MAY 22, 2006 TEST REPORT # RANDOM VIBRATION TEST SERIES PROBE TEST SOCKET INTERCONNECT DEVICES, INC.

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1 MAY 22, 2006 TEST REPORT # RANDOM VIBRATION TEST SERIES PROBE TEST SOKET INTERONNET DEVIES, IN. APPROVED BY: MAX PEEL SENIOR FELLOW ONTEH RESEARH, IN. ontech Research

2 REVISION HISTORY DATE REV. NO. DESRIPTION ENG. 5/22/ Initial Issue MP TR#206320, REV of 30 ontech Research

3 ERTIFIATION This is to certify that the evaluation described herein was designed and executed by personnel of ontech Research, Inc. It was performed with the concurrence of Interconnect Devices, Inc. of Kansas ity, KS who was the test sponsor. All equipment and measuring instruments used during testing were calibrated and traceable to NIST according to ISO and ANSI/NSL Z540-1 and MIL-STD as applicable. All data, raw and summarized, analysis and conclusions presented herein are the property of the test sponsor. No copy of this report, except in full, shall be forwarded to any agency, customer, etc., without the written approval of the test sponsor and ontech Research. Max Peel Senior Fellow ontech Research, Inc. MP:js TR#206320, REV of 30 ontech Research

4 SOPE To perform Mechanical Shock and Random Vibration testing on Test Socket Probes as manufactured and submitted by the test sponsor Interconnect Devices, Inc. APPLIABLE DOUMENTS 1. Unless otherwise specified, the following documents of issue in effect at the time of testing performed form a part of this report to the extent as specified herein. The requirements of sub-tier specifications and/or standards apply only when specifically referenced in this report. 2. Standards: EIA Publication Drawings or Slash Sheets: Interconnect Devices Dwg TEST SAMPLES AND PREPARATION 1. The following test samples were submitted by the test sponsor, Interconnect Devices, Inc., for the evaluation to be performed by ontech Research, Inc. a) Probes mounted to test boards, Qty 2 2. Unless otherwise indicated, all materials were certified by the manufacturer to be in accordance with the applicable product specification. 3. The test samples as submitted were certified by the manufacturer as being fabricated and assembled utilizing normal production techniques common for this type of product and inspected in accordance with the quality criteria as established for the product involved. 4. All test samples were coded and identified by ontech Research to maintain continuity throughout the test sequences. Upon initiating testing, mated test samples remained with each other throughout the test sequences for which they were designated. 5. Test samples were received assembled to test boards by the test sponsor and tested in the "as received" condition. TR#206320, REV of 30 ontech Research

5 TEST SAMPLES AND PREPARATION - continued 6. Unless otherwise specified in the test procedures used, no further preparation was used. 7. All equipment and measuring instruments used during testing were calibrated and traceable to NIST according to ISO and ANSI/NSL Z540-1, as applicable. TR#206320, REV of 30 ontech Research

6 TEST SELETION 1. The following test sequence were established for this program: LLR MEHANIAL SHOK LLR RANDOM VIBRATION 3.1 G S RMS LLR RANDOM VIBRATION 5.35 G S RMS LLR RANDOM VIBRATION 7.56 G S RMS LLR RANDOM VIBRATION 9.26 G S RMS LLR 2. Test set ups and/or procedures which are standard or common are not detailed or documented herein provided they are certified as being performed in accordance with the applicable (industry or military) test methods, standards and/or drawings as specified in the detail specification. TR#206320, REV of 30 ontech Research

7 TR#206320, REV of 30 ontech Research

8 EQUIPMENT LIST ID# Next al Last al Equipment Name Manufacturer Model # Serial # Accuracy Freq.al 33 Vib. Power Amp Ling Dynamics MPA4 149 N/A N/A 86 Shaker Table MB Elect. 10E 141 N/A N/A /12/ /12/ channel Power Unit PB o. 483A 1303 See al ert 12mon 684 6/22/2006 6/22/2005 Accelerometer PB. o. 353B See al ert. 12mon 991 Sig Processor interface Agilent 35651B n/a N/A N/A /27/2006 7/27/2005 Microohm Meter Keithley See al ert 12 mon /19/2006 7/19/2005 Sine/Rndm Vib ontrol Digitizer Hewlett Packard E1432A US See al ert 12 mon 1167 Interface Hewlett Packard E8491B US N/A N/A 1168 Mainframe Hewlett Packard E8408A US N/A N/A 1169 omputer AR P133 none N/A N/A /18/2007 1/18/2006 Discontinuity Monitor Metronics DM K-1 See al ert 12mon 1219 omputer AR o ±2% N/A 1272 Shaker Table Unholtz Dickie S202PB 263 N/A N/A 1438 Main Frame Hewlett Packard A00927 N/A Ea Test /10/2007 1/10/2006 Programable DA Unit Hewlett Packard 35656A 3007A00107 See al ert 12 mo /10/2007 1/10/ han Input Module Hewlett Packard 35655A 2911A00337 N/A 12mon TR#206320, REV of 30 ontech Research

9 TEST RESULTS TR#206320, REV of 30 ontech Research

10 PROJET NO.: SPEIFIATION: IDI Test Plan PART NO.: PART DESRIPTION: Test Probe SAMPLE SIZE: Two Assemblies TEHNIIAN: MOB (32 ontacts Each) START DATE: 5/9/06 OMPLETE DATE: 5/12/ ROOM AMBIENT: 22 RELATIVE HUMIDITY: 42% EQUIPMENT ID#: 553, 684, 1125, 1166, 1167, 1168, 1169, 1175, 1219, MEHANIAL SHOK (SPEIFIED PULSE) PROEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure Test onditions: a) Peak Value : 58 G s b) Duration : 11 Milliseconds c) Wave Form : Half Sine d) No. of Shocks : 3 blows/direction/axis, 3 axis 3. Initial and final LLR was measured in accordance with EIA 364, Test Procedure 23 with a 100ma maximum test current and a 20 mv open circuit voltage on one assembly. 4. Discontinuity monitoring was performed in accordance with EIA 364, Test Procedure 46 on one assembly REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. There shall be no contact interruption greater than 1.0 microsecond (one test assembly 32 contacts). 3. The initial low level contact resistance shall be measured and recorded (one test assembly 32 contacts). 4. The post test change in low level contact resistance shall be measured and recorded (one test assembly 32 contacts). TR#206320, REV of 30 ontech Research

11 RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. There was no contact interruption greater than 1.0 microsecond. 3. The following is a summary of the data observed: LOW LEVEL IRUIT RESISTANE (Milliohms) Avg. Max. Avg. Max. hange hange See data file for individual data points. TR#206320, REV of 30 ontech Research

12 FIGURE #1 lassical Shock hannel 1 [g] AELERATION (g) UPPER LIMIT ATUAL PULSE----- LOWER LIMIT----- L R U P P - d r - d r D T A Z Project Actual Pulse 05/12/06 Tech:MOB [s] DURATION (Seconds) TR#206320, REV of 30 ontech Research

13 lassical Shock FIGURE #2 hannel 1 [g] AELERATION (g) UPPER LIMIT ATUAL PULSE----- LOWER LIMIT----- L R U P P - d r - d r D T Project al Wave #1 05/12/06 Tech:MOB [s] DURATION (Seconds) TR#206320, REV of 30 ontech Research

14 lassical Shock FIGURE #3 hannel 1 [g] AELERATION (g) UPPER LIMIT ATUAL PULSE----- LOWER LIMIT----- L R U P P - d r - d r D T Project al Wave 2 05/12/06 Tech: MOB [s] DURATION (Seconds) TR#206320, REV of 30 ontech Research

15 PROJET NO.: SPEIFIATION: IDI Test Plan PART NO.: PART DESRIPTION: Test Probe SAMPLE SIZE: Two Assemblies TEHNIIAN: DAM (32 ontacts Each) START DATE: 3/15/06 OMPLETE DATE: 3/17/ ROOM AMBIENT: 23 RELATIVE HUMIDITY: 41% EQUIPMENT ID#: 33, 86, 553, 684, 991, 1125, 1175, 1219, 1438, 1439, VIBRATION, RANDOM PROEDURE: 1. The test sample was fixtured to the test stand via rails located along the longitudinal length of the bottom test support. No restraints were used on the top board aside for the locking hardware. 2. Initial, intermediate (after each vibration condition) and final low level circuit resistance was performed in accordance with EIA 364, Test Procedure 23 with the following test condition: a) Test urrent : 100 ma Max. b) Open ircuit Voltage : 20 mv 3. The test was performed in accordance with EIA 364, Test Procedure Test onditions: Test #1 a) Power Spectral Density: 0.02 b) G RMS : 3.1 c) Frequency : Hz d) Duration : 1.0 hr/axis, 3 axis Test #2 a) Power Spectral Density: 0.02 b) G RMS : 5.35 c) Frequency : Hz d) Duration : 1.0 hr/axis, 3 axis TR#206320, REV of 30 ontech Research

16 Test onditions: continued Test #3 a) Power Spectral Density: 0.04 b) G RMS : 7.56 c) Frequency : Hz d) Duration : 1.0 hr/axis, 3 axis Test #4 a) Power Spectral Density: 0.06 b) G RMS : 9.26 c) Frequency : Hz d) Duration : 1.0 hr/axis, 3 axis REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. The change in low level contact resistance shall be measured and recorded. 3. There shall be no contact interruption greater than 1.0 microsecond RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. The following is a summary of the observed data: LOW LEVEL IRUIT RESISTANE (Milliohms) Avg. Max. Vib. 3.14G s, ΔR Vib. 5.35G s, ΔR Vib. 7.35G s, ΔR Vib. 9.26G s, ΔR Note: ΔR represents change in resistance 3. See data file for individual data points. 4. One board assembly was used for monitoring discontinuity. A second board assembly was used for measuring LLR throughout the total sequence including mechanical shock. TR#206320, REV of 30 ontech Research

17 Low Level ontact Resistance Project: Spec: IDI Test Plan ustomer: IDI Subgroup: N/A Product: Serirs File #: Description: GSS-10 Probe Assembly Open circuit voltage: 20mv urrent: 100ma Delta values units: milliohms Temp º R.H. % Date: 09May06 12May06 15May06 16May06 17May06 17May06 Pos. ID Initial Mechanical Random Random Random Random Vib 3.1 G Vib 5.35 G Vib 7.56 G Vib 9.26 G TR#206320, REV of 30 ontech Research

18 Product: Serirs File #: Description: GSS-10 Probe Assembly Open circuit voltage: 20mv urrent: 100ma Delta values units: milliohms Temp º R.H. % Date: 09May06 12May06 15May06 16May06 17May06 17May06 Pos. ID Initial Mechanical Random Random Random Random Vib 3.1 G Vib 5.35 G Vib 7.56 G Vib 9.26 G MAX MIN AVG STD Open Tech MOB MOB MOB MOB MOB MOB Equip ID TR#206320, REV of 30 ontech Research

19 FIGURE #4 Random ontrol channel [g²/hz] Project# ustomer: IDI Run 2 X-Axis:#1,Z-Axis:#2 Date:05/15/06 Test onditions: 3.1G PSD: to 500 Hz Tech: MOB [Hz] TR#206320, REV of 30 ontech Research

20 Random FIGURE #5 ontrol channel [g²/hz] Project# ustomer: IDI Run 3 Y-Axis:#1,Y-Axis:#2 Date:05/15/06 Test onditions: 3.1G PSD: to 500 Hz Tech: MOB [Hz] TR#206320, REV of 30 ontech Research

21 Random FIGURE #6 ontrol channel [g²/hz] Project# ustomer: IDI Run 1 Z-Axis:#1,X-Axis:#2 Date: 05/15/06 Test onditions: 3.1G PSD: to 500 Hz Tech:MOB [Hz] TR#206320, REV of 30 ontech Research

22 Random FIGURE #7 hannel 1 [g²/hz] Project# ustomer: IDI Run4 Z-Axis:#1,X-Axis:#2 Date:05/16/06 Test onditions: 5.35G PSD: to2000Hz Tech:MOB [Hz] TR#206320, REV of 30 ontech Research

23 Random FIGURE #8 ontrol channel [g²/hz] Project# ustomer: IDI Run4 Y-Axis:#1, Y-Axis:#2 Date:05/15/06 Test onditions: 5.35G PSD: to 2000Hz Tech:MOB [Hz] TR#206320, REV of 30 ontech Research

24 Random FIGURE #9 hannel 1 [g²/hz] Project# ustomer: IDI Run5 Y-Axis:#1,Z-Axis:#2 Date: 05/16/06 Test onditions: 5.35G PSD: to2000Hz Tech: MOB [Hz] TR#206320, REV of 30 ontech Research

25 Random FIGURE #10 hannel 1 [g²/hz] Project# ostomer:idi Run 7 X-Axis:#1,Z-Axis:#2 Date:05/16/06 Test onditions: 7.56G PSD to2000Hz Tech:MOB [Hz] TR#206320, REV of 30 ontech Research

26 Random FIGURE #11 hannel 1 [g²/hz] Project# ustomer:idi Run7 Z-Axis:#1,X-Axis:#2 Date:05/16/06 Test onditions: 7.56G PSD: to2000Hz Tech:MOB [Hz] TR#206320, REV of 30 ontech Research

27 Random FIGURE #12 ontrol channel [g²/hz] Project# Run9 Y-Axis:#1,Y-Axis: #2 Date:05/16/06 Test onditions: 7.56G PSD: to2000Hz Tech:MOB [Hz] TR#206320, REV of 30 ontech Research

28 Random FIGURE #13 hannel 1 [g²/hz] D L R U R R - e r - e r D T 2 R 0 S S Project# ustomer:idi Run 10 Y-Axis:#1,Y-Axis:#2 Date:05/17/06 Test onditions: 9.26G PSD: to2000Hz Tech:MOB [Hz] TR#206320, REV of 30 ontech Research

29 Random FIGURE #14 hannel 1 [g²/hz] D L R U R R - e r - e r D T 2 R 0 S S Project# ustomer:idi Run11 Z-Axis:#1 X-Axis:#2 Date:06/17/06 Test onditions: 9.26G PSD: to2000Hz Tech:MOB [Hz] TR#206320, REV of 30 ontech Research

30 Random FIGURE #15 hannel 1 [g²/hz] D L R U R R - e r - e r D T 2 R 0 S S Project# ustomer:idi Run 10 Y-Axis:#1,Y-Axis:#2 Date:05/17/06 Test onditions: 9.26G PSD: to2000Hz Tech:MOB [Hz] TR#206320, REV of 30 ontech Research

AUGUST 14, 2006 TEST REPORT # RANDOM VIBRATION TEST SERIES PROBE SERIES PROBE TEST SOCKET INTERCONNECT DEVICES, INC.

AUGUST 14, 2006 TEST REPORT #206271 RANDOM VIBRATION TEST 101377-000 SERIES PROBE 204130-036 SERIES PROBE TEST SOCKET INTERCONNECT DEVICES, INC. APPROVED BY: MAX PEEL SENIOR FELLOW CONTECH RESEARCH, INC.