error (ISO :2002); German version EN ISO :2002 Copper alloys; Determination of iron content; Na 2 EDTA titrimetric method; identical with ISO 4748, edition 1984 Gas analysis Preparation of calibration gas mixtures Weighing methods Gas analysis; preparation of calibration gas mixtures; static volumetric methods Laboratory glassware; One-mark pipettes Determination of water; Karl Fischer method (General method) Copper alloys; Determination of tin as alloying element; Volumetric method Copper and copper alloys; Determination of lead; Extracting titration method Copper alloys; Determination of iron content; Na 2 EDTA titrimetric method Steel and iron; determination of nickel content; gravimetric or titrimetric method Carbonaceous materials for the production of aluminium; pitch for electrodes; determination of sulfur content by the bomb method Automatic checkweighing and weight grading instruments Test methods for loss and residue of chemical products General rules for methods of potentiometric, amperometric, coulometric, and Karl-Fischer titrations General rules for thermal analysis Technical terms for analytical chemistry (Electrochemistry division) Technical terms for analytical chemistry (chromatography part) Glassware. Hydrolytic resistance of the interior surfaces of glass containers. Part 1: determination by titration method and classification. Pyknometer Jaulmes type. Piston-operated volumetric apparatus Part 6: gravimetric methods for the determination of measurement error. Reagents for chemical analysis. Specifications. Part 3: primary standard. Sodium carbonate. Diaphragm gas meters Rotary piston gas meters and turbine gas meters; Int. Standards Physical Methods for the Measurement of Chemical Composition (4.2) S-4-94 ANSI/ASTM D 1976: S-4-95 ANSI/ASTM D 2650: S-4-96 ANSI/ASTM D 3649a: Test Method for Elements in Water by Inductively-Coupled Argon Plasma Atomic Emission Spectroscopy Chemical Composition of Gases by Mass Spectrometry, Test Method for (05.02, 05.05) / Note: revision of ANSI/ASTM D Test Method for High-Resolution Gamma-Ray Spectrometry of Water / Note: 2. revision 1998.

6 1102 Part Appendix International Standards Int. Standards S-4-97 ANSI/ASTM D 4628: Analysis of Barium, Calcium, Magnesium, and Zinc in Unused Lubricating Oils by Atomic Absorption Spectrometry, Method for (05.02) / Note: revision of ANSI/ASTM D S-4-98 ANSI/ASTM D 6732: Test Method for the Determination of Copper in Jet Fuels by Graphite Furnace Atomic Absorption Spectrometry / Note: revision of ANSI/ASTM D S-4-99 ANSI/ASTM D 6785: Test Method for Determination of Lead in Workplace Air Using Flame or Graphite Furnace Atomic Absorption Spectrometry S ANSI/ASTM E 1727: Practice for Field Collection of Soil Samples for Lead Determination by Atomic Spectrometry Techniques (04.11) / Note: revision of ANSI/ASTM E S ANSI/ASTM E 1729: Practice for Field Collection of Dried Paint Samples for Lead Determination by Atomic Spectrometry Techniques (04.11) / Note: revision of ANSI/ASTM E S ASTM B 890: Standard Test Method for Determination of Metallic Constituents of Tungsten Alloys and Tungsten Hardmetals by X-Ray Fluorescence Spectrometry S ASTM C 1111: Standard Test Method for Determining Elements in Waste Streams by Inductively Coupled Plasma-Atomic Emission Spectroscopy S ASTM C 1118: Standard Guide for Selecting Components for Wavelength-Dispersive X-Ray Fluorescence (XRF) Systems / Note: Reapproved 2000 S ASTM C 1163: Standard Test Method for Mounting Actinides for Alpha Spectrometry Using Neodymium Fluoride S ASTM C 1508: Standard Test Method for Determination of Bromine and Chlorine in UF 6 and Uranyl Nitrate by X-Ray Fluorescence (XRF) Spectroscopy S ASTM D 1976: Standard Test Method for Elements in Water by Inductively-Coupled Argon Plasma Atomic Emission Spectroscopy S ASTM D 2650: Standard Test Method for Chemical Composition of Gases By Mass Spectrometry S ASTM D 5954: Standard Test Method for Mercury Sampling and Measurement in Natural Gas by Atomic Absorption Spectroscopy S ASTM D 6350: Standard Test Method for Mercury Sampling and Analysis in Natural Gas by Atomic Fluorescence Spectroscopy S ASTM D 6732: Standard Test Method for Determination of Copper in Jet Fuels by Graphite Furnace Atomic Absorption Spectrometry S ASTM D 6785: Standard Test Method for Determination of Lead in Workplace Air Using Flame or Graphite Furnace Atomic Absorption Spectrometry S ASTM E 131a: Standard Terminology Relating to Molecular Spectroscopy / Note: 2. revision 2000 S ASTM E 386: Standard Practice for Data Presentation Relating to High-Resolution Nuclear Magnetic Resonance (NMR) Spectroscopy / Note: Reapproved 1999 S ASTM E 406: Standard Practice for Using Controlled Atmospheres in Spectrochemical Analysis / Note: Reapproved 1996 S ASTM E 507: Standard Test Method for Aluminum in Iron Ores by Atomic Absorption Spectrometry S ASTM E 508: Standard Test Method for Calcium and Magnesium in Iron Ores by Atomic Absorption Spectrometry S ASTM E 539: Standard Test Method for X-Ray Emission Spectrometric Analysis of 6Al-4V Titanium Alloy S ASTM E 573: Standard Practices for Internal Reflection Spectroscopy S ASTM E 673: Standard Terminology Relating to Surface Analysis S ASTM E 827: Standard Practice for Indentifying Elements by the Peaks in Auger Electron Spectroscopy S ASTM E 863: Standard Practice for Describing Flame Atomic Absorption Spectroscopy Equipment S ASTM E 876: Standard Practice for Use of Statistics in the Evaluation of Spectrometric Data / Note: 1. editorial change. Reapproved 1994

7 Appendix International Standards Part B Measurement Methods for Composition and Structure 1103 S ASTM E 902: Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers / Note: Reapproved 1999 S ASTM E 925: Standard Practice for Monitoring the Calibration of Ultraviolet Visible Spectrophotometers whose Spectral Slit Width does not Exceed 2 nm S ASTM E 984: Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy / Note: Reapproved 2001 S ASTM E 1078: Standard Guide for Procedures for Specimen Preparation and Mounting in Surface Analysis S ASTM E 1097: Standard Guide for Direct Current Plasma Emission Spectrometry Analysis S ASTM E 1127: Standard Guide for Depth Profiling in Auger Electron Spectroscopy / Note: Reapproved 1997 S ASTM E 1162: Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS) / Note: Reapproved 2001 S ASTM E 1184: Standard Practice for Electrothermal (Graphite Furnace) Atomic Absorption Analysis S ASTM E 1217: Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers S ASTM E 1361: Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis / Note: Reapproved 1999 S ASTM E 1452: Standard Practice for Preparation of Calibration Solutions for Spectrophotometric and for Spectroscopic Atomic Analysis / Note: Reapproved 1996 S ASTM E 1504: Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS) / Note: Reapproved 2001 S ASTM E 1505: Standard Guide for Determining SIMS Relative Sensitivity Factors from Ion Implanted External Standards / Note: Reapproved 2001 S ASTM E 1508: Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy S ASTM E 1523: Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy S ASTM E 1621: Standard Guide for X-Ray Emission Spectrometric Analysis / Note: Reapproved 1999 S ASTM E 1622: Standard Practice for Correction of Spectral Line Overlap in Wavelength-Dispersive X-Ray Spectrometry / Note: 1. editorial change. Reapproved 1999 S ASTM E 1634: Standard Guide for Performing Sputter Crater Depth Measurements S ASTM E 1635: Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS) / Note: Reapproved 2000 S ASTM E 1636: Standard Practice for Analytically Describing Sputter-Depth-Profile Interface Data by an Extended Logistic Function / Note: Reapproved 1999 S ASTM E 1644: Standard Practice for Hot Plate Digestion of Dust Wipe Samples for the Determination of Lead S ASTM E 1655: Standard Practices for Infrared Multivariate Quantitative Analysis S ASTM E 1683: Standard Practice for Testing the Performance of Scanning Raman Spectrometers S ASTM E 1726: Standard Practice for Preparation of Soil Samples by Hotplate Digestion for Subsequent Lead Analysis; S ASTM E 1727: Standard Practice for Field Collection of Soil Samples for Lead Determination by Atomic Spectrometry Techniques S ASTM E 1729: Standard Practice for Field Collection of Dried Paint Samples for Lead Determination by Atomic Spectrometry Techniques S ASTM E 1754: Standard Test Method for Determination of Low Levels of Water in Liquid Chlorine by Infrared Spectrophotometry / Note: 1. editorial change. Reapproved 2001 S ASTM E 1770: Standard Practice for Optimization of Electrothermal Atomic Absorption Spectrometric Equipment / Note: Reapproved 2001 S ASTM E 1786: Standard Test Method for Determination of Low Levels of Water in Liquid Chlorine by On-Line Infrared Spectrophotometry S ASTM E 1790: Standard Practice for Near Infrared Qualitative Analysis S ASTM E 1812: Standard Practice for Optimization of Flame Atomic Absorption Spectrometric Equipment Int. Standards

8 1104 Part Appendix International Standards Int. Standards S ASTM E 1852: Standard Test Method for Determination of Low Levels of Antimony in Carbon and Low- Alloy Steel by Electrothermal Atomic Absorption Spectrometry / Note: Reapproved 2001 S ASTM E 1999: Standard Test Method for Analysis of Cast Iron Using Optical Emission Spectrometry / Note: 1. editorial change S ASTM E 2056: Standard Practice for Qualifying Spectrometers and Spectrophotometers for Use in Multivariate Analyses, Calibrated Using Surrogate Mixtures S ASTM E 2105: Standard Practice for General Techniques of Thermogravimetric Analysis (TGA) Coupled With Infrared Analysis (TGA/IR) S ASTM E 2106: Standard Practice for General Techniques of Liquid Chromatography-Infrared (LC/IR) and Size Exclusion Chromatography-Infrared (SEC/IR) Analyses S ASTM E 2108: Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer S ASTM F 1708: Standard Practice for Evaluation of Granular Polysilicon by Meter-Zoner Spectroscopies S ASTM F 1710: Standard Test Method for Trace Metallic Impurities in Electronic Grade Titanium by High Mass-Resolution Glow Discharge Mass Spectrometer / Note: Reapproved 2002 S ASTM F 1723: Standard Practice for Evaluation of Polycrystalline Silicon Rods by Float-Zone Crystal Growth and Spectroscopy S ASTM F 2139: Standard Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry S DIN : Spectral measurement of radiation; terminology, quantities, characteristic values S DIN : Spectral measurement of radiation; spectral isolation; definitions and characteristics S DIN 32635: Spectrophotometrical analysis of solutions; terms, symbols, units S DIN : Inductively coupled plasma mass spectrometry (ICP-MS) Part 1: Principes and definitions S DIN 51003: Total reflection x-ray fluorescence Principles and definitions S DIN : Optical emission spectrometry (OES) Part 1: Terms for systems with sparks and low pressure discharges S DIN : Optical Emission Spectrometry (OES) Part 2: Terms for flame and plasma systems S DIN 51009: Optical atomic spectral analysis Principles and definitions S DIN : Atomic absorption spectrometry (AAS) Part 1: Terms S DIN Supplement 1: Atomic absorption spectrometry (AAS) Part 1: Terms; explanations S DIN : X-ray spectrometry X-ray emission- and X-ray fluorescence analysis (XRF) Part 1: Definitions and basic principles S DIN : X-ray spectrometry X-ray emission- and X-ray fluorescense analysis (XRF) Part 2: Definitions and basic principles for measurements, calibration and evaluation of results S DIN Supplement 1: S DIN : S DIN : S DIN EN VDE 0411 Teil 2-061: S ISO 78-3: S ISO 78-4: S ISO 6286: S ISO 6955: X-ray spectrometry X-Ray Emission- and X-ray Fluorescence analysis (XRF) Part 2: Definitions and basic principles for measurements, calibration and evaluation of results; additional information and examples of calculation Photometer for analytical tests; requirements for the description of technical data for the user Optical cells for photometric measurements; concepts Safety requirements for electrical equipment for measurement, control, and laboratory use Part 2-061: Particular requirements for laboratory atomic spectrometers with thermal atomization and ionization (IEC 66/286/CDV:2002); German version pren :2002 Chemistry; Layouts for standards; Part 3: Standard for molecular absorption spectrometry Layouts for standards; Part 4: Standard for atomic absorption spectrometric analysis Molecular absorption spectrometry; Vocabulary; General; Apparatus Analytical spectroscopic methods; Flame emission, atomic absorption, and atomic fluorescence; Vocabulary Bilingual edition

9 Appendix International Standards Part B Measurement Methods for Composition and Structure 1105 S ISO : S ISO 14237: S ISO/FDIS 14594: S ISO 14606: S ISO 14707: S ISO/DIS 15470: S ISO/DIS 15471: S ISO 15472: S ISO 15632: S ISO/DIS 17331: S ISO/DIS 17470: S ISO 17560: S ISO 17973: S ISO 17974: S ISO 18114: S ISO/DIS 18118: S ISO/DIS 19318: S ISO/FDIS 20341: S ISO/DIS 21270: S JIS B 7957: S JIS K 0083: S JIS K 0085: S JIS K 0104: S JIS K 0105: S JIS K 0106: S JIS K 0106/ERRATUM 1: S JIS K 0115: S JIS K 0116: S JIS K 0121: S JIS K 0123: S JIS K 0131: Glass and glassware; analysis of extract solutions; part 4: determination of aluminium oxide by molecular absorption spectrometry Surface chemical analysis Secondary-ion mass spectrometry Determination of boron atomic concentration in silicon using uniformly doped materials Microbeam analysis Electron probe microanalysis Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy Surface chemical analysis Sputter depth profiling Optimization using layered systems as reference materials Surface chemical analysis Glow discharge optical emission spectrometry (GD-OES) Introduction to use Surface chemical analysis X-ray photoelectron spectroscopy Description of selected instrumental performance parameters Surface chemical analysis Auger electron spectroscopy Description of selected instrumental performance parameters Surface chemical analysis X-ray photoelectron spectrometers Calibration of energy scales Microbeam analysis Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors Surface chemical analysis Chemical methods for the collection of elements from the surface of silicon-wafer working-reference materials and their determination by total-reflection X-ray fluorescence spectroscopy (TXRF) Microbeam analysis Electron probe microanalysis Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry Surface chemical analysis Secondary-ion mass spectrometry Method for depth profiling of boron in silicon Surface chemical analysis Medium-resolution Auger electron spectrometers Calibration of energy scales for elemental analysis Surface chemical analysis High-resolution Auger electron spectrometers Calibration of energy scales for elemental and chemical-state analysis Surface chemical analysis Secondary-ion mass spectrometry Determination of relative sensitivity factors from ion-implanted reference materials Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials Surface chemical analysis X-ray photoelectron spectroscopy Reporting of methods used for charge control and charge correction Surface chemical analysis Secondary-ion mass spectrometry Method for estimating depth resolution parameters with multiple delta-layer reference materials Surface chemical analysis X-ray photoelectron and Auger electron spectrometers Linearity of intensity scale Continuous analyzers for oxidants in ambient air Method for determination of metals in flue gas Methods for determination of bromine in flue gas Methods for determination of nitrogen oxides in flue gas Methods for determination of fluorine compounds in flue gas Methods for determination of chlorine in flue gas Methods for determination of chlorine in flue gas (Erratum 1) General rules for molecular absorptiometric analysis General rules for atomic emission spectrometry General rules for atomic absorption spectrochemical analysis General rules for analytical methods in gas chromatography mass spectrometry General rules for X-ray diffractometric analysis Int. Standards

10 1106 Part Appendix International Standards Int. Standards S JIS K 0133: S JIS K 0141: S JIS K 0142: S JIS K 0143: S JIS K 0144: S JIS K 0212: S NF A07-001: S NF C42-730, NF EN : S NF T01-032: S NF T01-036: S NF T01-041: S NF T20-058: S NF X20-301: S NF X20-302: S NF X20-307: S NF X20-351; S NF X20-352: S NF X20-357: S OIML R 83: S OIML R 100: S OIML R 116: S OIML R 123: General rules for high frequency plasma mass spectrometry Surface chemical analysis Data transfer format Surface chemical analysis Information formats Surface chemical analysis Secondary ion mass spectrometry Determination of boron atomic concentration in silicon using uniformly doped materials Surface chemical analysis Glow discharge optical emission spectrometry (GD-OES) Introduction to use Technical terms for analytical chemistry (optical part) Metal products. General data on emission spectrometry Safety requirements for electrical equipment for measurement, control and laboratory use. Part 2-061: particular requirements for laboratory atomic spectrometers with thermal atomization and ionization Molecular absorption spectrophotometry. Optical cells Molecular absorption spectrophotometry. Methods of inspection of apparatus Atomic absorption spectroscopy. General approach to practice Chemical products for industrial use. General method for determination of silicon content. Reduced molybdosilicate spectrometric method Gas analysis by absorption of a non dispersive infra-red radiation beam Gas analysis by mass spectrometry. Determination of gas chemical composition Gas analysis by colorimetry Determination of sulphur dioxide by absorption of a non dispersive infra-red radiation beam Dioxide sulphur determination by mass spectrometry Dioxide sulphur determination by spectrophotometry using pararosanilin Gas chromatograph/mass spectrometer/data system for analysis of organic pollutants in water Atomic absorption spectrometers for measuring metall pollutants in water Inductively coupled plasma atomic emission spectrometers for measurement of metall pollutants in water Portable and transportable X-ray fluorescence spectrometers for field measurement of hazardous elemental pollutant Chapter 5 Molecular Architecture and Microstructure Spectroscopic Analysis (5.5.2) S-5-1 ASTM D 5017: S-5-2 ASTM D 5292: S-5-3 ASTM E 386: S-5-4 ASTM D 2650: S-5-5 ASTM E 1162: S-5-6 ASTM E 1504: Standard Test Method for Determination of Linear Low Density Polyethylene (LLDPE) Composition by Carbon-13 Nuclear Magnetic Resonance Standard Test Method for Aromatic Carbon Contents of Hydrocarbon Oils by High Resolution Nuclear Magnetic Resonance Spectroscopy Standard Practice for Data Presentation Relating to High-Resolution Nuclear Magnetic Resonance (NMR) Spectroscopy / Note: Reapproved 1999 Standard Test Method for Chemical Composition of Gases By Mass Spectrometry Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS) / Note: Reapproved 2001 Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS) / Note: Reapproved 2001

11 Appendix International Standards Part B Measurement Methods for Composition and Structure 1107 S-5-7 ASTM E 1505: Standard Guide for Determining SIMS Relative Sensitivity Factors from Ion Implanted External Standards / Note: Reapproved 2001 S-5-8 ASTM E 1634: Standard Guide for Performing Sputter Crater Depth Measurements S-5-9 ASTM E 1635: Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS) / Note: Reapproved 2000 S-5-10 ASTM E 1636: Standard Practice for Analytically Describing Sputter-Depth-Profile Interface Data by an Extended Logistic Function / Note: Reapproved 1999 S-5-11 ASTM F 1710: Standard Test Method for Trace Metallic Impurities in Electronic Grade Titanium by High Mass-Resolution Glow Discharge Mass Spectrometer / Note: Reapproved 2002 S-5-12 ASTM F 2139: Standard Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry S-5-13 DIN : Recording in medical application of ionizing radiation Part 5: Radiological report S-5-14 DIN V : S-5-15 DIN : S-5-16 DIN EN ISO 11543: S-5-17 DIN EN VDE 0411 Teil 2-061: S-5-18 DIN EN VDE 0411 Teil 2-061: S-5-19 NF C74-122, NF EN : S-5-20 NF C74-122/A11, NF EN /A11: S-5-21 EN ISO 11543: S-5-22 DIN : S-5-23 ISO 14237: S-5-24 ISO 17560: S-5-25 ISO 18114: S-5-26 ISO/FDIS 20341: S-5-27 JIS K 0123: S-5-28 JIS K 0133: S-5-29 JIS K 0141: S-5-30 JIS K 0142: S-5-31 JIS K 0143: S-5-32 NF X20-302: S-5-33 NF X20-352: Image quality assurance in diagnostic X-ray departments Part 57: Acceptance testing for image display devices Digital archiving in medical radiology Part 1: General requirements for the archiving of images Modified starch Determination of hydroxypropyl content Method using proton nuclear magnetic resonance (NMR) spectrometry (ISO 11543:2000); German version EN ISO 11543:2002 Safety requirements for electrical equipment for measurement, control, and laboratory use Part 2-061: Particular requirements for laboratory atomic spectrometers with thermal atomization and ionization (IEC 66/286/CDV:2002); German version pren :2002 Safety requirements for electrical equipment for measurement, control, and laboratory use Part 2-061: Particular requirements for laboratory atomic spectrometers with thermal atomization and ionization (IEC 66/286/CDV:2002); German version pren :2002 Medical electrical equipment. Part 2: particular requirements for the safety of magnetic resonance equipment for medical diagnosis Medical electrical equipment Part 2: particular requirements for the safety of magnetic resonance equipment for medical diagnosis Modified starch Determination of hydroxypropyl content Method using proton nuclear magnetic resonance (NMR) spectrometry (ISO 11543:2000) Inductively coupled plasma mass spectrometry (ICP-MS) Part 1: Principes and definitions Surface chemical analysis Secondary-ion mass spectrometry Determination of boron atomic concentration in silicon using uniformly doped materials Surface chemical analysis Secondary-ion mass spectrometry Method for depth profiling of boron in silicon Surface chemical analysis Secondary-ion mass spectrometry Determination of relative sensitivity factors from ion-implanted reference materials Surface chemical analysis Secondary-ion mass spectrometry Method for estimating depth resolution parameters with multiple delta-layer reference materials General rules for analytical methods in gas chromatography mass spectrometry General rules for high frequency plasma mass spectrometry Surface chemical analysis Data transfer format Surface chemical analysis Information formats Surface chemical analysis Secondary ion mass spectrometry Determination of boron atomic concentration in silicon using uniformly doped materials Gas analysis by mass spectrometry. Determination of gas chemical composition Dioxide sulphur determination by mass spectrometry; Part B Measurement Methods for Composition and Structure Int. Standards

12 1108 Part Appendix International Standards Int. Standards Chapter 6 Surface and Interface Characterization Surface Chemical Analysis (6.1) S-6-1 ASTM E 983: S-6-2 ASTM E 984: S-6-3 ASTM E 995: S-6-4 ASTM E 996: S-6-5 ASTM E 1078: Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy / Note: Reapproved 1999 Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy / Note: Reapproved 2001 Standard Guide for Background Subtraction Techniques in Auger Electron and X-ray Photoelectron Spectroscopy Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy / Note: Reapproved 1999 Standard Guide for Procedures for Specimen Preparation and Mounting in Surface Analysis S-6-6 ASTM E 1127: Standard Guide for Depth Profiling in Auger Electron Spectroscopy / Note: Reapproved 1997 S-6-7 ASTM E 1217: Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers S-6-8 ISO/DIS 21270: Surface chemical analysis X-ray photoelectron and Auger electron spectrometers Linearity of intensity scale S-6-9 DIN : Vacuum technology; terms and definitions, surface analysis techniques S-6-10 ASTM E 1162: Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS) / Note: Reapproved 2001 S-6-11 ASTM E 1438: Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS / Note: Reapproved 2001 S-6-12 ASTM E 1504: Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS) / Note: Reapproved 2001 S-6-13 ASTM E 1505: Standard Guide for Determining SIMS Relative Sensitivity Factors from Ion Implanted External Standards / Note: Reapproved 2001 S-6-14 ASTM E 1635: Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS) / Note: Reapproved 2000 S-6-15 ASTM E 1880: Standard Practice for Tissue Cryosection Analysis with SIMS / Note: Reapproved 2002 S-6-16 ASTM E 1881: Standard Guide for Cell Culture Analysis with SIMS / Note: Reapproved 2002 S-6-17 ASTM F 1366: Standard Test Method for Measuring Oxygen Concentration in Heavily Doped Silicon Substrates by Secondary Ion Mass Spectrometry / Note: Reapproved 2002 S-6-18 ASTM F 1528: Standard Test Method for Measuring Boron Contamination in Heavily Doped N-Type Silicon Substrates by Secondary Ion Mass Spectrometry / Note: Reapproved 1999 S-6-19 ASTM F 1617: Standard Test Method for Measuring Surface Sodium, Aluminum, Potassium, and Iron on Silicon and EPI Substrates by Secondary Ion Mass Spectrometry / Note: Reapproved 2002 S-6-20 ANSI/IEEE 759: Semiconductor X-Ray Energy Spectrometers, Test Procedures for / Note: reaffirmation of ANSI/IEEE (R1991) S-6-21 ASTM C 1255: Standard Test Method for Analysis of Uranium and Thorium in Soils by Energy Dispersive X-Ray Fluorescence Spectroscopy / Note: Reapproved 1999 S-6-22 ASTM C 1271: Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone S-6-23 ASTM E 539: Standard Test Method for X-Ray Emission Spectrometric Analysis of 6Al-4V Titanium Alloy S-6-24 ASTM E 572: Standard Test Method for X-Ray Emission Spectrometric Analysis of Stainless Steel / Note: 1. editorial change. Reapproved 2000 S-6-25 ASTM E 902: Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers / Note: Reapproved 1999 S-6-26 ASTM E 1078: Standard Guide for Procedures for Specimen Preparation and Mounting in Surface Analysis S-6-27 ASTM E 1085: Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels / Note: Reapproved 2000

13 Appendix International Standards Part B Measurement Methods for Composition and Structure 1109 S-6-28 ASTM E 1172: S-6-29 ASTM E 1217: S-6-30 ASTM E 1523: S-6-31 ASTM E 2108: S-6-32 DIN 51009: S-6-33 DIN EN : S-6-34 ISO/DIS 15471: S-6-35 ISO 17973: S-6-36 ISO 17974: S-6-37 ISO/DIS 18118: S-6-38 ISO 14237: S-6-39 ISO 17560: S-6-40 ISO 18114: S-6-41 ISO/FDIS 20341: S-6-42 ISO/DIS 15470: S-6-43 ISO 15472: S-6-44 ISO/DIS 18118: S-6-45 ISO/DIS 19318: Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer / Note: Reapproved 2001 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer Optical atomic spectral analysis Principles and definitions Non-destructive testing Measurement and evaluation of the X-ray tube voltage Part 3: Spectrometric method; German version EN :1999 Surface chemical analysis Auger electron spectroscopy Description of selected instrumental performance parameters Surface chemical analysis Medium-resolution Auger electron spectrometers Calibration of energy scales for elemental analysis Surface chemical analysis High-resolution Auger electron spectrometers Calibration of energy scales for elemental and chemical-state analysis Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials Surface chemical analysis Secondary-ion mass spectrometry Determination of boron atomic concentration in silicon using uniformly doped materials Surface chemical analysis Secondary-ion mass spectrometry Method for depth profiling of boron in silicon Surface chemical analysis Secondary-ion mass spectrometry Determination of relative sensitivity factors from ion-implanted reference materials Surface chemical analysis Secondary-ion mass spectrometry Method for estimating depth resolution parameters with multiple delta-layer reference materials Surface chemical analysis X-ray photoelectron spectroscopy Description of selected instrumental performance parameters Surface chemical analysis X-ray photoelectron spectrometers Calibration of energy scales Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials Surface chemical analysis X-ray photoelectron spectroscopy Reporting of methods used for charge control and charge correction S-6-46 ISO/DIS 21270: Surface chemical analysis X-ray photoelectron and Auger electron spectrometers Linearity of intensity scale S-6-47 JIS K 0143: Surface chemical analysis Secondary ion mass spectrometry Determination of boron atomic concentration in silicon using uniformly doped materials S-6-48 OIML D 21: Secondary standard dosimetry laboratories for the calibration of dosimeters used in radiotherapy Int. Standards Surface Topography Analysis (6.2) S-6-49 DIN V 32938: Surface profiling by means of optical microscopic methods Concepts and measurement procedures S-6-50 DIN V 32950: Geometrical product specification (GPS) Masterplan (ISO/TR 14638:1995) S-6-51 DIN EN ISO 1302: S-6-52 DIN EN ISO 3274: Geometrical Product Specifications (GPS) Indication of surface texture in technical product documentation (ISO 1302:2002); German version EN ISO 1302:2002 Geometrical Product Specifications (GPS) Surface texture: Profile method Nominal characteristics of contact (stylus) instruments (ISO 3274:1996); German version EN ISO 3274:1997