CHARACTERIZATION OF SILICON CARBIDE AND PYROCARBON COATINGS FOR FUEL PARTICLES FOR HIGH TEMPERATURE REACTORS (HTR)

Similar documents
Advanced Characterization Techniques for SiC and PyC Coatings on High-Temperature Reactor Fuel Particles

Specimen Preparation Technique for a Microstructure Analysis Using the Focused Ion Beam Process

SIMS AND TEM ANALYSIS OF NIOBIUM BICRYSTALS

High speed steels are widely used in making highspeed

Microstructural Characterization of a Hot Pressed Si 3 N 4 TiN Composite Studied by TEM

Microstructural study of titanium carbide coating on cemented carbide

Directional Amorphization of Boron Carbide Subjected to Laser Shock Compression

Silver Diffusion Bonding and Layer Transfer of Lithium Niobate to Silicon

X-RAY DIFFRACTION CHARACTERIZATION OF MULTILAYER EPITAXIAL THIN FILMS DEPOSITED ON (0001) SAPPHIRE

MATERIALS. Silicon Wafers... J 04 J 01. MATERIALS / Inorganics & thin films guide

Investigating the crystal orientation of SiC CVD using orientation imaging microscopy (OIM) & X-ray diffraction (XRD) by Deepak Ravindra

Specimen configuration

ON-GOING STUDIES AT CEA ON CHROMIUM COATED ZIRCONIUM BASED NUCLEAR FUEL CLADDINGS FOR ENHANCED ACCIDENT TOLERANT LWRS FUEL

Focused Ion Beam CENTRE INTERDISCIPLINAIRE DE MICROSCOPIE ELECTRONIQUE. Marco Cantoni, EPFL-CIME CIME ASSEMBLEE GENERALE 2007

EBSD Basics EBSD. Marco Cantoni 021/ Centre Interdisciplinaire de Microscopie Electronique CIME. Phosphor Screen. Pole piece.

Why does polycrystalline natural diamond turn black after annealing?

SiC nanorods prepared from SiO and activated carbon

Low Resistance TiAl Ohmic Contacts with Multi-Layered Structure for p-type 4H SiC

Failure Analysis for the Economizer Tube of the Waste Heat Boiler

Transmission Kikuchi Diffraction in the Scanning Electron Microscope

Imaging with Diffraction Contrast

Changes in Microstructure of Al/AlN Interface during Thermal Cycling

Growth Of TiO 2 Films By RF Magnetron Sputtering Studies On The Structural And Optical Properties

Practical 2P8 Transmission Electron Microscopy

Reading assignment. Nondestructive evaluation (NDE) Nondestructive testing (NDT) Penetrant. Conventional NDE mthods. Topic 7

Sputtered Zinc Oxide Films for Silicon Thin Film Solar Cells: Material Properties and Surface Texture

Relation Between Internal Stress and Surface Roughness of Titanium Nitride Films Deposited by HCD Ion Plating

Amorphous silicon waveguides for microphotonics

Alternative Methods of Yttria Deposition For Semiconductor Applications. Rajan Bamola Paul Robinson

Study on Estimation Methods of Applied Stress using Fractography Analysis

THE EFFECT OF SOL-GEL TECHNIQUE ON THE ALUMINIUM SiCp COMPOSITE

SEMATECH Symposium Korea 2012 Practical Analysis Techniques of Nanostructured Semiconductors by Electron Microscopy

Electron Beam Melted (EBM) Co-Cr-Mo Alloy for Orthopaedic Implant Applications Abstract Introduction The Electron Beam Melting Process

Impacts of Back Grind Damage on Si Wafer Thinning for 3D Integration

Characterization of fresh EMPIrE and SEMPER FIDELIS plates with PVD-coated U(Mo) particles

The Mechanical Properties of Metal Oxide Coated Polyester Films.

Application of Advanced Techniques for Metals Identification and Characterisation

Chapter 8: Strain Hardening and Annealing

Morfological and Structural Characteristics of II VI Semiconductor Thin Films (ZnTe, CdTe, ZnS)

Microstructure and Vacuum Leak Characteristics of SiC coating Layer by Three Different Deposition Methods

Practical 2P8 Transmission Electron Microscopy

High Anisotropy L1 0 FePt Media for Perpendicular Magnetic Recording Applications

MACROSTRUCTURE, MICROSTRUCTURE AND MICROHARDNESS ANALYSIS

Cold Spray Developments at UTRC

Materials Characterization for Stress Management

MICROSTRUCTURAL EVOLUTION IN CERIUM DIOXIDE IRRADIATED WITH HEAVY IONS AT HIGH TEMPERATURE

Structural Characterization of Nano-porous Materials

High Temperature Tensile Deformation Behavior of New Heat Resistant Aluminum Alloy

The principles and practice of electron microscopy

Deformation Twinning in Bulk Aluminum with Coarse Grains

Dependence of confined plastic flow of polycrystalline Cu thin films on microstructure

Kinematical theory of contrast

Preparation and structural characterization of thin-film CdTe/CdS heterojunctions

1. Project special reports

Low kv EBSD using AZtecHKL and NordlysNano: Characterisation of a mollusc shell

High Resolution X-ray Diffraction

Annealing Effects on the Properties of Copper Selenide Thin Films for Thermoelectric Applications

Development of New Composites; Ceramic Bonded Carbon

Effect of barrier layers on the texture and microstructure of Copper films

DELIVERABLE (D-N : 2.2) Status of Rim and Grain Boundary Diffusion Experiments (12 months)

COMPATIBILITY OF THE ALTERNATIVE SEED LAYER (ASL) PROCESS WITH MONO- Si AND POLY-Si SUBSTRATES PATTERNED BY LASER OR WET ETCHING

EBSD Electron BackScatter Diffraction Principle and Applications

EFFECT OF SCANNING METHODS IN THE SELECTIVE LASER MELTING OF 316L/TiC NANOCOMPOSITIES

Supporting Information

A.W. GODFREY and J.W. MARTIN. Oxford University Department of Materials Parks Road OXFORD OX1 3PH, UK. Abstract

Electron microscopy II

Tailor Made Carbon and Graphite Based Anode Materials for Lithium Ion Batteries. Heribert Walter, Battery+Storage 2013

TEM Study of the Morphology Of GaN/SiC (0001) Grown at Various Temperatures by MBE

Combinatorial RF Magnetron Sputtering for Rapid Materials Discovery: Methodology and Applications

Application of Scanning Electron Microscope to Dislocation Imaging in Steel

Supplementary Figure S1 Crystal structure of the conducting filaments in sputtered SiO 2

Index. Atmosphere Effect on fatigue processes, 49, 200 Auger spectroscopy, 51 A533-B steel Mode II fracture, 235, 242 B

Effect of SiC Whiskers on Properties of SiC Coating for. Carbon/carbon Composites

CORROSION PROPERTIES OF CERMET COATINGS SPRAYED BY HIGH-VELOCITY OXYGEN-FUEL. Dragos UŢU, Iosif HULKA, Viorel-Aurel ŞERBAN, Hannelore FILIPESCU

Relationship between Microstructure and Vacuum Leak Characteristics of SiC Coating Layer

HIGH TEMPERATURE DEFORMATION BEHAVIOR OF NANOCRYSTALLINE SiC/C COMPOSITE

A TEM Study on the Microstructure of Fine Flaky Graphite

CHARACTERIZATION OF THIN WALLED Ti-6Al-4V COMPONENTS PRODUCED VIA ELECTRON BEAM MELTING

Final Year Project Proposal 1

Fatigue Evaluation of Novel HVOF Spray Coated Al-based Plain Bearing Alloys

Structure factors and crystal stacking

Three-Dimensional Microstructure Reconstruction Using FIB-OIM

Transmission electron microscopy of NdNiO 3 thin films on silicon substrates

Influence of Bulk Graphite Thickness on the Accuracy of X-Ray Diffraction Measurement. I. Introduction

Growth and properties of (ultra) nano crystalline diamond

Consolidation of Al 2 O 3 Nano-powder by Magnetic Pulsed Compaction and Sintering

Transmission Electron Microscopy (TEM) Prof.Dr.Figen KAYA

Diffusion of Fission Products through Silicon Carbide

8.4 BACKSCATTERED ELECTRON IMAGING OF POLISHED SECTIONS

5.2 Relationships between microstructure and mechanical properties

Point Defects. Vacancies are the most important form. Vacancies Self-interstitials

What if your diffractometer aligned itself?

Let s show em what we re made of

Microstructure and Mechanical Properties of High- Hardness Nano-Polycrystalline Diamonds

Supporting Information. Low temperature synthesis of silicon carbide nanomaterials using

Functionally Graded Thermal Barrier Composite Coatings Formed by Gas Tunnel Type Plasma Spraying

Laser Micromachining for Industrial Applications and R&D. 3D-Micromac AG. Symposium on Smart Integrated Systems in Chemnitz. 3D-Micromac AG

Production of Few-Layer Phosphorene by Liquid Exfoliation of Black Phosphorus

Annealing Effect on Elastic Constant of Ultrathin Films Studied by Acoustic-Phonon Resonance Spectroscopy

CNT-PyC-SiC/SiC double-layer oxidation-protection coating on C/C composite

Transcription:

CHARACTERIZATION OF SILICON CARBIDE AND PYROCARBON COATINGS FOR FUEL PARTICLES FOR HIGH TEMPERATURE REACTORS (HTR) D. Hélary 1,2, X. Bourrat 1, O. Dugne 2, G. Maveyraud 1,2, F. Charollais 3, M. Pérez 4, F.Cellier 5 1 Laboratoire des Composites Thermostructuraux (LCTS), Bordeaux University - FRANCE. 2 CEA DEN/VRH/DTEC/STCF/LMAC, Pierrelatte - FRANCE. 3 CEA DEN/Cadarache/DEC/SPUA, St Paul lez Durance, - FRANCE 4 CEA DRT/Grenoble/DTEN/SMP/LPTS, Grenoble - FRANCE. 5 FRAMATOME-ANP Plant Sector, Lyon - FRANCE. 1

AGENDA Background SiC microstructure PyC microstructure PyC/SiC interfaces Concluding remarks 2

BACKGROUND Reviving interest worldwide for HTR technology (co-generation, safety, rentability) Fuel design = key element : 1 st confinement barrier for fission products SiC/PyC multilayer coating 1 mm kernel Buffer (100 µm, d 1) I-PyC (35 µm, d 1,9) SiC (35 µm, d 3,2) O-PyC (35 µm, d 1,9) 40 µm Production and qualification of fuel particles are conducted by the CEA in collaboration with AREVA 3

BACKGROUND PyC and SiC material challenges : PyC : gas-tight and perfect isotropic texture to improve performance under irradiation SiC : β-sic (cubic structure) to compensate the swelling effect due to irradiation and tight layer : fine-grained and strong grain boundaries to reduce the migration of fission products, less flaws as possible to sustain strain PyC/SiC interfaces : strong for mechanical synergy NEED FOR : Developing analytical procedures Characterising as-processed particles to improve process parameters Comparing with analytic know-how developed in the 1970 s 4

SiC MICROSTRUCTURE SEM micrograph of SiC in cross-section after Murakami etching SiC Columnar grains : Thickness ~ 1 µm Length ~ 4-5 µm Finer grains in the beginning of the coating I-PyC 6 µm Pole figure Exhibition of preferred orientation during growth (Electron Back-Scattering Diffraction) <111> pole parallel to the growth direction XO normal to the particle 5

SiC MICROSTRUCTURE Crystallographic nature : β-sic (3C) No excess free carbon and silicon SiC stoichiometric Si/C=1.02 (Electron Probe Micro Analysis) Intensity (a. u.) First-order Raman spectrum TO LO Detection limits : C=0.1 % at. Si=1 % at. 600 700 800 900 1000 1100 1200 Wave length (cm -1 ) Measuring of chlorine : - At the extreme surface concentration : 0.43 % at. (X-ray Photoelectron Spectrometry) - In the core layer : Cl<15 ppm (EPMA) 6

SiC CHEMICAL ANALYSIS SIMS DEPTH PROFILE :semi quantitative results Profil sur bille 10000 1000 i ua 100 10 1 SiC surface 0 50 100 150 200 e (nm) C O 37Cl SiC 243D XPS analysis at : C 83.24 %, O 6.61 %, Si 9.72 %, Cl 0.43 % 7

SiC MICROSTRUCTURE SEM fractography Predominantly transgranular cleavage Bright field TEM image Grain 1 Strong grain boundaries no free C,Si and Cl detected Grain 2 No intergranular porosity 8

SiC MICROSTRUCTURE Evidence of flaws by short etching on polished surface (reducing the SiC elastic limit) 20 µm Microcavities = Potential cracks initiators SiC I-PyC BU = 12% Prevision on the cracks apparition and propagation in the layer 9

SiC MICROSTRUCTURE Evidence of crystallographic Stacking Faults (SF) by TEM Observations along the <110> β-sic crystal direction SF Bright field TEM image HRTEM image SF α-sic 110 nm Very few α-sic Rather one-dimensionally-disordered polytypes 10

PyC MICROSTRUCTURE PyC texture : competition of 2 growth mechanisms Reactions in the gas-phase : Isotropic PyC Direct deposition onto the surface : Anisotropic PyC J.L. Kaae, Carbon, 23, 6, 665-673, 1985 11

PyC MICROSTRUCTURE SEM images Buffer fractography I-PyC fractography I-PyC polished and etched section 1 µm 1 µm 1 µm Agglomerated spheroids Heterogeneous distribution formed in the gas phase of opened porosity (Diameter = 300-400 nm) 12

PyC MICROSTRUCTURE SEM images Buffer fractography I-PyC fractography I-PyC polished and etched section 1 µm 1 µm 1 µm Agglomerated spheroids (mean diameter=500 nm) surrounded by PyC deposited directly on the substrate 13

PyC MICROSTRUCTURE SEM images Buffer fractography 1 µm I-PyC fractography 1 µm I-PyC polished and etched section 1 µm Isotropic PyC fraction Anisotropic PyC fraction 14

a PyC MICROSTRUCTURE HRTEM images Good agreement with CEA (Pelissier & Lombard) PyC classification (1976) Buffer b I-PyC c Flat substrate 2nm 2nm 2nm Tangled fiber Layered Mosaic 15

PyC/SiC INTERFACES Raman mapping on polished cross-sections SiC 400 SiC I-PyC 800 O-PyC 300 600 200 400 1 µm 100 1 µm 200 0 0 34 36 38 40 32 34 36 38 Length X (µm) Length X (µm) Smooth O-PyC/SiC interface Weak interface Rough SiC/I-PyC interface Strong interface 16

CONCLUDING REMARKS Re-appropriation of analytical know-how developed in the 1970 s Methods Specimen preparation Informations on SiC PyC Morphology flaws Fracture mode (transgranular or intergranular) On caps or Grains size Texture polished cross-sections Morphology Fraction of Stacking faults anisotropic dense PyC TEM Thin slices thinned Grains size and HR-TEM mechanically and by ion morphology structure sputtering Nature of Texture crystallographic Isotropy defects treshold Fractography Fracture surfaces Presence of Etching + SEM Quality of grain boundaries XRD Powders Presence of Structure hexagonal (d 002 ; L c ) polytype DAR Polished cross-sections _ Isotropy 17

CONCLUDING REMARKS New analytical procedures for qualifying the microstructure of fuel particles Methods TEM observations Imaging + diffraction Raman microspectroscopy + mapping EBSD EPMA Specimen preparation Thin slices thinned by Focus Ion Beam (FIB) Polished crosssections Polished crosssections Polished crosssections Informations on SiC PyC Grains size and HR-TEM morphology structure Nature of Texture crystallographic Isotropy defects treshold Quality of grain boundaries Presence of hexagonal polytypes Presence of excess Si and C Grains size and morphology Texture Stoichiometry Si/C XPS-ToF-SIMS Without Chemical composition of the SiC extreme surface Crystalline organisation (presence of defects) Chemical composition near interfaces with the SiC _ 18

CONCLUDING REMARKS Re-appropriation of analytical know-how developed in the 1970 s New analytical procedures for qualifying the microstructure of fuel particles Next challenge : correlation growth mechanisms / microstructure 19