AUGUST 14, 2006 TEST REPORT #206271 RANDOM VIBRATION TEST 101377-000 SERIES PROBE 204130-036 SERIES PROBE TEST SOCKET INTERCONNECT DEVICES, INC. APPROVED BY: MAX PEEL SENIOR FELLOW CONTECH RESEARCH, INC.
REVISION HISTORY DATE REV. NO. DESCRIPTION ENG. 8/11/06 1.0 Initial Issue MP TR#206271, REV.1.0 2 of 30
CERTIFICATION This is to certify that the evaluation described herein was designed and executed by personnel of, Inc. It was performed with the concurrence of Interconnect Devices, Inc. of Kansas City, KS who was the test sponsor. All equipment and measuring instruments used during testing were calibrated and traceable to NIST according to ISO 10012-1 and ANSI/NCSL Z540-1 and MIL-STD-45662 as applicable. All data, raw and summarized, analysis and conclusions presented herein are the property of the test sponsor. No copy of this report, except in full, shall be forwarded to any agency, customer, etc., without the written approval of the test sponsor and. Max Peel Senior Fellow MP:js TR#206271, REV.1.0 3 of 30
SCOPE To perform Mechanical Shock and Random Vibration Testing on Test Socket Probes as manufactured and submitted by the test sponsor Interconnect Devices, Inc. APPLICABLE DOCUMENTS 1. Unless otherwise specified, the following documents of issue in effect at the time of testing performed form a part of this report to the extent as specified herein. The requirements of sub-tier specifications and/or standards apply only when specifically referenced in this report. 2. Standards: EIA Publication 364 3. Drawings or Slash Sheets: Interconnect Devices Dwg. 100410 TEST SAMPLES AND PREPARATION 1. The following test samples were submitted by the test sponsor, Interconnect Devices, Inc., for the evaluation to be performed by, Inc. a) 101377-000 Probes b) 204130-036 Test Socket Assy 2. Unless otherwise indicated, all materials were certified by the manufacturer to be in accordance with the applicable product specification. 3. The test samples as submitted were certified by the manufacturer as being fabricated and assembled utilizing normal production techniques common for this type of product and inspected in accordance with the quality criteria as established for the product involved. 4. All test samples were coded and identified by (Contech Research or the test sponsor) to maintain continuity throughout the test sequences. Upon initiating testing, mated test samples remained with each other throughout the test sequences for which they were designated. 5. Test samples were assembled to test boards by the test sponsor. The test boards were fabricated from FR-4 with 1.0 ounce copper material using typical production techniques. Special circuit lines and/or plated though hole patterns were provided for ease of efficient test lead attachment. The test boards were 0.093 thick. TR#206271, REV.1.0 4 of 30
TEST SAMPLES AND PREPARATION continued 6. Prior to testing a common buss was soldered to the bottom test board for the performance of Low Level Contact Resistance and to complete the series circuit required for discontinuity monitoring. 7. After soldering, the applicable test boards were ultrasonically cleaned after test lead attachment, preparation and/or soldering using the following process: A) Test samples were immersed into the Branson 8210 cleaner which contained Kyzen Ionex HC cleaning solution with the following conditions: a) Temperature : 55 ± 4 C b) Frequency : 43 KHz c) Immersion Time : 3 to 5 Minutes B) Test samples were slowly removed and placed into the Branson 5210 cleaner which contained DI water with the following conditions: a) Temperature : 55 ± 4 C b) Frequency : 47 KHz c) Immersion Time : 1 to 2 Minutes C) Test samples were removed and placed in a Fisher Thermix agitator containing DI water warmed to 55 ± 5 C for 1 to 2 minutes. D) Upon removal, the test samples were rinsed for 1 to 2 minutes in free flowing DI water at 55 ± 5 C. E) After final rinse, test samples were dried in an air circulating oven for 2 to 3 minutes minimum at 50 ± 2 C. F) Test samples were allowed to recover to room ambient conditions prior to testing. 8. Unless otherwise specified in the test procedures used, no further preparation was used. 9. All equipment and measuring instruments used during testing were calibrated and traceable to NIST according to ISO 10012-1 and ANSI/NCSL Z540-1, as applicable. TR#206271, REV.1.0 5 of 30
TEST SELECTION 1. The following test sequence was established for this program: LLCR MECHANICAL SHOCK LLCR RANDOM VIBRATION 3.1 G S RMS LLCR RANDOM VIBRATION 5.35 G S RMS LLCR RANDOM VIBRATION 7.56 G S RMS LLCR RANDOM VIBRATION 9.26 G S RMS LLCR 2. Test set ups and/or procedures which are standard or common are not detailed or documented herein provided they are certified as being performed in accordance with the applicable industry test methods, standards and/or drawings as specified in the detail specification. TR#206271, REV.1.0 6 of 30
TR#206271, REV.1.0 7 of 30
EQUIPMENT LIST ID# Next Cal Last Cal Equipment Name Manufacturer Model # Serial # Accuracy Freq.Cal 601 Computer A.M.I. P111-450 082714 N/A N/A 681 Computer ARC Co. P166 N/A N/A N/A 684 7/10/2007 7/10/2006 Accelerometer PCB. Co. 353B04 47648 See Cal Cert. 12mon 991 Sig Processor interface Agilent 35651B n/a N/A N/A 1047 11/15/2006 11/15/2005 Microohm Meter Keithley 580 0705731 See Cal Cert 12mon 1175 1/18/2007 1/18/2006 Discontinuity Monitor Metronics DM3000-10 6-2K-1 See Cal Cert 12mon 1243 Computer ARC Co. P450 BU-001 N/A N/A 1271 Amplifier Unholtz Dickie SA15 3483 See Manual N/A 1272 Shaker Table Unholtz Dickie S202PB 263 N/A N/A 1278 8/1/2007 8/1/2006 Microohm mtr Keithley 580 0803947 See Manual 12 mon. 1438 Main Frame Hewlett Packard 35650 2911A00927 N/A Ea Test 1439 1/10/2007 1/10/2006 Programable DAC Unit Hewlett Packard 35656A 3007A00107 See Cal Cert 12 mo 1440 1/10/2007 1/10/2006 8 Chan Input Module Hewlett Packard 35655A 2911A00337 N/A 12mon TR#206271, REV.1.0 8 of 30
TEST RESULTS TR#206271, REV.1.0 9 of 30
PROJECT NO.: 206271 SPECIFICATION: IDI Test Plan ------------------------------------------------------------ PART NO.: 101377-000 Probes PART DESCRIPTION: Test Probe 204130-036 Probes ------------------------------------------------------------ SAMPLE SIZE: Two Assemblies TECHNICIAN: BE ------------------------------------------------------------ START DATE: 8-8-06 COMPLETE DATE: 8-8-06 ------------------------------------------------------------ ROOM AMBIENT: 22 C RELATIVE HUMIDITY: 50% ------------------------------------------------------------ EQUIPMENT ID#: 601, 684, 991, 1175, 1243, 1271, 1272, 1278, 1438, 1439, 1440 ------------------------------------------------------------ MECHANICAL SHOCK (SPECIFIED PULSE) PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 27. 2. Test Conditions: a) Peak Value : 58 G s b) Duration : 11 Milliseconds c) Wave Form : Half Sine d) No. of Shocks : 3 blows/direction/axis, 3 axis 3. Initial and final LLCR was measured in accordance with EIA 364, Test Procedure 23 with a 100ma maximum test current and a 20 mv open circuit voltage. 4. Discontinuity monitoring was performed in accordance with EIA 364, Test Procedure 46. ------------------------------------------------------------ REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. There shall be no contact interruption greater than 1.0 microsecond. (one test assembly 32 contacts) 3. The initial low level contact resistance shall be measured and recorded. (one test assembly 32 contacts) 4. The post test change in low level contact resistance shall be measured and recorded. (one test assembly 32 contacts) TR#206271, REV.1.0 10 of 30
RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. There was no contact interruption greater than 1.0 microsecond. 3. The following is a summary of the data observed: LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Initial Post Mech. Shock Std. Avg. Max. Std. Avg. Max. Dev. Change Change Dev. 4.9 26.8 5.0 +0.1 +3.4 3.2 4. See data file 20627101 for individual data points. TR#206271, REV.1.0 11 of 30
Classical Shock Channel 1 [g] ACCELERATION (g) 100 80 60 40 20 0-20 -40-60 -80 UPPER LIMIT------ Project 206271 IDI 8/08/06 Actual Wave ACTUAL PULSE----- Tech:BE / LOWER LIMIT----- 0.40 0.42 0.44 0.46 0.48 0.50 0.52 0.54 0.56 0.58 0.60 [s] DURATION (Seconds) TR#206271, REV.1.0 12 of 30
Classical Shock Channel 1 [g] ACCELERATION (g) 100 80 60 40 20 0-20 -40-60 -80 UPPER LIMIT------ Project 206271 IDI 8/08/06 Cal Wave 1 ACTUAL PULSE----- Tech: BE/ LOWER LIMIT----- 0.40 0.42 0.44 0.46 0.48 0.50 0.52 0.54 0.56 0.58 0.60 [s] DURATION (Seconds) TR#206271, REV.1.0 13 of 30
Classical Shock Channel 1 [g] ACCELERATION (g) 100 80 60 40 20 0-20 -40-60 -80 UPPER LIMIT------ Project 206271 IDI 8/08/06 Cal Wave 2 ACTUAL PULSE----- Tech: BE/ LOWER LIMIT----- 0.40 0.42 0.44 0.46 0.48 0.50 0.52 0.54 0.56 0.58 0.60 [s] DURATION (Seconds) TR#206271, REV.1.0 14 of 30
PROJECT NO.: 206271 SPECIFICATION: IDI Test Plan ------------------------------------------------------------ PART NO.: 101377-000 Probes PART DESCRIPTION: Test Probe 204130-036 Probes ------------------------------------------------------------ SAMPLE SIZE: Two Assemblies TECHNICIAN: MOB ------------------------------------------------------------ START DATE: 8-8-06 COMPLETE DATE: 8-10-06 ------------------------------------------------------------ ROOM AMBIENT: 22 C RELATIVE HUMIDITY: 50% ------------------------------------------------------------ EQUIPMENT ID#: 601, 681, 684, 991, 1047, 1175, 1243, 1271, 1272, 1278, 1438, 1439, 1440 ------------------------------------------------------------ VIBRATION, RANDOM PROCEDURE: 1. The test sample was fixtured to the test stand via rails located along the longitudinal length of the bottom test support. No restraints were used on the top board aside for the locking hardware. 2. Initial, intermediate (after each vibration condition) and final low level circuit resistance was performed in accordance with EIA 364, Test Procedure 23 with the following test condition: a) Test Current : 100 ma Max. b) Open Circuit Voltage : 20 mv 3. The test was performed in accordance with EIA 364, Test Procedure 28. 4. Test Conditions: Test #1 a) Power Spectral Density : 0.02 b) G RMS : 3.1 c) Frequency : 20-500 Hz d) Duration : 1.0 hr/axis, 3 axis Test #2 a) Power Spectral Density : 0.02 b) G RMS : 5.35 c) Frequency : 50-2000 Hz d) Duration : 1.0 hr/axis, 3 axis TR#206271, REV.1.0 15 of 30
Test Conditions: continued Test #3 a) Power Spectral Density : 0.04 b) G RMS : 7.56 c) Frequency : 50-2000 Hz d) Duration : 1.0 hr/axis, 3 axis Test #4 a) Power Spectral Density : 0.06 b) G RMS : 9.26 c) Frequency : 50-2000 Hz d) Duration : 1.0 hr/axis, 3 axis ----------------------------------------------------------- REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. The change in low level contact resistance shall be measured and recorded. 3. There shall be no contact interruption greater than 1.0 microsecond. ------------------------------------------------------------ RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. The following is a summary of the observed data: 4 LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Std. Avg. Max. Dev. Vib. 3.14G s, R +1.0 +7.2 1.5 Vib. 5.35G s, R +0.3 +5.9 3.9 Vib. 7.35G s, R +1.0 +6.4 1.5 Vib. 9.26G s, R +0.2 +5.8 3.8 Note: R represents change in resistance. 3. See data file 20627101 for individual data points. 4. One board assembly was used for monitoring discontinuity. A second board assembly was used for measuring LLCR throughout the total sequence including mechanical shock. TR#206271, 16 of 30
Low Level Contact Resistance Project: 206271 Spec: IDI Test Plan Customer: IDI Subgroup: N/A Product: 101377-000 File #: 20627101 Description: Probe Assy. Open circuit voltage: 20mv Current: 100ma Delta values units: milliohms Temp ºC 22 22 22 22 22 23 R.H. % 50 50 50 48 48 46 Date: 08Aug06 08Aug06 08Aug06 09Aug06 09Aug06 10Aug06 Pos. ID Initial Mech Shk Vibration Vibration Vibration Vibration 3.1 grms 5.35 grms 7.56 grms 9.26 grms 1 1.2 0.0 0.0 0.2 0.0 0.0 2 1.2 0.1 0.0-0.2 0.1 0.0 3 6.9 0.3 1.6 1.7 1.7 1.7 4 7.1 3.4 1.8 5.9 6.4 5.8 5 8.0 0.1 1.2 2.6 1.9 1.4 6 26.8-16.6 7.2-19.7-0.7-19.5 7 1.8 0.1 0.2 0.0 0.1 0.1 8 0.6 0.0-0.1 0.0 0.0 0.0 9 7.4 2.6 2.5 3.6 2.1 2.4 10 6.5 1.2 0.8 0.3 0.6-0.1 11 8.1 1.8 1.4 0.6 0.8 2.0 12 6.4 1.4 1.0 1.1 0.8 0.6 13 0.3 0.0 0.0 0.1 0.0 0.0 14 0.4 0.0 0.0-0.1 0.0-0.1 15 0.5 0.0 0.1 0.0 0.0 0.1 16 1.3 0.0-0.1 0.0 0.1 0.0 17 8.6 0.2 0.5 1.2 1.4 0.2 18 6.9 0.9 0.8 1.4 1.5 1.1 19 6.9 0.5 0.9 1.0 1.7 1.3 20 6.6 2.7 4.4 4.1 4.8 1.8 21 1.7 0.1 0.0-0.1 0.3-0.1 22 1.8-0.1 0.0 0.1-0.1 0.1 23 6.1 0.6 0.6 0.3 1.3 0.2 24 5.3 0.6 1.4 1.1 2.0 1.4 25 8.3-0.1 1.1-1.4-0.6-1.1 26 6.2 1.6 1.0 1.0 1.0 1.3 27 1.3 0.0 0.0 0.1 0.1 0.1 28 1.0 0.0 0.0 0.2 0.2 0.3 29 5.3 2.1 2.4 2.7 3.1 2.7 30 5.5 1.1 1.6 1.8 2.6 2.5 31 0.5-0.1-0.2-0.2-0.1-0.1 32 1.2 0.1 0.2 0.3 0.1 0.1 TR#206271, 17 of 30
Product: 101377-000 File #: 20627101 Description: Probe Assy. Open circuit voltage: 20mv Current: 100ma Delta values units: milliohms Temp ºC 22 22 22 22 22 23 R.H. % 50 50 50 48 48 46 Date: 08Aug06 08Aug06 08Aug06 09Aug06 09Aug06 10Aug06 Pos. ID Initial Mech Shk Vibration Vibration Vibration Vibration 3.1 grms 5.35 grms 7.56 grms 9.26 grms MAX 26.8 3.4 7.2 5.9 6.4 5.8 MIN 0.3-16.6-0.2-19.7-0.7-19.5 AVG 4.9 0.1 1.0 0.3 1.0 0.2 STD 5.0 3.2 1.5 3.9 1.5 3.8 Open 0 0 0 0 0 0 Tech BE BE BE BE BE BE Equip ID 601 601 601 601 601 681 1278 1278 1278 1278 1278 1047 TR#206271, 18 of 30
Random Channel 1 [g²/hz] 0.1 Project# 206271 X-Axis Date:8/08/06 Test Conditions: 3.1 grms 1 hr Axis Tech:BE 0.01 0.001 0.0001 20 100 200 300 400 500 [Hz] TR#206271, REV.1.0 19 of 30
Random Channel 1 [g²/hz] 1 0.1 Project# 206271 Y Axis-Axis Date:8/08/06 Test Conditions: 3.1 grms 1 hour Axis Tech:BE 0.01 0.001 20 100 200 300 400 500 [Hz] TR#206271, 20 of 30
Random Channel 1 [g²/hz] 0.1 Project# 206271 Z-Axis Date:8/08/06 Test Conditions: 3.1 grms 1 hour Axis Tech:BE 0.01 0.001 0.0001 20 100 200 300 400 500 [Hz] TR#206271, 21 of 30
Random Channel 1 [g²/hz] 1 0.1 Project# 206271 X-Axis Date: 8/08/06 Test Conditions: 5.35 grms 1 hr Axis Tech:BE 0.01 0.001 50 100 1000 2000 [Hz] TR#206271, 22 of 30
Random Channel 1 [g²/hz] 1 0.1 Project# 206271 Y-Axis Date:8/09/06 Test Conditions: 5.35 grms 1 hr Axis Tech:BE 0.01 0.001 50 100 1000 2000 [Hz] TR#206271, 23 of 30
Random Channel 1 [g²/hz] 1 0.1 Project# 206271 Z-Axis Date:8/09/06 Test Conditions: 5.35 grms 1 hr Axis Tech:BE 0.01 0.001 50 100 1000 2000 [Hz] TR#206271, 24 of 30
Random Channel 1 [g²/hz] 1 0.1 Project# 206271 X-Axis Date:8/09/06 Test Conditions: 7.56 grms 1 hr Axis Tech:BE 0.01 0.001 0.0001 50 100 1000 2000 [Hz] TR#206271, 25 of 30
Random Channel 1 [g²/hz] 1 0.1 Project# 206271 Y-Axis Date:8/09/06 Test Conditions: 7.56 grms 1 hr Axis Tech:BE 0.01 0.001 50 100 1000 2000 [Hz] TR#206271, 26 of 30
Random Channel 1 [g²/hz] 1 0.1 Project# 206271 Z-Axis Date:8/09/06 Test Conditions: 7.56 grms 1 hr Axis Tech: 0.01 0.001 50 100 1000 2000 [Hz] TR#206271, 27 of 30
Random Channel 1 [g²/hz] 1 Project#206505 X-Axis Date:8/09/06 Test Conditions: 9.26 grms 1 hr Axis Tech:BE 0.1 0.01 0.001 50 100 1000 2000 [Hz] TR#206271, 28 of 30
Random Channel 1 [g²/hz] 1 0.1 Project#206505 Y-Axis Date:8/10/06 Test Conditions: 9.26 grms 1 hr Axis Tech:BE 0.01 0.001 50 100 1000 2000 [Hz] TR#206271, 29 of 30
Random Channel 1 [g²/hz] 1 0.1 Project# 206271 Z-Axis Date:8/10/06 Test Conditions: 9.26 grms 1 hr Axis Tech:BE 0.01 0.001 50 100 1000 2000 [Hz] TR#206271, 30 of 30