Current standard certification testing to detect infant mortality. Future movement to align certification standards testing to real world failures.

Transcription

1 IEEE Santa Clara Valley Chapter, Cmpnents, Packaging & Manufacturing Technlgy Sciety Impact f Packaging n Phtvltaic Panel Perfrmance and Reliability Feb Alelie Funcell Cherif Kedir Chris Ling Certificatin Services: IEC61215 IEC61646 IEC62108 IEC60904 IEC61730 UL1703 UL1741 BOS Cmpnent Testing: Junctin Bxes, Cables, Cnnectrs, Inverters Outdr Perfrmance Validatin: Energy Yield Validatin, Siling, Degradatin and Site Cmmissining Renewable Energy Test Center Overview Overview f current PV packaging technlgies. Functinal Requirements Types Cmmn Failure Mdes Standards fr Testing IEC + UL Current standard certificatin testing t detect infant mrtality. Future mvement t align certificatin standards testing t real wrld failures. www-retc-ca.cm Slide 2

2 IEEE Santa Clara Valley Chapter, Cmpnents, Packaging & Manufacturing Technlgy Sciety PV Packaging Overview Functinal requirements f the PV Packaging Prvide adhesin f material stack High transmissin Anti Reflectin Misture Barrier Impact Prtectin Anti Siling Structural Supprt Heat Dissipatin Electrical Insulatin Backsheet Reflectin Flexibility fr thermal expansin. Typical bulk silicn mdule materials. www-retc-ca.cm Slide 3 PV Packaging Technlgies Crystalline Silicn Lw Irn Glass (tempered) Ethyl Vinyl Acetate (EVA) Tedlar Backsheet Thin Film ETFE Flexible Films Lw Irn Glass (tempered) Ethyl Vinyl Acetate (EVA) Glass (annealed) Cncentrating PV Acrylic Lens Alternative (New) Materials Silicne Adhesives Aluminum Backsheet www-retc-ca.cm Slide 4

3 IEEE Santa Clara Valley Chapter, Cmpnents, Packaging & Manufacturing Technlgy Sciety PV Packaging Cmmn Failure Mdes TOP 5 Failure Mde Standards Testing 1. Misture Ingress Damp Heat 85 C / 85% RH Hurs Humidity Freeze 85 C / 85% / -40 C - 10 Days 2. Thermal Cefficient f Expansin Mismatch / Intercnnect Failure Thermal Cycling Humidity Freeze 3. Structural Mechanical Lad Test 4. Leakage Current Insulatin Test Dielectric Withstand Test Wet Leakage Current Test Impulse Vltage Test 5. Crrsin / In Migratin Damp Heat Visual Inspectin Crrsive Atmsphere Test Salt Spray www-retc-ca.cm Slide 5 Crrsin / In Migratin www-retc-ca.cm Slide 6

4 IEEE Santa Clara Valley Chapter, Cmpnents, Packaging & Manufacturing Technlgy Sciety Electrluminescence f cell shwing Misture Ingress www-retc-ca.cm Slide 7 Thermal Expansin, Lateral Stresses, Thermal Mismatch www-retc-ca.cm Slide 8

5 IEEE Santa Clara Valley Chapter, Cmpnents, Packaging & Manufacturing Technlgy Sciety Electrluminescence f Misture Ingress due t Undercured EVA www-retc-ca.cm Slide 9 EVA Delaminatin - (TCO = Transparent Cnductive Oxide / Electr Chemical Glass Crrsin) www-retc-ca.cm Slide 10

6 IEEE Santa Clara Valley Chapter, Cmpnents, Packaging & Manufacturing Technlgy Sciety UV Induced Yellwing / Disclratin www-retc-ca.cm Slide 11 Structural Failure f Glass Substrate www-retc-ca.cm Slide 12

7 IEEE Santa Clara Valley Chapter, Cmpnents, Packaging & Manufacturing Technlgy Sciety Humidity Freeze / Thermal Cycling Test Chamber Prfile www-retc-ca.cm Slide 13 Current IEC Standards Testing t Evaluate Packaging Integrity Thermal Expansin - Intercnnect Failures (Thermal Cycling) Intercnnect Quality Temperature Cycle Prvide adhesin f material stack (Maximum Pwer Determinatin) High transmissin (Maximum Pwer Determinatin) Anti Reflectin (Maximum Pwer Determinatin) Misture Barrier (Damp Heat / Humidity Freeze Test) Impact Prtectin (Impact / Cut / Push / Hail Test) Anti Siling (Maximum Pwer Determinatin) Structural Supprt (Mechanical Lad Test) Heat Dissipatin (Measurement f Temperature Cefficient / NOCT) Electrical Insulatin (Insulatin Test / Wet Leakage Test) Backsheet Reflectin (Maximum Pwer Determinatin) * Tests require weeks f envirnmental chamber testing. There is a current mvement by a cnsrtium t present Thresher Prtcl Testing at NREL cnference later this mnth. www-retc-ca.cm Slide 14

8 IEEE Santa Clara Valley Chapter, Cmpnents, Packaging & Manufacturing Technlgy Sciety References PVCDROM Mdule Materials. STR Macquarie Wind & Slar: Getting Cnnected Cnference 12/10/ IECEE IEC Standard. iec61215_2ed_2005 IECEE IEC Standard. iec61646{ed2.0}b Peter Hacke, NREL System Bias Vltage Stress Effects in Multicrystalline Silicn Mdules Thmas Weber et. Al. ELECTROLUMINESCENCE ON THE TCO CORROSION OF THIN FILM MODULES Sensvatin Phtvltaic Imaging f Slar Cells and Mdules PVPRO Cymax PV Mdule. Trendir Flexible Slar Panels by PwerFilm - Revlutinary Slar Film Technlgy Jhn Whlgemuth, Daniel W. Cunningham, Andy Nguyen, Gerge Kelly and Dinesh Amin, BP Slar. Failure Mdes f Crystalline Si Mdules Emcre Failure Mdes f CPV Mdules and Hw t Test fr Them G. TamizhMani, B. Li, T. Arends, J. Kuitche, B. Raghuraman, W. Shisler, K. Farnswrth, J. Gnzales, & A. Vrpayev,. Failure analysis f design qualificatin testing: 2007 vs Arizna State University Phtvltaic Testing Labratry (ASU-PTL), Mesa, Arizna, USA Mia Sle Cmmn Failure Mdes fr Thin-Film Mdules and Cnsideratins Tward Hardening CIGS Cells t Misture Dennis Cyle, Hlly Blaydes, James Pickett, Tdd Tlliver, RiAn Zha, and J.ames Gardne. GE Glbal Research. Packaging Requirements fr ITO-Hardened CIGS www-retc-ca.cm Slide 15