S2 PUMA for Analysis of Geological Materials. Innovation with Integrity. Precise and Reliable Grade Control of Geological Materials EDXRF

Transcription

1 S2 PUMA for Analysis of Geological Materials Precise and Reliable Grade Control of Geological Materials Innovation with Integrity EDXRF

2 Maximizing Your Process Yield and Improve Material Grades with S2 PUMA Process steps in mining operations are already optimized to a very high degree. But with fast and reliable information about the elemental composition of the geological material and their intermediate products, such processes can be further optimized. Therefore, fast and reliable grade control of geological material is essential to maximize the process yield. S2 PUMA for Geological Materials the Perfect Fit for Better and Quicker Results The S2 PUMA is a ruggedized, benchtop energy dispersive X-ray spectrometer developed for highly accurate grade control of geological materials. Simple sample preparation makes XRF the fastest and most practical method for all applications in mining. And the S2 PUMA with its ideal configuration for all relevant elements in mining delivers the required analytical accuracy and precision. It enables the close control of the mining operation in order to achieve cost efficiency and realize dramatic cost savings. This all comes in handy with a low cost of ownership. Precise and reliable grade control is the key to optimize process yield Wide range of geological materials are covered with the S2 PUMA such as: zfeldspar zclay zdolomite zlimestone zphosphate zbauxite zsilica zgypsum zmagnesite zyour Material S2 PUMA Single for quick grade control of geological samples 2

3 Measurement Parameters Measurements were performed on an S2 PUMA with XFlash LE silicon drift detector (SDD) and the X-ray tube with Ag anode. The XFlash LE detector is equipped with an ultrathin, high transmission entrance window that enhances the sensitivity for light elements (LE) such as Na and Mg. Ideal for geological materials is the analysis under vacuum, since it combines optimal sensitivity for all elements with low running costs and less installation requirements, since no gas flushing is required. Table 1 shows the measurement conditions for all elements analyzed. The tube current is set automatically by our DynaMatch technology to ensure an optimum count rate of 100 kcps. At this count rate, the XFlash LE detector is operating at its optimum giving the best resolution and the count rate stability. many different mineral types can be used to form a single calibration. This means that a single calibration can cover a wide concentration range. The fused beads were prepared by using 1.1 g standard or sample material and 6.9 g lithium tetraborate. Different geological samples used for the precision tests were prepared in the same way. The overall processing time per sample, including sample handling, evacuating the sample chamber and actual counting time for the measurement, is typically 5 minutes. Samples prepared as fused beads for best results over a wide calibration range The standards were prepared as fused beads. This preparation method avoids mineralogical and grain size effects, which especially may effect light element determination. As the mineralogical structure of the standard is broken down during the fusion process, Geological samples prepared as pressed pellets ensure fast availability of the analytical results Samples prepared as pressed pellets for fast feedback of the chemical composition Controlling the mining process often requires a fast feedback of the chemical composition. Therefore the time between collecting a sample and obtaining the analytical result should be as short as possible. In such case, the geological samples are prepared as pressed pellets. When compared with the preparation of fused beads, this method simplifies and shortens the sample preparation time considerably, meaning that the results are available sooner after the sample has been collected. Table 1: Optimal measurement conditions for geological samples on the S2 PUMA Geological samples prepared as fused beads ensure a wide concentration range for the calibration Voltage [kv] Beam filter Measurement time [s] Elements analyzed 20 No Filter 100 Na, Mg, Al, Si, P, S µm Al 100 K, Ca, Ti, Mn, Fe 3

4 A set of 20 geological certified reference materials (CRM) were used to establish a wide calibration range. This set of CRMs covers different geological materials from feldspar to gypsum. In addition, the set contains 3 validation standards for checking the quality of the calibration. The standards cover the 11 most important elements for the analysis of major and minor elements as oxides in geological materials. The following elements are included in the evaluation: Na 2 O, MgO, Al 2, SiO 2, P 2 O 5, S, K 2 O, CaO, TiO 2, Mn 2 and Fe 2. The concentration ranges covered with the calibration are shown in Table 2. As an example, the calibration curve for the oxide MgO is shown in figure 1 while the figure 2 shows an overlaid spectra of the low-energy fluorescence range. Table 2: Concentration range covered with certified reference materials (CRMs) Oxide Min. concentration Max. concentration Figure 1: Calibration curve from 0.02 % to 96 % MgO Na 2 O MgO Al SiO P 2 O S K 2 O CaO TiO Mn Fe Figure 2: Low-energy spectra of the calibration standards prove the excellent energy resolution of the XFlash LE detector 4

5 Measurement Accuracy and Precision Measurements of unknown samples were evaluated against the established calibration curves. The measured concentration showed an excellent agreement with the expected data. Furthermore precision tests have been performed to prove the repeatability of the instrument. Therefore 20 replicates of the same sample were measured and the repeatability is shown in Table 3. Table 3: Precision test of a feldspar sample Sample Na 2 O MgO Al 2 SiO 2 P 2 O 5 S K 2 O CaO TiO 2 Mn 2 Fe 2 Rep Rep Rep Rep Rep Rep Rep Rep Rep Rep Rep Mean value Abs. std. dev. Rel. std. dev Results For all relevant elements in geological materials the typical standard deviation is less than 2 % and even below 1 % for majors. Due to the higher dilution of fused beads the precision can be optimized using pressed pellet preparation in order to enhance the precision for specific materials. Based on S2 PUMA the grade of geological material is quickly determined. 5

6 EDXRF made easy, only with S2 PUMA and TouchControl Thanks to TouchControl, the operation of the S2 PUMA is easy and straightforward - no special training required and no manual to read! With TouchControl, any user can perform measurement jobs on the S2 PUMA. First, select the application and enter the sample ID. You can also add additional information, like preparation or sample weight if required. Then simply start the measurement and view the results on the screen. But it gets even easier: For routine QC type work, you just have to press the button once - this starts a predefined automatic application and that s it! S2 PUMA with TouchControl : TouchControl for quick, failsafe ease-of-use zintuitive, failsafe ease-of-use zfree language selection: English, German, French, Spanish, Portuguese, Italian, Russian, Chinese, Japanese zminimal training required get results quickly from day one zadjustable touchscreen, glove-friendly Adjustable TouchControl interface Island mode: No PC, keyboard and mouse required for routine operation 6

7 S2 PUMA - Elemental analysis couldn t be easier! EDXRF made easy, only with S2 PUMA Energy-dispersive X-ray fluorescence (EDXRF) with the S2 PUMA offers all you need to measure and monitor elements in your geological samples. The strength of EDXRF is the wide range of elements covered by the technique, from very light elements like C, to heavy elements like U. S2 PUMA with HighSense the top-performing EDXRF for geological material Instrument precision is the key for precise and accurate grade control. The S2 PUMA delivers excellent precision with its HighSense technology, the 50-Watt power of the X-ray tube and unique closely coupled beam path. This superior stability guarantees grade control at its best even with a very narrow range for the results, minimizing waste and maximizing yield in your process. Unmatched detection limits, precision and speed in EDXRF by HighSense technology: zdirect-excitation, closely coupled beam path zx-ray tube with up to 50 W power and 50 kv excitation zoptimal Light Element (LE) configuration with thinwindow X-ray tube and XFlash LE detector Stops dust & liquids S2 PUMA with SampleCare : Unique contamination protection of important system components guarantees highest instrument uptime XFlash LE detector with excellent Light Element (LE) performance 7

8 Technical Data S2 PUMA Single S2 PUMA XY Autochanger Element range Sodium to americium (Na Am) with standard XFlash Carbon to americium (C Am) with XFlash Light Element (LE) Concentration range From ppm to 100 % X-ray tube Pd or Ag anode; max. power 50 W, max. voltage 50 kv (Low kv-version: 30 kv max.) Primary beam filters 10-position automatic filter changer; for wide range elemental analysis pre-installed filters: 5 μm Ag, 20 and 500 μm Al, 100 and 250 μm Cu Detector XFlash Silicon Drift Detector: Peltier cooled (no need for liquid nitrogen) Standard XFlash detector: resolution typ. 135 ev at Mn Ka and cps XFlash detector LE: resolution typ. 141 ev at Mn Ka and cps Mode Air mode Gas flushing (optional): nitrogen or helium for liquids and loose powders Vacuum pump (optional): Enhanced light element performance, low cost of operation TouchControl Integrated 12.1 TFT touchscreen, multilingual user interface Connectivity Built-in Ethernet port RJ45, 4x USB ports for mouse, keyboard, printer Power requirements V, 50/60 Hz, max. power consumption 600 VA Automation Connectivity to conveyor belt (optional) Sample types Loose powders, granules, solids, pressed pellets, fused beads and liquids up to 50 ml Sample rotation Optional S2 PUMA Single S2 PUMA XY Autochanger Sample sizes Up to 51.5 mm Ø samples. Liquids, loose powders and smaller samples in liquid cups: up to 50 ml Up to 40 mm Ø and 38 mm height in sample holders, max. weight 200 g or 51.5 mm Ø as sample ring. Sample loader Dimensions width x depth x height; weight Quality & safety Bruker AXS GmbH Single position, manually 66 x 70 x 37 cm; 81 kg 26 x 27.6 x 14.6 ; 179 lbs EasyLoad XY sample tray, 20-position, removable. Grabber with automatic sample detection 66 x 70 x 60 cm; 112 kg 26 x 27.6 x 23.6 ; 247 lbs DIN EN ISO 9001:2008; CE-certified Machinery directive 2006/42/EC; Electrical equipment 2006/95/EC; Electromagnetic Compatibility 2004/108/EC; Fully radiation-protected system; radiation < 1 μsv/h (H*); German type approval (BfS) for X-ray safety; Conform to ICRP, IAEA, EURATOM Karlsruhe Germany Phone Fax info.baxs@bruker.com TouchControl, SampleCare, EasyLoad, DynaMatch, HighSense and DustShield are trademarks of Bruker AXS Inc.; XFlash is a registered trademark of Bruker Nano Analytics DuraBeryllium is a trademark of Moxtek Inc. Bruker AXS is continually improving its products and reserves the right to change specifications without notice. Order No. DOC-B80-EXS Bruker AXS GmbH.