Embedded Resistor Reliability Results

Transcription

1 Electronic Products and Systems Center 2 Embedded Resistor Reliability Results L. Salzano, C. Wilkinson, P. Sandborn Peter Sandborn (31) Sandborn@calce.umd.edu Electronic Products and Systems Center 1 Copyright 23 CALCE EPSC TV1R Reliability Test Plan Fabricate cores 36 MacDermid Selective Trim 36 Gould Pre-lam resistance Post-lam resistance = Completed = Remaining Work Selective Rework Laminate FEM Model Step Stress Test Matl. Properties Test Limits Pre-condition CALCE Model Temp/ Humidity Temperature shock Temperature coefficient 3 point bend Stability Failure Analysis Temperature cycling High temperature bake Torsion bend

2 Electronic Products and Systems Center 4 Reliability Test Conditions Environmental High Temperature Bake Constant set point at 15 o C for 1 hours Temperature Coefficient Ramp temperature from -25 o C to 125oC at.625 o C/min Temperature Cycling Ramp temperature from 25 o C to 125 o C at 5 o C/min and dwell at 125 o C for 3 minutes Ramp temperature from 125 o C to -65 o C at 5 o C/min and dwell at - 65 o C for 3 minutes Ramp temperature back to 25 o C and repeat for 5 cycles Temperature Shock Dip between -4 o C and 12 o C baths, dwelling 5 minutes in each for 5 Humidity 85% humidity at 13 o C for 1 hours Electronic Products and Systems Center 3 Copyright 23 CALCE EPSC Embedded Resistor Environmental & Mechanical Testing Status Environmental High Temperature Bake Finished - 21 (1 planned) Temperature Coefficient Finished Temperature Cycling Finished - 5 Temperature Shock Finished - 5 Humidity Finished (1 planned)

3 / Definition Electronic Products and Systems Center 6 Resistor Orientation Electronic Products and Systems Center 5 Copyright 23 CALCE EPSC Isolated/Daisy Chained Measurements Note: Data counts are given on basis of number of measurements and not on number of resistors (measurements are for a mixture of isolated resistors and daisy chains). Each daisy chain contains 36 resistors MacDermid - Temperature Shock - Isolated Data MacDermid - Temperature Shock - Daisy Chained Data.9.8 Plotted Data: 188 σ: Plotted Data: 8 σ: After analyzing each environmental test s data, no shift occurred in expected value as a result of segregating isolated or daisy chained resistor measurements. Therefore, only combined isolated/daisy chained data is represented in the remainder of the histograms.

4 Pre/Post Lamination Gould - Pre/Post Lamination Plotted/Total Data: 15534/15863 Outliers: 2.7 % σ: Electronic Products and Systems Center 7 Copyright 23 CALCE EPSC Pre/Post Lamination MacDermid - Pre/Post Lamination Plotted/Total Data: 24959/25666 Outliers: 2.75 % σ: Electronic Products and Systems Center 8

5 Temperature Coefficient Temperature History Gould - Temperature History (Median Case) MacDermid - Temperature History (Median Case) Resistance ( Ohm ) Resistance ( Ohm ) Temperature ( C ) Temperature ( C ) Gould - Temperature Characteristic (Selected Cases) MacDermid - Temperature History (Selected Cases) Resistance ( Ohm ) Resistance ( Ohm ) Temperature ( Electronic Products and C ) Systems Center Temperature ( C ) Copyright 23 CALCE EPSC 55.6 Temperature Coefficient Due to the non-linear characteristic in MacDermid s results percent difference is plotted instead of temperature coefficient. Gould - All Data MacDermid - Temperature Coefficient - All Data Plotted/Total Data: 232/295 Non-Functional: 63.5 σ:.65 Plotted/Total Data: 256/295 σ: Non-Functional: o C to 125 o C Temperature Coefficient Gould - All Data (Zoomed) MacDermid - Temperature Coefficient- All Data (Zoomed) Electronic Products and Systems Center

6 Temperature Coefficient Due to the non-linear characteristic in MacDermid s results percent difference is plotted instead of temperature coefficient. Gould - Data MacDermid - Temperature Coefficient - Data.5.45 Plotted Data: 17 σ:.62 Plotted Data: 129 σ: o C to 125 o C Temperature Coefficient Gould - Data MacDermid - Temperature Coefficient - Data.3.25 Plotted Data: 125 σ:.62 Plotted Data: 127 σ: Electronic Products Temperature and Coefficient Systems Center Copyright 23 CALCE EPSC Temperature Coefficient Due to the non-linear characteristic in MacDermid s results percent difference is plotted instead of temperature coefficient. Gould - Data MacDermid - Temperature Coefficient - Data.3.25 Plotted Data: 91 σ:.58 Plotted Data: 91 σ: o C to 125 o C Temperature Coefficient Gould - Non- Data MacDermid - Temperature Coefficient - Non- Data Plotted Data: 118 σ:.62 Plotted Data: 143 σ: Electronic Products Temperature and Coefficient Systems Center

7 High Temperature Bake Time History Gould - High Temperature Bake Time History (Median Case) MacDermid - High Temperature Bake Time History (Median Case) Gould - High Temperature Bake Time History (Selected Cases) MacDermid - High Temperature Bake Time History (Selected Cases) Electronic Products and Systems Center Copyright 23 CALCE EPSC. High Temperature Bake After 21 Gould - High Temperature Bake - All Data MacDermid - High Temperature Bake - All Data T = 15 o C Plotted Data: 218 Failed/Non-Functional: 3/74.6 σ: Plotted Data: 263 Failed/Non-Functional: /32 σ: Gould - High Temperature Bake - All Data (Zoomed) MacDermid - High Temperature Bake - All Data (Zoomed) Electronic Products Percent and Difference Systems Center

8 High Temperature Bake After 21 Gould - High Temperature Bake - Data MacDermid - High Temperature Bake - Data T = 15 o C.8.7 Plotted Data: 98 σ: 4.29 Plotted Data: 136 σ: Gould - High Temperature Bake - Data MacDermid - High Temperature Bake - Data.8.7 Plotted Data: 12 σ: Plotted Data: 127 σ: Electronic Products Percent and Difference Systems Center Copyright 23 CALCE EPSC High Temperature Bake After Gould - High Temperature Bake - Data MacDermid - High Temperature Bake - Data.6.5 T = 15 o C Plotted Data: 14 σ: 3.7 Plotted Data: 114 σ: Gould - High Temperature Bake - Non- Data MacDermid - High Temperature Bake - Non- Data.8.7 Plotted Data: 114 σ: Plotted Data: 149 σ: Electronic Products Percent and Difference Systems Center

9 Temperature Cycling Time History Gould - Temperature Cycling Time History (Median Case) MacDermid - Temperature Cycling Time History (Median Case) Gould - Temperature Cycling Time History (Selected Cases) MacDermid - Temperature Cycling Time History (Selected Cases) Electronic Products and Systems Center Copyright 23 CALCE EPSC -2. Temperature Cycling After 5 Gould - Temperature Cycling - All Data MacDermid - Temperature Cycling - All Data Plotted/Total Data: 231/295 Failed/Non-Functional: 2/62 1 σ: 4.41 Plotted/Total Data: 274/295 Failed/Non-Functional: 1/2 σ: o C to 125 o C at 5 o C/min with 3 min dwell at extremes Gould - Temperature Cycling - All Data (Zoomed) MacDermid - Temperature Cycling - All Data (Zoomed) Electronic Products Percent and Difference Systems Center

10 Temperature Cycling After 5 Gould - Temperature Cycling - Data MacDermid - Temperature Cycling - Data Plotted Data: 113 σ: Plotted Data: 139 σ: o C to 125 o C at 5 o C/min with 3 min dwell at extremes Gould - Temperature Cycling - Data MacDermid - Temperature Cycling - Data Plotted Data: 112 σ: Plotted Data: 135 σ: Electronic Products Percent and Difference Systems Center Copyright 23 CALCE EPSC Temperature Cycling After 5 Gould - Temperature Cycling - Data MacDermid - Temperature Cycling - Data.9.8 Plotted Data: 119 σ: Plotted Data: 121 σ: o C to 125 o C at 5 o C/min with 3 min dwell at extremes Gould - Temperature Cycling - Non- Data MacDermid - Temperature Cycling - Non- Data.7.6 Plotted Data: 112 σ: 5.67 Plotted Data: 153 σ: Electronic Products Percent and Difference Systems Center

11 Temperature Shock Time History Gould - Temperature Shock Time History (Median Case) MacDermid - Temperature Shock Time History (Median Case) Percecnt Difference Gould - Temperature Shock Time History (Selected Cases) MacDermid - Temperature Shock Time History (Selected Cases) Electronic Products and Systems Center 21 Copyright 23 CALCE EPSC. Temperature Shock After 5 Gould - Temperature Shock - All Data MacDermid - Temperature Shock - All Data Plotted/Total Data: 235/295 Failed/Non-Functional: 1/59.9 σ: Plotted/Total Data: 268/ Failed/Non-Functional: /27 σ: o C to 12 o C with 5 min dwell MacDermid - Temperature Shock - All Data (Zoomed) Gould - Temperature Shock - All Data (Zoomed) Electronic Products Percent and Difference Systems Center

12 Temperature Shock After 5 Gould - Temperature Shock - Data MacDermid - Temperature Shock - Data Plotted Data: 11 σ: Plotted Data: 134 σ: o C to 12 o C with 5 min dwell Gould - Temperature Shock - Data MacDermid - Temperature Shock - Data.6.5 Plotted Data: 125 σ: Plotted Data: 134 σ: Electronic Products Percent and Difference Systems Center Copyright 23 CALCE EPSC Temperature Shock After 5 Gould - Temperature Shock - Data MacDermid - Temperature Shock - Data Plotted Data: 116 σ: Plotted Data: 117 σ: o C to 12 o C with 5 min dwell Gould - Temperature Shock - Non- Data MacDermid - Temperature Shock - Non- Data.6.5 Plotted Data: 119 σ: Plotted Data: 151 σ: Electronic Products Percent and Difference Systems Center

13 Humidity Time History Gould - Humdity Time History (Median Case) MacDermid - Humidity Time History (Median Case) Gould - Humidity Time History (Selected Cases) MacDermid - Humidity Time History (Selected Cases) Electronic Products and Systems Center Copyright 23 CALCE EPSC. Humidity After 1244 Gould - Humidity - All Data MacDermid - Humidity - All Data 85% at 13 o C Plotted/Total Data: 195/295 Failed/Non-Functional: 47/53.12 σ: 8.8 Plotted/Total Data: 23/295.1 Failed/Non-Functional: 29/36 σ: Gould - Humidity - All Data (Zoomed) MacDermid - Humidity - All Data (Zoomed) Electronic Products Percent and Difference Systems Center

14 Humidity After 1244 Gould - Humidity - Data MacDermid - Humidity - Data 85% at 13 o C.4.35 Plotted Data: 95 σ: Plotted Data: 119 σ: Gould - Humidity - Data MacDermid - Humidity - Data.6.5 Plotted Data: 1 σ: Plotted Data: 111 σ: Electronic Products Percent and Difference Systems Center Copyright 23 CALCE EPSC Humidity After 1244 Gould - Humidity - Data MacDermid - Humidity - Data.14 Plotted Data: 1 σ: Plotted Data: 13 σ: % at 13 o C Gould - Humidity - Non- Data MacDermid - Humidity - Non- Data.4.35 Plotted Data: 95 σ: Plotted Data: 127 σ: Electronic Products Percent and Difference Systems Center

15 Electronic Products and Systems Center 3 Failure Summary * Test Condition Manufacturer Gould MacDermid High Temperature Bake (15 o C) 1/98 2/12 1/14 2/114 /136 /128 /115 /149 Temperature Coefficient (-25 o C to 125 o C at.625 o C/min) /17 /125 /114 /118 /129 /127 /113 /143 Temperature Cycling (-65 o C to 125 o C at 5 o C/min with 3 min dwell at extremes) /113 2/118 1/119 1/112 1/139 /135 1/121 /153 Temperature Shock (-4 o C to 12 o C with 5 min dwell) 1/111 /125 1/117 /119 /134 /119 /117 /151 Humidity (85% at 13 o C) 18/95 29/1 21/1 26/95 16/119 13/111 11/13 18/127 * Failures defined as R > 5% Electronic Products and Systems Center 29 Copyright 23 CALCE EPSC Underway now (May 23) Failure Analysis