X-Ray Fluorescence To Inspire. Measuring instruments for coating thickness measurement and material analysis. Produktübersicht

Transcription

1 X-Ray Fluorescence To Inspire Produktübersicht Produktübersicht Measuring instrents for coating thickness measurement and material analysis 0 Ag Cu Au Pd Cd Al Zn P Sn Ni Pt Product Overview Roentgenanalytik Systeme GmbH & Co. KG [kv]

2 Measuring Task Thnical Features Software Models at a Glance Z Z Si(Li) XRay maxxi 6L XRay ComPact mini XRay maxxi 5 XRay maxxi o XRay ComPact 5 XRay ComPact o XRay Nanomaster XRay Eagle III µ-probe XSp XMasteR Coating Thickness Instrents n Materialsanalyser Software Symbol legend at the last page of the brochure 2

3 Coating Thickness & Material Analyser Application XRay maxxi 6L / XRay ComPact mini The coating thickness measurement instrents differ primarily in the size of the measuring chamber and the options, as all models offers all the basic functions of an XRAY measuring instrent. The cost-usage relation depends on the range of applications. The ease of use, elements to be measured, measurement time and reliability, size and geometry of the spimens, needed dettion limit, as well as the measuring intervals are important factors. Roentgenanalytik Systeme GmbH & Co. KG offers here since more than 30 years, for a wide sptr of measuring tasks, the suitable instrent. Should the measuring tasks be unclear with regard to certain restrictions and possibilities, we help you with our experience. Besides that, we support you to find as quickly as possible an optim solution for your measuring task. Using material analysis a spimen is analysed with regard to his elements and their concentrations. The achievement of certain dettion limits as well as a very high nber in measurable elements are important factors which are considered during the development process. With the coating thickness measurement instrents XRay maxxi 6L and XRay ComPact mini, single and multiple layers on different base materials, thickness and concentration could be measured. In addition, material analysis is possible. Beyond it, elements and their concentrations can be measured in liquids by a bath analysis module. The XRay maxxi 6L have as well as the XRay maxxi 5 a slotted chamber. Very large spimens like leading disks, tins or pipes which stand out from the case could be comfortable measured. Also, due to the big Z axis movement and the chamber design, very high spimens are measurable. The chamber has, compared to the XRay maxxi 5, with the same inside dimensions smaller outside dimensions. The XRay ComPact mini is designed for small parts. It is the most compact coating thickness measuring instrent from Roentgenanalytik Systeme GmbH & Co. KG. In spite of the low outside dimensions it uses the same measuring thnology as the XRay maxxi 6L. The communication between the system and the Computer is purely running via an interface. Therefore the software could run on a Desktop PC, Laptop or Tablet PC depending on the customers choice. The most significant areas of application are: - Eltro-plating - Analysis of eltroplating baths - Printed circuit boards and wafers - Jewelry and watch industry - Metallurgy, geology and forensic science - Research and laboraoty 3

4 XRay maxxi 5 / XRay ComPact 5 The XRay maxxi 5 and the XRay ComPact 5 are universal coating thickness measuring instrents and material analysers. The difference is the size of the sample chamber. Users who demand the highest measuring prision, easy processing and versatility find here an ideal measuring instrent. In only a few sonds the exact thickness of one or multiple coating layers could be measured nondestructive. At the same time coating thickness and quantitative analysis of the alloy composition could be determined. It is easy to determine the metal ion content in bath solutions. The chamber design together with an optimised X-ray geometry, allow the use of small collimators. A multiple collimator changer, combined with a programmable tube current, allows an optimisation for practically every measuring task. A software-controlled table and head movement allows the automation of all measuring requests. Depending on the spimens to be measured the best test chamber size can be chosen. An optim for applications in all industries is guaranteed XRay maxxi o / XRay ComPact o XRay maxxi o and XRay ComPact o are designed for coating thickness measurement and material analysis at the best price-performance ratio available. The difference ist just the sample chamber. Users searching high prision, rigid construction and customized applications for the measurement task, these are the ideal systems. In a couple of sonds single and multiple layers could be analysed using the X-Ray fluorescence. At the same time the coating layers and the alloy composition is analysed. Also, liquid analysis is possible, defining the metal ion content of bath solutions. Depending on the spimen, the user selt the right chamber size. Proved thnology for a wide range of industries. Z 4

5 XRay NanoMaster Miniaturization of modern eltronics assemblies leads to smaller components, espially in eltronic contacts. For cost and environment prottion reasons these parts are very thin coated down to nanometers. Thus the measuring task which cannot be covered by standard XRF coating thickness analyzers arise. The innovative concept of the XRay NanoMaster offers the solution, even standardless. Material analyses with high prision and a low dettion limit could be performed as well as analysis according to WEEE and ROHS. The highlights of the XRay NanoMaster are: - Si- dettor with eltrical cooling. - HiSpeX Sptrometer with digital pulse processing. - Different possibilities X-Ray lenses. - Beamforming down to <25 µm possibly. - Vacu-measuring chamber for proof of light elements from AL onwards XRay Eagle III µ-probe With the Eagle III µ-probe the third generation of micro-xrf- Sptrometer is introduced. The analysed surface by the use of X-ray-optical components (capillary optics) is in the area of 20 µm to 300 µm. The focussed concentration of the radiation with the optics available, guarantees an high intensity and therefore high prision of the analysis. The spial advantages of the XRay EAGLE III µ-probe are: - Dettion limits down to ppm and a high quality signal-to-base-ratio. - Non destructive analysis also for irregularly shaped parts by using the small optics. - Optional large test chamber for volinous spimens. - Measurements can be done under vacu or in air, so that organic or wet samples are analysable up to elements with Z~15. - Adaptation of the measurement point of the surface to the test structure by capillary change or by use of the VariSpot unit. 5

6 Operating Software XSp The operating software XSp is a new development of operating software. The features resulting from the advancement of XMasteR and completely included in the software XSp. Among the rest, XSp gives the following advantages: Coating thickness measurement and material analysis, standardfree and calibrated. Choice of any nber of elements for the material analysis. Freely determinable layer construction, optionally with several alloy layers. Simple intelligent calibration to be used also for complicated layer systems. Corrtion of interaction of the elements or layers together. Mouse controlled setup of complicated table programs. Free arrangement of tables, graphics and sptra in the user screen. Quick change from applications to sptr evaluation of materials, layers and bath solutions. Database for the management and seltion of measurements after tests, measuring rows, customers and applications. An easy and comfortable sptr treatment. Trend graphs with tolerance for easy process control. Free arrangement of report contents in table, graphics and sptr. Reports export in Word, Excel, PDF and HTML. RS232 export of measuring results. Projt-related archiving. Compatible with Microsoft XP, Vista and Win7. XMasteR The operating software XMasteR is used highly successful with a huge nber of applications and is continous developed. XMasteR contains the tools μ-master for coating thickness measurement and element master for material analysis. XMasteR can be extended with the following additional programmes: %-MasteR - Addon for material analyses (jewellery). Report-MasteR - Add on for report creation in MS-Word. Data-MasteR - Add on for Databasemanagement. Liquid-MasteR - Add on for Bath Solutions. AirVac-Changer - Add on for measuring under vacu. 6

7 XRay ConTi Systems XRay ConTi is designed for any applications which customers need spial inline solutions for continuous measurement. The measuring task will be analysed upfront together with the end user and chked on restrictions. The complete planning, development, installation and acceptance is taken over by our engineering team in close cooperation with the end user. 7

8 Coating Thickness Measurement Measurement of Single-, Double-, Triple- or Alloy Layers independent of the substrate material Si(Li) Si(Li) Dettor Dettor system with a very high energyresolution with liquid nitrogen cooling for dettion of critical material combinations. Material Analysis Analysis of Composition and Concentration in a spimen. -Automatisation For convenient and prise positioning of the spimens, automated XY-Z axis control Solution Analysis Analyses of Composition and Concentration in a bath solution. Collimator Changer Automated collimator changer for changing collimators in accordance to the selted application. Spot Analysis Defined point analyses for the composition and concentration in a bulk material with a measurement spot < 20µm. Filter Changer Seltion of different primary filters for improvement of the dettion limits of critical element combinations Liquid Analysis Analysis of composition and concentration in liquids, using higher dettion limits. Vaccu Evacuated Vaccu chamber for dettion of light elements Trace Element Analysis Analysis of composition and concentration of bulk materials using a higher dettion limit. easy connt Conntion of Desktop, Laptop or Tablet PC for operationg the measurement instrent. Powder Analysis Analysis of composition and conentration in powder spimens. Database Software for creation of a measurement database and administration of customer data. -Diode Dettor system with a higher energy resolution for improved measurement of critical material combinations. Customized reports Software for customized report including measurement data and sample picture. Silizi Drift Dettor Dettor system with a very high energy resolution for improved measurement accuracy for critical material combinations. info@ra-sys.com 2013 Roentgenanalytik Systeme GmbH & Co. KG Georg-Ohm-Straße 6 D Taunusstein Germany T+49(0) F+49(0)