MAY 22, 2006 TEST REPORT #206320 RANDOM VIBRATION TEST 100045-042 SERIES PROBE TEST SOKET INTERONNET DEVIES, IN. APPROVED BY: MAX PEEL SENIOR FELLOW ONTEH RESEARH, IN. ontech Research
REVISION HISTORY DATE REV. NO. DESRIPTION ENG. 5/22/06 1.0 Initial Issue MP TR#206320, REV.1.0 2 of 30 ontech Research
ERTIFIATION This is to certify that the evaluation described herein was designed and executed by personnel of ontech Research, Inc. It was performed with the concurrence of Interconnect Devices, Inc. of Kansas ity, KS who was the test sponsor. All equipment and measuring instruments used during testing were calibrated and traceable to NIST according to ISO 10012-1 and ANSI/NSL Z540-1 and MIL-STD-45662 as applicable. All data, raw and summarized, analysis and conclusions presented herein are the property of the test sponsor. No copy of this report, except in full, shall be forwarded to any agency, customer, etc., without the written approval of the test sponsor and ontech Research. Max Peel Senior Fellow ontech Research, Inc. MP:js TR#206320, REV.1.0 3 of 30 ontech Research
SOPE To perform Mechanical Shock and Random Vibration testing on Test Socket Probes as manufactured and submitted by the test sponsor Interconnect Devices, Inc. APPLIABLE DOUMENTS 1. Unless otherwise specified, the following documents of issue in effect at the time of testing performed form a part of this report to the extent as specified herein. The requirements of sub-tier specifications and/or standards apply only when specifically referenced in this report. 2. Standards: EIA Publication 364 3. Drawings or Slash Sheets: Interconnect Devices Dwg. 100045-042 TEST SAMPLES AND PREPARATION 1. The following test samples were submitted by the test sponsor, Interconnect Devices, Inc., for the evaluation to be performed by ontech Research, Inc. a) 100045-042 Probes mounted to test boards, Qty 2 2. Unless otherwise indicated, all materials were certified by the manufacturer to be in accordance with the applicable product specification. 3. The test samples as submitted were certified by the manufacturer as being fabricated and assembled utilizing normal production techniques common for this type of product and inspected in accordance with the quality criteria as established for the product involved. 4. All test samples were coded and identified by ontech Research to maintain continuity throughout the test sequences. Upon initiating testing, mated test samples remained with each other throughout the test sequences for which they were designated. 5. Test samples were received assembled to test boards by the test sponsor and tested in the "as received" condition. TR#206320, REV.1.0 4 of 30 ontech Research
TEST SAMPLES AND PREPARATION - continued 6. Unless otherwise specified in the test procedures used, no further preparation was used. 7. All equipment and measuring instruments used during testing were calibrated and traceable to NIST according to ISO 10012-1 and ANSI/NSL Z540-1, as applicable. TR#206320, REV.1.0 5 of 30 ontech Research
TEST SELETION 1. The following test sequence were established for this program: LLR MEHANIAL SHOK LLR RANDOM VIBRATION 3.1 G S RMS LLR RANDOM VIBRATION 5.35 G S RMS LLR RANDOM VIBRATION 7.56 G S RMS LLR RANDOM VIBRATION 9.26 G S RMS LLR 2. Test set ups and/or procedures which are standard or common are not detailed or documented herein provided they are certified as being performed in accordance with the applicable (industry or military) test methods, standards and/or drawings as specified in the detail specification. TR#206320, REV.1.0 6 of 30 ontech Research
TR#206320, REV.1.0 7 of 30 ontech Research
EQUIPMENT LIST ID# Next al Last al Equipment Name Manufacturer Model # Serial # Accuracy Freq.al 33 Vib. Power Amp Ling Dynamics MPA4 149 N/A N/A 86 Shaker Table MB Elect. 10E 141 N/A N/A 553 12/12/2006 12/12/2005 12 channel Power Unit PB o. 483A 1303 See al ert 12mon 684 6/22/2006 6/22/2005 Accelerometer PB. o. 353B04 47648 See al ert. 12mon 991 Sig Processor interface Agilent 35651B n/a N/A N/A 1125 7/27/2006 7/27/2005 Microohm Meter Keithley 580 451920 See al ert 12 mon. 1166 7/19/2006 7/19/2005 Sine/Rndm Vib ontrol Digitizer Hewlett Packard E1432A US39342279 See al ert 12 mon 1167 Interface Hewlett Packard E8491B US390100753 N/A N/A 1168 Mainframe Hewlett Packard E8408A US39000357 N/A N/A 1169 omputer AR P133 none N/A N/A 1175 1/18/2007 1/18/2006 Discontinuity Monitor Metronics DM3000-10 6-2K-1 See al ert 12mon 1219 omputer AR o. 350 350 ±2% N/A 1272 Shaker Table Unholtz Dickie S202PB 263 N/A N/A 1438 Main Frame Hewlett Packard 35650 2911A00927 N/A Ea Test 1439 1/10/2007 1/10/2006 Programable DA Unit Hewlett Packard 35656A 3007A00107 See al ert 12 mo 1440 1/10/2007 1/10/2006 8 han Input Module Hewlett Packard 35655A 2911A00337 N/A 12mon TR#206320, REV.1.0 8 of 30 ontech Research
TEST RESULTS TR#206320, REV.1.0 9 of 30 ontech Research
PROJET NO.: 206320 SPEIFIATION: IDI Test Plan ------------------------------------------------------------ PART NO.: 100045-042 PART DESRIPTION: Test Probe ------------------------------------------------------------ SAMPLE SIZE: Two Assemblies TEHNIIAN: MOB (32 ontacts Each) ------------------------------------------------------------ START DATE: 5/9/06 OMPLETE DATE: 5/12/06 ------------------------------------------------------------ ROOM AMBIENT: 22 RELATIVE HUMIDITY: 42% ------------------------------------------------------------ EQUIPMENT ID#: 553, 684, 1125, 1166, 1167, 1168, 1169, 1175, 1219, 1272 ------------------------------------------------------------ MEHANIAL SHOK (SPEIFIED PULSE) PROEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 27. 2. Test onditions: a) Peak Value : 58 G s b) Duration : 11 Milliseconds c) Wave Form : Half Sine d) No. of Shocks : 3 blows/direction/axis, 3 axis 3. Initial and final LLR was measured in accordance with EIA 364, Test Procedure 23 with a 100ma maximum test current and a 20 mv open circuit voltage on one assembly. 4. Discontinuity monitoring was performed in accordance with EIA 364, Test Procedure 46 on one assembly. ------------------------------------------------------------ REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. There shall be no contact interruption greater than 1.0 microsecond (one test assembly 32 contacts). 3. The initial low level contact resistance shall be measured and recorded (one test assembly 32 contacts). 4. The post test change in low level contact resistance shall be measured and recorded (one test assembly 32 contacts). TR#206320, REV.1.0 10 of 30 ontech Research
RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. There was no contact interruption greater than 1.0 microsecond. 3. The following is a summary of the data observed: LOW LEVEL IRUIT RESISTANE (Milliohms) Avg. Max. Avg. Max. hange hange 19.8 43.4 +4.9 +23.6 4. See data file 20632001 for individual data points. TR#206320, REV.1.0 11 of 30 ontech Research
FIGURE #1 lassical Shock hannel 1 [g] AELERATION (g) 100 80 60 40 20 0-20 -40-60 UPPER LIMIT------ ATUAL PULSE----- LOWER LIMIT----- L R U P P - d r - d r D T A Z Project 206320 Actual Pulse 05/12/06 Tech:MOB -80 0.40 0.42 0.44 0.46 0.48 0.50 0.52 0.54 0.56 0.58 0.60 [s] DURATION (Seconds) TR#206320, REV.1.0 12 of 30 ontech Research
lassical Shock FIGURE #2 hannel 1 [g] AELERATION (g) 100 80 60 40 20 0-20 -40-60 UPPER LIMIT------ ATUAL PULSE----- LOWER LIMIT----- L R U P P - d r - d r D T Project206320 al Wave #1 05/12/06 Tech:MOB -80 0.40 0.42 0.44 0.46 0.48 0.50 0.52 0.54 0.56 0.58 0.60 [s] DURATION (Seconds) TR#206320, REV.1.0 13 of 30 ontech Research
lassical Shock FIGURE #3 hannel 1 [g] AELERATION (g) 100 80 60 40 20 0-20 -40-60 UPPER LIMIT------ ATUAL PULSE----- LOWER LIMIT----- L R U P P - d r - d r D T Project 206320 al Wave 2 05/12/06 Tech: MOB -80 0.40 0.42 0.44 0.46 0.48 0.50 0.52 0.54 0.56 0.58 0.60 [s] DURATION (Seconds) TR#206320, REV.1.0 14 of 30 ontech Research
PROJET NO.: 206320 SPEIFIATION: IDI Test Plan ------------------------------------------------------------ PART NO.: 100045-042 PART DESRIPTION: Test Probe ------------------------------------------------------------ SAMPLE SIZE: Two Assemblies TEHNIIAN: DAM (32 ontacts Each) ------------------------------------------------------------ START DATE: 3/15/06 OMPLETE DATE: 3/17/06 ------------------------------------------------------------ ROOM AMBIENT: 23 RELATIVE HUMIDITY: 41% ------------------------------------------------------------ EQUIPMENT ID#: 33, 86, 553, 684, 991, 1125, 1175, 1219, 1438, 1439, 1440 ------------------------------------------------------------ VIBRATION, RANDOM PROEDURE: 1. The test sample was fixtured to the test stand via rails located along the longitudinal length of the bottom test support. No restraints were used on the top board aside for the locking hardware. 2. Initial, intermediate (after each vibration condition) and final low level circuit resistance was performed in accordance with EIA 364, Test Procedure 23 with the following test condition: a) Test urrent : 100 ma Max. b) Open ircuit Voltage : 20 mv 3. The test was performed in accordance with EIA 364, Test Procedure 28. 4. Test onditions: Test #1 a) Power Spectral Density: 0.02 b) G RMS : 3.1 c) Frequency : 20-500 Hz d) Duration : 1.0 hr/axis, 3 axis Test #2 a) Power Spectral Density: 0.02 b) G RMS : 5.35 c) Frequency : 50-2000 Hz d) Duration : 1.0 hr/axis, 3 axis TR#206320, REV.1.0 15 of 30 ontech Research
Test onditions: continued Test #3 a) Power Spectral Density: 0.04 b) G RMS : 7.56 c) Frequency : 50-2000 Hz d) Duration : 1.0 hr/axis, 3 axis Test #4 a) Power Spectral Density: 0.06 b) G RMS : 9.26 c) Frequency : 50-2000 Hz d) Duration : 1.0 hr/axis, 3 axis ----------------------------------------------------------- REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. The change in low level contact resistance shall be measured and recorded. 3. There shall be no contact interruption greater than 1.0 microsecond. ------------------------------------------------------------ RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. The following is a summary of the observed data: LOW LEVEL IRUIT RESISTANE (Milliohms) Avg. Max. Vib. 3.14G s, ΔR +4.9 +23.4 Vib. 5.35G s, ΔR +4.6 +28.9 Vib. 7.35G s, ΔR +3.1 +23.5 Vib. 9.26G s, ΔR +3.6 +26.9 Note: ΔR represents change in resistance 3. See data file 20632001 for individual data points. 4. One board assembly was used for monitoring discontinuity. A second board assembly was used for measuring LLR throughout the total sequence including mechanical shock. TR#206320, REV.1.0 16 of 30 ontech Research
Low Level ontact Resistance Project: 206320 Spec: IDI Test Plan ustomer: IDI Subgroup: N/A Product: 100045-042-958 Serirs File #: 20632001 Description: GSS-10 Probe Assembly Open circuit voltage: 20mv urrent: 100ma Delta values units: milliohms Temp º 22 21 23 20 22 22 R.H. % 40 40 41 39 42 42 Date: 09May06 12May06 15May06 16May06 17May06 17May06 Pos. ID Initial Mechanical Random Random Random Random Vib 3.1 G Vib 5.35 G Vib 7.56 G Vib 9.26 G 1-1 23.6 16.9 5.5-0.6 1.9 5.3 1-2 10.9 4.1 8.6 28.9 23.5 26.9 1-3 34.3 1.6 0.2 3.0 0.0-1.8 1-4 22.2 1.7 0.6 0.6-0.7 1.8 1-5 8.0 1.8 0.7-0.1 2.3 1.3 1-6 30.2 1.9 7.0 1.3 4.0 0.2 1-7 43.4 0.9 1.8-0.2-0.9 0.2 1-8 32.8-0.4 7.2-0.8-0.5-1.1 1-9 32.3 3.6 3.3 2.1 2.5-0.5 1-10 34.3 7.2 1.6 7.8 1.1 1.9 1-11 32.6 7.6 0.6 0.1-0.5-1.5 1-12 35.3 2.9 2.0 0.1-1.5-1.4 1-13 9.8-0.1 0.0 0.1-0.2 0.3 1-14 24.0-0.1-0.3 0.4-0.9-0.4 1-15 10.6 1.8 3.5-0.4-1.3-0.5 1-16 10.7 0.3 7.8 6.6-0.7-0.7 1-17 21.4 0.9 0.6 0.4-1.3-1.2 1-18 14.6 4.4 20.1 1.5 0.4 15.3 1-19 11.9 14.3 13.8 15.1 14.9 11.7 1-20 10.5 4.6 23.4 22.9 19.5 18.0 1-21 14.7 20.1 15.8 17.4 13.9 15.3 1-22 13.1 23.6 21.0 21.7 15.2 16.1 1-23 21.1 6.4 4.6 1.5 1.1 2.4 1-24 7.1 1.0 0.2 0.1 0.1-0.1 1-25 9.7 1.1 0.7-1.8-1.4-1.5 1-26 31.4-0.4-0.3 2.2 0.8 1.1 1-27 23.0-0.6 3.5 1.8 3.4-0.4 1-28 20.7 5.6 4.9 4.0 3.7 4.2 1-29 9.9 8.5 0.6-0.5 0.6 8.6 1-30 9.8-0.5-2.0-1.4-0.5-1.8 1-31 10.4 13.7-0.1 11.4 0.1-1.5 1-32 8.2 1.9 0.7 1.9-0.6-0.2 TR#206320, REV.1.0 17 of 30 ontech Research
Product: 100045-042-958 Serirs File #: 20632001 Description: GSS-10 Probe Assembly Open circuit voltage: 20mv urrent: 100ma Delta values units: milliohms Temp º 22 21 23 20 22 22 R.H. % 40 40 41 39 42 42 Date: 09May06 12May06 15May06 16May06 17May06 17May06 Pos. ID Initial Mechanical Random Random Random Random Vib 3.1 G Vib 5.35 G Vib 7.56 G Vib 9.26 G MAX 43.4 23.6 23.4 28.9 23.5 26.9 MIN 7.1-0.6-2.0-1.8-1.5-1.8 AVG 19.8 4.9 4.9 4.6 3.1 3.6 STD 10.5 6.3 6.8 8.0 6.6 7.3 Open 0 0 0 0 0 0 Tech MOB MOB MOB MOB MOB MOB Equip ID 1125 1125 1125 1125 1125 1125 1219 1219 1219 1219 1219 1219 TR#206320, REV.1.0 18 of 30 ontech Research
FIGURE #4 Random ontrol channel [g²/hz] 1 0.1 0.01 Project# 206320 ustomer: IDI Run 2 X-Axis:#1,Z-Axis:#2 Date:05/15/06 Test onditions: 3.1G PSD: 0.02 20 to 500 Hz Tech: MOB 0.001 20 100 200 300 400 500 [Hz] TR#206320, REV.1.0 19 of 30 ontech Research
Random FIGURE #5 ontrol channel [g²/hz] 1 0.1 0.01 Project# 206320 ustomer: IDI Run 3 Y-Axis:#1,Y-Axis:#2 Date:05/15/06 Test onditions: 3.1G PSD: 0.02 20 to 500 Hz Tech: MOB 0.001 20 100 200 300 400 500 [Hz] TR#206320, REV.1.0 20 of 30 ontech Research
Random FIGURE #6 ontrol channel [g²/hz] 1 0.1 0.01 Project# 206320 ustomer: IDI Run 1 Z-Axis:#1,X-Axis:#2 Date: 05/15/06 Test onditions: 3.1G PSD:0.02 20 to 500 Hz Tech:MOB 0.001 20 100 200 300 400 500 [Hz] TR#206320, REV.1.0 21 of 30 ontech Research
Random FIGURE #7 hannel 1 [g²/hz] 1 0.1 0.01 Project# 206320 ustomer: IDI Run4 Z-Axis:#1,X-Axis:#2 Date:05/16/06 Test onditions: 5.35G PSD: 0.02 50to2000Hz Tech:MOB 0.001 50 100 1000 2000 [Hz] TR#206320, REV.1.0 22 of 30 ontech Research
Random FIGURE #8 ontrol channel [g²/hz] 0.1 0.01 Project# 206320 ustomer: IDI Run4 Y-Axis:#1, Y-Axis:#2 Date:05/15/06 Test onditions: 5.35G PSD:.02 50 to 2000Hz Tech:MOB 0.001 0.0001 50 100 1000 2000 [Hz] TR#206320, REV.1.0 23 of 30 ontech Research
Random FIGURE #9 hannel 1 [g²/hz] 1 0.1 0.01 Project# 206320 ustomer: IDI Run5 Y-Axis:#1,Z-Axis:#2 Date: 05/16/06 Test onditions: 5.35G PSD:0.02 50to2000Hz Tech: MOB 0.001 50 100 1000 2000 [Hz] TR#206320, REV.1.0 24 of 30 ontech Research
Random FIGURE #10 hannel 1 [g²/hz] 0.1 0.01 Project# 206302 ostomer:idi Run 7 X-Axis:#1,Z-Axis:#2 Date:05/16/06 Test onditions: 7.56G PSD0.04 50to2000Hz Tech:MOB 0.001 0.0001 50 100 1000 2000 [Hz] TR#206320, REV.1.0 25 of 30 ontech Research
Random FIGURE #11 hannel 1 [g²/hz] 1 0.1 0.01 Project#206320 ustomer:idi Run7 Z-Axis:#1,X-Axis:#2 Date:05/16/06 Test onditions: 7.56G PSD:0.04 50to2000Hz Tech:MOB 0.001 50 100 1000 2000 [Hz] TR#206320, REV.1.0 26 of 30 ontech Research
Random FIGURE #12 ontrol channel [g²/hz] 1 0.1 0.01 Project# 206320 Run9 Y-Axis:#1,Y-Axis: #2 Date:05/16/06 Test onditions: 7.56G PSD:0.04 50to2000Hz Tech:MOB 0.001 50 100 1000 2000 [Hz] TR#206320, REV.1.0 27 of 30 ontech Research
Random FIGURE #13 hannel 1 [g²/hz] 1 0.1 0.01 0.001 D L R U R R - e r - e r D T 2 R 0 S S Project# 206320 ustomer:idi Run 10 Y-Axis:#1,Y-Axis:#2 Date:05/17/06 Test onditions: 9.26G PSD:0.06 50to2000Hz Tech:MOB 50 100 1000 2000 [Hz] TR#206320, REV.1.0 28 of 30 ontech Research
Random FIGURE #14 hannel 1 [g²/hz] 1 0.1 0.01 0.001 D L R U R R - e r - e r D T 2 R 0 S S Project# 206320 ustomer:idi Run11 Z-Axis:#1 X-Axis:#2 Date:06/17/06 Test onditions: 9.26G PSD:0.06 50to2000Hz Tech:MOB 50 100 1000 2000 [Hz] TR#206320, REV.1.0 29 of 30 ontech Research
Random FIGURE #15 hannel 1 [g²/hz] 1 0.1 0.01 0.001 D L R U R R - e r - e r D T 2 R 0 S S Project# 206320 ustomer:idi Run 10 Y-Axis:#1,Y-Axis:#2 Date:05/17/06 Test onditions: 9.26G PSD:0.06 50to2000Hz Tech:MOB 50 100 1000 2000 [Hz] TR#206320, REV.1.0 30 of 30 ontech Research