Project Proposal. Cu Wire Bonding Reliability Phase 3 Planning Webinar. Peng Su June 6, 2014

Similar documents
MATERIAL NEEDS AND RELIABILITY CHALLENGES IN AUTOMOTIVE PACKAGING UNDER HARSH CONDITIONS

Copper Wire Bonding: the Last Frontier of Cost Savings. Bernd K Appelt Business Development ASE (U.S.) Inc. April 11, 2012

Advanced Analytical Techniques for Semiconductor Assembly Materials and Processes. Jason Chou and Sze Pei Lim Indium Corporation

Critical Barriers Associated with Copper Bonding Wire. William (Bud) Crockett Jr.

Chips Face-up Panelization Approach For Fan-out Packaging

Supplier Response (CHD Cu wire) FSL-TJN-FM S9S08SG32E1xTG/ SG16E1xTG - MC9S08SG32. Item Name. 2. Supplier s Part Number/Data Sheet:

Copper Wire Bonding Technology and Challenges

Quality and Reliability Report

ALTERNATIVES TO CROSS-SECTIONAL SAMPLE PREPARATION FOR PACKAGE AND BOARD-LEVEL FAILURE ANALYSIS

IMPLEMENTATION OF A FULLY MOLDED FAN-OUT PACKAGING TECHNOLOGY

Rockwell R RF to IF Down Converter

Dallas Semicoductor DS80C320 Microcontroller

PRODUCT/PROCESS CHANGE NOTIFICATION

Innovative MID Plating Solutions

RoHS Compliance Document

Lead-Free Solder Bump Technologies for Flip-Chip Packaging Applications

Quality and Reliability Report

Automotive Electronic Material Challenges. Anitha Sinkfield, Delphi

Unique Failure Modes from use of Sn-Pb and Lead-Free (mixed metallurgies) in PCB Assembly: CASE STUDY

Xilinx CN Package Qualification Updates for MRQW 2015 Kangsen Huey Space Product Marketing Manager January, 2014

Advancements In Packaging Technology Driven By Global Market Return. M. G. Todd

Motorola PC603R Microprocessor

PROCESS CHANGE NOTIFICATION PCN1801

A STUDY OF THE ENEPIG IMC FOR EUTECTIC AND LF SOLDERS

National Semiconductor LM2672 Simple Switcher Voltage Regulator

Component Palladium Lead Finish - Specification Approved by Executive Board 1997-xx-xx August 22 Version

Silicon Wafer Processing PAKAGING AND TEST

Hitachi A 64Mbit (8Mb x 8) Dynamic RAM

Power Electronics Packaging Solutions for Device Junction Temperature over 220 o C

Lattice isplsi1032e CPLD

MTS Semiconductor Solution

Teaching Lab Course on Electronic Packaging and Materials

Using Argon Plasma to Remove Fluorine, Organic and Metal Oxide Contamination for Improved Wire Bonding Performance

Package Qualification Report Reliability By Design

Composition/wt% Bal SA2 (SABI) Bal SA3 (SABI + Cu) Bal

Bonding Wires for Semiconductor Technology

Observations of Intermetallic Compound Formation of Hot Dip Aluminized Steel

PROCESS CHANGE NOTIFICATION PCN1714

The Morphology Evolution and Voiding of Solder Joints on QFN Central Pads with a Ni/Au Finish

Advances in Printing nano Cu and Using Existing Cu Based Manufacturing Processes. Michael J. Carmody Chief Scientist, Intrinsiq Materials

Exclusive Technology Feature. Failure Analysis On Power MOSFETs With Copper Wire Bonds. Problems Of Decapsulation.

Interlayer Dielectric (ILD) Cracking Mechanisms and their Effects on Probe Processes. Daniel Stillman, Daniel Fresquez Texas Instruments Inc.

Study of the Interface Microstructure of Sn-Ag-Cu Lead-Free Solders and the Effect of Solder Volume on Intermetallic Layer Formation.

Customizing Processes for Hermetic Assembly Of Devices Designed for Plastic Packages (1 of 3)

Comparative Study of NiNiP Leadframes from Different Processes

WF6317. A superactive low-volatile/high heat-resistant water-soluble flux for ball soldering

Product and Properties Guide Alcryn fi MPR

System Level Effects on Solder Joint Reliability

Figure 1 Copper vs Gold Wire Savings

Novel Materials and Activities for Next Generation Package. Hitachi Chemical., Co.Ltd. Packaging Solution Center Hiroaki Miyajima

IMPACT OF MICROVIA-IN-PAD DESIGN ON VOID FORMATION

Wafer Level Chip Scale Package (WLCSP)

Arch. Metall. Mater. 62 (2017), 2B,

Analog, MEMS and Sensor Group (AMS)

Reliability And Processability Of Sn/Ag/Cu Solder Bumped Flip Chip Components On Organic High Density Substrates

WorkShop Audace. INSA ROUEN 8 juin 2012

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

Wire Bonding Integrity Assessment for Combined Extreme Environments

Fabrication of Smart Card using UV Curable Anisotropic Conductive Adhesive (ACA) Part I: Optimization of the curing conditions

Cypress Semiconductor Package Qualification Report

Failure Modes in Wire bonded and Flip Chip Packages

Final Year Project Proposal 1

Effects of Pd Addition on Au Stud Bumps/Al Pads Interfacial Reactions and Bond Reliability

Dissolution of electroless Ni metallization by lead-free solder alloys

Localized Corrosion of a 7075 Aluminum Alloy Exposed to KCl

Micro-Structural Observation of the Bonding Interface between Au Wire and a Platinum Electrode

3D Package Technologies Review with Gap Analysis for Mobile Application Requirements. Apr 22, 2014 STATS ChipPAC Japan

High Density PoP (Package-on-Package) and Package Stacking Development

Preeti S. Chauhan Anupam Choubey ZhaoWei Zhong Michael G. Pecht. Copper Wire Bonding

Power quad flat no-lead (PQFN) package

COMPONENT LEVEL RELIABILITY FOR HIGH TEMPERATURE POWER COMPUTING WITH SAC305 AND ALTERNATIVE HIGH RELIABILITY SOLDERS

3D-WLCSP Package Technology: Processing and Reliability Characterization

Qualification Report CASCADEABLE FIFOS. November 1995, QTP# Version 1.2 DEVICE DESCRIPTION MARKETING PART NUMBER. 1K x 9 Cascadeable FIFO

YOUR Strategic TESTING ENGINEERING CONCEPT SMT FLIP CHIP PRODUCTION OPTO PACKAGING PROCESS DEVELOPMENT CHIP ON BOARD SUPPLY CHAIN MANAGEMENT

Effect of Die Bonding Condition for Die Attach Film Performance in 3D QFN Stacked Die.

System in Package: Identified Technology Needs from the 2004 inemi Roadmap

Material Selection and Parameter Optimization for Reliable TMV Pop Assembly

Qualification Report. PALCE16V8 (Flash Erasable, Reprogramable CMOS PAL ) April 1996, QTP# 96023, Version 1.0

Aging Treatment Characteristics of Shear Strength in Micro Solder Bump

Specimen Preparation Technique for a Microstructure Analysis Using the Focused Ion Beam Process

SEMI MEMS Tech Seminar (Sept 26, Cornaredo, Italy)

Lead-Free Inspection Methods. Tom Perrett Marketing Manager Soldertec & Keith Bryant European Sales Manager Dage Precision Industries

12500 TI Boulevard, MS 8640, Dallas, Texas 75243

KGC SCIENTIFIC Making of a Chip

Copyright 2009 Year IEEE. Reprinted from 2009 Electronic Components and Technology Conference. Such permission of the IEEE does not in any way imply

SGS-Thomson M17C1001 1Mb UVEPROM

Qualification Report. June, 1994, QTP# Version 1.1 CY7C46X/47X, MINNESOTA FAB MARKETING PART NUMBER DEVICE DESCRIPTION. Cascadable 32K x 9 FIFO

Signature Failure Analysis-Based Methodology for Customer Failure Analysis

EFFECT OF THE MICROSTRUCTURE OF Ni/Au METALLIZATION ON BONDABILITY OF FR-4 SUBSTRATE

Room-Temperature Pressureless Bonding with Silver Nanowire. Paste: Towards Organic Electronic and Heat-Sensitive Functional

Development of Al-TiC Alloys Using Powder Metallurgy as Grain Refiners for Aluminium and Its Alloys

Tin/Nickel Plated Leads Qualification Summary

Packaging Technologies for SiC Power Modules

3.155J / 6.152J Micro/Nano Processing Technology TAKE-HOME QUIZ FALL TERM 2005

10 Manor Parkway, Suite C Salem, New Hampshire

Fig 1. Typical application for thick film on ceramic substrates (simplified)

Visit

2015 IEEE. REPRINTED, WITH PERMISSION, FROM Next Generation Metallization Technique for IC Package Application

Cost effective 300mm Large Scale ewlb (embedded Wafer Level BGA) Technology

Microstructural Characteristics and Mechanical Properties of Single-Mode Fiber Laser Lap-Welded Joint in Ti and Al Dissimilar Metals

Transcription:

Project Proposal Cu Wire Bonding Reliability Phase 3 Planning Webinar Peng Su June 6, 2014

Problem Statement Background Work of the inemi Cu wire reliability project identified that bonding quality and component reliability can be affected by source of the wires (i.e. vendor and characteristics of the wires). Specifically, Pd-coated wires showed variations in reliability performance and it was suspected Pd-distribution within the FAB and ball bond played a role. This needs to be investigated and validated; And if true, root cause needs to be understood. In addition, new Cu wire types and Ag-alloy wires are increasing in adoption. Processing capability and reliability performance of these wires need assessment as well. Opportunity This inemi project has established a collaboration team that delivered results. It would be a natural progression to move on to further in-depth evaluations. Goal Investigate and understand root cause of variation in reliability of various Cu and Ag wire types. 2

IS / IS NOT Analysis This Project IS: This Project IS NOT: Provide initial analysis of what the Project IS and IS NOT Assessment of effects of wire types on component reliability Comprehensive evaluation of all package types and packaging material sets Provide comparison of performance of different wire types and compare with Au wires Use only biased HAST as reliability performance output Endorsement of one vendor over another; Performance differences are also limited to the wires selected by this project and cannot be extrapolated to other types. Will not include any other tests 3

Purpose of Project inemi Statement of Work Understand key characters of various types of Cu wires and Ag wires that may impact alloy elements distribution, bond quality, and component reliability. Understand key bonding process parameters that may impact alloy distribution, bond quality, and component reliability. Scope of Work Only BGA package(s) will be included in this project. Multiple body sizes and packaging BOM may be included if deemed necessary by the team. Only biased HAST will be used for reliability evaluation. The output of the project will be a set of reliability testing results for the components using different wire types, bonding conditions, and packaging BOMs. 4

Business Impact inemi Statement of Work Reduce the need and efforts for individual member companies to run evaluation on the reliability performance of various types of Cu wires and Ag wires. Establish potential common requirements on wire materials properties and bonding process controls. Outcome of Project Test results will be provided for all reliability tests, including electrical pass/fail data and all other failure analysis data. An assessment of the reliability of various Cu bond wire and Ag wire types. A result summary should be available to all inemi members in reports from this project. 5

Detailed Project Planning Task 1 Evaluation Matrix Definition Discuss and finalize evaluation test vehicle and experiment matrix. Package Type: BGA Wire diameter: 1.0 or 0.8 mil Au Pure Cu Pd-Cu Wire Type Pd-Cu with Au Flash Alloyed Cu Alloyed Ag type1 (high Ag content) Alloyed Ag type2 (low Ag content) Wire Characteristics (Pd thickness, etc.) 4N Cu 94% Ag purity 86% Ag purity Bonding Process Process 1 Process 2 Process 1 Process 2 Process 1 Process 2 Process 1 Process 2 FAB Characterization Ball Bond Characterization Green Mold Compound ph, Cl, S, ion catcher, Tg, etc Reliability Test: HAST 130C/ 85RH%, 5V or higher 6

Task 2 Component Assembly Detailed Project Planning Determine assembly sites and process variations. Task 3 Reliability Testing Determine testing facilities and durations Task 2 Failure Analysis Determine FA techniques, facility, and expected outcome. 7

Schedule Phase3 Months Tasks 1,2 3,4 5,6 7,8 9,10 11,12 13,14 15,16 17,18 19,20 21,22 23,24 1. Finalize resource & DoE 2. Materials sourcing 3. Assembly components 4. Test boards design & manufacturing 5. Reliability Test 5.1. MSL3 5.2. HAST 6. Failure analysis 7. Summary report 8

Resource in-kind Contribution Material Test Boards Assembly HAST Test Input others not in the list but you recommend Please input "Yes" for those items below that your firm plans to provide in-kind support to this project. Resource / Capability Needs Bonding Wire (Au, 4N Cu, Cu/Pd, Ag Alloy, Cu Alloy) Die Daisy Chain Substrate Mold Compound (low Chlorine type) Design Test board fabrication BGA Assembly Pre-Condition (Level 2.5) HAST (130/85 5.5V) Failure Analysis Cross Section Observation SAT (C-Scan/ T-Scan) X Ray Inspection Decap (SEM) EDX (Ball to Pad) AES (crack area) Optical Image on the Bonded Ball/Pad Area Note: Final material selection, test vehicle design as well as who do what will be reviewed and decided by the project team. In-kind Contribution 9